MatSE 482/Phys 430 Spring 2003 SURFACE SPECTROSCOPIES

Transcription

1 MatSE 482/Phys 430 Spring 2003 OVERVIEW SURFACE SPECTROSCOPIES D. P. Woodruff and T. A. Delchar, Modern Techniques of Surface Science (Cambridge Univ. Press, Cambridge 1986) Chapts. 3,4. G. Ertl and J. Küppers, Low Energy Electrons and Surface Chemistry (VCH, Weinheim 1985). Excellent for all techniques. PHYSICS OF AUGER EMISSION E.H.S. Burhop, The Auger Effect (Cambridge University Press, 1952). Good survey of early work and theory for X-ray stimulated radiationless emission in gases. E.H.S. Burhop and W. N. Asaad, Adv. Atomic Molec. Phys. 8, 163 (1972). Thorough updating of the original book. J. Electron Spectrosc. 93 (1998). 4 th Internat l Workshop on Auger Spectroscopy AUGER SPECTROSCOPY OF SURFACES M. Prutton, Surf. Interface Anal. 29, 561 (2000). Scanning Auger microscope. M. P. Seah, I. S. Gilmore, and S. J. Spencer, J. Vac. Sci. Technol. A 18, 1083 (2000). Combined Auger and XPS. P. L. King, Surf. Interface Anal. 30, 377 (2000). Artifacts in Auger microanalysis. P. Lejcek, Surf. Interface Anal. 30, 321 (2000). Metallurgical Applications of Auger. S. Hofmann, Surf. Interface Anal. 30, 228 (2000). Depth resolution in AES sputter profiling. S. Mroz and A. Mroz, Thin Solid Films 367, 126 (2000). Auger analysis in MBE. J. J. Kolodziej, T. E. Madey, J. W. Keister, and J. E. Rowe, Phys. Rev. B 62, 5150 (2000). Photoelectron spectroscopy of growth. Appl. Sur. Sci. 100/107, (1996). Quantitative surface and interface analysis. H. Watanabe and M. Ichikawa, Rev. Sci. Inst. 67, (1996). Nanometer scanning system for electron spectroscopy. M. Sancrotti, Surf. Rev. Lett. 2, (1995). Surface analysis by x-ray photoemission and Auger spectroscopy. M. P. Seah and I. S. Gilmore, J. Vac. Sci. Technol. A 14, (1996). High resolution digital Auger database. G. G. Kleiman, Phys. Stat. Solid. B 192, (1995). High resolution Auger of metals and alloys. S. Valeri, Surf. Sci. Rpts. 17, (1993). Auger emission by ion impacts. C. L. Briant and R. P. Messmer, Auger Electron Spectroscopy (Academic, 1988). Various applications of the technique. I. F. Ferguson, Auger Microprobe Anaylsis (IOP, Bristol 1989). C. C. Chang, Surface Sci. 25, 53 (1971). A good early review of Auger spectroscopy of surfaces.

2 2 J. T. Grant, in Characterization of Metal and Polymer Surfaces, edited by L. H. Lee (Academic, New York, 1977) Vol. 1, p Brief early survey. N. J. Taylor, Rev. Sci. Instr. 40, 792 (1969). Good analyis of this experimental aspects of Auger spectroscopy. E. F. Bishop and J. C. Riviere, J. Appl. Phys. 40, 1740 (1969). Estimates of production efficiency of Auger electrons. P. H. Holloway, Adv. Electronics Electron. Phys. 54, 241 (1980). Up-to-date review of Auger and applications. E. N. Sickafus, J. Ed. Mod. Mater. Sci. Eng. 1, 1 (1979). A good introduction. R. Weissman and K. Müller, Surf. Sci. Repts. 1, 251 (1981). AES, a local probe for solid surfaces. J. T. Grant, Appl. Surf. Sci. 13, 35 (1982). Surface analysis with AES. J. C. Riviere, The Analyste 108, 649 (1983). Auger techniques in analytical chemistry - a brief review. D. Briggs and M. P. Seah, Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy (J. Wiley, N.Y., 1983). M. P. Seah, in Microscopic Methods in Metals, edited by U. Gonser, Vol. 40, of Topics in Current Physics (Springer, Berlin 1986), Chapt. 8. Expert review of Auger. M. P. Seah and C. P. Hunt, Rev. Sci. Inst. 59, 217 (1988). Methods for accurate signal-to-noise and figure-of-merit measurements in AES. H. E. Bishop, in Methods of Surface Analysis, ed. by J. M. Walls (Cambirdge, 1990) Chapt. 4. TECHNICAL ASPECTS OF AUGER SPECTROSCOPY T. W. Haas, G. J. Dooley, and J. T. Grant, Prog. Surf. Sci. 1, (1971). Tabulation of observed Auger lines. P. W. Palmberg, G. E. Riach, R. E. weber, and N. C. MacDonald, Handbook of Auger Electron Spectroscopy (Phys. Electronics Industries, 1972). Empirical listing of Auger spectra. F. P. Larkins, Atomic Data Nuclear Data Tables 20, 311 (1977). Semi-empirical Auger-electron energies for 10 < Z < 100. D. P. Blair and P. H. Sydenham, J. Phys. E. 8, 621 (1975). Review of phase sensitive detection. W. A. Coghlan and R. E. Clausing, A Catalog of Calculated Auger Transitions for the Elements, ORNL- TM-3576, Nat'l. Tech. Infor. Service Nov J. A. Bearden and A. F. Burr, Rev. Mod. Phys. 39, 125 (1967). Listing of X-ray levels. W. Bambynek, B. Crasemann, R. W. Fink, H. U. Freund, H. Mark, C. D. Swift, R. E. Price, and P. V. Rao, Rev. Mod. Phys. 44, 716 (1972). Review of X-ray fluorescence yields. A Benninghoven, O. Ganschow, P. Steffens, and L. Wiedmann, J. Electron Spectroscopy 14, 19 (1978). Dose limitation. D. Roy and J. D. Carette, in Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer- Verlag, Berlin, 1977). p. 13. Sound review of electron spectrometers. J. L. Lawson and G. E. Uhlenbeck, Threshold Signals (McGraw-Hill, New York, 1950). Discussion of shot noise.

3 D. E. Ramaker, Chemistry and Physics of Solid Surfaces IV, edited by R. Vanselow and R. Howe (Springer, Berlin, 1982) p. 19. Auger spectroscopy as a probe of valence bonds and bands.. 3 D. Briggs and M. P. Seah, Practical Surface Analysis by AES and XPS (Wiley, New York, 1983). A good collection of detailed articles. M. Cailler, J. P. Ganachaud, and D. Roptin, Adv. Electron. Electron Phys. 61, 161 (1983). Quantitative Auger spectroscopy. V. Jensen, J. N. Andersen, H. B. Nielsen, and D. L. Adams, Surf. Sci. 116, 66 (1986). M. Mundschau and R. Vanselow, Surf. Sci. 157, 87 (1985). Difficulties in the detection of surface impurities on platinum using AES. SUNDRY OTHER TOPICS J. Braun, Rpts. Prog. Phys. 59, (1996). Angle-resolved UV photoemission. M. P. Seah and W. A. Dench, Surf. Interface Anal. 1, 2 (1979). All about inelastic mean free paths. N. H. Turner and R. J. Colton, Anal. Chem. 54, 293R (1982). Voluminous literature survey of surface interface. C. A. Evans, Jr., Anal. Chem. 47, 818A (1975). An elementary description and comparison of different techniques for surface analysis. G. K. Wertheim, in Microscopic Methods in Metals, edited by U. Gonser, Vol. 40 of Topics in Current Physics (Springer, Berlin 1986), Chapt. 7. XPS R. L. Park, Chemical Analysis of Surfaces, in Surface Physics of Crystalline Solids, edited by J. M. Blakely (Academic, New York, 19075), Vol. II, 377. A good comparison of different techniques for surface analysis--auger, photoemission, ESCA. C. J. Todd, Vacuum 23, 195 (1973). Comparative survey of electron spectroscopy under UHV conditions. R. L. Park and J. E. Houston, J. Vac. Sci. Technol. 10, 176 (1973). Authoritative review of soft X-ray appearnace potential spectroscopy. R. Gomer, Adv. Chem. Phys. 27, 211 (1974). Electron spectroscopy of chemisorption on metals, with emphasis on adsorbed layers. B. Feuerbacher, B. Fitton and R. F. Willis, Photoemission and the Electronic Properties of Surfaces (Wiley, London, 1978). Excellent review. G. Margaritondo and J. H. Weaver, in Solid State Physics: Surfaces, edited by R. P. Park and M. G. Lagally (Academic, Orlando 1985), Chapt. 3. Photoemission of valence states. Methods of Surface Analysis, edited by A. W. Czanderna (Elsevier, Amsterdam, 1975). Somewhat uneven, but nevertheless a most useful survey of many techniques. Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer, New York, 1977). Excellent reviews of various aspects of electron spectroscopy by experts dealing with photoemission, electron loss, core level spectroscopies. A. Benninghoven, Appl. Phys. 1, 3 (1973). Brief survey of surface analytical methods. P. Braun, F. Rüdenauer, and F. P. Viehböck, Adv. Electronics Electron Phys. 57, 231 (1981). Surface analysis using charged-particle beams, a comparitive review.

4 M. J. Higatsberger, Adv. Electronics Electron Phys. 56, 291 (1981). Thumbnail sketches of different methods of surface analysis. 4 L. E. Murr, Electron and Ion Microscopy and Microanalysis (M. Dekker, New York, 1982). A broad presentation of various techniques, including some for surface studies. N. H. Turner, B. I. Dunlap, and R. J. Colton, Analytical Chem. 56, 373R (1984). Surface analysis: X-ray photoelectron spectroscopy, AES, and SIMS. A massive compendium of references. N. Winogard, in Chemistry and Physics of Solid Surfaces V, edited by R. Vanselow and R. Howe (Springer, Berlin 1984), p Angle-resolved secondary ion mass spectrometry. B. J. Tatarchuk and J. A. Dumesic, ibid, p. 65. Mössbauer spectroscopy: application to surface and catalytic phenomena. R. L. Park, in Solid State Physics: Surfaces, edited by R. L. Park and M. G. Lagally (Academic, Orlando 1985), Chapt. 4. Core level spectroscopies. J. M. Walls, Methods of Surface Analysis (Cambridge, 1990). Various techniques are surveyed. VIBRATIONAL SPECTROSCOPIES R. F. Willis, ed., Vibrational Sepctroscopy of Adsorbates, Springer Series in Chemical Physics 15 (Springer, lberlin 1980). A. Campion, Ann. Rev. Phys. Chem. 36, 549 (1985). Raman spectroscopy of molecules adsorbed on solid surfaces. A. T. Bell, in Chemistry and Physics of Solid Surfaces V, edited by R. Vanselow and R. Howe (Springer, Berllin 1984) p. 23. Fourier-transform infrared in heterogenous catalysis. F. M. Hoffman, Surf. Sci. Repts. 3, 107 (1983). IR reflection-absorption spectroscopy of adsorbed molecules. A. Campion, in Chemistry and Physics of Solid Surfaces VI, edited by R. Vanselow and R. Howe (Springer, Berlin 1986), Chapt. 11. Raman spectroscopy of adsorbed molecules. W. H. Weinberg, in Solid State Physics: Surfaces, edited by R. L. Park and M. G. Lagally (Academic, Orlando 1985), Chapt. 2. Review of vibrations in overlayers. Y. J. Chabal, in Chemistry and Physics of Solid Surfaces VI, edited by R. Vanselow and R. Howe (Springer, Berlin 1988), Chapt. 3. Infrared spectroscopy of semiconductor surfaces. SIMS A. Benninghoven, Surface Sci. 53, 596 (1975). Development in SIMS and applications to surface studies. A good introduction. W. N. Delgass, L. L. Lauderback, and D. G. Taylor, Chemistry and Physics of Solid Surfaces IV, edited by R. Vanselow and R. Howe (Springer, Berllin 1982) p. 51. SIMS of reactive surfaces. A. Benninghoven, F. G. Rudenauer, and H. W. Werner, Secondary Ion Mass Spectrometry (J. Wiley, N.Y. 1987). P. Williams, in Applied Atomic Collison Physics 4, edited by S. Datz (Academic, Orlando 1983) p A. Benninghoven et al., SIMS, Springer Series in Chemical Physics (Springer, Berlin). Recent conference proceedings. Look for the latest one!

5 L. R. Becerra, C. P. Slichter, and J. H. Sinfelt, Phys. Rev. B 52, (1995). NMR investigation of CO on Pd. 5