Working with Zernike Polynomials

Similar documents
Using a Membrane DM to Generate Zernike Modes

AOL Spring Wavefront Sensing. Figure 1: Principle of operation of the Shack-Hartmann wavefront sensor

Wavefront Sensing using Polarization Shearing Interferometer. A report on the work done for my Ph.D. J.P.Lancelot

Pupil matching of Zernike aberrations

Distortion mapping correction in aspheric null testing

ABSTRACT. * phone ; fax ;

Zernike Polynomials and Beyond

Progressive Addition Lenses

Orthonormal vector polynomials in a unit circle, Part I: basis set derived from gradients of Zernike polynomials

Wavefront Optics for Vision Correction

Sky demonstration of potential for ground layer adaptive optics correction

TMT Metrology study for M2 and M3

Maximum likelihood estimation as a general method of combining. sub-aperture data for interferometric testing

REAL-TIME estimation of optical wavefronts is critical

Alignment metrology for the Antarctica Kunlun Dark Universe Survey Telescope

* AIT-4: Aberrations. Copyright 2006, Regents of University of California

Ocular Wavefront Error Representation (ANSI Standard) Jim Schwiegerling, PhD Ophthalmology & Vision Sciences Optical Sciences University of Arizona

Response of DIMM turbulence sensor

Optical Shop Testing. Second Edition. Edited by DANIEL MALACARA. John Wiley & Sons, Inc. A Wiley-Interscience Publication

Wave-front generation of Zernike polynomial modes with a micromachined membrane deformable mirror

Deformable mirror fitting error by correcting the segmented wavefronts

CHARA Meeting 2017 Pasadena, California

Applications of the Abbe Sine Condition in Multi-Channel Imaging Systems

Course 2: Basic Technologies

Wavefront aberration analysis with a multi-order diffractive optical element

AN INTERPOLATION METHOD FOR RIGID CONTACT LENSES

Orthogonality and convergence of discrete Zernike polynomials

IMPROVING BEAM QUALITY NEW TELESCOPE ALIGNMENT PROCEDURE

Imaging through Kolmogorov model of atmospheric turbulence for shearing interferometer wavefront sensor

Making FEA Results Useful in Optical Analysis Victor Genberg, Gregory Michels Sigmadyne, Inc. Rochester, NY

Alignment aberrations of the New Solar Telescope

Closed Loop Active Optics with and without wavefront sensors

Optical Shop Testing

Designing a Computer Generated Hologram for Testing an Aspheric Surface

A NEW APPROACH FOR MECHANICAL DESIGN OF ANTENNA REFLECTORS CONSIDERING RF PARAMETERS & ZERNIKE COEFFICIENTS

Geometric aberrations: introduction, definitions, bibliography

Open loop control on large stroke MEMS deformable mirrors

Homogeneity of optical glass

Overview of Aberrations

Technical Note Turbulence/Optical Quick-Reference Table

A Path to Freeform Optics. Kyle Fuerschbach University of Rochester Jannick Rolland University of Rochester Kevin Thompson Synopsys

Zernike expansions for non-kolmogorov turbulence

AVEFRONT ANALYSIS BASED ON ZERNIKE POLYNOMIALS

Electrostatic Membrane Deformable Mirror Wavefront Control Systems: Design and Analysis

Using 50-mm electrostatic membrane deformable mirror in astronomical adaptive optics

Figure testing of 300 mm Zerodur mirrors at cryogenic temperatures

Opto-Mechanical I/F for ANSYS

Phase Retrieval for the Hubble Space Telescope and other Applications Abstract: Introduction: Theory:

eff (r) which contains the influence of angular momentum. On the left is

3D Laser Pulse Shaping for the Cornell ERL Photoinjector. August 9 th, 2012 Sierra Cook Advisors: Adam Bartnik, Ivan Bazarov, Jared Maxson

Correction of Errors in Polarization Based Dynamic Phase Shifting Interferometers

Wavefront Analysis for Annular Ellipse Aperture

Figure measurement of a large optical flat with a Fizeau interferometer and stitching technique

Active Optics on the Baade 6.5-m (Magellan I) Telescope

A STUDY OF PYRAMID WFS BEHAVIOUR UNDER IMPERFECT ILLUMINATION

Polarization Shearing Interferometer (PSI) Based Wavefront Sensor for Adaptive Optics Application. A.K.Saxena and J.P.Lancelot

The Distributed Defining System for the Primary Mirrors

ETNA Kent State University

Part 1 - Basic Interferometers for Optical Testing

Mechanics, Heat, Oscillations and Waves Prof. V. Balakrishnan Department of Physics Indian Institute of Technology, Madras

Optical/IR Observational Astronomy Telescopes I: Optical Principles. David Buckley, SAAO. 24 Feb 2012 NASSP OT1: Telescopes I-1

Optical Interface for MSC.Nastran

Design and Correction of optical Systems

Astronomical Seeing. Northeast Astro-Imaging Conference. Dr. Gaston Baudat Innovations Foresight, LLC. April 7 & 8, Innovations Foresight

Static telescope aberration measurement using lucky imaging techniques

International Journal of Scientific & Engineering Research, Volume 4, Issue 7, July ISSN

Available online at ScienceDirect

Four-Mirror Freeform Design

Use of computer generated holograms for alignment of complex null correctors

INAF Osservatorio astronomico di Torino Technical Report nr. 152

Simulation of specimen-induced aberrations for objects with

Keeping the Hubble Space Telescope in focus.

n The visual examination of the image of a point source is one of the most basic and important tests that can be performed.

NB: from now on we concentrate on seeing, as scintillation for large telescopes is unimportant

Linear optical model for a large ground based telescope

Least Square Approximation with Zernike Polynomials Using SAGE

Legendre Polynomials and Angular Momentum

July 21 Math 2254 sec 001 Summer 2015

Spherical Harmonics and Related Topics. David Randall 2 S = 0, r 2 r r S 2. S = r n Y n

Optical metrology for very large convex aspheres

Comparison of the Performance of Modal Control Schemes for an Adaptive Optics System and Analysis of the Effect of Actuator Limitations

Measurement accuracy in control of segmented-mirror telescopes

Residual phase variance in partial correction: application to the estimate of the light intensity statistics

Primary Mirror Cell Deformation and Its Effect on Mirror Figure Assuming a Six-zone Axial Defining System

Misalignment-Induced Aberrations of JWST:

DESIGN STUDY OF STRESSED MIRROR POLISHING (SMP) FIXTURE FOR SEGMENTED MIRROR TELESCOPES

Control Systems Engineering ( Chapter 8. Root Locus Techniques ) Prof. Kwang-Chun Ho Tel: Fax:

Euclid/NISP grism qualification model AIT/AIV campaign: optical, mechanical, thermal and vibration tests

CHAPTER 3 POTENTIALS 10/13/2016. Outlines. 1. Laplace s equation. 2. The Method of Images. 3. Separation of Variables. 4. Multipole Expansion

Sky Projected Shack-Hartmann Laser Guide Star

Closed Loop Optimization of Opto-Mechanical Structure via Mechanical and Optical analysis software. Abstract:

Department of Physics, Korea University

IMECE SINGLE CRYSTAL PIEZOELECTRIC ACTUATORS FOR ADVANCED DEFORMABLE MIRRORS

Measurement of specimen-induced aberrations of biological. samples using phase stepping interferometry

Athermal design of nearly incompressible bonds

Low Coherence Vibration Insensitive Fizeau Interferometer

Design and Development of Bimorph Deformable Mirrors for Defocus Correction

WAVEFRONT OPTICS FOR THE NON-MATHEMATICIAN

Reconstruction of laser beam wavefronts based on mode analysis

Characterization for vision science applications of a bimorph deformable mirror using Phase-Shifting Interferometry

Transcription:

AN06 Working with Zernike Polynomials Author: Justin D. Mansell, Ph.D. Active Optical Systems, LLC Revision: 6/6/0 In this application note we are documenting some of the properties of Zernike polynomials and describing in more detail how they are used in the AOS software. Zernike Decomposition Vector The real Zernike polynomials are defined as [D. Malacara, Optical Shop Testing], where, and n and l are the index parameters. In this software, the Zernike polynomials (aka Zernikes) are ordered in increasing order of n then l. The n index is effectively the radial power and l corresponds to the angular oscillation factor, which is valid from n to +n in steps of 2. The first few terms in the n-l order are commonly referred to as x-axis tilt (henceforth x-axis will be x), y tilt, 90-degree astigmatism, focus, 45-degree astigmatism, x trefoil, x coma, y coma, y trefoil, x quadrafoil, 2 nd -order x astigmatism, spherical aberration, 2 nd -order y astigmatism, y quadrafoil, and x pentafoil. Since we are applying these polynomials to a Hartmann-type sensor, we are not using the first piston Zernike term. Ordering There are many different ways to order Zernike polynomials in the literature. The most common is the Noll ordering, but Wyant and Malacara also show representations. In general, these orderings

go increasing radial power order (the n index), but differ in the order of the l term (the angular term). Table summarizes the n and l terms for the different ordering schemes for the first 25 Zernike terms. From this ordering table, we can see some of the logic associated with the ordering. AOS uses an ordering we call n,l ordering in which we are sorting in increasing order the n and then the l indices of the Zernikes. Noll ordering sorts by increasing n then increasing l magnitude (absolute value) with positive l numbers before negative l numbers if n is even and negative l terms before positive l terms if n is odd. Malacara s ordering from his Optical Shop Testing book sorts by increasing n then decreasing l (or increasing m where m = (n-l)/2).

Table : Summary of Zernike Ordering Techniques Index AOS - NL Ordering Noll Malacara Wyant n l m n l m n l m n l m - - 0-2 0 0-0 3 2-2 2 2 0 2 2 0 2 0 4 2 0 2 2 0 2 0 2-2 2 5 2 2 0 2-2 2 2-2 2 2 2 0 6 3-3 3 3 3 3 0 3-2 7 3-2 3-2 3 3 8 3 3 3 0 3-2 4 0 2 9 3 3 0 3-3 3 3-3 3 3-3 3 0 4-4 4 4 0 2 4 4 0 3 3 0 4-2 3 4-2 3 4 2 4-2 3 2 4 0 2 4 2 4 0 2 4 2 3 4 2 4-4 4 4-2 3 5-3 4 4 4 0 4 4 0 4-4 4 5 2 5 5-5 5 5-3 5 5 0 6 0 3 6 5-3 4 5 2 5 3 4-4 4 7 5-3 5-3 4 5 2 4 4 0 8 5 2 5 3 5-3 5-3 4 9 5 3 5-5 5 5-3 4 5 3 20 5 5 0 5 5 0 5-5 5 6-2 4 2 6-6 6 6 0 3 6 6 0 6 2 2 22 6-4 5 6 2 2 6 4 7-4 23 6-2 4 6-2 4 6 2 2 7 3 24 6 0 3 6 4 6 0 3 8 0 4 25 6 2 2 6-4 5 6-2 4 5-5 5

Amplitude - No Normalization Analysis of Peak-to-Valley and RMS in Zernike Polynomials Using the above formulation for Zernike polynomials (or the equivalent and easier to implement representation given in Hedser van Brug's SPIE paper "Efficient Cartesian representation of Zernike polynomials in computer memory"), we numerically studied the peak-to-valley (PV) amplitude and root-mean-squared (RMS) amplitude of the Zernikes over a unit radius circle using 024 x 024 grid of samples. Figure shows the results of this analysis. The peak-to-valley amplitude is 2.0 for almost all the Zernikes with the exception of those with l=0 and n is a multiple of 4. In those cases, the peak-to-valley amplitude is 2-0.5 or approximately.4. The RMS amplitude has a general trend related to the radial index (n), but has anomalies when l=0 and n is a multiple of 2. 2.5 2.5 Peak to Valley RMS 0.5 0 0 0 20 30 40 50 60 70 80 90 00 Zernike Index (NL Ordering) Figure Peak-to-Valley and RMS Amplitude for the first 00 Zernike Polynomials Study of Anomalous Peak-to-Valley Zernike terms where l=0 and n is a multiple of 4 show anomalous peak-to-valley amplitudes. These terms were analyzed numerically to see if there was indeed a simple discernable pattern in their peak-to-valley amplitude. Each of these Zernike terms showed a maximum of.0, but a minimum that varied from exactly -0.5 to a value near -0.4. 4

Minimum Value of the Zernike Polynomial in the Unit Circle AN06: Working with Zernike Polynomials -0.4-0.42-0.44-0.46-0.48 We analyzed the values numerically to try to discern an obvious pattern, but could not find a simple pattern. Suffice to say that the peak-to-valley amplitude of these Zernikes can be approximately reduced by a factor of /sqrt(2) and be accurate to within a few percent. Table 2 Analysis of the l=0,n =4*index Zernike Terms Minima n -0.5 2 3 4 5 6 Index of Zernike with l=0 and n is a multiple of 4 Minimum Value Approximate Fraction Fraction Value Difference PV Difference from 2 4-0.5 -/2-0.5 0 0.085786 8-0.42857429-3/7-0.42857 4.44089E-6 0.04358 2-0.4475046-90/27-0.4475 3.966E-06 0.000537 6-0.409690446-93/227-0.40969 -.8368E-06-0.00452 20-0.407276229-347 / 852-0.40728-7.66205E-07-0.00694 24-0.405936584-4 / 0-0.40594-4.0046E-06-0.00828 PV to RMS Ratio Pattern Analysis of the ratio of peak-to-valley to RMS illustrated a simple mathematical relationship relative to the radial power term (n) given by 2 PV 8, unless l 0 RMS 4, if l 0 and m%4 0 and m%2 0 (m is a multiple of 2, but not 4) ( n ) 2, if l 0 and m%4 0 (m is a multiple of 4) Figure 2 shows this relationship for the first 00 Zernike terms. 5

(PV/RMS) 2 / (n+), No Normalization AN06: Working with Zernike Polynomials 8 7 6 5 4 3 2 0 0 0 20 30 40 50 60 70 80 90 00 Zernike Index (NL Ordering) Figure 2 - Illustration of the simplification of the PV to RMS relationship with the n Zernike index. Amplitude Scaling for Overlap Integral Orthonormalization Zernikes are orthogonal about a unit circle, but their native overlap is not equal to one without proper scaling factors. In our software we have implemented the scaling factor such that the Zernikes self-overlap is unity. Using the polynomial definition described above, Malacara notes that the overlap of all Zernikes can be given by, 2 n In the software, the overlapping Zernike is scaled by. The vector will report the results of the decomposition with the traditional overlap integral normalization. The only exception we found to this was for the terms where n is a multiple of 4 and l is zero, in which case the normalization factor needs to be reduced by a factor of. Below is a table of the first few Zernikes and their 2 associated numerical normalization factors. 6

AN06: Working with Zernike Polynomials Index n l Name Normalization Factor - X Tilt 2 2 Y Tilt 2 3 2-2 90-degree Astigmatism 2.4495 4 2 0 Focus.732 5 2 2 45-degree Astigmatism 2.4495 6 3-3 X Trefoil 2.8284 7 3 - X Coma 2.8284 8 3 Y Coma 2.8284 9 3 3 Y Trefoil 2.8284 0 4-4 X Quadrafoil 3.623 4-2 X 2nd-order 3.623 Astigmatism 2 4 0 Spherical Aberration 2.236 3 4 2 Y 2nd-order 3.623 Astigmatism 4 4 4 Y Quadrafoil 3.623 5 5-5 X Pentafoil 3.464 Peak-to-Valley Zernike Normalization The raw Zernike polynomials are scaled with the following code to create a near unity peak to valley: x=0.5; if (mod(n,4)==0 && l==0) x=/sqrt(2); end; if (n==4 && l==0) x=/.5; end; if (n==8 && l==0) x=/(+3/7); end; Overlap-Normalized Scaling The raw Zernike polynomials are scaled with the following code to create a near unity overlap integral: x=sqrt(2.0*(n+.0)/pi); if (mod(n,2)==0 && l==0); x=x./sqrt(2); end; Overlap Integral Calculation for Zernike Decomposition To start calculating the overlap integral (aka dot product) we multiplied each sample by its corresponding point in the overlap-normalized Zernike term over the unit-radius circle and then divided by the number of points. The code for this in Matlab can be implemented as coef(ii) = sum(sum(zideal.*ztest))./ cnt;. This methodology does not take into account the area factor, so when we evaluated the self-overlap integral between the overlap normalized Zernike polynomials over the first 00 Zernikes and found that the result was /π. To complete the overlap integral, we need to multiply by the area of the unit circle, which is π, and leaves unity. 7

Value Overlap Coefficient * sqrt(pi) / RMS AN06: Working with Zernike Polynomials Comparison of RMS to Overlap-Normalized Overlap Integral We performed the overlap integral on a Zernike term that had been scaled to have a peak-to-valley amplitude of micron with its corresponding overlap-normalized Zernike term without multiplying by the area (π). Figure 3 shows the results from this analysis. The resulting overlap coefficient was found to be equal to the RMS wavefront of the test Zernike divided by π within the numerical noise. If the proper area factor is used, the RMS Zernike amplitude would be the overlap integral divided by π instead of times π. 2 x 0-7.8.6.4 Overlap Coefficient RMS WFE / sqrt(pi).00 0.999 0.998 0.997.2 0.8 0.6 0.996 0.995 0.994 0.993 0.992 0.4 0 20 40 60 80 00 Zernike Term (NL Ordering) Figure 3 - Results of Overlap Integral between -micron PV amplitude Zernike and the Overlap- Normalized Zernike Term Conclusions Zernike polynomials are widely used in optics, but have different orderings and different amplitude scale factors. The AOS software uses the Zernike terms ordered by increasing n then increasing l (NL ordering). The software reports the overlap-normalized (orthonormalized) coefficients as the Zernike polynomial decomposition. The RMS amplitude of each Zernike from the decomposition is equal to the overlap integral coefficient times π. References 0.99 0 20 40 60 80 00 Zernike Term (NL Ordering) D. Malacara, Optical Shop Testing, Wiley-Interscience; 2 edition (January 992). Hedser van Brug, "Efficient Cartesian representation of Zernike polynomials in computer memory", Proc. SPIE Vol. 390, p. 382-392. http://www.optics.arizona.edu/jcwyant/zernikes/zernikes.pdf (Applied Optics and Optical Engineering, Vol. XI., Chapter ) 8