Copper Wire for Wire-Bonded BGA and Leadframe QFP Packages Qualification Report. RPT156 (v1.1) December 9, 2013

Transcription

1 Copper Wire for Wire-Bonded BGA and Leadframe QFP Packages Qualification Report

2 The information disclosed to you hereunder (the Materials ) is provided solely for the selection and use of Xilinx products. To the maximum extent permitted by applicable law: (1) Materials are made available AS IS and with all faults, Xilinx hereby DISCLAIMS ALL WARRANTIES AND CONDITIONS, EXPRESS, IMPLIED, OR STATUTORY, INCLUDING BUT NOT LIMITED TO WARRANTIES OF MERCHANTABILITY, NON-INFRINGEMENT, OR FITNESS FOR ANY PARTICULAR PURPOSE; and (2) Xilinx shall not be liable (whether in contract or tort, including negligence, or under any other theory of liability) for any loss or damage of any kind or nature related to, arising under, or in connection with, the Materials (including your use of the Materials), including for any direct, indirect, special, incidental, or consequential loss or damage (including loss of data, profits, goodwill, or any type of loss or damage suffered as a result of any action brought by a third party) even if such damage or loss was reasonably foreseeable or Xilinx had been advised of the possibility of the same. Xilinx assumes no obligation to correct any errors contained in the Materials, or to advise you of any corrections or update. You may not reproduce, modify, distribute, or publicly display the Materials without prior written consent. Certain products are subject to the terms and conditions of the Limited Warranties which can be viewed at IP cores may be subject to warranty and support terms contained in a license issued to you by Xilinx. Xilinx products are not designed or intended to be fail-safe or for use in any application requiring fail-safe performance; you assume sole risk and liability for use of Xilinx products in Critical Applications: Copyright Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Revision History The following table shows the revision history for this document. Date Version Revision 08/12/ Initial Xilinx release. Associated with XCN /09/ Associated with XCN Added test results for XC3SD3400A devices in Table 1, page 6 and Table 2, page 7, page 8, and page 9 for TC-B, uhast, and HTS. Copper Wire for Wire-Bonded Packages

3 Table of Contents Revision History Copper Wire for Wire-Bonded BGA and Leadframe QFP Packages Overview Qualification Objectives Package Qualification Plan Reliability and Results Qualification Data and Results for Assembly Supplier in Taiwan Qualification Data and Results for Assembly Supplier in Korea Copper Wire for Wire-Bonded Packages 3

4 4 Copper Wire for Wire-Bonded Packages

5 Copper Wire for Wire-Bonded BGA and Leadframe QFP Packages Overview This qualification report summarizes the results of the reliability stress tests that were performed to qualify the copper wire used by wire-bonded BGA and leadframe QFP packages. Qualification Objectives Package Qualification Plan The objective of the reliability stress testing summarized in this document is to qualify the use of copper wire in wire-bonded BGA and leadframe QFP packages assembled by Xilinx-approved assembly suppliers in Taiwan and Korea. Specific reliability stress tests for qualification were run on selected qualification vehicles based on package type, package size, pin count, assembly site, and other known reliability risk factors. Reliability and Results Table 1 summarizes the results and test conditions for the reliability stress tests performed on the qualification vehicles. Based on the data gathered, copper wire demonstrates performance meeting the qualification requirements for use in wire-bonded BGA packages and leadframe QFP packages and is released for production use. Copper Wire for Wire-Bonded Packages 5

6 Reliability and Results Table 1: Summary of Reliability and Results Vehicle- Package Type Cumulative Device-Hours/Cycle Number of Failures TC-B (1) -55 C/+125 C XC3S1200E-FTG ,000 0 XC3S1400A-FGG ,000 0 XC3S1400A-FTG ,000 0 XC3S1500-FGG ,000 0 XC3S1600E-FGG ,000 0 XC3S1600E-FGG ,000 0 XC3S400-PQG ,000 0 XC3S5000-FGG ,000 0 XC3S500E-CPG ,000 0 XC3SD3400A-FGG ,000 0 XC3SD3400A-CSG ,000 0 THB (1) XC3S1400A-FGG , C, 85% RH, Bias V CCMAX XC3S250E-VQG ,000 0 HAST (1) XC3S1400A-FTG , C, 85% RH, Bias V CCMAX XC3S1500-FGG ,800 0 XC3S1200E-FTG ,800 0 XC3S1400A-FGG ,536 0 XC3S1400A-FTG ,800 0 uhast (1) 110 C, 85% RH XC3S1500-FGG ,800 0 XC3S1600E-FGG ,800 0 XC3S250E-VQG ,800 0 XC3S400-PQG ,800 0 XC3SD3400A-FGG ,800 0 XC3S1200E-FTG ,000 0 XC3S1400A-FGG ,000 0 XC3S1400A-FTG ,000 0 HTS 150 C XC3S1600E-FGG ,000 0 XC3S250E-VQG ,000 0 XC3S400-PQG ,000 0 XC3SD3400A-FGG ,000 0 Notes: 1. Package level-3 preconditioning using Pb-free reflow temperature was performed prior to TC-B, THB, HAST, and uhast tests. 6 Copper Wire for Wire-Bonded Packages

7 Reliability and Results Qualification Data and Results for Assembly Supplier in Taiwan Table 2: Qualification Data Number Device Package Sample Duration Failure TC-B (1) -55 C/+125 C XC3S400 PQG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S400 PQG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S400 PQG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S5000 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S5000 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S5000 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1200E FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1200E FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1200E FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S500E CPG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S500E CPG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S500E CPG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A CSG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A CSG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3SD3400A CSG ,000 cycles 0 THB (1) 85 C, 85% RH, Bias V CCMAX XC3S250E VQG ,000 hours 0 Copper Wire for Wire-Bonded Packages 7

8 Reliability and Results Table 2: Qualification Data (Cont d) Number Device Package Sample Duration Failure THB (1) 85 C, 85% RH, Bias V CCMAX XC3S250E VQG ,000 hours 0 THB (1) 85 C, 85% RH, Bias V CCMAX XC3S250E VQG ,000 hours 0 THB (1) 85 C, 85% RH, Bias V CCMAX XC3S1400A FGG ,000 hours 0 THB (1) 85 C, 85% RH, Bias V CCMAX XC3S1400A FGG ,000 hours 0 THB (1) 85 C, 85% RH, Bias V CCMAX XC3S1400A FGG ,000 hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 uhast (1) 110 C, 85% RH XC3S400 PQG hours 0 uhast (1) 110 C, 85% RH XC3S400 PQG hours 0 uhast (1) 110 C, 85% RH XC3S400 PQG hours 0 uhast (1) 110 C, 85% RH XC3S250E VQG hours 0 uhast (1) 110 C, 85% RH XC3S250E VQG hours 0 uhast (1) 110 C, 85% RH XC3S250E VQG hours 0 uhast (1) 110 C, 85% RH XC3S1400A FGG hours 0 uhast (1) 110 C, 85% RH XC3S1400A FGG hours 0 uhast (1) 110 C, 85% RH XC3S1400A FGG hours 0 uhast (1) 110 C, 85% RH XC3S1200E FTG hours 0 uhast (1) 110 C, 85% RH XC3S1200E FTG hours 0 uhast (1) 110 C, 85% RH XC3S1200E FTG hours 0 uhast (1) 110 C, 85% RH XC3SD3400A FGG hours 0 uhast (1) 110 C, 85% RH XC3SD3400A FGG hours 0 uhast (1) 110 C, 85% RH XC3SD3400A FGG hours 0 HTS 150 C XC3S400 PQG ,000 hours 0 HTS 150 C XC3S400 PQG ,000 hours 0 HTS 150 C XC3S400 PQG ,000 hours 0 HTS 150 C XC3S250E VQG ,000 hours 0 HTS 150 C XC3S250E VQG ,000 hours 0 HTS 150 C XC3S250E VQG ,000 hours 0 HTS 150 C XC3S1400A FGG ,000 hours 0 HTS 150 C XC3S1400A FGG ,000 hours 0 HTS 150 C XC3S1400A FGG ,000 hours Copper Wire for Wire-Bonded Packages

9 Reliability and Results Table 2: Qualification Data (Cont d) Number Device Package Sample Duration Failure HTS 150 C XC3S1200E FTG ,000 hours 0 HTS 150 C XC3S1200E FTG ,000 hours 0 HTS 150 C XC3S1200E FTG ,000 hours 0 HTS 150 C XC3SD3400A FGG ,000 hours 0 HTS 150 C XC3SD3400A FGG ,000 hours 0 HTS 150 C XC3SD3400A FGG ,000 hours 0 Notes: 1. Package level-3 preconditioning using Pb-free reflow temperature was performed prior to TC-B, THB, HAST, and uhast tests. Qualification Data and Results for Assembly Supplier in Korea Table 3: Qualification Data Number Device Package Sample Duration Failure TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1400A FTG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1500 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1500 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1500 FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 TC-B (1) -55 C/+125 C XC3S1600E FGG ,000 cycles 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1400A FTG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1500 FGG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1500 FGG hours 0 HAST (1) 110 C, 85% RH, Bias V CCMAX XC3S1500 FGG hours 0 uhast (1) 110 C, 85% RH XC3S1400A FTG hours 0 uhast (1) 110 C, 85% RH XC3S1400A FTG hours 0 Copper Wire for Wire-Bonded Packages 9

10 Reliability and Results Table 3: Qualification Data (Cont d) Number Device Package Sample Duration Failure uhast (1) 110 C, 85% RH XC3S1400A FTG hours 0 uhast (1) 110 C, 85% RH XC3S1500 FGG hours 0 uhast (1) 110 C, 85% RH XC3S1500 FGG hours 0 uhast (1) 110 C, 85% RH XC3S1500 FGG hours 0 uhast (1) 110 C, 85% RH XC3S1600E FGG hours 0 uhast (1) 110 C, 85% RH XC3S1600E FGG hours 0 uhast (1) 110 C, 85% RH XC3S1600E FGG hours 0 HTS 150 C XC3S1400A FGG ,000 hours 0 HTS 150 C XC3S1400A FGG ,000 hours 0 HTS 150 C XC3S1400A FGG ,000 hours 0 HTS 150 C XC3S1400A FTG ,000 hours 0 HTS 150 C XC3S1400A FTG ,000 hours 0 HTS 150 C XC3S1400A FTG ,000 hours 0 HTS 150 C XC3S1600E FGG ,000 hours 0 HTS 150 C XC3S1600E FGG ,000 hours 0 HTS 150 C XC3S1600E FGG ,000 hours 0 Notes: 1. Package level-3 preconditioning using Pb-free reflow temperature was performed prior to TC-B, THB, HAST, and uhast tests Copper Wire for Wire-Bonded Packages