65536-word 16-bit CMOS UV Erasable and Programmable ROM Description The Hitachi HN27C1024H series is a 1-Mbit (64-kword 16-bit) ultraviolet erasable and electrically programmable ROM. Fabricated on new advanced fine process technique, the HN27C1024H makes high speed access time 85/100 ns (max) possible. (HN27C1024H is the fastest 1-Mbit EPROM.) Therefore, it is suitable for 16-bit microcomputer systems using high speed microcomputer such as the 8086 and 68000. The HN27C1024H offers high speed programming using page programming mode. It has the package variation of cerdip 40-pin and JLCC 44-pin. Features Fast high-reliability programming mode and fast high-reliability page programming mode Programming voltage: 12.5 V DC Fast High-reliability page programming 14 sec (typ) High speed inputs and outputs TTL compatible during both read and program modes Low power dissipation: 60 mw/mhz (typ) Device identifier mode: Manufacturer code and device code JEDEC standard Ordering Information Type No. Access Time Package HN27C1024HG-85 HN27C1024HG-10 HN27C1024HG-12 HN27C1024HG-15 HN27C1024HCC-85 HN27C1024HCC-10 HN27C1024HCC-12 HN27C1024HCC-15 85 ns 100 ns 120 ns 150 ns 85 ns 100 ns 120 ns 150 ns 600-mil 40-pincerdip (DG-40A) 44-pin J-bend leaded chip carrier (CC-44)
Pin Arrangement HN27C1024HG Series HN27C1024HCC Series V PP CE I/O15 I/O14 I/O13 I/O12 I/O11 I/O10 I/O9 I/O8 V SS I/O7 I/O6 I/O5 I/O4 I/O3 I/O2 I/O1 I/O0 OE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 V CC PGM NC A15 A14 A13 A12 A11 A10 A9 V SS A8 A7 A6 A5 A4 A3 A2 A1 A0 I/O12 I/O11 I/O10 I/O9 I/O8 V SS NC I/O7 I/O6 I/O5 I/O4 7 8 9 10 11 12 13 14 15 16 17 I/O13 I/O14 I/O15 CE V PP NC V CC PGM NC A15 A14 6 5 4 3 2 1 44 43 42 41 40 18 19 20 21 22 23 24 25 26 27 28 I/O3 I/O2 I/O1 I/O0 OE NC A0 A1 A2 A3 A4 (Top view) 39 38 37 36 35 34 33 32 31 30 29 A13 A12 A11 A10 A9 V SS NC A8 A7 A6 A5 (Top view) Pin Description Pin Name A0 A15 I/O0 I/O15 CE OE V CC V PP V SS PGM NC Function Address Input/output Chip enable Output enable Power supply Programming power supply Ground Programming enable No connection 2
Block Diagram A6 X-Decoder 1024 1024 Memory Matrix A15 I/O0 I/O15 Input Data Control Y-Gating Y-Decoder CE OE PGM A0 A5 V CC V PP H H : High Threshold Inverter V SS 3
Mode Selection Pin CE OE PGM V PP V CC A9 I/O G (2) (20) (39) (1) (40) (31) (3 10, 12 19) Mode CC (3) (22) (43) (2) (44) (35) (4 11, 14 21) Read V IL V IL V IH V CC V CC X Dout Output disable V IL V IH V IH V CC V CC X High-Z Standby V IH X X V CC V CC X High-Z Program V IL V IH V IL V PP V CC X Din Program verify V IL V IL V IH V PP V CC X Dout Page data latch V IH V IL V IH V PP V CC X Din Page program V IH V IH V IL V PP V CC X High-Z Program inhibit V IL V IL V IL V PP V CC X High-Z V IL V IH V IH V IH V IL V IL V IH V IH V IH Identifier V IL V IL V IH V CC V CC V H Code Notes: 1. X: Don t care 2. V H : 12.0 V ± 0.5 V Absolute Maximum Ratings Parameter Symbol Value Unit All input and output voltages * 1 Vin, Vout 0.6* 2 to +7.0 V A9 input voltage * 1 V ID 0.6* 2 to +13.5 V V PP voltage * 1 V PP 0.6 to +13.0 V V CC voltage * 1 V CC 0.6 to 7.0 V Operating temperature range Topr 0 to +70 C Storage temperature range Tstg 65 to +125 C Storage temperature range under bias Tbias 10 to +80 C Notes: 1. Relative to V SS. 2. Vin, Vout, V ID min = 1.0 V for pulse width ± 50 ns 4
Capacitance (Ta = 25 C, f = 1 MHz) HN27C1024HG Series Parameter Symbol Min Typ Max Unit Test Conditions Input capacitance Cin 12 pf Vin = 0 V Output capacitance Cout 15 pf Vout = 0 V HN27C1024HCC Series Parameter Symbol Min Typ Max Unit Test Conditions Input capacitance Cin 6 pf Vin = 0 V Output capacitance Cout 12 pf Vout = 0 V Read Operation DC Characteristics (Ta = 0 to +70 C, V CC = 5 V ± 5%, V PP = V CC ) Parameter Symbol Min Typ Max Unit Test Conditions Input leakage current I LI 2 µa Vin = 5.25 V Output leakage current I LO 2 µa Vout = 5.25 V/0.45 V V PP current I PP1 1 20 µa V PP = 5.5 V Standby V CC current I SB 25 ma CE = V IH Operating V CC current I CC1 50 ma CE = V IL, Iout = 0 ma I CC2 110 ma f = 12 MHz, Iout = 0 ma I CC3 25 ma f = 1 MHz, Iout = 0 ma, Input low voltage V IL 0.3* 1 0.8 V Input high voltage V IH 2.2 V CC + 1.0* 2 V Output low voltage V OL 0.45 V I OL = 2.1 ma Output high voltage V OH 2.4 V I OH = 400 µa Notes: 1. V IL min = 1.0 V for pulse width 50 ns 2. V IH max = V CC + 1.5 V for pulse width 20 ns If V IH is over the specified maximum value, read operation cannot be guaranteed. 5
AC Characteristics (Ta = 0 to +70 C, V CC = 5 V ± 5%, V PP = V CC ) Test Conditions Input pulse levels: 0.45 V to 2.4 V Input rise and fall time: 10 ns Output load: 1 TTL gate + 100 pf Reference levels for measuring timing: Inputs; 1.5 V Outputs; 1.5 V HN27C1024H -85-10 -12-15 Parameter Symbol Min Max Min Max Min Max Min Max Unit Test Conditions Address to output delay t ACC 85 100 120 150 ns CE = OE = V IL CE to output delay t CE 85 100 120 150 ns OE = V IL OE to output delay t OE 45 50 60 60 ns CE = V IL OE high to output float t DF 0 30 0 50 0 50 0 50 ns CE = V IL Address to output hold t OH 0 0 0 0 ns CE = OE = V IL Note: t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. Read Timing Waveform Address CE Standby Mode Active Mode Standby Mode t CE OE t OE t DF t OH t ACC Data Out Data Out Valid 6
Fast High-Reliability Programming This device can be applied the programming algorithm shown in the following flowchart. This algorithm allows to obtain faster programming time without any voltage stress to the device nor deterioration in reliability of programmed data. START SET PROG./VERIFY MODE V PP = 12.5 ± 0.3 V, V CC = 6.0 ± 0.25 V Address = 0 n = 0 n + 1 n Program t PW = 0.2 ms ± 5% Address + 1 Address VERIFY NOGO GO Program t OPW = 0.2n ms n = 25 NO NO LAST Address? YES YES SET READ MODE V CC = 5.0 V ± 0.25 V, V PP = V CC READ All Address NOGO END GO FAIL Fast High-Reliability Programming Flowchart 7
DC Characteristics (Ta = 25 C ± 5 C, V CC = 6 V ± 0.25 V, V PP = 12.5 V ± 0.3 V) Parameter Symbol Min Typ Max Unit Test Conditions Input leakage current I LI 2 µa Vin = 6.25 V/0.45 V Output low voltage during verify V OL 0.45 V I OL = 2.1 ma Output high voltage during verify V OH 2.4 V I OH = 400 µa Operating Vcc current I CC 50 ma Input low level V IL 0.1* 5 0.8 V Input high level V IH 2.2 V CC + 0.5* 6 V V PP supply current I PP 40 ma CE = PGM = V IL Notes: 1. V CC must be applied simultaneously or before V PP and removed simultaneously or after V PP. 2. V PP must not exceed 13 V including overshoot. 3. An influence may be had upon device reliability if the device is installed or removed while V PP = 12.5 V. 4. Do not alter V PP either V IL to 12.5 V or 12.5 V to V IL when CE = low. 5. V IL min = 0.6 V for pulse width 20 ns. 6. If V IH is over the specified maximum value, programming operation cannot be guaranteed. 8
AC Characteristics (Ta = 25 C ± 5 C, V CC = 6 V ± 0.25 V, V PP = 12.5 V ± 0.3 V) Test Conditions Input pulse levels: 0.45 to 2.4 V Input rise and fall time: 20 ns Reference levels for measuring timing: Inputs: 0.8 V, 2.0 V Outputs: 0.8 V, 2.0 V Parameter Symbol Min Typ Max Unit Address setup time t AS 2 µs OE setup time t OES 2 µs Data setup time t DS 2 µs Address hold time t AH 0 µs Data hold time t DH 2 µs OE to output float delay t DF * 1 0 130 ns V PP setup time t VPS 2 µs V CC setup time t VCS 2 µs PGM initial programming pulse width t PW 0.19 0.2 0.21 ms PGM overprogramming pulse width t OPW * 2 0.19 5.25 ms CE setup time t CES 2 µs Data valid from OE t OE 0 150 ns Notes: 1. t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. 2. Refer to the programming flowchart for t OPW. 9
Fast High-Reliability Programming Timing Waveform Program Program Verify Address t AS t AH Data Data in Stable Data Out Valid t DS t DH t DF V PP V PP V CC t VPS V CC V CC +1 V CC t VCS CE t CES PGM t PW toes t OE OE 10
Fast High-Reliability Page Programming This device can be applied the high performance page programming algorithm shown in the following flowchart. This algorithm allows to obtain faster programming time without any voltage stress to the device nor deterioration in reliability of programmed data. START SET PAGE PROGRAM LATCH MODE V PP = 12.5 ± 0.3 V, V CC = 6.0 ± 0.25 V Address = 0 n = 0 Latch Address + 1 Address Latch n + 1 SET PAGE PROG./VERIFY MODE V PP = 12.5 ± 0.3 V, V CC = 6.0 ± 0.25 V Program t PW = 0.2 ms ± 5% n NO n = 25 YES Address + 1 Address NOGO VERIFY GO Program t OPW = 0.2n ms NO LAST Address? YES SET READ MODE V CC = 5.0 V ± 0.25 V, V PP = V CC READ All Address NOGO END GO FAIL Fast High-Reliability Page Programming Flowchart 11
DC Characteristics (V CC = 6 V ± 0.25 V, V PP =12.5 V ± 0.3 V, Ta = 25 C ± 5 C) Parameter Symbol Min Typ Max Unit Test Conditions Input leakage current I LI 2 µa Vin = 6.25 V/0.45 V Output low voltage during verify V OL 0.45 V I OL = 2.1 ma Output high voltage during verify V OH 2.4 V I OH = 400 µa Operating V CC current I CC 50 ma Input low level V IL 0.1* 5 0.8 V Input high level V IH 2.2 V CC +0.5* 6 V V PP supply current I PP 50 ma PGM = V IL Notes: 1. V CC must be applied simultaneously or before V PP and removed simultaneously after V PP. 2. V PP must not exceed 13 V including overshoot. 3. An influence may be had upon device reliability if the device is installed or removed while V PP = 12.5 V. 4. Do not alter V PP either V IL to 12.5 V or 12.5 V to V IL when CE = low. 5. V IL min = 0.6 V for pulse width 20 ns. 6. If V IH is over the specified maximum value, programming operation cannot be guaranteed. 12
AC Characteristics (V CC = 6 V ± 0.25 V, V PP = 12.5 V ± 0.3 V, Ta = 25 C ± 5 C) Test Conditions Input pulse levels: 0.45 to 2.4 V Input rise and fall time: 20 ns Reference levels for measuring timings: Inputs; Outputs; 0.8 V, 2.0 V 0.8 V, 2.0 V Parameter Symbol Min Typ Max Unit Address setup time t AS 2 µs OE setup time t OES 2 µs Data setup time t DS 2 µs Address hold time t AH 0 µs t AHL 2 µs Data hold time t DH 2 µs OE to output float delay t DF * 1 0 130 ns V PP setup time t VPS 2 µs V CC setup time t VCS 2 µs PGM initial programming pulse width t PW 0.19 0.2 0.21 µs PGM overprogramming pulse width t OPW * 2 0.19 5.25 µs CE setup time t CES 2 µs Data valid from OE t OE 0 150 ns OE pulse width during data latch t LW 1 µs PGM setup time t PGMS 2 µs CE hold time t CEH 2 µs OE hold time t OEH 2 µs Notes: 1. t DF is defined as the time at which the output achieves the open circuit condition and data is no longer driven. 2. Refer to the programming flowchart for t OPW. 13
Fast High-Reliability Programming Timing Waveform Page data latch Page Program Program Verify A1 to A15 t AS t AHL t AH A0 t DF t DS t DH t PGMS t OE Data Data in Stable t VPS Data Out Valid V PP V PP V CC t VCS V CC +1 V CC VCC t CES t OEH CE t CEH PGM t LW t PW t OES OE Erase Erasure of HN27C4096G/CC is performed by exposure to ultraviolet light of 2537 Å and all the output data are changed to 1 after this erasure procedure. The minimum integrated dose (i.e. UV intensity exposure time) for erasure is 15 W sec/cm 2. 14
Mode Description Device Identifier Mode The device identifier mode allows the reading out of binary codes that identify manufacturer and type of device, from outputs of EPROM. By this mode, the device will be automatically matched its own corresponding programming algorithm, using programming equipment. HN27C1024H Identifier Code Pin A0 I/O8 to I/O15 I/O7 I/O6 I/O5 I/O4 I/O3 I/O2 I/O1 I/O0 G (21) (10) to (3) (12) (13) (14) (15) (16) (17) (18) (19) Identifier CC (24) (11) to (4) (14) (15) (16) (17) (18) (19) (20) (21) Data Hex Manufacturer code V IL X 0 0 0 0 0 1 1 1 07 Device code V IH X 1 0 1 1 1 0 1 0 BA Note: X: Don t care, A9 = 12.0 V ± 0.5 V, A1 A8, A10 A15, CE, OE=V IL, PGM = V IH Electric Curves Supply Current I CC2 (Normalized) Supply Current vs. Supply Voltage 1.6 Ta=25 C Vin= V CC /V SS 1.4 f=12 MHz 1.2 1.0 0.8 0.6 4 5 6 Supply Voltage V CC (V) 15
Supply Current I CC2 (Normalized) Supply Current vs. Ambient Temperature 1.6 1.4 1.2 1.0 0.8 0.6 V CC =5. 0V Vin=V CC /V SS f=12 MHz 0.4 0 20 40 60 80 Ambient Temperature Ta ( C) Supply Current I CC (Normalized) 10 5 2 1.0 0.5 0.2 Supply Current vs. Frequency V CC =5 V Ta=25 C Vin=V CC /V SS 0.1 0.1 0.2 0.5 1.0 2 5 10 20 Frequency f (MHz) 16
Access Time t ACC, t CE (Nomalized) Access Time vs. Supply Voltage 1.4 Ta=25 C 1.3 1.2 1.1 1.0 0.9 0.8 4.0 4.5 5.0 5.5 6.0 Supply Voltage V CC (V) Access Time t ACC, t CE (Nomalized) Access Time vs. Ambient Temperature 1.3 V CC =5. 0V 1.2 1.1 1.0 0.9 0.8 0.7 0 20 40 60 80 Ambient Temperature Ta ( C) 17
Package Dimensions HN27C1024HG Series (DG-40A) Unit: mm 52.07 40 53.34 Max 21 φ8.89 1 1.32 20 2.54 Max 14.66 15.51 Max 0.51 Min 6.30 Max 15.24 2.54 ± 0.25 0.48 ± 0.10 2.54 Min 0 10 0.25 + 0.11 0.05 HN27C1024HCC Series (CC-44) Unit: mm 17.57 +0.16 0.24 +0.38 16.51 0.22 39 29 40 28 +0.16 0.24 17.57 44 1 φ 8.89 6 18 7 17 0.89 0.73 1.025 0.46 +0.07 0.13 15.75 +0.38 0.22 0.18 1.27 M 4.80 Max 2.75 Max 15.75 +0.38 0.22 0.15 18