Design Objective 108-57912 01-Jun-2012 Rev A MINI USB CONNECTOR, RECEPTACLE, VERTICAL, DIP, B TYPE 1. SCOPE 1.1. Contents This specification covers the performance, tests and quality requirements for the TE Connectivity MINI USB CONNECTOR, RECEPTACLE, VERTICAL, DIP, B TYPE 1.2. Qualification When tests are performed on the subject product line, the procedures specified in Figure 1 shall be used. All inspections shall be performed using the applicable inspection plan and product drawing. 2. APPLICABLE DOCUMENT The following documents form a part of this specification to the extent specified herein. In the event of conflict between the requirements of this specification and the product drawing, the product drawing shall take precedence. In the event of conflict between the requirements of this specification and the referenced documents, this specification shall take precedence. 2.1. TE Connectivity Documents 109-1: General Requirements for Test Specifications 109-197:Test Specification(TE Test Specifications vs EIA and IEC Test Methods) 501-118035:Test Report 2.2. Industry Standard EIA-364:Electrical Connector/Socket Test Procedures Including Environmental Classifications. 3. REQUIREMENTS 3.1. Design and Construction Product shall be of the design, construction and physical dimensions specified on the applicable product drawing. 3.2. Materials Materials used in the construction of product shall be as specified on the applicable product drawing. 3.3. Ratings A. Voltage:30 VAC rms. B. Current:1 A Max. C. Temperature:-40 C to +85 C 3.4. Performance and Test description The product is designed to meet the electrical, mechanical and environmental performance requirements specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental conditions per EIA-364. DR DATE APVD DATE Justin Chen 01-Jun-2012 William Kodama 01-Jun-2012 2007 Tyco Electronics Corporation Taipei, Taiwan All International Rights Reserved. * Trademark Indicates change For latest revision, visit our website at www.tycoelectronics.com\documents. For Regional Customer Service, visit our website at www.tycoelectronics.com 1 of 5 LOC DW
3.5. Test Requirements and Procedures Summary TEST ITEM REQUIREMENT PROCEDURE Meets requirements of product 1 Examination of Product Visual inspection. drawing. No physical damage. ELECTRICAL REQUIREMENT 2 Contact Resistance 3 Dielectric withstanding Voltage 4 Insulation Resistance 50 mohm Max.(Initial) 50 mohm Max.(Final) No creeping discharge or flashover shall occur. Current leakage: 0.5 ma Max. 100 MOhm Min.(Initial) 100 MOhm Min.(Final) Subject mated contacts assembled in housing to 20mV Max open circuit at 100mA Max. EIA-364-23B. Refer to Fig.3 100 VAC for 1minute connector. EIA-364-20B Impressed voltage 500 VDC. connector. EIA-364-21C. EIA 364-70 Method B When measured at an ambient temperature of 5 Contact Current Rating 1.0A at 250VAC Min. 25. With Power applied to the contacts, the ΔT shall not exceed + 30 at any point in the USB connector under test 6 Contact Capacitance 2pF Maximum per Contact connector at 1 KHz. The object of this test is to detail a standard method to determine the capacitance between conductive elements of a USB connector. MECHANICAL REQUIREMENT 7 Mating Force 35N (3.57 kgf) Max. 8 Unmating Force 9 Durability See Note 10 Vibration 11 Mechanical Shock 7N (0.71 kgf) Min. (Initial) 3N (0.31 kgf) Min. (Final) No electrical discontinuity greater than 1μsec shall occur. See Note 1. No electrical discontinuity greater than 1μsec shall occur. See Note 1. Operation Speed:12.5 mm/min. Measure the force required to mate connector. EIA-364-13B Operation Speed:12.5 mm/min. Measure the force required to unmate connector. EIA-364-13B Operation Speed:200 cycle per hour. Durability Cycles:5,000 Cycles EIA-364-9C Subject mated connectors to 10-55-10Hz traversed in 1minutes at 1.52mm amplitude 2 Hours each of 3 mutually perpendicular planes. EIA-364-28D Accelerate Velocity:490m/s 2 (50G) Waveform:Half-sine shock plus Duration:11msec. No. of Drops:3 drops each to normal and reversed directions of X, Y and Z axes, totally 18 drops. EIA-364-27B 12 Contact Retention Force 3.9N (0.4 kgf) Min. Shall be measured with tension gauge or tension tester in same direction. Figure 1(Cont.) Rev A 2 of 5
ENVIRONMENTAL REQUIREMENTS TEST ITEM REQUIREMENT PROCEDURE 13 Solder ability 14 Resistance to Reflow Soldering Heat [See Note 2] 15 Thermal Shock See Note 1 16 Humidity-Temperature Cycle Temperature Life 17 (Heat Aging) The inspected area of each lead must have 95% solder coverage minimum. No physical damage shall occur. (Lead-Free) See Note 1 See Note 1 Steam Aging Preconditioning: 1. Intended for nontin and nontin-alloy leadfinishes for 93+3/-5 1hrs. 2. Intended for tin and tin-alloy leadfinishes for 93+3/-5 48hrs. <JESD22-B102D, Condition C> Solder pot temperature: 245±5, 5sec. Pre-soak condition, 85 /85%RH for 168 hours. Pre Heat:150~180, 90±30sec. Heat:230 Min., 30±10sec. Peak Temp.:260+0/-5, 20~40sec. Duration:3 cycles Test spec. 109-201, Condition B, Fig 4. Mated Connector -55+/-3 (30 min.), +85+/ -2 (30 min.) Perform this cycle, repeat 5 cycles EIA-364-32C Mated Connector 25~65, 90~95% RH, 7 Cycles, EIA-364-31B. Mated Connector 85, 250 hours, EIA-364-17B. Subject mated connectors to 35+/-2 and No detrimental corrosion allowed 5+/-1% salt condition for 48hours. After test, 18 Salt Spray in contact area and base metal rinse the sample with water and recondition the exposed. room temperature for 1 hour. EIA-364-26B. Figure 1(End) Note 1:Shall meet visual requirements, show no physical damage, and meet requirement of additional tests as specified in the test sequence in Figures 2 Note 2:Resistance to soldering process is indicated on notes of customer drawing. Select the appropriate test type which drawing notes are matched with. Rev A 3 of 5
3.6. Product Qualification and Requalification test Test Group Test or Examination A B C D E F G H Test Sequence(a) Examination of Product 1, 11 1, 5 1, 9 1, 3 1, 3 1, 3 1, 5 1, 3 Contact Resistance 3, 9 2, 4 2, 4 Dielectric withstanding Voltage 4, 8 Insulation Resistance 3, 7 Contact Current Rating 2 Contact Capacitance 2 Mating Force 2, 8 Unmating Force 4, 10 Durability 5 Vibration 6 Mechanical Shock 7 Contact Retention Force 2 Solder ability 2 Resistance to Soldering Heat 2 Thermal Shock 5 Humidity Temperature Cycling 6 Temperature Life 3 Salt Spray 3 NOTE:(a)Numbers indicate sequence in which tests are performed. (b)discontinuities shall not take place in this test group, during tests. Figure 2 Rev A 4 of 5
Figure 3 Contact Resistance Measuring Points Figure 4 Temperature profile of reflow soldering Rev A 5 of 5