Scanning Near-Field Infrared Microscopy (SNFIM) LPC, Newport News, VA, January 17, Edward Gillman

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Scanning Near-Field Infrared Microscopy (SNFIM) LPC, Newport News, VA, January 17, 00 Edward Gillman (gillman@jlab.org)

Scanning Near-Field Optical Microscope (SNOM) The scanning near-field optical microscope (SNOM) is capable of revealing features smaller than the diffraction limit because it relies on nearfield probing rather than beam focusing. Antenna Micropipette tips Transparent AFM tips Optical Fibers (Wave Guides) Opaque AFM Tips (Apertureless Probes) Sensitive Detector or Detector Array

Scanning Near-field Optical Microscope (SNOM) E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weineran and R. L. Kostelak, Science 51, 1468 (1991). SEM Optical Microscope SNOM SNOM (Fourier Filtered)

A Near-Field Example We Have Already Used! Harmonic Lasing of the FEL Spectrum observed from fifth harmonic lasing of the IR-DEMO FEL.0 INTENSITY (arbitrary units) 1.5 1.0 0.5 0.0 100 1030 1040 1050 1060 WAVELENGTH (nm) Fundamental = 5164nm = 1041nm For ka 1and normal incidence T Classical Electrodynamics, nd Ed., J. D. Jackson, John Wiley and Sons (1975). 1 / 0 J 1 ka 1 ( kasin ) m0 J m1 sin (ka) sin d

Apertureless Scanning Near-field Optical Microscope (SNOM) Optical Antenna At sufficiently high frequencies any inhomogeneties exposed to a field becomes a source of radiation; an antenna. This radiation can be detected many wavelengths from its origin in the far-field. In the farfield the scattering observed depends on the on near-field zone that surrounds the source, its dielectric and magnetic properties and the mode of excitation.

Complex Dielectric Constant Z f 4 πχ 1 ω ε iω ω ω m 4 πne 1 ω ε iω ω ω, i i e 1 1 0 0 i i i i t i γ f e γ m e e t e m E x E E x x p E x x x x For N molecules per unit volume and f i electrons per molecule with binding frequency i and damping constant i :

Principles of the SNFIM Experiment M.J.O. Strutt, Ann. Physik, V I, 71-77 (199). D. W. Pohl Scanning Near-Field Optical Microscopy (SNOM), in Advances in Optical and Electron Microscopy, 41-43

Scattering and Extinction Cross-section B. Knoll and F. Keilmann, Nature 399, 134 (1999). =f(k, s, t,d,a) α eff β α ε sample sample 4 πa 3 1 ε ε tip tip 1 α 1 β αβ 1 16 πa d ε 1 3 σ a = tip radius d = tip sample distance k 4 α eff 6 π kim α d d < d eff

Jefferson Lab FEL Fred Dylla, Friday, 9:40 Room 113 (EL+SE+TF-FrM5) Light Sources High Power Tunable Infrared Laser Source M.Würtz a, S.Borneis b, T.Kühl b, F.Laeri a, T.Tschudi a a Institut für Angewandte Physik, TU Darmstadt; b GSI Darmstadt Quantum Confinement Laser DEOS MID-IR- RF- excited,frequency-doubled-co- waveguide laser system (4.6-5.8 m) MID-INFRARED (NARROW GAP) SEMICONDUCTOR LASER EFFORT -5 m - Optical Science and Technology Center University of Iowa

Scanning Near-field Infrared Microscopy A. Piednoir, C. Licope, and F. Creuzet, Opt. Commun. 19, 414 (1996). - Hollow metal wave guide. (FEL) M. K. Hong, A. G. Jeung, N. V. Dokholyan, T. I. Smith, H. A. Schwettman, P. Huie and S. Erramilli, Nucl. Instrum. Methods Phys. Res. B 144, 46 (1998). - Application in Biophysics; Imaging single living cells. (FEL). C. A. Michaels, S. J. Stranick, L. J. Richter and R. R. Cavanagh, J. Appl. Phys. 88, 483 (000). Metal coated, tapered single mode fluoride fiber and broad bandwidth, ultrafast IR laser. B. Knoll and F. Keilmann, Nature 399, 134 (1999). Tunable CO laser and SPM tip.

Limitations of Light Sources watts/cm -1 /mm /sr 1E8 1000000 10000 100 1 0.01 1E-4 1E-6 1E-8 1E-10 Brightness of IR Sources 000K Black Body JLab FEL NSLS U4IR 800mA 90x90 mr JLab FEL Lasing 1 10 100 1000 10000 frequency (cm -1 ) Watts/cm -1 0.1 0.01 1E-3 1E-4 1E-5 1E-6 1E-7 1E-8 1E-9 1E-10 1E-11 1E-1 1E-13 1E-14 1E-15 1E-16 1E-17 Signal into a 0.01 micron area at f/1 NSLS JLab FEL Detector "noise" 100K Black Body 1000 000 3000 4000 5000 Wavenumbers (cm -1 ) Coupling of Infrared Radiation to an optical fiber. Incident power on an SPM tip resulting in a change of mechanical properties. Maximum power into a 10 spot is ~100mW

Experimental Method The proposed experiment will use an aperture-less design based on the work of Knoll and Keilmann 1. In this experiment infrared radiation incident on a metal-coated AFM tip acts as the antenna. The infrared radiation is scattered into a detector in the far field while a sample is being scanned in close proximity to the tip (near-field). 1 B. Knoll and F. Keilmann, Nature, 399, 134 (1999).

Experimental Method Two images are collected simultaneously, the AFM image, which reveals structural information about the sample and the infrared image, which supplies chemical information from absorbing species. At the conclusion of the scan the images are superimposed and the chemistry is correlated with the features observed in the AFM scan.

Schematic Diagram

Scanning Near-field Infrared Microscopy

Extracting the Signal Lock-in Technique: The signal from the infrared detector is modulated by the resonant frequency of the cantilever (~300 khz), which is set by an external oscillator. The reference from the external oscillator is used by the lock-in to generate a sine wave that is multiplied by the signal from the IR detector. Phase Jitter (arb units) JLab FEL Drive Laser Phase Noise September 001 M. Shinn 0 1000 000 3000 Frequency (Hz)

SNFIM Data MNA * /Si(100) 5140nm Trial 1 Trial In the micrographs above the images on the left are from the infrared detector. Enhanced contrast due to IR absorption is indicated by the two blue circles and the blue arrow. The fact that this experiment could be repeated is a good indication that this is truly due to IR contrast and is not an artifact of the scan. *MNA=-methyl-4nitroanaline

Where do we go from here? Improved optics. LN cooled InSb focal plane array for simultaneous acquisition of infrared spectra. C. A. Michaels, S. J. Stranick, L. J. Richter and R. R. Cavanagh, J. Appl. Phys. 88, 483 (000). New Laser? Wavelength modulation?

SNFIM Acknowledgements This work was supported by U.S. DOE Contract No. DE-AC05-84-ER40150, ONR Contract No. N00014-99-1-093, the Commonwealth of Virginia and the Laser Processing Consortium. Chuck Mooney, JEOL, USA Shin-Ichi Kitamura, JEOL, Ltd. Gwyn Williams, Jefferson Lab Kyeongwoo (Peter) Nam, NSU