Silicon Detectors. Particle Physics

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Mitglied der Helmholtz-Gemeinschaft Silicon Detectors for Particle Physics 9. August 2012 Ralf Schleichert, Institut für Kernphysik

Outline Different Cameras Silicon Detectors Taking Pictures in Particle Physics

Different Cameras

Different Cameras Surface Barrier Single-Pixel Camera

Different Cameras Silicon Tracking Telescope Camera

Different Cameras ATLAS Camera CMS Camera

What do all these cameras have in common? They are expensive for the photographer. The photographer is proud to have them. The intuition which picture to take is not implemented. and seriously They all have silicon sensors to take the pictures. They all have the same underlying principle

The Principle

A Brief History of Silicon Cameras 1951 First detectors with germanium pn-diodes (McKay) 1959 Gold Surface Barrier Si-Diode J.M. McKenzie and D.A. Bromley, Bull. Am. Phys. Soc. 4 (1959) 422 1960 Working samples of p-i-n detectors (E.M. Pell) 1961 Lithium drifted thick detectors (J.H. Elliot, NIM 12 (1961) 60) 1964 Use of semiconductor detectors in nuclear physics (G.T. Ewan, A.J. Tavendale) 1980 Planar technology (J. Kemmer, NIM 169 (1980) and NIM 226 (1984) 89) 1980-86 CERN NA11 and NA32 measure charm meson lifetimes with planar Si-detectors > 1990 Europe: CERN: ALEPH, DELPHI, L3, OPAL DESY: H1, HERMES, HERA-B, ZEUS. USA: FermiLab: CDF and D0 > 2000 Europe: CERN ATLAS, ALICE, CMS, LHC-b. USA: SLAC Babar Japan: KEK BELLE

Silicon Strip Detectors: The Birth Fixed target experiment at CERN with a planar diode. First of planar process developed for chip industry.

The birth: NA11 at CERN The aim: Measure lifetime of charm quarks (decay length 30µm)

Silicon Strip Detectors: The Fabrication From sand to silicon detectors.

The Fabrication: Polycristals sand (SiO 2 ) is heated in a furnace to 1650 C and deoxidated to gaseous SiO. SiO reacts to 99 % pure raw silicon. raw silicon is treated chemically to get 100 % pure polycristalline silicon

The Fabrication: Monocrystals

The Fabrication: Planar Process

Silicon Detectors: Fabrication Use very pure material High resistivity Low bias to deplete device Easy of operation, away from breakdown, charge spreading for better position resolution Low defect concentration No extra current sources No trapping of charge carriers Planar fabrication techniques Make p-i-n diode pattern of implants define type of detector (pixel/strip) extra guard rings used to control surface leakage currents metallisation structure effects E-field mag limits max bias

Silicon Strip Detector 6 inch wafer

Silicon Detectors: LEP@CERN and SLAC

Silicon Detectors: DELPHI@LEP (CERN)

Silicon Detectors: CDF@Tevatron (FermiLab)

Silicon Detectors: CMS Tracker@LHC (CERN)

CMS Tracker: Silicon Sensors

CMS Tracker: Logistics

CMS Tracker

CMS Tracker as a Camera

and the picture: ATLAS Camera CMS Camera

Silicon Detectors: Development in Size

The Principle

How to take a picture in particle physics?

Interaction 50 MeV proton beam on a deuterium target

Interaction of Particles with Matter

Silicon Tracking Telescopes Range telescopes with 3 layers of x,y silicon detectors provide 1. E/E particle identification and tracking 2. Energy determination of stopped particles 3. Self-triggering 4. < 1ns time-resolution 5100 µm thick Si(Li) detector 69 µm Si Detektor 300 µm Si detector (is missing in this picture)

Charge Collection and Signal Formation

Processing of Electrical Signals preamplifiers +HV preamplifiers position-sensitive detector p i n +HV BIAS 0 + - + - VSS VDD OutP OutM VDD VSS +LV -LV Capacitive connection of preamplifiers (Bias 250 V - 2 kv) +HV BIAS 0 FGND + - + - FVDD FVSS VDD VSS +FV -FV FVDD FVSS FGND AC Buffer with BLR +LV -LV Floating power supply connection of preamplifiers (Bias 0-100 V) VDD VSS 0 OutP OutM 0

VA32TA2 self-triggering front-end electronics: Number of channels 32 Technology 0.8 µm CMOS Power supply ±2 V Power dissipation 3 mw/channel Linear range 11 MeV (±500fC) Slow shaper (Peaking Time) 2 µs Fast shaper (Peaking Time) 80 ns Minimum Threshold 40 kev (1.8fC) Threshold homogenity 4 kev (0.2fC) Time walk (0.05-11MeV) ~100 ns Time resolution σ < 1 ns Energy resolution (C det =60pF) 890 e - (sigma) Readout frequency 10 Mhz 6.3mm

Before threshold DAC-tuning Max diff. = 1.2 fc (27keV) After threshold DAC-tuning Max diff. = 0.2 fc (4keV) 90mm

MATE3 self-triggering front-end electronics: 64 (128) channel MATE 3 board 90mm Parameters of the MATE 3 front-end chip Number of channels 16 Technology 0.8 µm BICMOS Power supply ±2.5 V Power dissipation 30 mw/channel Linear energy range 50 MeV (± 2220fC) Slow shaper (Peaking Time) 1 µs and 3 µs Fast shaper (Peaking Time) 22 ns Minimum trigger threshold 0.4 MeV (8fC) Time resolution (E>1.5MeV) σ 0.3 ns Energy resolution (C det =60pF) σ = 1530 e - Readout frequency 2 MHz (energy & time) Common stop reset needed

3D-Modeling for Design and Engineering

Bond Technology

Laboratory Infrastructure Nitrogen low humidity boxes Mass spectrometer to check vacuum compatibility Clean room for assembly Test stations for checking electronics Test station for temperature training Vacuum chamber for test and storage

Key components to build the detection system: Detectors with front-end electronics. Cooling system for detectors, pre-amplifiers amplifiers, and front-end electronics in vacuum. DAQ system to provide control and read-out of front- end electronics. Trigger system HV Bias and Low Voltage power supply system Independent monitoring systems Monitoring and control software Interlock protection systems Data analysis

Silicon Tracking Telescope Cooled vacuum electronics Cooling feed-through Detectors Front-end Electronics

Silicon Tracking Telescope in the ANKE target chamber Cluster Target Beam COSY Beam

Detector Calibration: Energy Left Telescope Right Telescope E 1 (300µm) vs. E 2 (300µm) p d p d d d E 2 (300µm) vs. E 3 (5000µm) p p

Detector Calibration: Tracking

Science Result, a picture in particle physics Physics case, experience, infrastructure, and the right team.