74F843 9-Bit Transparent Latch

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9-Bit Traparent Latch General Description The 74F843 bus interface latch is designed to eliminate the extra packages required to buffer existing latches and provide extra data width for wider address/data paths or buses carrying parity. Features 3-STATE output January 1988 Revised January 2004 74F843 9-Bit Traparent Latch Ordering Code: Order Number Package Number Package Description 74F843SCX M24B 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Logic Symbols Connection Diagram IEEE 2004 Fairchild Semiconductor Corporation DS009453 www.fairchildsemi.com

Unit Loading/Fan Out U.L. Input I IH /I IL Pin Names Description HIGH/LOW Output I OH /I OL D 0 D 8 Data Inputs 1.0/1.0 20 µa/ 0.6 ma OE Output Enable Input 1.0/1.0 20 µa/ 0.6 ma LE Latch Enable 1.0/1.0 20 µa/ 0.6 ma CLR Clear 1.0/1.0 20 µa/ 0.6 ma PRE Preset 1.0/1.0 20 µa/ 0.6 ma O 0 O 8 3-STATE Data Outputs 150/40 3 ma/24 ma Functional Description The 74F843 coists of nine D-type latches with 3-STATE outputs. The flip-flops appear traparent to the data when Latch Enable (LE) is HIGH. This allows asynchronous operation, as the output traition follows the data in traition. On the LE HIGH-to-LOW traition, the data that meets the setup times is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH, the bus output is in the high impedance state. In addition to the LE and OE pi, the 74F843 has a Clear (CLR) pin and a Preset (PRE). These pi are ideal for parity bus interfacing in high performance systems. When CLR is LOW, the outputs are LOW if OE is LOW. When CLR is HIGH, data can be entered into the latch. When PRE is LOW, the Outputs are HIGH if OE is LOW. Preset overrides CLR. Function Table Inputs Internal Output Function CLR PRE OE LE D Q O H H X X X X Z High Z H H H H L L Z High Z H H H H H H Z High Z H H H L X NC Z Latched H H L H L L L Traparent H H L H H H H Traparent H H L L X NC NC Latched H L L X X H H Preset L H L X X L L Clear L L L X X H H Preset L H H L X L Z Latched H L H L X H Z Latched H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance NC = No Change Logic Diagram Please note that this diagram is provided only for the understanding of logic operatio and should not be used to estimate propagation delays. www.fairchildsemi.com 2

Absolute Maximum Ratings(Note 1) Storage Temperature 65 C to +150 C Ambient Temperature under Bias 55 C to +125 C Junction Temperature under Bias 55 C to +150 C V CC Pin Potential to Ground Pin 0.5V to +7.0V Input Voltage (Note 2) 0.5V to +7.0V Input Current (Note 2) 30 ma to +5.0 ma Voltage Applied to Output in HIGH State (with V CC = 0V) Standard Output 0.5V to V CC 3-STATE Output 0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (ma) Recommended Operating Conditio Free Air Ambient Temperature Supply Voltage 0 C to +70 C +4.5V to +5.5V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditio is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. 74F843 DC Electrical Characteristics Symbol Parameter Min Typ Max Units V CC Conditio V IH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal V IL Input LOW Voltage 0.8 V Recognized as a LOW Signal V CD Input Clamp Diode Voltage 1.2 V Min I IN = 18 ma V OH Output HIGH 10% V CC 2.5 I OH = 1 ma Voltage 10% V CC 2.4 I OH = 3 ma V Min 5% V CC 2.7 I OH = 1 ma 5% V CC 2.7 I OH = 3 ma V OL Output LOW Voltage 10% V CC 0.5 V Min I OL = 24 ma I IH Input HIGH Current 5.0 µa Max V IN = 2.7V I BVI Input HIGH Current Breakdown Test 7.0 µa Max V IN = 7.0V I CEX Output HIGH Leakage Current 50 µa Max V OUT = V CC V ID Input Leakage I ID = 1.9 µa 4.75 V 0.0 Test All other pi grounded I OD Output Leakage V IOD = 150 mv 3.75 µa 0.0 Circuit Current All other pi grounded I IL Input LOW Current 0.6 ma Max V IN = 0.5V I OZH Output Leakage Current 50 µa Max V OUT = 2.7V I OZL Output Leakage Current 50 µa Max V OUT = 0.5V I OS Output Short-Circuit Current 60 150 ma Max V OUT = 0V I ZZ Bus Drainage Test 500 µa 0.0V V OUT = 5.25V I CC Power Supply Current 65 90 ma Max 3 www.fairchildsemi.com

AC Electrical Characteristics T A = +25 C T A = 0 C to +70 C Symbol Parameter Units C L = 50 pf C L = 50 pf Min Typ Max Min Max t PLH Propagation Delay 2.5 5.4 8.0 2.0 9.0 t PHL D n to O n 1.5 4.2 6.5 1.5 7.0 t PLH Propagation Delay 5.0 8.5 12.0 4.5 13.5 t PHL LE to O n 2.0 4.7 7.5 2.0 8.0 t PLH Propagation Delay PRE to O n 3.0 7.3 10.0 2.5 11.0 t PHL Propagation Delay CLR to O n 3.0 6.9 10.0 2.5 11.0 t PZH Output Enable Time 2.5 5.0 8.5 2.0 9.5 t PZL OE to O n 2.5 6.1 9.0 2.0 10.0 t PHZ Output Disable Time 1.0 3.6 6.5 1.0 7.5 t PLZ OE to O n 1.0 3.4 6.5 1.0 7.5 AC Operating Requirements T A = +25 C T A = 0 C to +70 C Symbol Parameter Units Min Max Min Max t S (H) Setup Time, HIGH or LOW 2.0 2.5 t S (L) D n to LE 2.0 2.5 t H (H) Hold Time, HIGH or LOW 2.5 3.0 t H (L) D n to LE 3.0 3.5 t W (H) LE Pulse Width, HIGH 4.0 4.0 t W (L) PRE Pulse Width, LOW 5.0 5.0 t W (L) CLR Pulse Width, LOW 5.0 5.0 t REC PRE Recovery Time 10.0 10.0 t REC CLR Recovery Time 12.0 13.0 www.fairchildsemi.com 4

Physical Dimeio inches (millimeters) unless otherwise noted 74F843 9-Bit Traparent Latch 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M24B Fairchild does not assume any respoibility for use of any circuitry described, no circuit patent licees are implied and Fairchild reserves the right at any time without notice to change said circuitry and specificatio. LIFE SUPPORT POLICY FAIRCHILD S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with itructio for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com 5 www.fairchildsemi.com