Available online at www.pelagiaresearchlibrary.com Advances in Applied Science Research, 2013, 4(4):501-507 ISSN: 0976-8610 DEN (USA): AASRF Physiochemical properties of crystalline etch products for R-39 track detector after α-particles irradiation ussain A. Al-Jobouri 1, Nasreen R. Jber 2, Abbas. Al-Shukrawi 2 and Mazin K. amid 1 1 Department of Physics, ollege of Science, AL-Nahrain University, Baghdad, Iraq 2 Department of hemistry, ollege of Science, AL-Nahrain University, Baghdad, Iraq ABSTRAT The effect of α- particles from radiation source Am-241 with activity 1µi on the nuclear track detector - NTD type R-39, dimensions (28x28x1.2) mm 3 were measured. The measurements included the changes in physical and chemical properties for the solution of etch crystalline products for R-39 after irradiation by α-particles irradiation at two periodic times 0.3 h and 23 h for low and high doses respectively. The changes in organic compounds for etch products were measured by using of FTIR - spectroscopy and transmission electron microscope TEM. FTIR spectroscopy shown there was decrease in the values of transmission percent ratios - Tr of wave numbers 1787, 2800, 839 and 1650 m -1 relative to wave number 792 m -1 respectively with increase of irradiation time of α-particles. The etch products after α-particles irradiation of R-39 detectors were change to low molecular weight organ compounds as a results of degradation bonds and may be formed compounds 2.2-oxy diethanol and 2-propen as the reaction products. Also, shown from transmission electron microscope TEM there was increase in the degradation amount of etching organic compounds with increase of irradiation time of α-particles. While the change in inorganic compounds for etch crystalline products after α- particles irradiation of R-39 detectors were describe by using of polarized optical microscope - PM, which shown from its images there was broken in crystalline layers to small crystal with increase of irradiation time. The physiochemical properties which measured by FTIR spectroscopy and transmission electron microscope TEM for organic etching products were better than the analysis of inorganic crystalline etching products by Polarized microscope-pm. Keywords: R-39, nuclear track detector-ntd, crystalline etch products, α- particles. INTRDUTIN R-39 represent of one type of polymers which employed as a detectors in field of science and technology [ 1, 2, 3]. one of these field was measurement the radiation effects for non-particle radiation as ionizing radiation[4] and particle radiation as ion beam, neutron and α-particle[5], and so named since named nuclear track detector- NTD[6,7]. The main strength of these detectors is that the damage produced by the ionizing particle can be enlarged through chemical etching [8]. These enlarged tracks, and physical properties can be viewed under the optical microscope and fourier transform infrared spectroscopy FTIR [9,10]. Nuclear track detector NTD type R-39 is one of the trade names of the family of Poly Allyl Diglycol arbonate PAD etch track detectors. When it is etched in sodium hydroxide Na solution, a variety of inorganic and organic compounds are formed as the reaction products, which also effect on the thickness of R-39 [11, 12]. Many products were formed after R-39 etched in Na solution as poly allyl alcohol, 2.2-oxy diethanol 2 [13], allyl alcohol, isopropyl alcohol, sodium carbonate, sodium bicarbonate, and 3 ions [ 14, 15 ] as well as crystalline products as nahcolite ( Na3 ), natrite ( Na 2 3 :7 ), thermonatrite (Na 2 3: ), natron (Na 2 3 :10 ) and trona (Na 2 3 Na 3 : 2 )[14]. When the physical and chemical products of crystalline etch products is changes with type of radiation damage. So, in the present work, we examined the 501
ussain A. Al-Jobouri et al Adv. Appl. Sci. Res., 2013, 4(4):501-507 properties of crystalline etch products of R-39 after irradiation with α- particles. The effect of α- radiation on R-39 detector through their crystalline etch products was measured by analysis of organic compounds of these products from using of FTIR spectroscopy [9] and transmission electron microscope TEM [16], when the analysis of inorganic compounds [17] of these products from using of polarized microscope. MATERIALS AND METDS Three pieces sample of nuclear track detector-ntd type R-39 was munched from Xuchang Tianhe Welding Products o., Ltd. aving dimensions ( 28 x 28 x 1.2 ) mm 3. Two pieces samples of R-39 were irradiated by α-particle from Am-241 source with activity 1µi. ne of these samples irradiated at 0.3 h ( for low radiation dose ) and another sample irradiated at 23h ( for high radiation dose). Third sample of R-39 was un-irradiated as a control. Three sample above were dissolved in 200 ml of 6:0 M sodium hydroxide - Na solution contained in a 300 ml Pyrex beaker. The beaker was placed in a water bath maintained at 70.2-70.3 and shacked for 70 h to prepare a super-saturated solution of the etch products. The separation of organic compounds solutions for R- 39 during etching process for three sample above were sampled as E, ER 1 and ER 2 for un-irradiated, 0.3 h α- irradiated and 23 h α- irradiated respectively. E, ER 1 and ER 2 were separated in pure forms by solvent extraction with 50 ml diethyl ether with the aid of 250 ml separating funnel for three steps, then the organic extracting evaporated at room temperature up to 2 ml concentrate sample, and the FTIR spectra in the range (4000 400 ) m -1 were recorded using Nal sandwich cell on FTIR instrument, model - 8000 Shimadzu spectrophotometer. Separation of organic compounds was also analysis by transmission electron microscope - TEM, Model - Philips M10 with an optimal operating voltage of 200 kev, to show the images of organic compounds after irradiation comparing with un-irradiated samples. The separation of inorganic compounds for E, ER 1 and ER 2 by splitting the aqueous layer samples and left this layer to evaporate at room temperature to grow the formed inorganic products for 2 months, different needle crystalline for each sample were separated manually upon a glass microscope for image analysis by polarized optical microscope PM, model Meiji MT9000. The texture of the compounds were observed using polarized light with crossed polarizer, the sample being prepared as a thin film sandwiched between a glass slide and a cover slip. A camera Lumenera was installed on the polarizing microscope. RESULTS AND DISUSSIN Figure 1 shown the FTIR spectrum at the wave number rang 4000-400 m -1 for chemical etching products of E, ER 1 and ER 2 samples for un-irradiated, 0.3 h irradiated and 23 h irradiated of R-39 respectively. The FTIR spectrum for E sample, show the presence of band at 1787.9 m -1 due to the stretching of carbonyl group of ester and band at 839 m -1 for out of plane bending, these two band also appeared for ER 1 while this two bands disappeared for ER 2, which can attributed to the decomposition of compound ER 2 by the action of radiation and converted to another compounds (alcohol and ether). ther bands like aliphatic - stretching at 2800 m -1 and = stretching at 1650 m -1 having small effect relative to wave numbers 1787.9 m -1 and 839 m -1. As we see from figures all the functional group decreases this due to as we said the decomposition of compound to lower molecular mass alkane during etching of R-39, as shown in figure 2. The FTIR spectra show the appearance of stretching group for samples E, ER 1 and ER 2, because the reactant and the products contain hydroxyl group. Also from the spectra we have bands for carbonyl stretching at 1787.9 cm -1 for sample E and ER 1 and disappeared for sample ER 2 this can be explain as follows : sample E contain two carbonyl groups, after radiation produce sample ER 1 which contain one carbonyl group, while sample ER 2 don t have carbonyl group as show in figure 2. Table 1 show the wave numbers and assignment for crystalline etch products for E, ER 1 and ER 2 of R-39 detector measured by FTIR spectroscopy, which shown the mains bonds still appear with increase of irradiation time at wave numbers 2800, 1787, 1650, 839 m -1 as wall as to another wave numbers 3300, 1402, 1109 m -1. 502
ussain A. Al-Jobouri et al Adv. Appl. Sci. Res., 2013, 4(4):501-507 Fig. 1 : Transmission percent T% from FTIR spectrum at wave number range 4000-400 m -1 for organic etching products of E, ER 1 and ER 2 samples after α particle irradiated of R-39 detector respectively. A: un-irradiated, B: 0.3 h irradiated, : 23 h irradiated + 2 - p r o p e n - 1 - o l 2, 2 - x y d i e t h a n o l Fig. 2 : Scheme for the possible positions which are subjected to cleavage by the hydroxide ion [ 13]. 503
ussain A. Al-Jobouri et al Adv. Appl. Sci. Res., 2013, 4(4):501-507 Table 1 : Wave numbers m -1 and assignment crystalline etch products of for chemical etching products of measured by FTIR spectroscopy as per Figure 1 R-39 detector ES (m -1 ) 3300 3193 2800 2761 1787.9 1650 1402 1109 1043 839 769 ESR 1 (m -1 ) 3300 3192 2800 2761 1787.9 1650 1400 1109 1043 839 769 ESR 2 (m -1 ) 3348 3190 2860 1635 1577 1492 1367 ---- 1134 ---- 794.6 Assignment stretching =- stretching Symmetric stretching Symmetric stretching = stretching = stretching of vinyl group bending - bending - bending -- stretching -- stretching - rocking out of plane - rocking out of plane Figure 3 show the transmission ratio Tr of the wave numbers 1787, 2800, 839 and 1650 m -1 relative to wave number 792 m -1 for each samples of E, ER 1 and ER 2 samples of R-39 detector. Transmission ratios T r of the wave numbers 1787, 2800, 839 and 1650 m -1 named to Tr 1, Tr 2, Tr 3 and Tr 4 calculated by following equations respectively. * Tr 1 =, Tr 2 = Tr 3 =, Tr 4 = (1) The values of Tr 1, Tr 2, Tr 3 and Tr 4 were dropping with increase of time of irradiation of α- particles as shown in fig. 3. Fig. 3 : Transmission percent ratios Tr 1, Tr 2, Tr 3 and Tr 4 (1) for wave numbers 1787, 2800, 839 and 1650 m -1 relative to wave number 792 m -1 respectively. E, ER 1 and ER 2 samples to un-irradiated, 0.3 h irradiated and 23 h irradiated for α particle irradiation of R-39 detector respectively Tr 1 and Tr 3 for = group stretching and - group rocking respectively were a good agreement for radiation response better than Tr 2 and Tr 4 for group starching and = respectively, figure 3. For high doses of α- radiation at time of irradiation more than 23 h represent degradation for all chemical etching products to low organic compound as appearing the stability of Tr 1, Tr 2, Tr 3 and Tr 4 after the irradiation time 23 h. And the degradation of organic compounds with increase of irradiation time was clear appearing in the images of transmission electron microscope - TEM as shown in figure 4. 504
ussain A. Al-Jobouri et al Adv. Appl. Sci. Res., 2013, 4(4):501-507 Fig. 4 : Transmission electron microscope TEM* images for organic etching products of E, ER 1 and ER 2 samples after α particle irradiated of R-39 detector respectively. A: un-irradiated, B: 0.3 h irradiated, : 23 h irradiated. * Transmission electron microscope TEM model Philips M10 The average diameter ranges of organic compounds which measured by TEM for sample B and were 70-90 nm. The α-radiation effect below irradiation time 0.3 h, figure 4 may be assessment the radiation effect for low doses by measured of relative transmission percent Tr 1 and Tr 3 for 1789 and 1650 m -1 respectively equivalent to image analysis process by programming software for diameter ranges. The PM - analysis of inorganic compounds of chemical etching products were appear these compounds as layers at un-irradiated samples as shown in the image A for E sample, figure 5. When α-irradiation at time 0.3 h for ER 1 sample the crystalline layers were broke to small crystal as shown in the image B for ER 1 sample. while α- irradiation at time 23 h these small crystal were degradation to vary small crystal as shown in image for ER 2. The degradation of small crystals in image, Figure 5 also may be measured by image analysis process using programming software to produce good agreements which reflected the effect of α- radiation on R-39 detector. From this study shown the properties of chemicals etching products after α-irradiation R-39 detector with α- particles for 0.3 h and 23 h was change depended on the time of radiation, and these properties measured by FTIR spectroscopy and transmission electron microscope TEM for organic etching products were better than the analysis of inorganic crystalline etching products by Polarized microscope - PM. 505
ussain A. Al-Jobouri et al Adv. Appl. Sci. Res., 2013, 4(4):501-507 Fig. 5 : Polarized optical microscope PM* images for inorganic crystalline etching products of E, ER1 and ER2 samples after α particle irradiated of R-39 detector respectively. A: un-irradiated, B: 0.3 h irradiated, : 23 h irradiated. *Polarized optical microscope PM, model - Meiji MT9000. NLUSIN The physiochemical properties which measured by FTIR spectroscopy and transmission electron microscope TEM for organic etching products for R-39 track detector after α- particles irradiation were better than the analysis of inorganic crystalline etching products by Polarized microscope-pm. REFERENES [1] Khan A, Qureshi, IE. Radiat Meas, 1999, 31, 25. [2] Buford Price P., 2005, Radiation Measurements 40, 146. [3] Nada F. Tawfiq, Lamya T. Ali, ussain A. Al-Jobouri, J Radioanal Nucl hem, 2013, 295, 671. [4] Renu Guptaa, V. Kumara, P.K. Goyala, Shyam Kumara, P.. Kalsib and Sneh Lata Goyalc, Advances in Applied Science Research, 2011, 2 (1): 248-254 [5] A. M. Vatsa, R. Adamu, A. K. Abubakar, Y. I. Zakari and U. Sadiq, Advances in Applied Science Research, 2013, 4(3), 338-343 [6] uda R. Algaim, Rifat M. Dakhil and Isa J. Al-Khalifa, Advances in Applied Science Research, 2012, 3 (2), 950-961 [7] Thaer. M. Salman and Muntadher. A. Qasim, Advances in Applied Science Research, 2013, 4(1):105-112 [8] usaini SN, Khan EU, Khattak NU, Qureshi AA, Malik F, IE, Qureshi IE, Karim T, Khan A, Radiation Measurements, 2002, 35, 3. [9] hong S, Ishak I, Mahat R, Amin YM., Radiation Measurements, 1997, 28, 19. [10] ussain A. Al-Jobouri, Sulaiman JMA, SJ Ahamed, Journal of Al-Nahrain University, 2012. 15, (4), 318. [11] Malik F, Khan EU, Qureshi IE, usaini SN, Sajid M, Karim S, Jamil K., Radiation Measurements, 2002, 35, 301. [12] Mukhtar Ahmed Rana., Radiation Measurements, 2012, 47, 50. 506
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