Preliminary data. Maximum Ratings,at T j = 25 C, unless otherwise specified Parameter Symbol Value Unit Continuous drain current I D. I D puls -2.

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Transcription:

OptiMOS -P Small-Signal-Transistor Feature P-Channel Enhancement mode Super Logic Level (.5 V rated) 5 C operating temperature valanche rated dv/dt rated Product Summary V DS - V R DS(on) 55 mω I D -.58 SOT- VSO556 Type Package Ordering Code SOT- Q67-S7 Marking Xs Gate pin Drain pin Source pin Maximum Ratings,at T j = 5 C, unless otherwise specified Parameter Symbol Value Unit Continuous drain current T =5 C T =7 C Pulsed drain current I D puls -. T =5 C I D -.58 -.6 valanche energy, single pulse E S.5 mj I D =-.58, V DD =-V, R GS =5Ω Reverse diode dv/dt dv/dt -6 kv/µs I S =-.58, V DS =-6V, di/dt=/µs, T jmax =5 C Gate source voltage V GS ± V Power dissipation P tot.5 W T =5 C Operating and storage temperature T j, T stg -55... +5 C IEC climatic category; DIN IEC 68-55/5/56 Page --5

Thermal Characteristics Parameter Symbol Values Unit min. typ. max. Characteristics Thermal resistance, junction - soldering point R thjs - - K/W SMD version, device on PCB: @ min. footprint @ 6 cm cooling area ) R thj - - - - 6 Electrical Characteristics, at T j = 5 C, unless otherwise specified Parameter Symbol Values Unit min. typ. max. Static Characteristics Drain-source breakdown voltage V (BR)DSS - - - V V GS =V, I D =-5µ Gate threshold voltage, V GS = V DS V GS(th) -.6 -.9 -. I D =-.5µ Zero gate voltage drain current V DS =-V, V GS =, T j =5 C V DS =-V, V GS =, T j =5 C I DSS µ - - -. - - - Gate-source leakage current I GSS - - - n V GS =-V, V DS = Drain-source on-state resistance R DS(on) - 56 9 mω V GS =-.5V, I D =-.6 Drain-source on-state resistance R DS(on) - 69 55 V GS =-.5, I D =-.58 Device on mm*mm*.5mm epoxy PCB FR with 6cm (one layer, 7 µm thick) copper area for drain connection. PCB is vertical without blown air; t sec. Page --5

Electrical Characteristics, at T j = 5 C, unless otherwise specified Parameter Symbol Conditions Values Unit min. typ. max. Dynamic Characteristics Transconductance g fs V DS * I D *R DS(on)max.87.7 - S I D =-.6 Input capacitance C iss V GS =, V DS =-5V, - 89.9 - pf Output capacitance C oss f=mhz -. - Reverse transfer capacitance C rss -.5 - Turn-on delay time t d(on) V DD =-V, V GS =-.5V, -. 6.6 ns Rise time t r I D =-.58, R G =6Ω - 5.8 8.7 Turn-off delay time t d(off) - 7.6. Fall time t f -.5 6.7 Gate Charge Characteristics Gate to source charge Q gs V DD =-V, I D =-.58 - -. -.7 nc Gate to drain charge Q gd - -.7 -. Gate charge total Q g V DD =-V, I D =-.58, - -.9 -.8 V GS = to -.5V Gate plateau voltage V (plateau) V DD =-V, I D =-.58 - -.7 - V Reverse Diode Inverse diode continuous I S T =5 C - - -.5 forward current Inverse diode direct current, I SM - - -. pulsed Inverse diode forward voltage V SD V GS =, I F = I D - -. -.88 V Reverse recovery time t rr V R =-V, I F = l D, - 9. ns Reverse recovery charge Q rr di F /dt=/µs -.7.59 nc Page --5

Power dissipation P tot = f (T ) Drain current I D = f (T ) parameter: V GS.5 V.85 W.7 -.65 -.55 -.5.6 -.5 Ptot.5 ID -. -.5. -.. -.5 -.. -.5. -. -.5 6 8 C 6 T 6 8 C 6 T Safe operating area I D = f ( V DS ) parameter : D =, T = 5 C Transient thermal impedance Z thjs = f (t p ) parameter : D = t p /T - K/W ID - R DS(on) = V DS / I D t p = 8.µs µs ms ZthJS ms D =.5. - - -..5 DC - single pulse.. - - - - - - V - V DS Page - -7-6 -5 - - - s t p --5

5 Typ. output characteristic I D = f (V DS ); T j =5 C parameter: t p = 8 µs 6 Typ. drain-source on resistance R DS(on) = f (I D ) parameter: V GS Vgs = -.5V Vgs = -V Ω Vgs = -.V Vgs = -.5V - ID Vgs = -V Vgs = -.8V Vgs = -.5V RDS(on).8.7.6 Vgs = - V Vgs= -.5V Vgs = - V Vgs = -.5V Vgs= - 5V Vgs= - 6V Vgs = - 7V Vgs = -.5V Vgs = -7V Vgs = -.V.5 Vgs = -V. Vgs = -.8V. 5 6 7 8 V - V DS 7 Typ. transfer characteristics I D = f ( V GS ); V DS x I D x R DS(on)max parameter: t p = 8 µs 6....6.8...6 - I D 8 Typ. forward transconductance g fs = f(i D ); T j =5 C parameter: t p = 8 µs S 5.5 - ID.5 gfs.5.5.5.5.5.5.5.5.5 V.5 - V GS 6 - I D Page 5 --5

9 Drain-source on-resistance R DS(on) = f(t j ) parameter: I D = -.58, V GS = -.5 V 7 mω Gate threshold voltage V GS(th) = f (T j ) parameter: V GS = V DS, I D = -.5 µ. V RDS(on) 6 55 98% VGS(th) 98% 5.8 typ. 5.6. % 5 typ.. 5-6 - 6 C 6 T j -6-6 C 6 T j Typ. capacitances C = f (V DS ) parameter: V GS =, f= MHz Forward character. of reverse diode I F = f (V SD ) parameter: T j, tp = 8 µs - pf - C IF Ciss Coss Crss - - T j = 5 C typ T j = 5 C typ T j = 5 C (98%) T j = 5 C (98%) 5 V - V DS Page 6 - - -. -.8 -. -.6 - -. V - V SD --5

Typ. avalanche energy E S = f (T j ), par.: I D = -.58 V DD = - V, R GS = 5 Ω mj Typ. gate charge V GS = f (Q Gate ) parameter: I D = -.58 pulsed V 9 ES.5 - VGS 8 7 6. Vds max.5 Vds max.8 Vds max.5 5.5 5 5 75 C 5 T j.5.5 nc Q Gate 5 Drain-source breakdown voltage V (BR)DSS = f (T j ) -.5 V -.5 V(BR)DSS - -.5 - -.5 - -.5 - -9.5-9 -8.5-8 -6-6 C 8 T j Page 7 --5

Published by Infineon Technologies G, Bereichs Kommunikation St.-Martin-Strasse 5, D-85 München Infineon Technologies G 999 ll Rights Reserved. ttention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Reprensatives worldwide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Page 8 --5