Lecture 9: Indirect Imaging 2. Two-Element Interferometer. Van Cittert-Zernike Theorem. Aperture Synthesis Imaging. Outline

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Lecture 9: Indirect Imaging 2 Outline 1 Two-Element Interferometer 2 Van Cittert-Zernike Theorem 3 Aperture Synthesis Imaging

Cygnus A at 6 cm Image courtesy of NRAO/AUI

Very Large Array (VLA), New Mexico, USA Image courtesy of NRAO/AUI

Two-Element Interferometer Fringe Pattern for I 1 = I 2 = I 0 I = 2I 0 {1 + γ 12 (τ) cos [α 12 (τ) φ]} V = γ 12 (τ) source S on central axis, fully coherent waves from two holes I = 2I 0 (1 + cos φ) = 4I 0 cos 2 φ 2

Fringe Pattern (continued) I = 4I 0 cos 2 φ 2 φ = 2π λ (r 2 r 1 ) = 2πντ distance a between pinholes distance s to observation plane Σ O, s a path difference (r 2 r 1 ) in equation for φ in good approximation r 2 r 1 = aθ = a s y and therefore I = 4I 0 cos 2 πay sλ

Interference Fringes from Monochromatic Point Source irradiance as a function of the y-coordinate of the fringes in observation plane Σ O irradiance vs. distance distribution is Point-Spread Function (PSF) of ideal two-element interferometer non-ideal two-element interferometer with finite apertures using pupil function concept (Observational Astrophysics 1)

Finite Apertures two circular apertures, diameter d, separated by baseline direction vector s origin of pupil function P( r) on baseline vector s symmetrically positioned between apertures pupil function using 2-dimensional circular window function Π ( ) ( ) r s/2 r + s/2 P( r) = Π + Π d d with spatial frequency variable ζ = r/λ ( ) ( ) ζ P( ζ) s/2λ ζ + s/2λ = Π + Π d/λ d/λ

Finite Apertures (continued) with ζ = r/λ ( ) ζ P( ζ) s/2λ = Π d/λ + Π ( ) ζ + s/2λ d/λ length of baseline vector s = D if d D, pupil function can be approximated by P( ζ) ( ) ( ) = δ ζ s/2λ + δ ζ + s/2λ optical transfer function (OTF) from self-convolution of (λ/r)p( ζ) symmetrical pupil function: autocorrelation of (λ/r)p( ζ): OTF = H λ ( ζ) = ( ) λ 2 P( ζ R )P( ζ ζ)d ζ pupil plane

Finite Apertures (continued) pupil function for d D P( ζ) ( ) = δ ζ s/2λ ( ) + δ ζ + s/2λ autocorrelation of (λ/r)p( ζ): OTF = H λ ( ζ) = = ( ) λ 2 R [ = 2 ( λ R ( ) λ 2 R pupil plane [ ( ) δ ζ s/2λ P( ζ )P( ζ ζ)d ζ ( )] + δ ζ + s/2λ pupil plane ( δ ζ ζ ) ( s/2λ + δ ζ ζ )] + s/2λ dζ ) 2 [ δ( ζ ) + 1 ( ) 2 δ ζ s/λ + 1 ( ) ] 2 δ ζ + s/λ

Finite Apertures (continued) from before OTF = 2 ( ) λ 2 [ δ( ζ R ) + 1 ( ) 2 δ ζ s/λ + 1 ( ) ] 2 δ ζ + s/λ pair of pinholes transmits three spatial frequencies DC-component δ( 0) two high frequencies related to length of baseline vector s at ± s/λ 3 spatial frequencies represent three-point sampling of the uv-plane in 2-d spatial frequency space complete sampling of uv-plane provides sufficient information completely reconstruct original brightness distribution

Point-Spread Function (PSF) Optical Transfer Function (OTF) of 2-element interferometer OTF = 2 ( ) λ 2 [ δ( ζ R ) + 1 ( ) 2 δ ζ s/λ + 1 ( ) ] 2 δ ζ + s/λ PSF is Fourier Transform of H λ ( ζ) ( ) δ ζ s/λ ( ) δ ζ + s/λ δ( ζ ) 1 e i2π θ s/λ e i2π θ s/λ Point-Spread Function of 2-element interferometer ( ) λ 2 [ 2(1 + cos 2πθ R s/λ)] θ: 2-d angular coordinate vector 2 = 4 ( ) λ 2 cos 2 πθ R s/λ

Point-Spread Function (continued) from before PSF = 4 ( ) λ 2 cos 2 πθ R s/λ flux I 0 from each pinhole brightness distribution for diffracted beam I = 4I 0 cos 2 π θ s/λ compare to previous result I = 4I 0 cos 2 πay sλ the same but now in 2-d setting with θ replacing y/s and s replacing pinhole distance a

Interpretation of fringe pattern flux I 0 from each pinhole brightness distribution for diffracted beam I = 4I 0 cos 2 π θ s/λ full constructive interference for I = 4I 0 for θ s λ = n (= 0, ±1, ±2,...) θ = full destructive interference for nλ s cos φ I = 0 for θ s λ = (n + 1 2 ) (= ±1 2, ±3 2,...) θ = (n + 1 2 )λ s cos φ cos φ is angle between θ and baseline vector s

Interpretation of fringe pattern (continued) PSF represents corrugated sheet with modulation along direction of baseline vector s and periodicity ( θ) s = λ/ s PSF is pattern of alternating bright and dark stripes orthogonal to direction of baseline vector s aperture have finite size, diffracted light from apertures is localized, i.e. d < S, but approximation by δ-functions no longer holds

Finite Apertures: PSF PSF (amplitude squared of diffracted field) from Fourier transformation of pupil function ã( θ) λ [ { ( λ Π ζ )} { ( s λ + Π ζ + )}] s R d 2λ d 2λ shift and scale theorems of Fourier theory: if f (x) F(s), then f [a(x b)] ( e 2πibs /a ) F(s/a) amplitude of diffracted field ã( θ ) = ( ) [ λ 1 R ( ) [ λ 1 = 2 R 4 π (d/λ)2 PSF = ã( θ ) 2 = 4 ] [ 2J 1 (π θ ] d/λ) ( ) e 2πi θ s/2λ + e 2πi θ s/2λ 4 π (d/λ)2 ( λ R π θ d/λ ] [ ] 2J1 ( u ) cos u s/d u ) 2 [ 1 4 π (d/λ)2 u = π θ d/λ ] 2 [ ] 2 2J1 ( u ) cos 2 u s/d u

Finite Apertures: PSF Interpretation from before ( ) PSF = ã( θ ) λ 2 [ ] 1 2 [ ] 2 2 = 4 R 4 π 2J1 ( u ) (d/λ)2 cos 2 u s/d u full constructive interference for θ s λ = n (= 0, ±1, ±2,...) θ = full destructive interference for nλ s cos φ θ s λ = (n + 1 2 ) (= ±1 2, ±3 2, ±5 2,...) θ = (n + 1 2 )λ s cos φ cos φ is angle between θ and baseline vector s

PSF Interpretation (continued) from before ( ) PSF = ã( θ ) λ 2 [ ] 1 2 [ ] 2 2 = 4 R 4 π 2J1 ( u ) (d/λ)2 cos 2 u s/d u first two terms give normalisation for θ = 0 other terms represent corrugated 2-d Airy brightness distribution, intensity-modulated along the direction of the baseline vector s with periodicity ( θ) s = λ/ s pattern of alternating bright and dark annuli separation determined by ( θ) d = 1.220λ/d, 2.233λ/d, 3.238λ/d,... superimposed by fringes orthogonal to direction of baseline vector s at distance ( θ) s = λ/ s

2-d Brightness Distribution PSF of single circular aperture PSF of two-element interferometer, aperture diameter d = 25 m, length of baseline vector s = 144 m double beam interference fringes showing modulation effect of diffraction by aperture of a single pinhole

Modulation Effect of Aperture typical one-dimensional cross-section along u y = 0 of the central part of the interferogram visibilities are equal to one, because I min = 0 γ 12 (τ) = 1 for all values of τ and any pair of spatial points, if and only if the radiation field is strictly monochromatic a non-zero radiation field for which γ 12 (τ) = 0 for all values of τ and any pair of spatial points cannot exist in free space

Van Cittert-Zernike Theorem Basic Approach relates brightness distribution of extended source and phase correlation between two points in radiation field extended source S incoherent, quasi-monochromatic positions P 1 and P 2 in observers plane Σ Ẽ 1 (t)ẽ 2 (t) = E{Ẽ1(t)Ẽ 2 (t)} = Γ 12 (0)

Basic Approach (continued) in observers plane Σ with subscripts 1 and 2 referring to positions P 1 and P 2 Ẽ 1 (t)ẽ 2 (t) = E{Ẽ1(t)Ẽ 2 (t)} = Γ 12 (0) if Ẽ1 and Ẽ2 are uncorrelated, then Γ 12 (0) = 0 ( ) full correlation: γ 12 = Γ 12 (0) = 1 I1 I 2 partial correlation: 0 < γ 12 (0) < 1 extended source is collection of non-coherent infinitesimal sources reduction in fringe contrast described by Visibility function V: V = I max I min I max + I min = γ 12 (0)

Overview without Equations relate γ 12 (0) to brightness distribution of extended source S source S is quasi-monochromatic, incoherent source in plane σ, intensity distribution I(y, z) observation plane Σ parallel to σ l is perpendicular to both planes (coincident with the X-axis) connecting center of extended source (y = 0, z = 0) to zero reference in Σ (Y = 0, Z = 0).

Overview without Equations (continued) two positions P 1, P 2 describe coherence γ 12 (0) in plane Σ infinitesimal radiation element ds in source at distances R 1 and R 2 from P 1 and P 2 assume S not a source but an aperture of identical size and shape assume that I(y, z) is not description of intensity distribution but its functional form corresponds to the field distribution across that aperture

Overview without Equations (continued) imagine a transparancy at aperture with amplitude transmission characteristics that correspond functionally to the irradiance distribution I(y, z) imagine that aperture is illuminated by spherical wave converging towards fixed point P 2 so that diffraction pattern is centered at P 2 this diffracted field distribution, normalised to unity at P 2, is everywhere (e.g. at P 1 ) equal to the value of γ 12 (0) at that point

Overview with Equations in limit R 1, R 2 much larger than source diameter and relevant part of Σ-plane, equivalent of Fraunhofer diffraction almost always satisfied for astronomical observations van Cittert-Zernike theorem Γ( r) = I( Ω) = λ 2 source Σ-plane I( Ω)e 2πi Ω. r λ dω Γ( r)e 2πi Ω. r λ d r I( Ω) is intensity distribution of extended source as function of unit direction vector Ω as seen from observation plane Σ Γ( r) is coherence function in Σ-plane center of extended source S is origin of Ω (coincident with central axis l), small angular extent of source: I( Ω) = I(θ y, θ z ) and d Ω = dθ y dθ z, where θ y, θ z two orthogonal angular coordinate axes across the source

Overview with Equations (continued) van Cittert-Zernike theorem Γ( r) = I( Ω) = λ 2 source Σ-plane I( Ω)e 2πi Ω. r λ dω Γ( r)e 2πi Ω. r λ d r vector r represents arbitrary baseline r(x, Y ) in plane with d r = dydz (e.g. P 1 P 2 = r P1 r P2 ) Γ( r) and I( Ω) are linked through Fourier transform, except for scaling with wavelength λ scaling might be perceived as "true" Fourier transform with conjugate variables Ω and r/λ, van Cittert-Zernike theorem as Fourier pair I( Ω) Γ( r/λ)

Overview with Equations (continued) van Cittert-Zernike theorem Γ( r) = I( Ω) = λ 2 source Σ-plane complex spatial degree of coherence γ( r) = I( Ω)e 2πi Ω. r λ dω Γ( r) Γ( r)e 2πi Ω. r λ d r source I( Ω)d Ω i.e. normalising by total source intensity extended source S is spatially incoherent, but partially correlated radiation field at e.g. positions P 1 and P 2 exists since all individual source elements contribute to a specific location P in Σ-plane

Derivation of Van Cittert-Zernike Theorem observation plane Σ contains baseline vector r(y, Z ) and is perpendicular to vector pointing at centre of radiation source angular coordinates θ y and θ z across the source correspond to linear coordinates of unit direction vector Ω(Ω X, Ω Y, Ω Z ), i.e. direction cosines of Ω relative to X, Y, Z coordinate system (Ω 2 X + Ω2 Y + Ω2 Z = 1).

Derivation of Van Cittert-Zernike Theorem (continued) spatial coherence of EM-field between two positions 1 and 2 is outcome of correlator producing } E {Ẽ1 (t)ẽ 2 (t) positions 1, 2 not point like, represent radio antennae or optical telescopes if I( Ω) = I 0 δ( Ω), i.e. a point source on the X-axis, the Van Cittert-Zernike relation yields Γ( r) = I 0 and γ( r) = 1: a plane wave simultaneously hits entire YZ -plane, full coherence is preserved

Derivation of Van Cittert-Zernike Theorem (continued) infinitesimal source element in direction Ω 0 = I 0 δ( Ω Ω 0 ) projection of Ω 0 on the Σ plane is Ω 0 (Ω Y, Ω Z ) difference in path length between positions 1 and 2 given by projection of r on Ω 0, i.e. r. Ω 0 = Ω Y Y + Ω Z Z therefore Ẽ 1 (t) = Ẽ0(t)e 2πiν 0 Ẽ 2 (t) = Ẽ0(t)e t+ Ω 0. r c 2πiν 0 t+ 2πi Ω 0. r λ = Ẽ0(t)e 2πiν 0t ««

Derivation of Van Cittert-Zernike Theorem (continued) Ẽ 1 (t) = Ẽ0(t)e 2πiν 0 Ẽ 2 (t) = Ẽ0(t)e t+ Ω 0. r c 2πiν 0 t+ 2πi Ω 0. r λ = Ẽ0(t)e 2πiν 0t ««} } E {Ẽ1 (t)ẽ 2 (t) = E { Ẽ0(t) 2 e 2πi Ω 0. r λ = I 0 ( Ω 0 )e 2πi Ω 0. r λ integration over full source extent (all source elements are spatially uncorrelated) Γ( r) = I 0 ( Ω)e 2πiΩ. r/λ dω γ( r) = source source I 0( Ω)e 2πi Ω. r/λ d Ω source I 0( Ω)d Ω

Derivation of Van Cittert-Zernike Theorem (continued) coherence Γ( r) = source I 0 ( Ω)e 2πi Ω. r/λ d Ω Γ( r) at a certain point represents a single Fourier component (with baseline r) of the intensity distribution of the source with strength Γ( r)d r short baseline (small r ) corresponds to low spatial frequency component in brightness distribution I(θ y, θ z ), i.e. coarse structure large values of r correspond to fine structure in I(θ y, θ z ) diffraction limited resolution in aperture synthesis is r max = L max = θ min = λ 2L max factor 2 in denominator of expression for θ min follows from rotation symmetry in aperture synthesis

Example: Uniform Slit coherence function γ 12 (0) for uniform slit source slit width b, running coordinate ξ, observation plane Σ, running coordinate y, located at large distance l from slit source (Fraunhofer limit)

Example: Uniform Slit (continued) ( source function is window function Π ξ b ( ) in angular equivalent Π β, with β β0 0 = b/l application of Van Cittert-Zernike theorem I( Ω) Γ( r/λ): ( ) ( ) ( ) β yβ0 yb Π β 0 sinc = β 0 sinc λ λl β 0 sinc(x) = ( ) sin πx πx )

Example: Uniform Slit (continued) from Van Cittert-Zernike theorem I( Ω) Γ( r/λ): ( ) ( ) ( ) β yβ0 yb Π β 0 sinc = β 0 sinc λ λl β 0 modulus of normalised complex coherence function β 0 sinc yb λl γ(y) = β 0 = sincyb λl = V Visibility enlarging b with a factor shrinks coherence function by same factor if brightness structure of radiation source covers wide range of angular scales from down to δ, spatial coherence function shows finest detail of λ/ over maximum extent of λ/δ