Radiation Hardness Study on Double Sided 3D Sensors after Proton and Neutron Irradiation up to HL-LHC Fluencies

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Radiation Hardness Study on Double Sided 3D Sensors after Proton and Neutron Irradiation up to HL-LHC Fluencies D M S Sultan 1, G.-F. Dalla Betta 1, R. Mendicino 1, M. Boscardin 2 1 University of Trento and INFN, Italy 2 Fondazione Bruno Kessler (FBK), Italy INFN Laboratori Nazionali di Legnaro (Padova)

OUTLINE Introduction & Motivation Results from the electrical characterizations: Passing-Through Columns (IBL technology) Modified Non-Passing-Through Columns Comparative Investigations Conclusion

p D M S SULTAN S. Parker et. al. NIMA 395 (1997) 328 C. Kenney et. al. IEEE TNS 48(6) (2001) 2405 n n Introduction p 3D Radiation Sensors ADVANTAGES: Electrode distance and active substrate thickness decoupled: - Low depletion voltage (~10 V, before irradiation) - Fast response times - smaller trapping probability after irradiation High radiation hardness Cell Shielding Effect Active Edge and Slim-Edge Technology Sensitivity up to few µm from the edge DISADVANTAGES: Non uniform spatial response Higher capacitance with respect to planar Complicated technology (wafer bonding, DRIE, etc.) support wafer oxide C. Kenney et. al. IEEE TNS 46(4) (1999) 1224

Double-sided 3D sensors FBK (Trento, Italy) CNM (Barcelona, Spain) A. Zoboli et. al., IEEE TNS 55(5) (2008), 2775 G. Pellegrini et. Al. NIMA 592(2008), 38 Support wafer is not used reduced process complexity First Joint Production of 3D pixels accomplished for ATLAS IBL (FBK & CNM) Back-side accessible Easier assembly within a detector system Active edge not feasible Slim edge

FBK 3D Pixels for ATLAS IBL Electrical tests FEI4 G. Giacomini, et al., IEEE TNS 60(3) (2013) 2357 p-irrad, 5e15 n eq cm -2 The ATLAS IBL Collaboration, JINST 7 (2012) P11010

Charge collection in FE-I4 pixels with 90 Sr beta source S. Grinstein, Sh. Tsiskaridze, A. Micelli, C. Gemme

Breakdown voltage in FBK sensors In FBK 3D sensors the intrinsic breakdown occurs at the n + /p-spray junctions G. Giacomini et. al., IEEE TNS 60(3) (2013) 2357 P-spray doping reduction improved V bd from ~20 V (ATLAS08) to >60 V (IBL production, A09-II) For further improvements, it is important to learn more about breakdown behavior High P-Spray Lower Low P-Spray P-Spray Most critical regions for breakdown

Field-Plate Effect on Electric field Efield @ 35V w/o FP w FP M. Povoli et al, NIMA 699 (2013) 22 26 Comparable electric field peaks on front side and back side for std. structures The field-plate helps in redistributing and lowering the E-field on the front side (breakdown on the back side )

Improved design Most critical zone for VV bd removed Intrinsic Breakdown Increases up to 70 V - 130 V M. Povoli et al, NIMA 699 (2013) 22 26 Dalla Betta et al, (NSS/MIC), 2013 IEEE

Since breakdown voltage improves with ionizing dose (higher oxide charge), the same improvement should be observed after irradiation Is it also better after irradiation? Dedicated irradiation tests were performed to check this point a) 800 MeV protons at LANSCE facility Thanks to Martin Hoeferkamp and Sally Seidel b) TRIGA reactor neutrons at JSI Ljubljana, Slovenia Thanks to Vladimir Cindro

Layout Diversity 90.14 µm 56.6 µm Field Plate 67.3 µm Considered Simulation zone Different shapes, sizes and column configurations Different distances between n+ and p+ regions With and without field-plate (Passing Through Col. 3D Si Sensors) & Only with field plate (Non Passing Through Col. 3D Si Sensors)

IBL 3D Passing-Through Sensor with Proton Irrad. DATA: R. Mendicino et al, V bbbb has shown to be dependent of Layout Diversity, Field-plate inclusion and Irrad. fluencies. Field-plate improves to have Greater Breakdown Voltage. High fluencies evidently improves the breakdown voltage Field-plate has maintained on all Modified IBL process and next generation

IBL 3D Passing-Through Sensor with Proton Irrad. Measured at 1KHz Depletion Voltage increases around 100 V for proton irradiation fluencies up to 2x10 15 nn eeee /cccc 2

IBL 3D Passing-Through Sensor with Neutron Irrad. DATA: R. Mendicino et al, Breakdown voltage dependance upon different neutron irrad. fluencies has addressed Leakage current increases with higher fluencies Smooth increase of breakdown voltage shows quite good agreement with expectation (low gamma ray background Lower Surface Damage) Lower breakdown achieved here in comparison to the effect from Proton irrad. anticipates the contribution from bulk damage mostly!

IBL 3D Passing-Through Sensor with Neutron Irrad. Measured at 1KHz Depletion voltage increases with higher irradiation fluences At high fluencies, full depletion voltage can not be achieved due to breakdown FEI4 @ 5e 1111 Good agreement with expectation!!

Current (µa) 5 D M S SULTAN 3D Non Passing-Through Sensor with Proton I-V of FEI4 @ Different Proton Irrad. Fluencies [-10 o C] 15 Breakdown Voltage, VV FEI4 LANCSE 7.3e 15 bbbb, increased upto 260V for FEI4 & 290V for CMS at higher FEI4 LANCSE 4e 15 irrad. Dose FEI4 LANCSE 6.9e 14 For CMS, VV bbbb has seen ~290 V just for 10 CMS LANCSE 4e 15 nominal 4ee 15 nn eeee /cccc 2 CMS LANCSE 6.9e 14 At VV bbbb,sharp increase in the current points to probable n-col. tip-effect FEI4 @ 4e15 0 0 50 100 150 200 250 300 Voltage (V) SHR Agrreement up to large voltages near to VV bbbb both CMS & FEI4 Activation Energy has considered 1.21 ev.

3D Non Passing-Through Sensor with Proton Measured at 1KHz Measured at 1KHz FEI4 @ 6.9e14 FEI4 @ 4e15 FEI4 @ 7.3e15 Full depletion voltage shifts at higher voltage with the appliance of higher irrad. Dose. For the fluence, 5ee 15 nn eeee /cccc 2, it is evedent that Full depletion voltage shifts to >~100V Bias Operation range becomes limited at higher fluencies At more LH-HLC fluence, this effect would appear more adversely.

3D Non Passing-Through Sensor with Neutron Irrad. Breakdown Voltage, VV bbbb, reaches up to 200 V at higher neutron Irradiation fluencies @ 10 16 nn eeee /cccc 2 Neutron irrad. VV bbbb is lower than Proton irrad. Still the sharp breakdown appeared. Arrhenius plot has shown quite good agreement with SRH theory up to large voltage

3D Non Passing-Through Sensor with Neutron As expected, full depletion voltage appears at very near to Breakdown Voltage, VV bbbb. Surface damage is comparatively Smaller in Neutron Irrad. than Proton Irrad. 179.8 V 201.8 V Increment of irrad. dose increases the full depletion voltage Significantly, limiting bias operating range!

Voltage(V) 200 250 200 150 100 50 D M S SULTAN Passing Through with Proton Irrad. FEI4 Breakdown FEI4 Depletion CMS Breakdown CMS Depletion ~50 V (Approx. operating bias voltage range) Depletion Voltage Comparative Investigations Breakdown Voltage 0 0 1 2 3 4 5 Fluence x 10 15 Passing Through with Neutron Irrad. Voltage(V) 300 250 200 150 Non Passing Through with Proton Irrad. ~135 V (Approx. operating bias voltage range) Breakdown Voltage ~80 V (Approx. operating bias voltage range) 100 FEI4 Breakdown 50 Depletion FEI4 Depletion Voltage CMS Breakdown CMS Depletion 0 0 2 4 6 8 10 12 Fluence x 10 15 Non passing Passing Through with Neutron Irrad. 300 Voltage(V) 150 100 50 Fully depletion voltage appears almost at V bbbb FEI4 Breakdown FEI4 Depletion 0 0 1 2 3 Fluence 4 5 6 x 10 15 Voltage(V) 250 200 150 100 50 FEI4 Breakdown FEI4 Depletion Breakdown Voltage ~19 V (Approx. operating bias voltage range) Depletion Voltage 0 0 2 4 6 8 10 12 Fluence x 10 15

Conclusion The extended electrical characterization of IBL and modified 3D-DDTC sensors of FBK 4-inch tech. has been shown up to large fluencies The critical analysis of IBL 3D batches limitation regarding V bd has been addressed Ongoing limitation of Modified IBL 3D batches has pointed to n-column tip effect Modified technology showed promising candidate for complying the radiation hardness of foreseen HL-LHC Charge collection efficiency within new non-passing through technology yet to be investigated.

Thank You for Paying Your Attention!

Backup Slides

Marco Povoli et al, Impact Ionization effect (@ Pre-Irrad. Condition) on leakage current was widely seen on Passing Through Col. 3D Sensors at lower temperature

Jiaguo Zhang, PhD Thesis, University of Hamburg, 2013