arxiv:cond-mat/ v1 [cond-mat.stat-mech] 28 Mar 2000

Size: px
Start display at page:

Download "arxiv:cond-mat/ v1 [cond-mat.stat-mech] 28 Mar 2000"

Transcription

1 arxiv:cond-mat/ v1 [cond-mat.stat-mech] 28 Mar 2000 High Field Mobility and Diffusivity of Electron Gas in Silicon Devices S. F. Liotta 1 and A. Majorana 2 Dipartimento di Matematica - University of Catania - Viale A. Doria 6, Italy Abstract. In this paper the Boltzmann equation describing the carrier transport in a semiconductor is considered. A modified Chapman-Enskog method is used, in order to find approximate solutions in the weakly non-homogeneous case. These solutions allow to calculate the mobility and diffusion coefficients as function of the electric field. The integral-differential equations derived by the above method are numerically solved by means of a combination of spherical harmonics functions and finite-difference operators. The Kane model for the electron band structure is assumed; the parabolic band approximation is obtained as a particular case. The numerical values for mobility and diffusivity in a silicon device are compared with the experimental data. The Einstein relation is also shown. Keywords: Boltzmann equation; Silicon devices; Mobility; Diffusivity 1. Introduction Many commercial simulators of microelectronic devices are based on the well-known Drift-Diffusion equations. In this model the electron current density J n is given by the equation [2], [3] (1) J n = µ n ρe + D n x ρ, where ρ is the electron density, E the electric field, µ n and D n the mobility and the diffusion coefficient, or diffusivity, respectively. The symbol x denotes the gradient operator with respect to x. For low electric field the two transport coefficients µ n 1 liotta@dipmat.unict.it 2 majorana@dipmat.unict.it 1

2 and D n are related by the well-known Einstein relation ( ) kb T L (2) D n = µ n e where k B is the Boltzmann constant, T L the lattice temperature and e the absolute value of the electron charge. The transport coefficients µ n and D n are often assumed constant. This approximation becomes inadequate in presence of high electric fields. In these cases Eq. (1) remains valid only if the transport coefficients are considered as functions of the electric field. Many expression for these functions were proposed (see, for instance, Refs. [3], [8], [11]). They were obtained by fitting experimental data or Monte Carlo simulations [4], [12]. In this paper we obtain the functions µ n (E) and D n (E) directly from the Boltzmann transport equation. The paper is organised as follows. In Sec. 2 we briefly introduce the Boltzmann transport equation for an electron gas in a semiconductor. Only electron-phonon scatterings are considered. So that, electron-electron and electron-impurity interactions are assumed negligible. In Sec. 3 we perform a Chapman-Enskog expansion, and in Sec. 4 a numerical scheme is proposed in order to solve the obtained equations. In the last section we show numerical results for µ n and D n, which we compare with experimental data. Further, we analyze the validity of the Einstein relation for different values of the electric field. 2. Basic equations For an electron gas in a semiconductor device the coupled system Boltzmann-Poisson equations [2] writes (3) (4) F t + v(k) xf ē h E kf = Q(F), x E = e ( ) N D (x) N A (x) F dk ǫ where the unknown function F(t,x,k) represents the probability of finding an electron at the position x, with wave-vector k, at time t. The wave-vector k belongs 2

3 to R 3. The integrals with respect to k are performed over the whole space and the parameter h is the Planck constant divided by 2π. The group velocity v(k) depends on the band structure and it will be defined in the following. The symbol k denotes the gradient with respect to the variables k. The functions N A, N D are the concentration of acceptors and donors and ǫ is the dielectric constant. Here we assume that the low-density approximation holds, so that Q is a linear operator. If K(k,k ) is the symmetric scattering kernel, then (5) Q(F)(t,x,k) = K(k,k )F(t,x,k ) dk F(t,x,k) K(k,k) dk. We consider the scattering kernels describing acoustic phonon interactions (in the elastic approximation) K ac (k,k) = G K 0 δ(ε(k ) ε(k)), and non-polar optical phonon interactions ( ) nq + 1 K op (k,k) = G Kδ(ε(k ) ε(k) ± hω). n q Here, K 0 and K are constant and the overlap factor G for the conduction band is taken equal to 1 (see [4], [10]). We consider negligible the ionized impurity scattering; i.e. we assume low density of doping. With these assumptions, the collision operator esplicitelly writes (6) Q(f)(t,x,k) = (n q + 1) + n q + Kδ(ε(k ) ε(k) hω)f(t,x,k ) dk Kδ(ε(k ) ε(k) + hω)f(t,x,k )dk K 0 δ(ε(k ) ε(k))f(t,x,k )dk ν(k)f(t,x,k), where (7) ν(k) = n q Kδ(ε(k ) ε(k) hω)dk + (n q + 1) Kδ(ε(k ) ε(k) + hω)dk + K 0 δ(ε(k ) ε(k))dk. 3

4 For every admissible function F(t,x,k), we have [7] Q(F)dk = 0, which implies mass conservation. The band structure is assumed to be spherically symmetric. Hence, the electron energy ε is given by the equation (8) γ(ε) = h2 2m k2, where m is the reduced electron mass. We choose the Kane formula (9) γ(ε) = ε(1 + αε), which is simple but sufficiently accurate to describe high field regime. By putting α = 0 one obtain the usual parabolic band approximation. The velocity v(k) is explicity given by (10) v(k) := 1 h kε(k) = hk m (2αε + 1). 3. The Chapman-Enskog expansion The Chapman-Enskog method [5] allows us to find approximate solutions of the Boltzmann equation. They are valid only for a very small space domains. Moreover, these regions must be far enough from boundary layers. Nevertheless, these solutions have a great importance since they allow to obtain the transport coefficients. In the framework of electron transport in semiconductors, we expect that such solutions are valid in spatial domain, where the electric field and the doping are almost constant. Therefore, they should not furnish good results near junctions or boundaries. We follow the standard scheme [5], assuming that the solution of Eq. (3) is approximately expressible by the following relation (11) F(t,x,k) f(t,x,k) + δf(t,x,k). 4

5 As usually, the typical Chapman-Enskog constrain (12) δf(t,x,k)dk = 0 is imposed. Therefore using Eqs. (11)-(12) we obtain that the electron density is ρ(t,x) := F(t,x,k)dk f(t,x,k)dk. We assume that time and space partial derivatives of f are of the same order of δf and that the corresponding derivatives of δf are negligible. By inserting Eq. (11) into Eq. (3) and splitting terms of different orders, we obtain the following equations (13) (14) ē h E kf = Q(f), f t + v(k) xf ē h E kδf = Q(δf). In this approximation, the Poisson equation becomes (15) x E e ǫ ( N D N A ) f dk. In order to solve Eqs. (13)-(14) we assume that E is constant. This is a reasonable assumption, if the difference between the density of electrons and doping is negligible in the small domains, where we consider the Boltzmann equation. Of course, we solve before Eq. (13) and then the next one. Since Eq. (13) is linear and it does not depend explicitly on the variables (t,x), a solution can be written as (16) f(t,x,k) = ρ(t,x)g(k). We note that the function g(k) is also the stationary homogeneous solution of Eq. (3) for constant electric field, verifying the condition (17) g(k)dk = 1. Now, we consider Eq. (14). Using (16), it becomes [ ] ρ (18) g(k) t + v(k) xρ ē h E kδf = Q(δf). 5

6 By integrating Eq. (18) with respect to k, we find a compatibility condition, as usually arises in integral equations. Assuming the reasonable hypotesis k δfdk = 0, we obtain (19) where (20) ρ t + V xρ = 0, V := g(k)v(k) dk is the constant macroscopic electron velocity in the stationary homogeneous case. This vector is parallel to E (see appendix A). By eliminating the time derivative of ρ in Eq. (18) by using Eq. (19), we get (21) g(k) [v(k) V] x ρ ē h E kδf = Q(δf). The form of Eq. (21) suggest us to assume (22) δf(t,x,k) = x ρ(t,x) h(k). Now, Eq. (12) implies that (23) h(k)dk = 0. We denote by u the unit vector in the direction of x ρ; i.e. x ρ = x ρ u. It in general may depend on the variables (t,x). Using Eq. (22), it is easy to see that Eq. (21) becomes (24) g(k) [v(k) u V u] ē h E kh = Q(h). The case u parallel to E is the most meaningfull. 4. Approximate equations In order to obtain f and δf we have to solve the following set of equations for the unknowns g and h (25) ē h E kg = Q(g), 6

7 (26) (27) g(k) [ v(k) cosθ V ] ē h E kh = Q(h), g(k)dk = 1, h(k)dk = 0. Here θ is the angle between v(k) and u, and V = V. Since g and h are functions of the 3-dimensional variable k, we use a spherical harmonics expansion to reduce the dimension of the space of the indipendent variables. Taking in account the symmetries of the problem and considering only the first two terms of the expansion, we can choose (28) (29) g(k) g 0 (ε) + g 1 (ε) cosθ, h(k) h 0 (ε) + h 1 (ε) cosθ. The use of the Galerkin method allows to derive from Eqs. (25)-(26) a set of equations for g 0, g 1, h 0 and h 1. This approach recalls the well-known method of the spherical harmonics expansion to solve the Boltzmann-Poisson system, [6], [9], [13]. Since Eqs. (25)-(26) contain the same diffusion and collisions terms of the Boltzmann Equation, many calculations are performed following Ref. [9]. Then, the system (25)-(26) gives the following set of ordinary differential-difference equations (30) (31) (32) (33) ee ( γ ) (ε) 3 γ(ε) g 1 + g 1 v(ε) = Q 1(g 0 ) eeg 0 1 v(ε) = Q 2(g 1 ) V g 0 (ε) 3 v(ε) + g 1(ε) ee ( γ ) (ε) 3 γ(ε) h 1 + h 1 v(ε) = Q 1(h 0 ) V g 1 (ε) 1 v(ε) + g 0(ε) eeh 0 = 1 v(ε) = Q 2(h 1 ), where the prime indicates the derivative with respect to ε, v(ε) := 2 γ(ε) m γ (ε), 7

8 and Q 1 (ϕ) =(n q + 1)K σ(ε + hω)ϕ(ε + hω) + n q K σ(ε hω)ϕ(ε hω) (34) (35) [n q K σ(ε + hω) + (n q + 1)K σ(ε hω)]ϕ(ε), Q 2 (ϕ) = [n q K σ(ε + hω) + (n q + 1)K σ(ε hω) + K 0 σ(ε)]ϕ(ε). The density of states σ(u) is given by σ(u) := δ(ε(k) u) dk = 4 2π ( m h ) 3 H(u) γ(u)γ (u), where H(u) is the Heaviside step function. 5. Physical model and numerical results We use the following values for the parameters, appropriate for a silicon device: m = 0.32 m e T L = 300 K hω = ev K = (D tk) 2 8π 2 ρω K 0 = D t K = 11.4 ev A 1 ρ = 2330 Kg m 3 k BT L 4π 2 hv 2 0ρ Ξ2 d Ξ d = 9 ev v 0 = 9040 m sec 1. α = 0.5 ev 1 In the table, m e is the electron rest mass. We have solved numerically Eqs. (30)- (33) with the conditions (27) for different values of the electric field. The numerical procedures are similar to that used in Ref. [6]. The kinetic definition of the current density is (36) J n := F(t,x,k)v(k)dk ρ(t,x)v + x ρ(t,x) h(k)v(k) dk. Since V = V u and h(k)v(k) dk [h 0 (ε) + h 1 (ε) cosθ]v(k) dk (37) = h 1 (ε) v(k) u v(k) v(k) dk = u (v(k) u)2 h 1 (ε) dk, v(k) 8

9 a comparison between Eqs. (36)-(37) and (1) gives (38) µ n = V E and D n = (v(k) u)2 h 1 (ε) dk. v(k) They are functions of E, because V and h 1 depend on this parameter. In fig. 1 we show the mobility µ n against the electric field. The values are compared with two curves which fit experimental data by means of simply formulas (see [11], pp ). For low values of the electric field there is a small difference. It is meaningless because many different values (up to 20 % ) of low field mobility are reported in literature (see [11], pp ). In fig. 2 the value of diffusivity is shown together with experimental data (see [1], p. 6715). The agreement is very good for all range of E. Fig. 3 and fig. 4 compare the mobility and the diffusivity using Kane model and the parabolic band approximation. The last figure shows that Einstein relation is valid only for moderate fields. Acknowledgments We acknowledge partial support from Italian Consiglio Nazionale delle Ricerche (Prog. N PS01) and TMR project n. ERBFMRCT Asymptotic Methods in Kinetic Theory. Appendix A The unknown g must satisfy Eq. (25), which contains only two vectors, k and E. Since g is a scalar function, the only possibility is that g depends on k only throught the scalars k and k E i.e. g = g( k, k E). Therefore, from Eq. (20) we have V := g(k)v(k) dk = hk g( k,k E) m (2αε + 1) dk. Hence, it is evident that V is parallel to E. 9

10 References [1] Brunetti R., Jacoboni C., Nava F., reggiani L., Bosman G. and Zijlstra R.J.J., Diffusion Coefficient of Electrons in Silicon, J. Appl. Phys 1981; 52: [2] Ferry D. K., Semiconductors, New York, Macmillan Publ. Comp., [3] Hänsch W., The Drift-Diffusion Equation and its Applications in MOSFET Modelling, New York, Springer-Verlag, [4] Jacoboni C. and Lugli P., The Monte Carlo Method for Semiconductor Device Simulation, New York, Springer-Verlag, [5] Lifshitz E.M. and Pitaevskij L.P., Physical Kinetics, vol. 10, in the Landau & Lifshitz course of theoretical physics, Oxford, Pergamon press, [6] Liotta S. F. and Majorana A., A Novel Approach to Spherical-Harmonics Expansion for Electron Transport in Semiconductors,, Preprint Univ. of Catania, [7] Majorana A., Trend to Equilibrium of Electron Gas in a Semiconductor According to the Boltzmann Equation, Transport Theory Statist. Phys. 1998; 27: [8] Markowich P. A., Ringhofer C. and Schmeiser C., Semiconductor Equations, New York, Springer-Verlag, [9] Rahmat K., White J. and Antoniadis D. A., Simulation of Semiconductor Devices Using a Galerkin/Spherical Harmonic Expansion Approach to Solving the Coupled Poisson-Boltzmann System, IEEE Trans. Computer-Aided Design 1996; 15: [10] Reggiani S., Vecchi M. C. and Rudan M., Investigation on Electron and Hole Transport Properties Using the Full-Band Spherical-Harmonics Expansion Method, IEEE Trans. on Electron Devices 1998; 45: [11] Selberherr S., Analysis and Simulation of Semiconductors Devices, Wien-New York, Springer-Verlag, [12] Tomizawa K., Numerical Simulation of Sub Micron Semiconductor Device, Boston, Artech House, [13] Ventura D., Gnudi A. and Baccarani G., A Deterministic Approach to Solution of the BTE in Semiconductors, Rivista del Nuovo Cimento 1995; 18:

11 mobility (cm 2 /Vs) Electric Field (V/cm) Figure 1: Mobility as a function of electric field: dots indicates values obtained using Kane band model, solid line a fit with parameters of Canali et. al. and dashed line another fit with parameters of Caughey and Thomas (see Ref. [11]). 11

12 10 2 D n (cm 2 /sec) Electric Field (V/cm) Figure 2: Diffusivity as a function of electric field: solid line indicates values calculated using Kane band model and squares and circles experimental data (see Ref. [1]). 12

13 mobility (cm 2 /Vs) Electric Field (V/cm) Figure 3: Mobility versus electric field: Kane band model (solid line) and parabolic band approximation (dashed line). 13

14 10 2 D n (cm 2 /sec) Electric Field (V/cm) Figure 4: Diffusivity versus electric field: Kane band model (solid line) and parabolic band approximation (dashed line). 14

15 D n (cm 2 /sec) Electric Field (V/cm) Figure 5: Comparison between diffusivity calculated directly (dashed line) and using Einstein relation (solid line), both with Kane band model. 15

Finite Difference Scheme for Semiconductor Boltzmann Equation with Nonlinear Collision Operator

Finite Difference Scheme for Semiconductor Boltzmann Equation with Nonlinear Collision Operator Applied Mathematical Sciences, Vol. 7, 2013, no. 15, 735-750 Finite Difference Scheme for Semiconductor Boltzmann Equation with Nonlinear Collision Operator C. L. R. Milazzo Kore University of Enna Faculty

More information

A BGK model for charge transport in graphene. Armando Majorana Department of Mathematics and Computer Science, University of Catania, Italy

A BGK model for charge transport in graphene. Armando Majorana Department of Mathematics and Computer Science, University of Catania, Italy A BGK model for charge transport in graphene Armando Majorana Department of Mathematics and Computer Science, University of Catania, Italy December 6, 28 arxiv:82.862v math-ph 5 Dec 28 Abstract The Boltzmann

More information

Detectors of the Cryogenic Dark Matter Search: Charge Transport and Phonon Emission in Ge 100 Crystals at 40 mk

Detectors of the Cryogenic Dark Matter Search: Charge Transport and Phonon Emission in Ge 100 Crystals at 40 mk J Low Temp Phys (2008) 151: 443 447 DOI 10.1007/s10909-007-9666-5 Detectors of the Cryogenic Dark Matter Search: Charge Transport and Phonon Emission in Ge 100 Crystals at 40 mk K.M. Sundqvist B. Sadoulet

More information

NUMERICAL CALCULATION OF THE ELECTRON MOBILITY IN GaAs SEMICONDUCTOR UNDER WEAK ELECTRIC FIELD APPLICATION

NUMERICAL CALCULATION OF THE ELECTRON MOBILITY IN GaAs SEMICONDUCTOR UNDER WEAK ELECTRIC FIELD APPLICATION International Journal of Science, Environment and Technology, Vol. 1, No 2, 80-87, 2012 NUMERICAL CALCULATION OF THE ELECTRON MOBILITY IN GaAs SEMICONDUCTOR UNDER WEAK ELECTRIC FIELD APPLICATION H. Arabshahi,

More information

Two Dimensional MESFET Simulation

Two Dimensional MESFET Simulation VLSI DESIGN 2001, Vol. 13, Nos. 1-4, pp. 355-361 Reprints available directly from the publisher Photocopying permitted by license only (C) 2001 OPA (Overseas Publishers Association) N.V. Published by license

More information

2D Simulation of a Silicon MESFET with a Nonparabolic Hydrodynamical Model Based on the Maximum Entropy Principle

2D Simulation of a Silicon MESFET with a Nonparabolic Hydrodynamical Model Based on the Maximum Entropy Principle Journal of Computational Physics 176, 7 9 () doi:1.16/jcph.1.6968, available online at http://www.idealibrary.com on D Simulation of a Silicon MESFET with a Nonparabolic Hydrodynamical Model Based on the

More information

A Zero Field Monte Carlo Algorithm Accounting for the Pauli Exclusion Principle

A Zero Field Monte Carlo Algorithm Accounting for the Pauli Exclusion Principle A Zero Field Monte Carlo Algorithm Accounting for the Pauli Exclusion Principle Sergey Smirnov, Hans Kosina, Mihail Nedjalkov, and Siegfried Selberherr Institute for Microelectronics, TU-Vienna, Gusshausstrasse

More information

A brief survey of the discontinuous Galerkin method for the Boltzmann-Poisson equations 1

A brief survey of the discontinuous Galerkin method for the Boltzmann-Poisson equations 1 A brief survey of the discontinuous Galerkin method for the Boltzmann-Poisson equations Yingda Cheng, Irene M. Gamba 3 Department of Mathematics and ICES, University of Texas, Austin, TX 787, USA Armando

More information

Electrical Transport. Ref. Ihn Ch. 10 YC, Ch 5; BW, Chs 4 & 8

Electrical Transport. Ref. Ihn Ch. 10 YC, Ch 5; BW, Chs 4 & 8 Electrical Transport Ref. Ihn Ch. 10 YC, Ch 5; BW, Chs 4 & 8 Electrical Transport The study of the transport of electrons & holes (in semiconductors) under various conditions. A broad & somewhat specialized

More information

Applicability of the High Field Model: An Analytical Study via Asymptotic Parameters Defining Domain Decomposition

Applicability of the High Field Model: An Analytical Study via Asymptotic Parameters Defining Domain Decomposition Applicability of the High Field Model: An Analytical Study via Asymptotic Parameters Defining Domain Decomposition Carlo Cercignani,IreneM.Gamba, Joseph W. Jerome, and Chi-Wang Shu Abstract In this paper,

More information

Numerical calculation of the electron mobility in ZnS and ZnSe semiconductors using the iterative method

Numerical calculation of the electron mobility in ZnS and ZnSe semiconductors using the iterative method International Journal o the Physical Sciences Vol. 5(11), pp. 1752-1756, 18 September, 21 Available online at http://www.academicjournals.org/ijps ISSN 1992-195 21 Academic Journals Full Length Research

More information

Monte Carlo Based Calculation of Electron Transport Properties in Bulk InAs, AlAs and InAlAs

Monte Carlo Based Calculation of Electron Transport Properties in Bulk InAs, AlAs and InAlAs Bulg. J. Phys. 37 (2010) 215 222 Monte Carlo Based Calculation of Electron Transport Properties in Bulk InAs, AlAs and InAlAs H. Arabshahi 1, S. Golafrooz 2 1 Department of Physics, Ferdowsi University

More information

MONTE CARLO SIMULATION FOR ELECTRON DYNAMICS IN SEMICONDUCTOR DEVICES

MONTE CARLO SIMULATION FOR ELECTRON DYNAMICS IN SEMICONDUCTOR DEVICES Mathematical and Computational Applications, Vol., No., pp. 9-26, 25. Association for Scientific Research MONTE CARLO SIMULATION FOR ELECTRON DYNAMICS IN SEMICONDUCTOR DEVICES Mustafa Akarsu, Ömer Özbaş

More information

Chapter 12: Semiconductors

Chapter 12: Semiconductors Chapter 12: Semiconductors Bardeen & Shottky January 30, 2017 Contents 1 Band Structure 4 2 Charge Carrier Density in Intrinsic Semiconductors. 6 3 Doping of Semiconductors 12 4 Carrier Densities in Doped

More information

PHYS208 P-N Junction. Olav Torheim. May 30, 2007

PHYS208 P-N Junction. Olav Torheim. May 30, 2007 1 PHYS208 P-N Junction Olav Torheim May 30, 2007 1 Intrinsic semiconductors The lower end of the conduction band is a parabola, just like in the quadratic free electron case (E = h2 k 2 2m ). The density

More information

Using six moments of Boltzmann s transport equation for device simulation

Using six moments of Boltzmann s transport equation for device simulation JOURNAL OF APPLIED PHYSICS VOLUME 90, NUMBER 5 1 SEPTEMBER 2001 Using six moments of Boltzmann s transport euation for device simulation Tibor Grasser, a) Hans Kosina, Markus Gritsch, and Siegfried Selberherr

More information

Numerical Example: Carrier Concentrations

Numerical Example: Carrier Concentrations 2 Numerical ample: Carrier Concentrations Donor concentration: N d = 10 15 cm -3 Thermal equilibrium electron concentration: n o N d = 10 15 cm 3 Thermal equilibrium hole concentration: 2 2 p o = n i no

More information

Journal of Atoms and Molecules

Journal of Atoms and Molecules Research article Journal of Atoms and Molecules An International Online Journal ISSN 77 147 Hot Electron Transport in Polar Semiconductor at Low Lattice Temperature A. K. Ghorai Physics Department, Kalimpong

More information

MONTE CARLO SIMULATION OF THE ELECTRON MOBILITY IN STRAINED SILICON

MONTE CARLO SIMULATION OF THE ELECTRON MOBILITY IN STRAINED SILICON MONTE CARLO SIMULATION OF THE ELECTRON MOBILITY IN STRAINED SILICON Siddhartha Dhar*, Enzo Ungersböck*, Mihail Nedjalkov, Vassil Palankovski Advanced Materials and Device Analysis Group, at * *Institute

More information

2D semiconductor device simulations by WENO-Boltzmann schemes: efficiency, boundary conditions and comparison to Monte Carlo methods

2D semiconductor device simulations by WENO-Boltzmann schemes: efficiency, boundary conditions and comparison to Monte Carlo methods 2D semiconductor device simulations by WENO-Boltzmann schemes: efficiency, boundary conditions and comparison to Monte Carlo methods José A. Carrillo ICREA - Department de Matemàtiques, Universitat Autònoma

More information

PN Junction

PN Junction P Junction 2017-05-04 Definition Power Electronics = semiconductor switches are used Analogue amplifier = high power loss 250 200 u x 150 100 u Udc i 50 0 0 50 100 150 200 250 300 350 400 i,u dc i,u u

More information

collisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature

collisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature 1.9. Temperature Dependence of Semiconductor Conductivity Such dependence is one most important in semiconductor. In metals, Conductivity decreases by increasing temperature due to greater frequency of

More information

The Boltzmann Equation and Its Applications

The Boltzmann Equation and Its Applications Carlo Cercignani The Boltzmann Equation and Its Applications With 42 Illustrations Springer-Verlag New York Berlin Heidelberg London Paris Tokyo CONTENTS PREFACE vii I. BASIC PRINCIPLES OF THE KINETIC

More information

Semiconductor Junctions

Semiconductor Junctions 8 Semiconductor Junctions Almost all solar cells contain junctions between different materials of different doping. Since these junctions are crucial to the operation of the solar cell, we will discuss

More information

MONTE CARLO MODELING OF HEAT GENERATION IN ELECTRONIC NANOSTRUCTURES

MONTE CARLO MODELING OF HEAT GENERATION IN ELECTRONIC NANOSTRUCTURES Proceedings of IMECE 2 22 ASME International Mechanical Engineering Congress and Exposition November 17-22, 22, New Orleans, Louisiana, USA IMECE2/HT-32124 MONTE CARLO MODELING OF HEAT GENERATION IN ELECTRONIC

More information

Particle Monte Carlo simulation of quantum phenomena in semiconductor nanostructures

Particle Monte Carlo simulation of quantum phenomena in semiconductor nanostructures JOURNAL OF APPLIED PHYSICS VOLUME 89 NUMBER 7 APRIL 00 Particle Monte Carlo simulation of quantum phenomena in semiconductor nanostructures Hideaki Tsuchiya and Umberto Ravaioli a) Beckman Institute University

More information

Steady-State Electron Transport in Silicon Dioxide Employing Different Electronic Band-Structures

Steady-State Electron Transport in Silicon Dioxide Employing Different Electronic Band-Structures Steady-State Electron Transport in Silicon Dioxide Employing Different Electronic Band-Structures M. Hackel, H. Kosina, and S. Selberherr Institute for Microelectronics Technical University of Vienna Gusshausstrasse

More information

ELECTRON MOBILITY CALCULATIONS OF n-inas

ELECTRON MOBILITY CALCULATIONS OF n-inas Digest Journal of Nanomaterials and Biostructures Vol. 6, No, April - June 0, p. 75-79 ELECTRON MOBILITY CALCULATIONS OF n-inas M. A. ALZAMIL Science Department, Teachers College, King Saud University,

More information

Comparison of electron transport properties in submicrometer InAs, InP and GaAs n + -i-n + diode using ensemble Monte Carlo simulation

Comparison of electron transport properties in submicrometer InAs, InP and GaAs n + -i-n + diode using ensemble Monte Carlo simulation Comparison of electron transport properties in submicrometer InAs, InP and GaAs n + -i-n + diode using ensemble Monte Carlo simulation A. Guen-Bouazza 1, C. Sayah 1, B. Bouazza 1, N. E. Chabane-Sari 1

More information

Semiconductor Device Physics

Semiconductor Device Physics 1 Semiconductor Device Physics Lecture 3 http://zitompul.wordpress.com 2 0 1 3 Semiconductor Device Physics 2 Three primary types of carrier action occur inside a semiconductor: Drift: charged particle

More information

A -SiC MOSFET Monte Carlo Simulator Including

A -SiC MOSFET Monte Carlo Simulator Including VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 257-260 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by

More information

ECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline:

ECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline: ECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline: Depletion Approximation Step Junction Things you should know when you leave Key Questions What is the space charge region? What are the

More information

A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation. G. Kaiblinger-Grujin and S. Selberherr

A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation. G. Kaiblinger-Grujin and S. Selberherr A Universal Low-Field Electron Mobility Model for Semiconductor Device Simulation G. Kaiblinger-Grujin and S. Selberherr Institute for Microelectronics, TU Vienna Gusshausstrasse 27-29, A-14 Vienna, kaiblinger@iue.tuwien.ac.at

More information

Introduction to Engineering Materials ENGR2000. Dr.Coates

Introduction to Engineering Materials ENGR2000. Dr.Coates Introduction to Engineering Materials ENGR2000 Chapter 18: Electrical Properties Dr.Coates 18.2 Ohm s Law V = IR where R is the resistance of the material, V is the voltage and I is the current. l R A

More information

ESE 372 / Spring 2013 / Lecture 5 Metal Oxide Semiconductor Field Effect Transistor

ESE 372 / Spring 2013 / Lecture 5 Metal Oxide Semiconductor Field Effect Transistor Metal Oxide Semiconductor Field Effect Transistor V G V G 1 Metal Oxide Semiconductor Field Effect Transistor We will need to understand how this current flows through Si What is electric current? 2 Back

More information

Device Benchmark Comparisons via Kinetic, Hydrodynamic, and High-Field Models

Device Benchmark Comparisons via Kinetic, Hydrodynamic, and High-Field Models Device Benchmark Comparisons via Kinetic, Hydrodynamic, and High-Field Models Carlo Cercignani, Irene M. Gamba, Joseph W. Jerome, and Chi-Wang Shu Abstract This paper describes benchmark comparisons for

More information

Impact ionization in silicon: A microscopic view

Impact ionization in silicon: A microscopic view JOURNAL OF APPLIED PHYSICS VOLUME 83, NUMBER 9 1 MAY 1998 Impact ionization in silicon: A microscopic view A. Pacelli, A. S. Spinelli, a) and A. L. Lacaita Dipartimento di Elettronica e Informazione, Politecnico

More information

Electron-phonon scattering (Finish Lundstrom Chapter 2)

Electron-phonon scattering (Finish Lundstrom Chapter 2) Electron-phonon scattering (Finish Lundstrom Chapter ) Deformation potentials The mechanism of electron-phonon coupling is treated as a perturbation of the band energies due to the lattice vibration. Equilibrium

More information

Lecture 2 - Carrier Statistics in Equilibrium. February 8, 2007

Lecture 2 - Carrier Statistics in Equilibrium. February 8, 2007 6.720J/3.43J Integrated Microelectronic Devices Spring 2007 Lecture 21 Lecture 2 Carrier Statistics in Equilibrium Contents: February 8, 2007 1. Conduction and valence bands, bandgap, holes 2. Intrinsic

More information

PHYS208 p-n junction. January 15, 2010

PHYS208 p-n junction. January 15, 2010 1 PHYS208 p-n junction January 15, 2010 List of topics (1) Density of states Fermi-Dirac distribution Law of mass action Doped semiconductors Dopinglevel p-n-junctions 1 Intrinsic semiconductors List of

More information

CHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki

CHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki CHAPTER 4: P-N P N JUNCTION Part 2 Part 2 Charge Storage & Transient Behavior Junction Breakdown Heterojunction CHARGE STORAGE & TRANSIENT BEHAVIOR Once injected across the junction, the minority carriers

More information

Semiconductor Physics. Lecture 3

Semiconductor Physics. Lecture 3 Semiconductor Physics Lecture 3 Intrinsic carrier density Intrinsic carrier density Law of mass action Valid also if we add an impurity which either donates extra electrons or holes the number of carriers

More information

High power laser semiconductor interactions: A Monte Carlo study for silicon

High power laser semiconductor interactions: A Monte Carlo study for silicon High power laser semiconductor interactions: A Monte Carlo study for silicon K. Yeom, H. Jiang, a) and J. Singh Department of Electrical Engineering and Computer Science, The University of Michigan, Ann

More information

EE301 Electronics I , Fall

EE301 Electronics I , Fall EE301 Electronics I 2018-2019, Fall 1. Introduction to Microelectronics (1 Week/3 Hrs.) Introduction, Historical Background, Basic Consepts 2. Rewiev of Semiconductors (1 Week/3 Hrs.) Semiconductor materials

More information

Applicability of the High Field Model: A Preliminary Numerical Study

Applicability of the High Field Model: A Preliminary Numerical Study Applicability of the High Field Model: A Preliminary Numerical Study Carlo Cercignani,IreneM.Gamba, Joseph W. Jerome, and Chi-Wang Shu Abstract In a companion presentation, we have discussed the theory

More information

Influence of the doping element on the electron mobility in n-silicon

Influence of the doping element on the electron mobility in n-silicon JOURNAL OF APPLIED PHYSICS VOLUME 83, NUMBER 6 15 MARCH 1998 Influence of the doping element on the electron mobility in n-silicon G. Kaiblinger-Grujin, a) H. Kosina, and S. Selberherr Institute for Microelectronics,

More information

Lecture 3 Transport in Semiconductors

Lecture 3 Transport in Semiconductors EE 471: Transport Phenomena in Solid State Devices Spring 2018 Lecture 3 Transport in Semiconductors Bryan Ackland Department of Electrical and Computer Engineering Stevens Institute of Technology Hoboken,

More information

Frequency Influence on the Hot-Electron Noise Reduction in GaAs Operating under Periodic Signals

Frequency Influence on the Hot-Electron Noise Reduction in GaAs Operating under Periodic Signals Vol. 113 (2008) ACTA PHYSICA POLONICA A No. 3 Proceedings of the 13th International Symposium UFPS, Vilnius, Lithuania 2007 Frequency Influence on the Hot-Electron Noise Reduction in GaAs Operating under

More information

Minimal Update of Solid State Physics

Minimal Update of Solid State Physics Minimal Update of Solid State Physics It is expected that participants are acquainted with basics of solid state physics. Therefore here we will refresh only those aspects, which are absolutely necessary

More information

The Electromagnetic Properties of Materials

The Electromagnetic Properties of Materials The lectromagnetic Properties of Materials lectrical conduction Metals Semiconductors Insulators (dielectrics) Superconductors Magnetic materials Ferromagnetic materials Others Photonic Materials (optical)

More information

Hot-phonon effects on electron transport in quantum wires

Hot-phonon effects on electron transport in quantum wires Hot-phonon effects on electron transport in quantum wires R. Mickevičius, a) V. Mitin, G. Paulavičius, and V. Kochelap b) Department of Electrical and Computer Engineering, Wayne State University, Detroit,

More information

Quiz #1 Practice Problem Set

Quiz #1 Practice Problem Set Name: Student Number: ELEC 3908 Physical Electronics Quiz #1 Practice Problem Set? Minutes January 22, 2016 - No aids except a non-programmable calculator - All questions must be answered - All questions

More information

The German University in Cairo. Faculty of Information Engineering & Technology Semiconductors (Elct 503) Electronics Department Fall 2014

The German University in Cairo. Faculty of Information Engineering & Technology Semiconductors (Elct 503) Electronics Department Fall 2014 The German University in Cairo th Electronics 5 Semester Faculty of Information Engineering & Technology Semiconductors (Elct 503) Electronics Department Fall 2014 Problem Set 3 1- a) Find the resistivity

More information

FYS Vår 2017 (Kondenserte fasers fysikk)

FYS Vår 2017 (Kondenserte fasers fysikk) FYS3410 - Vår 2017 (Kondenserte fasers fysikk) http://www.uio.no/studier/emner/matnat/fys/fys3410/v16/index.html Pensum: Introduction to Solid State Physics by Charles Kittel (Chapters 1-9, 11, 17, 18,

More information

Lecture 1. OUTLINE Basic Semiconductor Physics. Reading: Chapter 2.1. Semiconductors Intrinsic (undoped) silicon Doping Carrier concentrations

Lecture 1. OUTLINE Basic Semiconductor Physics. Reading: Chapter 2.1. Semiconductors Intrinsic (undoped) silicon Doping Carrier concentrations Lecture 1 OUTLINE Basic Semiconductor Physics Semiconductors Intrinsic (undoped) silicon Doping Carrier concentrations Reading: Chapter 2.1 EE105 Fall 2007 Lecture 1, Slide 1 What is a Semiconductor? Low

More information

Lecture 7 - Carrier Drift and Diffusion (cont.) February 20, Non-uniformly doped semiconductor in thermal equilibrium

Lecture 7 - Carrier Drift and Diffusion (cont.) February 20, Non-uniformly doped semiconductor in thermal equilibrium 6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 7-1 Lecture 7 - Carrier Drift and Diffusion (cont.) February 20, 2007 Contents: 1. Non-uniformly doped semiconductor in thermal equilibrium

More information

Local and regular plasma oscillations in bulk donor type semiconductors

Local and regular plasma oscillations in bulk donor type semiconductors Local and regular plasma oscillations in bulk donor type semiconductors Yuri Kornyushin Maître Jean Brunschvig Research Unit, Chalet Shalva, Randogne, CH-3975 Abstract Restoring force acts on the electronic

More information

Optical Properties of Lattice Vibrations

Optical Properties of Lattice Vibrations Optical Properties of Lattice Vibrations For a collection of classical charged Simple Harmonic Oscillators, the dielectric function is given by: Where N i is the number of oscillators with frequency ω

More information

An Effective Potential Approach to Modelling 25nm MOSFET Devices S. Ahmed 1 C. Ringhofer 2 D. Vasileska 1

An Effective Potential Approach to Modelling 25nm MOSFET Devices S. Ahmed 1 C. Ringhofer 2 D. Vasileska 1 An Effective Potential Approach to Modelling 25nm MOSFET Devices S. Ahmed 1 C. Ringhofer 2 D. Vasileska 1 1 Department of Electrical Engineering, 2 Department of Mathematics, Arizona State University,

More information

Quantum Kinetic Transport under High Electric Fields

Quantum Kinetic Transport under High Electric Fields VLSI DESIGN 1998, Vol. 6, Nos. (1-4), pp. 3-7 Reprints available directly from the publisher Photocopying permitted by license only 1998 OPA (Ov+rseas Publishers Association) N.V. Published by license

More information

Supplementary Figures

Supplementary Figures Supplementary Figures 8 6 Energy (ev 4 2 2 4 Γ M K Γ Supplementary Figure : Energy bands of antimonene along a high-symmetry path in the Brillouin zone, including spin-orbit coupling effects. Empty circles

More information

An energy relaxation time model for device simulation

An energy relaxation time model for device simulation Solid-State Electronics 43 (1999) 1791±1795 An energy relaxation time model for device simulation B. Gonzalez a, *, V. Palankovski b, H. Kosina b, A. Hernandez a, S. Selberherr b a University Institute

More information

ECE 340 Lecture 21 : P-N Junction II Class Outline:

ECE 340 Lecture 21 : P-N Junction II Class Outline: ECE 340 Lecture 21 : P-N Junction II Class Outline: Contact Potential Equilibrium Fermi Levels Things you should know when you leave Key Questions What is the contact potential? Where does the transition

More information

Electro-Thermal Transport in Silicon and Carbon Nanotube Devices E. Pop, D. Mann, J. Rowlette, K. Goodson and H. Dai

Electro-Thermal Transport in Silicon and Carbon Nanotube Devices E. Pop, D. Mann, J. Rowlette, K. Goodson and H. Dai Electro-Thermal Transport in Silicon and Carbon Nanotube Devices E. Pop, D. Mann, J. Rowlette, K. Goodson and H. Dai E. Pop, 1,2 D. Mann, 1 J. Rowlette, 2 K. Goodson 2 and H. Dai 1 Dept. of 1 Chemistry

More information

Uniform excitation: applied field and optical generation. Non-uniform doping/excitation: diffusion, continuity

Uniform excitation: applied field and optical generation. Non-uniform doping/excitation: diffusion, continuity 6.012 - Electronic Devices and Circuits Lecture 2 - Uniform Excitation; Non-uniform conditions Announcements Review Carrier concentrations in TE given the doping level What happens above and below room

More information

Electronic Devices & Circuits

Electronic Devices & Circuits Electronic Devices & Circuits For Electronics & Communication Engineering By www.thegateacademy.com Syllabus Syllabus for Electronic Devices Energy Bands in Intrinsic and Extrinsic Silicon, Carrier Transport,

More information

POTENTIAL PERFORMANCE OF SiC AND GaN BASED METAL SEMICONDUCTOR FIELD EFFECT TRANSISTORS

POTENTIAL PERFORMANCE OF SiC AND GaN BASED METAL SEMICONDUCTOR FIELD EFFECT TRANSISTORS POTENTIAL PERFORMANCE OF SiC AND GaN BASED METAL SEMICONDUCTOR FIELD EFFECT TRANSISTORS H. ARABSHAHI 1, J. BAEDI 1, H.A. RAHNAMA 1, G.R. EBRAHIMI 2 1 Department of Physics, Tarbiat Moallem University of

More information

!""#$%&'("')*+,%*-'$(,".,#-#,%'+,/' /.&$0#%#'/(1+,%&'.,',+,(&$+2#'3*24'5.' 6758!9&!

!#$%&'(')*+,%*-'$(,.,#-#,%'+,/' /.&$0#%#'/(1+,%&'.,',+,(&$+2#'3*24'5.' 6758!9&! Università di Pisa!""#$%&'("')*+,%*-'$(,".,#-#,%'+,/' /.&$#%#'/(1+,%&'.,',+,(&$+#'3*'5.' 758!9&!!"#$%&'#()"*+"( H%8*'/%I-+/&#J%#)+-+-'%*#J-55K)+&'I*L%&+-M#5-//'&+%,*(#)+&'I*/%,*(#N-5-,&I=+%,*L%&+%(# @+%O-'.%/P#J%#F%.*#!"&,-..-(/#$$#''*$-(

More information

Monte Carlo Study of Thermal Transport of Direction and Frequency Dependent Boundaries in High Kn Systems

Monte Carlo Study of Thermal Transport of Direction and Frequency Dependent Boundaries in High Kn Systems Monte Carlo Study of Thermal Transport of Direction and Frequency Dependent Boundaries in High Kn Systems N.A. Roberts and D.G. Walker Department of Mechanical Engineering Vanderbilt University May 30,

More information

Unified theory of quantum transport and quantum diffusion in semiconductors

Unified theory of quantum transport and quantum diffusion in semiconductors Paul-Drude-Institute for Solid State Electronics p. 1/? Unified theory of quantum transport and quantum diffusion in semiconductors together with Prof. Dr. V.V. Bryksin (1940-2008) A.F. Ioffe Physical

More information

8.1 Drift diffusion model

8.1 Drift diffusion model 8.1 Drift diffusion model Advanced theory 1 Basic Semiconductor Equations The fundamentals of semiconductor physic are well described by tools of quantum mechanic. This point of view gives us a model of

More information

1 Name: Student number: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND. Fall :00-11:00

1 Name: Student number: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND. Fall :00-11:00 1 Name: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND Final Exam Physics 3000 December 11, 2012 Fall 2012 9:00-11:00 INSTRUCTIONS: 1. Answer all seven (7) questions.

More information

Influence of Schottky Diode Modelling Under Flat-Band Conditions on the Simulation of Submillimeter-Wave Mixers

Influence of Schottky Diode Modelling Under Flat-Band Conditions on the Simulation of Submillimeter-Wave Mixers Influence of Schottky Diode Modelling Under Flat-Band Conditions on the Simulation of Submillimeter-Wave Mixers José V. Siles 1, Jesús Grajal 1 and A. di Carlo 2 1 Dep. de Señales, Sistemas y Radiocomunicaciones,

More information

THE UNIVERSITY OF NEW SOUTH WALES SCHOOL OF PHYSICS FINAL EXAMINATION JUNE/JULY PHYS3080 Solid State Physics

THE UNIVERSITY OF NEW SOUTH WALES SCHOOL OF PHYSICS FINAL EXAMINATION JUNE/JULY PHYS3080 Solid State Physics THE UNIVERSITY OF NEW SOUTH WALES SCHOOL OF PHYSICS FINAL EXAMINATION JUNE/JULY 006 PHYS3080 Solid State Physics Time Allowed hours Total number of questions - 5 Answer ALL questions All questions are

More information

Electric Field--Definition. Brownian motion and drift velocity

Electric Field--Definition. Brownian motion and drift velocity Electric Field--Definition Definition of electrostatic (electrical) potential, energy diagram and how to remember (visualize) relationships E x Electrons roll downhill (this is a definition ) Holes are

More information

QUANTUM MODELS FOR SEMICONDUCTORS AND NONLINEAR DIFFUSION EQUATIONS OF FOURTH ORDER

QUANTUM MODELS FOR SEMICONDUCTORS AND NONLINEAR DIFFUSION EQUATIONS OF FOURTH ORDER QUANTUM MODELS FOR SEMICONDUCTORS AND NONLINEAR DIFFUSION EQUATIONS OF FOURTH ORDER MARIA PIA GUALDANI The modern computer and telecommunication industry relies heavily on the use of semiconductor devices.

More information

Micron School of Materials Science and Engineering. Problem Set 9 Solutions

Micron School of Materials Science and Engineering. Problem Set 9 Solutions Problem Set 9 Solutions 1. Mobility in extrinsic semiconductors is affected by phonon scattering and impurity scattering. Thoroughly explain the mobility plots for the following figures from your textbook

More information

ELECTRONS AND PHONONS IN SEMICONDUCTOR MULTILAYERS

ELECTRONS AND PHONONS IN SEMICONDUCTOR MULTILAYERS ELECTRONS AND PHONONS IN SEMICONDUCTOR MULTILAYERS В. К. RIDLEY University of Essex CAMBRIDGE UNIVERSITY PRESS Contents Introduction 1 Simple Models of the Electron-Phonon Interaction 1.1 General remarks

More information

A Wigner Function-Based Quantum Ensemble Monte Carlo Study of a Resonant Tunneling Diode

A Wigner Function-Based Quantum Ensemble Monte Carlo Study of a Resonant Tunneling Diode IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 3, MARCH 2003 769 A Wigner Function-Based Quantum Ensemble Monte Carlo Study of a Resonant Tunneling Diode L. Shifren, C. Ringhofer, and D. K. Ferry

More information

Lecture 8 - Carrier Drift and Diffusion (cont.) September 21, 2001

Lecture 8 - Carrier Drift and Diffusion (cont.) September 21, 2001 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-1 Lecture 8 - Carrier Drift and Diffusion (cont.) September 21, 2001 Contents: 1. Non-uniformly doped semiconductor in thermal equilibrium

More information

Carriers Concentration and Current in Semiconductors

Carriers Concentration and Current in Semiconductors Carriers Concentration and Current in Semiconductors Carrier Transport Two driving forces for carrier transport: electric field and spatial variation of the carrier concentration. Both driving forces lead

More information

Session 5: Solid State Physics. Charge Mobility Drift Diffusion Recombination-Generation

Session 5: Solid State Physics. Charge Mobility Drift Diffusion Recombination-Generation Session 5: Solid State Physics Charge Mobility Drift Diffusion Recombination-Generation 1 Outline A B C D E F G H I J 2 Mobile Charge Carriers in Semiconductors Three primary types of carrier action occur

More information

Transport Properties of Semiconductors

Transport Properties of Semiconductors SVNY85-Sheng S. Li October 2, 25 15:4 7 Transport Properties of Semiconductors 7.1. Introduction In this chapter the carrier transport phenomena in a semiconductor under the influence of applied external

More information

QUANTUM WELLS, WIRES AND DOTS

QUANTUM WELLS, WIRES AND DOTS QUANTUM WELLS, WIRES AND DOTS Theoretical and Computational Physics of Semiconductor Nanostructures Second Edition Paul Harrison The University of Leeds, UK /Cf}\WILEY~ ^INTERSCIENCE JOHN WILEY & SONS,

More information

ECE 340 Lecture 6 : Intrinsic and Extrinsic Material I Class Outline:

ECE 340 Lecture 6 : Intrinsic and Extrinsic Material I Class Outline: ECE 340 Lecture 6 : Intrinsic and Extrinsic Material I Class Outline: Effective Mass Intrinsic Material Extrinsic Material Things you should know when you leave Key Questions What is the physical meaning

More information

Semiconductor Detectors

Semiconductor Detectors Semiconductor Detectors Summary of Last Lecture Band structure in Solids: Conduction band Conduction band thermal conductivity: E g > 5 ev Valence band Insulator Charge carrier in conductor: e - Charge

More information

Carrier Mobility and Hall Effect. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India

Carrier Mobility and Hall Effect. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India Carrier Mobility and Hall Effect 1 Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India http://folk.uio.no/ravi/semi2013 calculation Calculate the hole and electron densities

More information

Calibration of a One Dimensional Hydrodynamic Simulator with Monte Carlo Data

Calibration of a One Dimensional Hydrodynamic Simulator with Monte Carlo Data VLSI DESIGN 1998, Vol. 8, Nos. (1-4), pp. 515-520 Reprints available directly from the publisher Photocopying permitted by license only (C) 1998 OPA (Overseas Publishers Association) N.V. Published by

More information

Numerical simulation of an intervalley. transition by the Wigner-function approach. Lucio Demeio. Dipartimento di Scienze Matematiche

Numerical simulation of an intervalley. transition by the Wigner-function approach. Lucio Demeio. Dipartimento di Scienze Matematiche Numerical simulation of an intervalley transition by the Wigner-function approach Lucio Demeio Dipartimento di Scienze Matematiche Universit a Politecnica delle Marche Via Brecce Bianche 1, I-6131 Ancona,

More information

Mat E 272 Lecture 25: Electrical properties of materials

Mat E 272 Lecture 25: Electrical properties of materials Mat E 272 Lecture 25: Electrical properties of materials December 6, 2001 Introduction: Calcium and copper are both metals; Ca has a valence of +2 (2 electrons per atom) while Cu has a valence of +1 (1

More information

Electronic and Optoelectronic Properties of Semiconductor Structures

Electronic and Optoelectronic Properties of Semiconductor Structures Electronic and Optoelectronic Properties of Semiconductor Structures Jasprit Singh University of Michigan, Ann Arbor CAMBRIDGE UNIVERSITY PRESS CONTENTS PREFACE INTRODUCTION xiii xiv 1.1 SURVEY OF ADVANCES

More information

Carrier transport: Drift and Diffusion

Carrier transport: Drift and Diffusion . Carrier transport: Drift and INEL 5209 - Solid State Devices - Spring 2012 Manuel Toledo April 10, 2012 Manuel Toledo Transport 1/ 32 Outline...1 Drift Drift current Mobility Resistivity Resistance Hall

More information

Quantum Corrections for Monte Carlo Simulation

Quantum Corrections for Monte Carlo Simulation Quantum Corrections for Monte Carlo Simulation Brian Winstead and Umberto Ravaioli Beckman Institute University of Illinois at Urbana-Champaign Outline Quantum corrections for quantization effects Effective

More information

Carriers Concentration, Current & Hall Effect in Semiconductors. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India

Carriers Concentration, Current & Hall Effect in Semiconductors. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India Carriers Concentration, Current & Hall Effect in Semiconductors 1 Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India http://folk.uio.no/ravi/semi2013 Conductivity Charge

More information

An Impact Ionization Model for Two-Carrier Energy-Momentum Simulation

An Impact Ionization Model for Two-Carrier Energy-Momentum Simulation 499 SIMULATION OF SEMICONDUCTOR DEVICES AND PROCESSES Vol. 4 Edited by W.Fichtner.D.Aemmer - Zurich (Switzerland) September 12-14,1991 - Hartung-Gorre An Impact Ionization Model for Two-Carrier Energy-Momentum

More information

Self-Consistent Drift-Diffusion Analysis of Intermediate Band Solar Cell (IBSC): Effect of Energetic Position of IB on Conversion Efficiency

Self-Consistent Drift-Diffusion Analysis of Intermediate Band Solar Cell (IBSC): Effect of Energetic Position of IB on Conversion Efficiency Self-onsistent Drift-Diffusion Analysis of ntermediate Band Solar ell (BS): Effect of Energetic Position of B on onversion Efficiency Katsuhisa Yoshida 1,, Yoshitaka Okada 1,, and Nobuyuki Sano 3 1 raduate

More information

A Review of Hydrodynamic and Energy-Transport Models for Semiconductor Device Simulation

A Review of Hydrodynamic and Energy-Transport Models for Semiconductor Device Simulation A Review of Hydrodynamic and Energy-Transport Models for Semiconductor Device Simulation TIBOR GRASSER, TING-WEI TANG, FELLOW, IEEE, HANS KOSINA, MEMBER, IEEE, AND SIEGFRIED SELBERHERR, FELLOW, IEEE Contributed

More information

Laser Diodes. Revised: 3/14/14 14: , Henry Zmuda Set 6a Laser Diodes 1

Laser Diodes. Revised: 3/14/14 14: , Henry Zmuda Set 6a Laser Diodes 1 Laser Diodes Revised: 3/14/14 14:03 2014, Henry Zmuda Set 6a Laser Diodes 1 Semiconductor Lasers The simplest laser of all. 2014, Henry Zmuda Set 6a Laser Diodes 2 Semiconductor Lasers 1. Homojunction

More information

Semiconductor Module

Semiconductor Module Semiconductor Module Optics Seminar July 18, 2018 Yosuke Mizuyama, Ph.D. COMSOL, Inc. The COMSOL Product Suite Governing Equations Semiconductor Schrödinger Equation Semiconductor Optoelectronics, FD Semiconductor

More information

Spin Lifetime Enhancement by Shear Strain in Thin Silicon-on-Insulator Films. Dmitry Osintsev, Viktor Sverdlov, and Siegfried Selberherr

Spin Lifetime Enhancement by Shear Strain in Thin Silicon-on-Insulator Films. Dmitry Osintsev, Viktor Sverdlov, and Siegfried Selberherr 10.1149/05305.0203ecst The Electrochemical Society Spin Lifetime Enhancement by Shear Strain in Thin Silicon-on-Insulator Films Dmitry Osintsev, Viktor Sverdlov, and Siegfried Selberherr Institute for

More information