p-n junction biasing, p-n I-V characteristics, p-n currents Norlaili Mohd. Noh EEE /09

Similar documents
Electronic Circuits for Mechatronics ELCT 609 Lecture 2: PN Junctions (1)

Lecture (02) PN Junctions and Diodes

PN Junction

Basic Physics of Semiconductors

Electronic PRINCIPLES

electronics fundamentals

ECE PN Junctions and Diodes

ECE-342 Test 2 Solutions, Nov 4, :00-8:00pm, Closed Book (one page of notes allowed)

Electro - Principles I

Lecture-4 Junction Diode Characteristics

Lecture (02) Introduction to Electronics II, PN Junction and Diodes I

Session 6: Solid State Physics. Diode

Diodes. EE223 Digital & Analogue Electronics Derek Molloy 2012/2013.

ITT Technical Institute ET215 Devices I Unit 1

ECE 340 Lecture 27 : Junction Capacitance Class Outline:

Solid State Electronics. Final Examination

PN Junction Diode. Diode Cases. Semiconductor Elements. 2009, EE141Associate Professor PhD. T.Vasileva

PN Junctions. Lecture 7

Peak Electric Field. Junction breakdown occurs when the peak electric field in the PN junction reaches a critical value. For the N + P junction,

n N D n p = n i p N A

For the following statements, mark ( ) for true statement and (X) for wrong statement and correct it.

Semiconductor Physics and Devices

Diodes. anode. cathode. cut-off. Can be approximated by a piecewise-linear-like characteristic. Lecture 9-1

A SEMICONDUCTOR DIODE. P-N Junction

Photosynthesis & Solar Power Harvesting

Spring Semester 2012 Final Exam

Chapter 7. The pn Junction

Consider a uniformly doped PN junction, in which one region of the semiconductor is uniformly doped with acceptor atoms and the adjacent region is

16EC401 BASIC ELECTRONIC DEVICES UNIT I PN JUNCTION DIODE. Energy Band Diagram of Conductor, Insulator and Semiconductor:

Lecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005

SEMICONDUCTORS. Conductivity lies between conductors and insulators. The flow of charge in a metal results from the

Junction Diodes. Tim Sumner, Imperial College, Rm: 1009, x /18/2006

Semiconductor Physics fall 2012 problems

Charge Carriers in Semiconductor

SEMICONDUCTOR DIODE. Unbiased (non-polarized) PN junction

Schottky Rectifiers Zheng Yang (ERF 3017,

KATIHAL FİZİĞİ MNT-510

Current mechanisms Exam January 27, 2012

Electronics The basics of semiconductor physics

CLASS 12th. Semiconductors

Misan University College of Engineering Electrical Engineering Department. Exam: Final semester Date: 17/6/2017

SRI VIDYA COLLEGE OF ENGINEERING AND TECHNOLOGY VIRUDHUNAGAR Department of Electronics and Communication Engineering

The pn junction. [Fonstad, Ghione]

Electronic Circuits 1. Transistor Devices. Contents BJT and FET Characteristics Operations. Prof. C.K. Tse: Transistor devices

3.7 Physical Operation of Diodes

Effective masses in semiconductors

L03: pn Junctions, Diodes

Lecture 12. Semiconductor Detectors - Photodetectors

CLASS 1 & 2 REVISION ON SEMICONDUCTOR PHYSICS. Reference: Electronic Devices by Floyd

UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences

ELEC 3908, Physical Electronics, Lecture 18. The Early Effect, Breakdown and Self-Heating

Semiconductor Physics fall 2012 problems

Chap. 11 Semiconductor Diodes

Concept of Core IENGINEERS- CONSULTANTS LECTURE NOTES SERIES ELECTRONICS ENGINEERING 1 YEAR UPTU. Page 1

Semiconductor Physics. Lecture 6

Course overview. Me: Dr Luke Wilson. The course: Physics and applications of semiconductors. Office: E17 open door policy

R. Ludwig and G. Bogdanov RF Circuit Design: Theory and Applications 2 nd edition. Figures for Chapter 6

ELECTRONICS IA 2017 SCHEME

Semiconductor Physics Problems 2015

Semiconductors (Chất1bán1dẫn)

Lect. 10: Photodetectors

Solid State Physics SEMICONDUCTORS - IV. Lecture 25. A.H. Harker. Physics and Astronomy UCL

(Refer Slide Time: 03:41)

Chapter 1 INTRODUCTION SEMICONDUCTORS MATERIAL

BASIC ELECTRONICS CONDUCTION IN SEMICONDUCTORS

Midterm I - Solutions

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors

pn JUNCTION THE SHOCKLEY MODEL

Introduction to Transistors. Semiconductors Diodes Transistors

CHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki

Avalanche breakdown. Impact ionization causes an avalanche of current. Occurs at low doping

Photodiodes and other semiconductor devices

Advantages / Disadvantages of semiconductor detectors

Lecture #11. Lecture

Metal Semiconductor Contacts

LEC E T C U T R U E R E 17 -Photodetectors

Electron Energy, E E = 0. Free electron. 3s Band 2p Band Overlapping energy bands. 3p 3s 2p 2s. 2s Band. Electrons. 1s ATOM SOLID.

OPTI510R: Photonics. Khanh Kieu College of Optical Sciences, University of Arizona Meinel building R.626

Semiconductors CHAPTER 3. Introduction The pn Junction with an Applied Voltage Intrinsic Semiconductors 136

Forward-Active Terminal Currents

Lecture 2. Semiconductor Physics. Sunday 4/10/2015 Semiconductor Physics 1-1

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors. Fabrication of semiconductor sensor

Quiz #1 Practice Problem Set

FREQUENTLY ASKED QUESTIONS February 21, 2017

Semiconductor Detectors

PHYSICAL ELECTRONICS(ECE3540) CHAPTER 9 METAL SEMICONDUCTOR AND SEMICONDUCTOR HETERO-JUNCTIONS

5. Semiconductors and P-N junction

This is the 15th lecture of this course in which we begin a new topic, Excess Carriers. This topic will be covered in two lectures.

- A free electron in CB "meets" a hole in VB: the excess energy -> a photon energy.

PHYSICAL ELECTRONICS(ECE3540) CHAPTER 9 METAL SEMICONDUCTOR AND SEMICONDUCTOR HETERO-JUNCTIONS

EECS130 Integrated Circuit Devices

Introduction to Semiconductor Physics. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Chenming Hu.

Where µ n mobility of -e in C.B. µ p mobility of holes in V.B. And 2

ECE321 Electronics I

Lecture 16 - The pn Junction Diode (II) Equivalent Circuit Model. April 8, 2003

junctions produce nonlinear current voltage characteristics which can be exploited

Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes

Introduction to Semiconductor Devices

MTLE-6120: Advanced Electronic Properties of Materials. Semiconductor p-n junction diodes. Reading: Kasap ,

Transcription:

CLASS 6&7 p-n junction biasing, p-n I-V characteristics, p-n currents 1

p-n junction biasing Unbiased p-n junction: the potential barrier is 0.7 V for Si and 0.3 V for Ge. Nett current across the p-n junction is 0 since the majority carriers diffusion current cancels off the minority carriers drift current p space-charge region n 2

Reverse bias Mj Majority carriers moving away from the junction as the holes inpwillbeattractedtothe ve terminal and electrons in n will beattractedtotheveterminal of the voltage supply. Effects: 1. Depletion region 2. Potential barrier 3. Very difficult for the majority carriers in the p and ntocross the p-n junction. Hence, no diffusion current will be generated. p space-charge region V R n 3

4. Minority carriers will flow across the p-n junction space-charge charge producing reverse leakage p region current. Reasons: -Electrons in p moving towards the junction away from the -ve terminal. Holes in n moving towards the junction away from the ve terminal. -The fixed ve ions will attract electrons in p space-charge region to cross the junction. The fixed -ve ions will attract holes in n space-charge region to cross the junction. V R n minority carrier leakage current 4

Initially, the reverse current will increase when V R is increased. This is because more minority carriers are able to cross the p-n junction. Beyond V R1, current will be constant at I S. This is because, if the temperature does not increase, the number of minority carriers will be quite consistent. Minority carriers will increase with the increase in temperature. I S is called reverse saturation current. I S for Ge is in µa and for Si is in na. This is because the bandgap for Ge < than the bandgap for Si. Hence, at the same temperature, electron-hole pairs in Ge > than the electronhole pairs in Si. p space-charge region VR V R1 n minority carrier leakage current I S 5

Reverse breakdown in p-n junction Breakdown voltage = V BD If V R > V BD, the reverse current I R will increase tremendously with just a small increase in V R.Thisis the reverse breakdown condition. Under the reverse breakdown condition, the reverse current is large and may damage the p-n junction if not limited by a series resistor. Hence, reverse breakdown is an unwanted condition 6

How does breakdown occur? Large V R Minority carriers are vibrating strongly and moving f fast. V R > V BD The minority free atom B carriers are moving very fast and electron (carrier) minority-carrier vibrating very strongly that when i it i they collide with atoms and ions, the energy that they passed to these atoms and ions will cause their valence electrons to breakaway from them. An avalanche of electron-hole pairs (minority carriers) generated. Reverse current will be very large. Reverse breakdown = avalanche breakdown because of the multiplication or avalanche of current thatt occurs. atom A free electron (carrier) atom C atom D free electron (carrier) free electron (carrier) 7

I-V characteristic of the I F forward current breakdown voltage reverse bias p-n V BD V junction. R I S reverse voltage forward voltage V F reverse saturated leakage current large reverse current increase for a small increase in reverse voltage I reverse current S 8

Forward biased p-n junction Majority carriers will move toward the junction as the holes in p will be attracted to the ve terminal and electrons in n will be attracted to the ve terminal of the voltage supply. When the majority carriers enter the space-charge region, the holes from p will neutralize the ve ions and the electrons from n will neutralize the ve ions. Effects: 1. Depletion region 2. Potential barrier 3. More majority carriers can overcome the potential barrier and cross the p-n junction. 4. Majority carrier current. V F I F. p I F space-charge region VF n 9

p space-charge charge region n If V F is large enough (V F >V o ), the potential barrier becomes negligible. Hence, there is no longer a constraint for the majority carriers to cross the junction. A small increase in V F will produce a large increase in the forward current I F. The forward bias voltage required to enable significant current to flow is > 0.3 V for the Ge and > 0.7 V for the Si. These voltages are the potential barrier voltages for the semiconductors. I F I F V F Vo VF 10

In an open-circuit p-n junction, the junction is unbiased, i.e. majority carrier diffusion current = minority carrier drift current. As both currents are flowing in the opposite direction, nett open circuit p-n junction current is 0. Under this condition, the space charge region is said to be in equilibrium. General equation: V BARRIER = V o V BIAS where V BARRIER = potential barrier voltage V o = potential barrier voltage when there is no bias V BIAS = biasing voltage In equilibrium: V BIAS = 0, V BARRIER = V o = 0.3 V (Ge) and 0.7 V (Si). In forward bias: For V BIAS = V F and V F < V o, V BARRIER will decrease when V F is increased. In reverse bias: For V BIAS = V R, V BARRIER = V o ( V R ) = V o V R,V BARRIER will increase when V R is increased. For V R >> V o, V BARRIER V R. 11

E o =ev o p conduction band n conduction band E cp E F E vp E o E o E cn E F E vn valence band valence band 12

IF forward current Overall p-n junction I-V characteristic: The p-n junction will let current flow when it is forward biased (with the condition that V F > V o, V o is typically written as V ON ). The p-n junction will prevent current from flowing when it is reverse biased. The avalanche current generated when V R >V BD is an undesired current as the junction will be damaged under this condition. breakdown voltage reverse voltage V R V BD large reverse current increase for a small increase in reverse voltage I S V ON reverse saturated leakage current forward voltage V F IS reverse current 13

Temperature effects on the I-V characteristics of the p-n junction I-V characteristics for the Si diode at 25 C and 100 C. Observations: 1. T V ON 2. T V F to obtain the same I F 3. T I S 4. T V BD 14

Cause for Effect 1: T V ON Unbiased p-n junction has V o = 0.3V (Ge) and 0.7V (Si). When T, the no. of minority carriers (from thermal generation). The minority carriers in the space-charge region will neutralize the fixed ions in this region. Depletion region, potential barrier. More majority carriers can overcome this barrier. A lower V F is required to enable significant amount of current to flow. Hence, V ON p space-charge region n 15

Cause for Effect 2: T V F to obtain the same I F. The cause for this effect is very much related to the cause for Effect 1. When T V ON.So,a lower V F is required to obtain the same I F as that at a lower temperature. 16

Cause for Effect 3: T I S. The current, I R, when the p-n junction is reverse biased is the reverse leakage current that depends on the minority carriers. At T, the no. of minority carriers from thermal generation. The no. of minority carriers crossing the p-n junction. I R. Hence, I S. p space-charge region VR n 17

Cause for Effect 4: T V BD. Avalance breakdown occurs when the minority carriers had moved along a sufficient distance to produce the secondary and tertiary carriers by the breaking of covalent bonds. When T, the no. of minority carriers. More fixed ions will be neutralized. Depletion region. Not enough secondary and tertiary carriers produced before the electrons cross the junction. Avalanche does not happen. Needs more voltage to enable the electrons to vibrate more and produce the secondary and tertiary carriers. Hence, V BD. 18

CURRENT COMPONENTS IN A FORWARD-BIASED P-N JUNCTION Diagram shows the hole and electron current components versus distance in an asymmetrical p-n junction diode (N A N D ). Current flowing through the p- n junction is the total of the hole and electron currents. I pp = hole current in the p (majority carrier current) I np = electron current in the p (minority carrier current) I nn = electron current in the n (majority carrier current) I pn = hole current in the n (minority carrier current) 19

In this example, N A > N D. Current equations: At x -1, I pp(x -1 ) I np (x -1 ) = I At x 1, I nn (x 1 ) I pn (x 1 ) = I In general, I pp (x) I np (x) = I I nn ()I (x) pn () (x) = I At x = 0, I np (0) I pn (0) = I 20

Current enters the p as a hole current but leaves the n as an electron current with the same magnitude. Total current is constant along the pn device but the portions contributed by the holes and electrons differ with distance. Current in the p-n diode is bipolar as this current is contributed by both ve and ve electrical carriers. 21

Hole current crosses the junction and enters the n as: VV T AqD ppn pn I = e 1 L p Electron current crosses the junction and enters the p as: VV AqDnnp T Inp = e 1 L n where A = cross section area L p,l n = hole, electron diffusion length in n, p p n,n p = hole, electron density in n, p (minority carriers) q = electronic charge, 1.6 x 10-19 C D p, D n =hole, electron diffusion coefficient V = forward biasing voltage, V T = temperature equivalent voltage = kt/q 26 mv at T = 300 K K, k = Boltzmann constant = 1.38x10-23 J/ K FORWARD CURRENT 22