The Second Half Year 2017 PAL-XFEL Call for Proposals Summary Information for Submitting Proposals We encourage scientists from all over the world to submit applications for beam time proposal to utilize the PAL-XFEL facility between October and December 2017. Currently, the PAL-XFEL has three experimental stations, two for hard X-rays (XSS: X-ray Scattering and Spectroscopy & NCI: Nano Crystallography and Imaging) and one for soft X-rays (SSS: Soft X-ray Scattering and Spectroscopy). Access to the PAL-XFEL is open to the international community, but we are sorry to report that all foreigners should collaborate with Korean scientists as a local contact for a limited time. If possible, all applicants should first contact the PAL-XFEL staff in advance to discuss the experimental details and submit beam time application. There is no cost to submit proposals, but if you are conducting an experiment as a user at the PAL-XFEL, you will have to pay a certain amount in accordance with Korean Government Policy. Please register as a user first and submit an application form of the PAL-XFEL proposal via the website (http://pal.postech.ac.kr/paleng/). Proposal Preparation Guidelines PAL-XFEL is scheduled to support user experiments in the second half of 2017 with the following six scientific instrumentations. 1. FXS (Femtosecond X-ray Scattering) @ XSS 2. FXL (Femtosecond X-ray Liquidography) @ XSS 3. CXI (Coherent X-ray Imaging) @ NCI 4. SFX (Serial Femtosecond X-tallography) @ NCI 5. XES/XAS (X-ray Emission/Absorption Spectroscopy) @ SSS 6. FTH (Fourier Transform Holography) @ SSS In addition to the experiments classified as Standard Configuration that meet the current PAL-XFEL instrument setup requirements, we also
welcome applications for Non-standard Configuration that require an installation of user equipments or unusual experimental beam conditions. In this case please proceed with discussion with the PAL-XFEL staff in advance. ㅇ Experiment Schedule for the 2nd half year 2017 - Period for a call for proposals : July 4 - July 31, 2017 - Period for User Experiments : October - December, 2017; 40 Days It consists of a total of 7 runs, each of which is supported for 6 days except the last one (4 days).
ㅇ Experimental Instrumentations/Stations & Contact Persons For details, please refer to the table of description of instrumentations at the end of this document. We strongly recommend that you contact one of the contact persons listed below to discuss the details of technical issues and specifics related to the experiment. The name shown as asterisk is the main contact person. Regardless of who you contact, all relevant instrumentation personnel will discuss the matter and provide a unified answer to your questions. XSS (X-ray Scattering & Spectroscopy) Experimental Station - FXS (Femtosecond X-Ray Scattering) fs Photon-Matter Interaction Dynamics *Dr. Sunam Kim (ksn7605@postech.ac.kr) - FXL (Femtosecond X-Ray Liquidography) fs Solution Scattering & X-ray Absorption Spectroscopy (XAS) *Dr. Jae Hyuk Lee (jaehyuk.lee@postech.ac.kr) NCI (Nano Crystallography & Coherent Imaging) Experimental Station - CXI (Coherent X-ray Imaging) at NCI station Nano-Crystal/Bio-Sample Imaging & fs Small Angle X-ray Scattering *Prof. Changyong Song (cysong@postech.ac.kr) Dr. Sangsoo Kim (sangsookim@postech.ac.kr) - SFX (Serial Femtosecond X-tallography) at NCI station Protein Crystallography *Dr. Ki Hyun Nam (structure@postech.ac.kr) Dr. Jaehyun Park (jaehyun.park@postech.ac.kr) Prof. Changyong Song (cysong@postech.ac.kr) 1. When applying for a SFX proposal, you must specify whether you will apply for the Protein Crystal Screening (PCS) Procedure. 2. Regular beam time will be provided in the future when acquiring data from PCS.
3. Additionally, regular beam time can be provided for high-quality proposals that do not require PCS beam time. Tender(> 2.5 kev) XAS Experiment *Dr. Jae Hyuk Lee (jaehyuk.lee@postech.ac.kr) SSS (Soft X-ray Scattering & Spectroscopy) Experimental Station - XES/XAS (X-ray Emission/Absorption Spectroscopy) at SSS station fs X-ray Emission Spectroscopy & Fluorescence Mode XAS - FTH (Fourier Transform Holography) at SSS station Holography Imaging & fs Transmission Mode XAS *Dr. Soonnam Kwon (snkwon@postech.ac.kr) Dr. Hyeong-Do Kim (hdkim6612@postech.ac.kr) Dr. Sang Han Park (sh0912@postech.ac.kr) User Information ㅇ Obligations - For all kinds of beam time proposals, an end of run report should be submitted to the user office of PAL within one year of completing the experiment. - PAL registration : all users to be registered, radiation safety, etc ㅇ PAL charges all users. For non-proprietary research, the fee is KRW 250,000 per shift(12 hrs). For proprietary research, the fee is KRW 50,000,000 per shift.
PAL-XFEL Source Characteristics & Instrumentations ㅇ Hard X-ray FEL Beam Characteristics - X-ray Energy = 2.50 12.7 kev - Repetition Rate = 10 Hz, 30 Hz - Pulse Duration < 20 fs RMS - Unfocused Beam Size < 500 μm - Bandwidth < 0.4 % - Photon Flux > 5.0 x 10 10 phs/pulse @ 9.7 kev - XFEL-Laser Timing Jitter < 60 fs FWHM w/o Timing Tools ㅇ Soft X-ray FEL Beam Characteristics - X-ray Energy = 300 1200 ev - Repetition Rate = 10 Hz, 30 Hz - Pulse Duration < 90 fs RMS - Bandwidth < 0.4 % - Photon Flux > 5 x 10 10 phs/pulse for all of the energy ranges - XFEL-Laser Timing Jitter : TBD ㅇ Optical Laser Beam Characteristics - Ti:Sapphire Oscillator with Regenerative Amplifier @ 800 nm - Pulse Duration = 100 fs FWHM @ 800 nm, XSS & NCI 40 fs FWHM @ 800 nm, SSS - Pulse Energy @ XSS & NCI Sample Position : < 5.0 mj @ 800 nm < 1.2 mj @ 400 nm (SHG) < 0.7 mj @ 266 nm (THG) - Pulse Energy @ SSS Sample Position : < 0.4 mj @ 800 nm < TBD mj @ 400 nm (SHG) < TBD mj @ 266 nm (THG) - Angle Between Laser and XFEL : Non-Collinear (~10 ) @ XSS & NCI Collinear & Non-Collinear (~5 ) @ SSS ㅇ Description of the Instrumentations for User Experiments
FXS & FXL @XSS CXI @NCI SFX @NCI Descriptions fs X-ray Scattering and Spectroscopy (Optical Laser Pump-XFEL Probe) Available XFEL Energy = 5.0 12 kev Temporal Resolution < 200 fs CRL Focused XFEL Beam Size (> 10 μm H x 10 μm V) Hexapod Based 2-Circle & 4-Circle Diffractometer 0-D Detector (Si-PIN Diode) 1-D Detector (Gotthard : 50 μm & 1280 Channels) 2-D Detector : MPCCD 0.5 M, Rayonix LX-255 HS Sample Environment : Air Ambient, Room Temperature & ~ 100 K (Cryostream) Vacuum (< 10-6 Torr) Displex System (10 450 K) Nano-Crystal/Bio-Sample Imaging Time-Resolved Imaging & Small Angle X-ray Scattering (Optical Laser Pump-XFEL Probe) Available XFEL Energy = 5.0-10 kev Temporal Resolution < 500 fs KB Focused XFEL Beam Size (> 5.0 μm H & 7.0 μm V @ E = 5.5 kev) Nano-Crystal Sample Preparation Sample Chamber in High Vacuum (< 10-4 Torr) Sample Delivery System for Fixed Target @ 10 & 30 Hz MPCCD 1M Pixel Detector Data Acquisition & Data Analysis Tools Serial Femtosecond Crystallography Available XFEL Energy = 8.0-10 kev (SFX) > 2.5 kev (Tender XAS) KB Focused XFEL Beam Size (> 2.0 μm H & 2.0 μm V) Bio Preparation Lab. Sample Chamber in a He Gas Environment Sample Delivery System : LCP Injector, GDVN Liquid Jet Injector, HPLC Pump Rayonix MX-225HS Detector Data Acquisition & Data Analysis Software (Cheetah, Psocake, NanoPeakCell, CrystFEL)
XES/XAS @SSS FTH @SSS Descriptions fs X-ray Emission Spectroscopy Fluorescence Mode Absorption Spectroscopy (Optical Laser-Pump XFEL-Probe) Soft X-ray Spectrometer (Plane VLS Grating Type, 200-1200 ev, Resolving Power ~ 3000 @ 500 ev) Solid State Sample with L-He Cooling Capability Magnetic Domain & Nano-Materials Imaging (Fourier Transform Holography) fs Transmission Absorption Spectroscopy (Optical Laser-Pump XFEL-Probe & XMCD) In-Vacuum CCD Camera (PI-MTE:2048B) KB Focused XFEL Beam Size (> 10 μm H x 10 μm V) Solid State Sample Circular Polarizer (Ni, Fe, Co) Magnetic Field < 0.15 T
[Reference 1] PAL-XFEL Beam time proposal (Less than 4 pages) 1. Title 2. Abstract 3. Research team Name, affiliation and position with email address PAL registration (all members to be registered, radiation safety, etc) Brief description on members: Expertise (experiment, data acquisition, data analysis, sample handling, etc.) Local contact (required for a foreign group) 4. Proposal details Scientific uniqueness of the proposal research Relevance to the XFEL Expected scientific or industrial impact 5. Supporting materials References Figures (if any) Preliminary results (if any) 6. Plan for the experiment Research method (includes preferred experimental station, x-ray energy, etc.) Apparatus required Apparatus to bring in (if any) Samples (names, quantity, safety clearance, etc.) Number of shifts (12 hours) required For a smooth beam time allocation, please specify the period during which the experiment can not proceed.