256M (16Mx16bit) Hynix SDRAM Memory

Similar documents
256M (16Mx16bit) Hynix SDRAM Memory

512K x 32 Bit x 4 Banks Synchronous DRAM

1M x 16 Bit x 4 Banks

BALL CONFIGURATION (TOP VIEW) (BGA 90, 8mmX13mmX1.0mm Body, 0.8mm Ball Pitch) A DQ26 DQ24 VSS VDD DQ23 DQ21 B DQ28 VDDQ VSSQ VDDQ VSSQ DQ19

BS4M16A. 4M x 16 Bit SDRAM ORDERING INFORMATION GENERAL DESCRIPTION FEATURES. Revision: 5.0 1/46

EM48AM3284LBB. Revision History. Revision 0.1 (May. 2010) - First release.

eorex EM48AM3284LBA Revision History Revision 0.1 (Jul. 2006) - First release. Revision 0.2 (Aug. 2007).. - Add IDD6 PASR Spec.

64Mb Synchronous DRAM Specification

Revision No History Draft Date Remark

EM42BM1684RBA. Revision History. Revision 0.1 (Dec. 2010) - First release. Dec /23

HYB39SC128800FE HYB39SC128160FE HYI39SC128800FE HYI39SC128160FE

DQML /WE /CA S /RA S /CS BA0 BA1 A10(AP) A0 A1 A2 A3. tck3 Clock Cycle time(min.) 6/7 ns tac3 Access time from CLK(max.) 5/5.4 ns

GENERAL DESCRIPTION z JEDEC standard 3.3V power supply. 2 x 524,288 words by 16 bits, fabricated with z MRS cycle with address key programs

ADVANCED. 16M (2-Bank x 524,288-Word x 16-Bit) Synchronous DRAM FEATURES OPTIONS GENERAL DESCRIPTION. APR (Rev.2.9)

SRM2264L10/12 CMOS 64K-BIT STATIC RAM. Low Supply Current Access Time 100ns/120ns 8,192 Words 8 Bits, Asynchronous DESCRIPTION

POWER-UP SEQUENCE AND DEVICE INITIALIZATION

Document Title 128K X 32 Bit Synchronous High Speed SRAM with Burst Counter and Pipelined Data Output. Rev. No. History Issue Date Remark

ISSI IS61SP K x 64 SYNCHRONOUS PIPELINE STATIC RAM JANUARY 2004

DESCRIPTION DECODER I/O DATA CIRCUIT CONTROL CIRCUIT

IS61C K x 16 HIGH-SPEED CMOS STATIC RAM

LH5P8128. CMOS 1M (128K 8) Pseudo-Static RAM PIN CONNECTIONS

IS61LV K x 16 LOW VOLTAGE CMOS STATIC RAM

Cover Sheet and Revision Status. 發行人 (Rev.) 變更說明 Jul New issue Hank Lin

DECODER I/O DATA CIRCUIT CONTROL CIRCUIT

5.0 V 256 K 16 CMOS SRAM

LH5P832. CMOS 256K (32K 8) Pseudo-Static RAM

SRAM with ZBT Feature Burst Counter and Pipelined Outputs

HN58C256 Series word 8-bit Electrically Erasable and Programmable CMOS ROM

3.3 V 256 K 16 CMOS SRAM

256K x 36, 512K x V Synchronous ZBT SRAMs ZBT Feature 3.3V I/O, Burst Counter Pipelined Outputs


64K x 18 Synchronous Burst RAM Pipelined Output

DatasheetDirect.com. Visit to get your free datasheets. This datasheet has been downloaded by

DQ0 DQ1 DQ2 DQ3 NC WE# RAS# A0 A1 A2 A3 A4 A5. x = speed

SRAM with ZBT Feature, Burst Counter and Pipelined Outputs

256K X 16 BIT LOW POWER CMOS SRAM

April 2004 AS7C3256A

256K x 36, 512K x V Synchronous ZBT SRAMs 2.5V I/O, Burst Counter Pipelined Outputs

5V 1M 16 CMOS DRAM (fast-page mode) DQ16 DQ15 DQ14 DQ13 RAS DQ12 DQ11 DQ10 DQ9 OE WE UCAS LCAS LCAS UCAS OE A9 A8 A7 A6 A5 A4

Revision No History Draft Date Remark. 00 Initial Draft Dec Preliminary. 01 Package Height Changed 1.0mm -> 0.9mm Mar.05.

HN58C66 Series word 8-bit CMOS Electrically Erasable and Programmable CMOS ROM. ADE F (Z) Rev. 6.0 Apr. 12, Description.

4Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ4G43AMR-xxC H5TQ4G83AMR-xxC

3.3V VDD, 3.3V or 2.5V I/O, Pipelined, Single-Cycle Deselect

4Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ4G43DFR-xxC H5TQ4G83DFR-xxC

2Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ2G43BFR-xxC H5TQ2G83BFR-xxC H5TQ2G63BFR-xxC

HN58C65 Series word 8-bit Electrically Erasable and Programmable CMOS ROM

3.3 V 64K X 16 CMOS SRAM

SRAM AS5LC512K8. 512K x 8 SRAM 3.3 VOLT HIGH SPEED SRAM with CENTER POWER PINOUT. PIN ASSIGNMENT (Top View)

2Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ2G43CFR-xxC H5TQ2G83CFR-xxC

5 V 64K X 16 CMOS SRAM

2-Mbit (128K x 16)Static RAM

Vcc DQ1 DQ2 DQ3 DQ4 Vcc DQ5 DQ6 DQ7 DQ8 WE# RAS# A0 A1 A2 A3 Vcc

Double DATA RATE 3 SDRAM AC Timing

4Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant)

NTE74HC299 Integrated Circuit TTL High Speed CMOS, 8 Bit Universal Shift Register with 3 State Output

HM6264A Series. Features. Ordering Information word 8-bit High Speed CMOS Static RAM

White Electronic Designs

HB56A1636B/SB-6B/7B/8B

PRELIMINARY DATA SHEET. 4G bits DDR3 SDRAM. EDJ4204BFBG (1024M words 4 bits) EDJ4208BFBG (512M words 8 bits) EDJ4216BFBG (256M words 16 bits)

4Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ4G43MFR-xxC H5TQ4G83MFR-xxC H5TQ4G63MFR-xxC

4-Mbit (256K x 16) Static RAM

IBM B IBM P 8M x 8 12/11 EDO DRAM

2Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant)

2M x 32 Bit 5V FPM SIMM. Fast Page Mode (FPM) DRAM SIMM S51T04JD Pin 2Mx32 FPM SIMM Unbuffered, 1k Refresh, 5V. General Description.

DRAM MT4LC4M16R6, MT4LC4M16N3. 4 MEG x 16 EDO DRAM

High Speed Super Low Power SRAM

IS61NLP102436A/IS61NVP102436A IS61NLP204818A/IS61NVP204818A

HYB18T512400B[C/F] HYB18T512800B[C/F] HYB18T512160B[C/F]

DQ0 DQ1 NC NC NC NC WE# RAS# A0 A1 A2 A3 A4 A5

1-Mbit (128K x 8) Static RAM

1Gb DDR3 SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TQ1G83DFR-xxC H5TQ1G83DFR-xxI H5TQ1G63DFR-xxC H5TQ1G63DFR-xxI

16-Mbit (1M x 16) Static RAM

9-Channel 64steps Constant-Current LED Driver with SPI Control. Features

HN27C4096G/CC Series. Ordering Information. Features word 16-bit CMOS UV Erasable and Programmable ROM

512K x 32 Static RAM CY7C1062AV33. Features. Functional Description. Logic Block Diagram. Selection Guide

DATA SHEET 1M-BIT CMOS STATIC RAM 128K-WORD BY 8-BIT. µpd431000a-l 70, to to

VCC DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 NC NC NC WE# RAS# NC NC A0 A1 A2 A3

HN27C1024HG/HCC Series

256K x 16 Static RAM CY7C1041BN. Features. Functional Description

Datasheet for ADTEC DDR4 Simplified Version

IBM IBM M IBM B IBM P 4M x 4 11/11 EDO DRAM

4Gb DDR3L-RS SDRAM. Lead-Free&Halogen-Free (RoHS Compliant) H5TC4G83BFR-xxR

About the change in the name such as "Oki Electric Industry Co. Ltd." and "OKI" in documents to OKI Semiconductor Co., Ltd.

1.35V DDR3L SDRAM Addendum

DS K x 8 Static RAM FEATURES PIN ASSIGNMENT PIN DESCRIPTION

36 Mb (1M x 36 & 2M x 18) QUAD (Burst of 2) Synchronous SRAMs

4Gb DDR3L SDRAM. Lead-Free&Halogen-Free (RoHS Compliant)

NTE74HC173 Integrated Circuit TTL High Speed CMOS, 4 Bit D Type Flip Flop with 3 State Outputs

SRAM AS5C512K8. 512K x 8 SRAM HIGH SPEED SRAM with REVOLUTIONARY PINOUT. PIN ASSIGNMENT (Top View) AVAILABLE AS MILITARY SPECIFICATIONS FEATURES

8Gb DDR3L SDRAM (Dual Die Package)

I/O 8 I/O 15 A13 A 14 BHE WE CE OE BLE

INTEGRATED CIRCUITS. For a complete data sheet, please also download:

HM514400B/BL Series HM514400C/CL Series

LH NMOS 256K (256K 1) Dynamic RAM DESCRIPTION

DS1225Y. 64K Nonvolatile SRAM FEATURES PIN ASSIGNMENT

16-Mbit (1M x 16) Pseudo Static RAM

MM74C922 MM74C Key Encoder 20-Key Encoder

NOTE: The Flatpak version has the same pinouts (Connection Diagram) as the Dual In-Line Package. *MR for LS160A and LS161A *SR for LS162A and LS163A

IBM IBM M IBM B IBM P 4M x 4 12/10 DRAM


Transcription:

256Mb Synchronous DRAM based on 4M x 4Bank x16 I/O 256M (16Mx16bit) Hynix SDRAM Memory Memory Cell Array - Organized as 4banks of 4,194,304 x 16 This document is a general product description and is subject to change without notice. Hynix does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev 1.0 / Dec. 2010 1

H57V2562GTR Document Title 256Mbit (16M x16) Synchronous DRAM Revision History Revision No. History Draft Date Remark 0.1 Preliminary Jun. 2009 1.0 Release (Update PKG dimension raw data) Dec. 2010 Rev 1.0 / Dec. 2010 2

DESCRIPTION The Hynix H57V2562GTR Synchronous DRAM is 268,435,456bit CMOS Synchronous DRAM, ideally suited for the consumer memory applications which requires large memory density and high bandwidth. It is organized as 4banks of 4,194,304 x 16 I/O. Synchronous DRAM is a type of DRAM which operates in synchronization with input clock. The Hynix Synchronous DRAM latch each control signal at the rising edge of a basic input clock (CLK) and input/output data in synchronization with the input clock (CLK). The address lines are multiplexed with the Data Input/ Output signals on a multiplexed x16 Input/ Output bus. All the commands are latched in synchronization with the rising edge of CLK. The Synchronous DRAM provides for programmable read or write Burst length of Programmable burst lengths: 1, 2, 4, 8 locations or full page. An AUTO PRECHARGE function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst access. The Synchronous DRAM uses an internal pipelined architecture to achieve high-speed operation. This architecture is compartible with the 2n rule of prefetch architectures, but it also allows the column address to be changed on every clock cycle to achieve a high-speed, fully random access. Precharging one bank while accessing one of the other three banks will hide the precharge cycles and provide seamless, high-speed, randon-access operation. Read and write accesses to the Hynix Synchronous DRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and the row to be accessed. The address bits registered coincident with the READ or WRITE command are used to select the bank and the starting column location for the burst access. All inputs are LVTTL compatible. Devices will have a VDD and VDDQ supply of 3.3V (nominal). Rev 1.0 / Dec. 2010 3

256Mb Synchronous DRAM(16M x 16) FEATURES Standard SDRAM Protocol Internal 4bank operation Power Supply Voltage : VDD = 3.3V, VDDQ = 3.3V All device pins are compatible with LVTTL interface Low Voltage interface to reduce I/O power 8,192 Refresh cycles / 64ms Programmable CAS latency of 2 or 3 Programmable Burst Length and Burst Type - 1, 2, 4, 8 or full page for Sequential Burst - 1, 2, 4 or 8 for Interleave Burst Commercial Temp : 0 o C ~ 70 o C Operation Package Type : 54_Pin TSOPII This product is in compliance with the directive pertaining of RoHS. ORDERING INFORMATION Part Number Clock Frequency CAS Latency H57V2562GTR-60C 166MHz 3 H57V2562GTR-75C 133MHz 3 H57V2562GTR-50C 200MHz 3 H57V2562GTR-60L 166MHz 3 H57V2562GTR-75L 133MHz 3 H57V2562GTR-50L 200MHz 3 Power Voltage Organization Interface Normal Low Power 3.3V 4Banks x 4Mbits x16 LVTTL Note: 1. H57V2562GTR-XXC Series: Normal power & Commercial temp. 2. H57V2562GTR-XXL Series: Low Power & Commercial temp. Rev 1.0 / Dec. 2010 4

54 TSOP II Pin ASSIGNMENTS VDD 1 54 VSS DQ0 2 53 DQ15 VDDQ 3 52 VSSQ DQ1 4 51 DQ14 DQ2 5 50 DQ13 VSSQ 6 49 VDDQ DQ3 7 48 DQ12 DQ4 8 47 DQ11 VDDQ 9 46 VSSQ DQ5 10 45 DQ10 DQ6 VSSQ DQ7 VDD 11 12 13 14 54 Pin TSOPII 400mil x 875mil 0.8mm pin pitch 44 43 42 41 DQ9 VDDQ DQ8 VSS LDQM 15 40 NC /WE 16 39 UDQM /CAS 17 38 CLK /RAS 18 37 CKE /CS 19 36 A12 BA0 20 35 A11 BA1 21 34 A9 A10/AP 22 33 A8 A0 23 32 A7 A1 24 31 A6 A2 25 30 A5 A3 26 29 A4 VDD 27 28 VSS Rev 1.0 / Dec. 2010 5

54_TSOPII Pin DESCRIPTIONS SYMBOL TYPE DESCRIPTION CLK CKE INPUT INPUT Clock : The system clock input. All other inputs are registered to the SDRAM on the rising edge of CLK Clock Enable: Controls internal clock signal and when deactivated, the SDRAM will be one of the states among power down, suspend or self refresh CS BA0, BA1 A0 ~ A12 RAS, CAS, WE LDQM, UDQM DQ0 ~ DQ15 INPUT INPUT INPUT INPUT I/O I/O Chip Select: Enables or disables all inputs except CLK, CKE and DQM Bank Address: Selects bank to be activated during RAS activity Selects bank to be read/written during CAS activity Row Address: RA0 ~ RA12, Column Address: CA0 ~ CA8 Auto-precharge flag: A10 Command Inputs: RAS, CAS and WE define the operation Refer function truth table for details Data Mask: Controls output buffers in read mode and masks input data in write mode Data Input / Output: Multiplexed data input / output pin VDD / VSS SUPPLY Power supply for internal circuits and input buffers VDDQ / VSSQ SUPPLY Power supply for output buffers NC - No connection : These pads should be left unconnected Rev 1.0 / Dec. 2010 6

FUNCTIONAL BLOCK DIAGRAM 4Mbit x 4banks x 16 I/O Synchronous DRAM Self refresh logic & timer Internal Row Counter CLK CKE CS RAS CAS WE LDQM, UDQM A0 A1 A12 BA1 State Machine Address Buffers Row Active Refresh Column Active Bank Select Address Register Row Pre Decoder Column Pre Decoder Column Add Counter Mode Register Burst Length X Decorders X Decorders Burst Counter CAS Latency 4M x16 Bank3 X Decorders 4M x16 Bank2 X Decoders 4M x16 Bank1 4M x16 Bank0 Memory Cell Array Y decoerders Data Out Control Sense AMP & I/O Gate Pipe Line Control I/O Buffer & Logic DQ0 DQ15 BA0 Rev 1.0 / Dec. 2010 7

ABSOLUTE MAXIMUM RATING Parameter Symbol Rating Unit Ambient Temperature TA 0 ~ 70 o C Storage Temperature TSTG -55 ~ 125 o C Voltage on Any Pin relative to VSS VIN, VOUT -1.0 ~ 4.6 V Voltage on VDD supply relative to VSS VDD, VDDQ -1.0 ~ 4.6 V Short Circuit Output IOS 50 ma Power Dissipation PD 1 W Note : Operation at above absolute maximum rating can adversely affect device reliability DC OPERATING CONDITION Parameter Symbol Min Max Unit Note Power Supply Voltage VDD, VDDQ 3.0 3.6 V 1 Input High Voltage VIH 2.0 VDDQ + 0.3 V 1, 2 Input Low Voltage VIL -0.3 0.8 V 1, 3 Note: 1. All voltages are referenced to VSS = 0V. 2. VIH(Max) is acceptable VDDQ + 2V for a pulse width with <= 3ns of duration. 3. VIL(min) is acceptable -2.0V for a pulse width with <= 3ns of duration. AC OPERATING TEST CONDITION (TA= 0 to 70 o C, VDD=3.3 0.3V / VSS=0V) Parameter Symbol Value Unit Note AC Input High / Low Level Voltage VIH / VIL 2.4 / 0.4 V Input Timing Measurement Reference Level Voltage Vtrip 1.4 V Input Rise / Fall Time tr / tf 1 ns Output Timing Measurement Reference Level Voltage Voutref 1.4 V Output Load Capacitance for Access Time Measurement CL 50 pf 1 Note: 1. See Next Page Rev 1.0 / Dec. 2010 8

VTT = 1.4V VTT = 1.4V RT = 50 Ohom RT = 50 Ohom Output Output Z0 = 50 Ohom 50pF 50pF DC Output Load Circuit AC Output Load Circuit CAPACITANCE (f=1mhz) Parameter Pin Symbol Min Max Unit CLK CI1 2.0 4.0 pf Input capacitance Data input / output capacitance A0 ~ A12, BA0, BA1, CKE, CS, RAS, CAS, WE CI2 2.0 4.0 pf LDQM, UDQM CI3 2.0 4.0 pf DQ0 ~ DQ15 CI/O 3.5 6.5 pf DC CHARACTERRISTICS I (TA= 0 to 70 o C) Parameter Symbol Min Max Unit Note Input Leakage ILI -1 1 ua 1 Output Leakage ILO -1 1 ua 2 Output High Voltage VOH 2.4 - V IOH = -4mA Output Low Voltage VOL - 0.4 V IOL = +4mA Note: 1. VIN = 0 to 3.6V, All other balls are not tested under VIN =0V 2. DOUT is disabled, VOUT=0 to 3.6 Rev 1.0 / Dec. 2010 9

DC CHARACTERISTICS II (TA= 0 to 70 o C) Parameter Symbol Test Condition Operating Precharge Standby in Power Down Mode Precharge Standby in Non Power Down Mode Active Standby in Power Down Mode Active Standby in Non Power Down Mode Burst Mode Operating Auto Refresh Self Refresh IDD1 Burst length=1, One bank active trc trc(min), IOL=0mA Speed (MHz) 200 166 133 Unit Note 110 90 70 ma 1 IDD2P CKE VIL(max), tck = 15ns 2 ma IDD2PS CKE VIL(max), tck = 2 ma IDD2N IDD2NS CKE VIH(min), CS VIH(min), tck = 15ns Input signals are changed one time during 2clks. All other pins VDD-0.2V or 0.2V CKE VIH(min), tck = Input signals are stable. IDD3P CKE VIL(max), tck = 15ns 5 IDD3PS CKE VIL(max), tck = 5 IDD3N IDD3NS IDD4 CKE VIH(min), CS VIH(min), tck = 15ns Input signals are changed one time during 2clks. All other pins VDD-0.2V or 0.2V CKE VIH(min), tck = Input signals are stable. tck tck(min), IOL=0mA All banks active 15 8 28 20 ma ma ma 120 100 80 ma 1 IDD5 trc trc(min), All banks active 180 160 140 ma 2 IDD6 CKE 0.2V Normal 2 Low Power 1 ma 3 Note: 1. IDD1 and IDD4 depend on output loading and cycle rates. Specified values are measured with the output open. 2. Min. of trc (Refresh RAS cycle time) is shown at AC CHARACTERISTICS II 3. H57V2562GTR-XXC Series: Normal, H57V2562GTR-XXL Series: Low Power Rev 1.0 / Dec. 2010 10

AC CHARACTERISTICS I (AC operating conditions unless otherwise noted) Parameter Speed (MHz) 200 166 133 Min Max Min Max Min Max System Clock Cycle Time CL = 3 tck3 5.0 6.0 1000 7.5 1000 ns 1000 CL = 2 tck2 - - 1000 10 1000 ns Clock High Pulse Width tchw 2.0-2.5-2.5 - ns 1 Clock Low Pulse Width tclw 2.0-2.5-2.5 - ns 1 Access Time From Clock CL = 3 tac3-4.5-5.4-5.4 ns 2 CL = 2 tac2 - - - - - 6 ns 2 Data-out Hold Time toh 2.0-2.0-2.5 - ns Data-Input Setup Time tds 1.5-1.5-1.5 - ns 1 Data-Input Hold Time tdh 0.8-0.8-0.8 - ns 1 Address Setup Time tas 1.5-1.5-1.5 - ns 1 Address Hold Time tah 0.8-0.8-0.8 - ns 1 CKE Setup Time tcks 1.5-1.5-1.5 - ns 1 CKE Hold Time tckh 0.8-0.8-0.8 - ns 1 Command Setup Time tcs 1.5-1.5-1.5 - ns 1 Command Hold Time tch 0.8-0.8-0.8 - ns 1 CLK to Data Output in Low-Z Time tolz 1.0-1.0-1.0 - ns CLK to Data Output in High-Z Time Unit CL = 3 tohz3-4.5 2.7 5.4 2.7 5.4 ns CL = 2 tohz2 - - - - 3 6 ns Note Note: 1. Assume tr / tf (input rise and fall time) is 1ns. If tr & tf > 1ns, then [(tr+tf)/2-1]ns should be added to the parameter. 2. Access time to be measured with input signals of 1V/ns edge rate, from 0.8V to 0.2V. If tr > 1ns, then (tr/2-0.5)ns should be added to the parameter. Rev 1.0 / Dec. 2010 11

AC CHARACTERISTICS II (AC operating conditions unless otherwise noted) Parameter Speed (MHz) 200 166 133 Min Max Min Max Min Max RAS Cycle Time Operation trc 55-60 - 63 - ns Auto Refresh trrc 55-60 - 63 - ns RAS to CAS Delay trcd 15-18 - 20 - ns RAS Active Time tras 38.7 100K 42 100K 42 100K ns RAS Precharge Time trp 15-18 - 20 - ns RAS to RAS Bank Active Delay trrd 10-12 - 15 - ns CAS to CAS Delay tccd 1-1 - 1 - CLK Write Command to Data-In Delay twtl 0-0 - 0 - CLK Data-in to Precharge Command tdpl 2-2 - 2 - CLK Unit Note Data-In to Active Command tdal tdpl + trp DQM to Data-Out Hi-Z tdqz 2-2 - 2 - CLK DQM to Data-In Mask tdqm 0-0 - 0 - CLK MRS to New Command tmrd 2-2 - 2 - CLK Precharge to Data CL = 3 tproz3 3-3 - 3 - CLK Output High-Z CL = 2 tproz2 - - - - 2 - CLK Power Down Exit Time tdpe 1-1 - 1 - CLK Self Refresh Exit Time tsre 1-1 - 1 - CLK 1 Refresh Time tref - 64-64 - 64 ms Note: 1. A new command can be given trc after self refresh exit. Rev 1.0 / Dec. 2010 12

BASIC FUNCTIONAL DESCRIPTION Mode Register BA1 BA0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 0 0 0 0 0 OP Code 0 0 CAS Latency BT Burst Length OP Code A9 Write Mode 0 Burst Read and Burst Write 1 Burst Read and Single Write Burst Type A3 Burst Type 0 Sequential 1 Interleave CAS Latency A6 A5 A4 CAS Latency 0 0 0 Reserved 0 0 1 Reserved 0 1 0 2 0 1 1 3 1 0 0 Reserved 1 0 1 Reserved 1 1 0 Reserved 1 1 1 Reserved Burst Length A2 A1 A0 Burst Length A3 = 0 A3=1 0 0 0 1 1 0 0 1 2 2 0 1 0 4 4 0 1 1 8 8 1 0 0 Reserved Reserved 1 0 1 Reserved Reserved 1 1 0 Reserved Reserved 1 1 1 Full page Reserved Rev 1.0 / Dec. 2010 13

COMMAND TRUTH TABLE Function CKEn-1 CKEn CS RAS CAS WE DQM ADDR A10 /AP BA Note Mode Register Set H X L L L L X Op Code No Operation H X L H H H X X Device Deselect H X H X X X X X Bank Active H X L L H H X Row Address V Read H X L H L H Read with Autoprecharge H X L H L H X Write H X L H L L X Note : 1. Exiting Self Refresh occurs by asynchronously bringing CKE from low to high. 2. see to Next page (DQM TRUTH TABLE) L V H V L V Column Column Column Write with Autoprecharge H X L H L L X Column H V Precharge All Banks H X L L H L X X H X Precharge selected Bank H X L L H L X X L V Burst stop H X L H H L X X DQM H X X V X 2 Auto Refresh H H L L L H X X Burst-Read Single-Write H X L L L H X A9 Pin High (Other Pins OP code) Self Refresh Entry H L L L L H X X Self Refresh Exit L H Precharge Power Down Entry Precharge Power Down Exit L H H L H X X X L H H H H X X X L H H H H X X X L H H H X X 1 Clock Suspend Entry H L H X X X L V V V X X Clock Suspend Exit L H X X X X X X X Rev 1.0 / Dec. 2010 14

DQM TRUTH TABLE Function CKEn-1 CKEn LDQM UDQM Data Write/Output enable H X L L Data Mask/Output disable H X H H Lower byte write/output enable, Upper byte mask/output disable H X L H Lower byte Mask/Output disable, Upper byte write/output enable H X H L Note 1. H: High Level, L: Low Level, X: Don't Care 2. Write DQM Latency is 0 CLK and Read DQM Latency is 2 CLK Rev 1.0 / Dec. 2010 15

CURRENT STATE TRUTH TABLE (Sheet 1 of 4) State CS RAS CAS WE BA0/ BA1 Command Amax-A0 Description Action Notes L L L L OP CODE Mode Register Set Set the Mode Register L L L H X X Auto or Self Refresh Start Auto or Self Refresh 5 L L H L BA X Precharge No Operation L L H H BA Row Add. Bank Activate Activate the specified bank and row idle L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 4 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 4 L H H H X X No Operation No Operation 3 H X X X X X Device Deselect No Operation or Power Down 3 L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge Precharge 7 Row Active L L H H BA Row Add. Bank Activate ILLEGAL 4 L H L L BA Col Add. A10 Write/WriteAP Start Write : optional AP(A10=H) 6 L H L H BA Col Add. A10 Read/ReadAP Start Read : optional AP(A10=H) 6 L H H H X X No Operation No Operation H X X X X X Device Deselect No Operation L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge Termination Burst: Start the Precharge Read L L H H BA Row Add. Bank Activate ILLEGAL 4 L H L L BA Col Add. A10 Write/WriteAP Termination Burst: Start Write(optional AP) 8,9 L H L H BA Col Add. A10 Read/ReadAP Termination Burst: Start Read(optional AP) 8 L H H H X X No Operation Continue the Burst Rev 1.0 / Dec. 2010 16

CURRENT STATE TRUTH TABLE (Sheet 2 of 4) State CS RAS CAS WE BA0/ BA1 Command Amax-A0 Description Action Notes Read H X X X X X Device Deselect Continue the Burst L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge Termination Burst: Start the Precharge 10 Write L L H H BA Row Add. Bank Activate ILLEGAL 4 L H L L BA Col Add. A10 Write/WriteAP Termination Burst: Start Write(optional AP) 8 L H L H BA Col Add. A10 Read/ReadAP Termination Burst: Start Read(optional AP) 8,9 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 Read with Auto Precharge L L H L BA X Precharge ILLEGAL 4,12 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 12 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 12 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 Write with Auto Precharge L L H L BA X Precharge ILLEGAL 4,12 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 12 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 12 L H H H X X No Operation Continue the Burst H X X X X X Device Deselect Continue the Burst Rev 1.0 / Dec. 2010 17

CURRENT STATE TRUTH TABLE (Sheet 3 of 4) State CS RAS CAS WE BA0/ BA1 Command Amax-A0 Description Action Notes L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge No Operation: Bank(s) idle after trp Precharging L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 4,12 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 4,12 L H H H X X No Operation H X X X X X Device Deselect No Operation: Bank(s) idle after trp No Operation: Bank(s) idle after trp L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,12 Row Activating L L H H BA Row Add. Bank Activate ILLEGAL 4,11,1 2 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 4,12 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 4,12 L H H H X X No Operation H X X X X X Device Deselect No Operation: Row Active after trcd No Operation: Row Active after trcd L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 4,13 Write Recovering L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add. A10 Write/WriteAP Start Write: Optional AP(A10=H) L H L H BA Col Add. A10 Read/ReadAP L H H H X X No Operation Start Read: Optional AP(A10=H) No Operation: Row Active after tdpl 9 Rev 1.0 / Dec. 2010 18

CURRENT STATE TRUTH TABLE (Sheet 4 of 4) State Write Recovering Write Recovering with Auto Precharge Refreshing Mode Register Accessing CS RAS CAS WE BA0/ BA1 Command Amax-A0 Description H X X X X X Device Deselect Action No Operation: Row Active after tdpl L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 Notes L L H L BA X Precharge ILLEGAL 4,13 L L H H BA Row Add. Bank Activate ILLEGAL 4,12 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 4,12 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 4,9,12 L H H H X X No Operation H X X X X X Device Deselect No Operation: Precharge after tdpl No Operation: Precharge after tdpl L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 13 L L H H BA Row Add. Bank Activate ILLEGAL 13 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 13 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 13 L H H H X X No Operation H X X X X X Device Deselect No Operation: idle after trc No Operation: idle after trc L L L L OP CODE Mode Register Set ILLEGAL 13 L L L H X X Auto or Self Refresh ILLEGAL 13 L L H L BA X Precharge ILLEGAL 13 L L H H BA Row Add. Bank Activate ILLEGAL 13 L H L L BA Col Add. A10 Write/WriteAP ILLEGAL 13 L H L H BA Col Add. A10 Read/ReadAP ILLEGAL 13 L H H H X X No Operation H X X X X X Device Deselect No Operation: idle after 2 clock cycles No Operation: idle after 2 clock cycles Rev 1.0 / Dec. 2010 19

Note : 1. H: Logic High, L: Logic Low, X: Don't care, BA: Bank Address, AP: Auto Precharge. 2. All entries assume that CKE was active during the preceding clock cycle. 3. If both banks are idle and CKE is inactive, then in power down cycle 4. Illegal to bank in specified states. Function may be legal in the bank indicated by Bank Address, depending on the state of that bank. 5. If both banks are idle and CKE is inactive, then Self Refresh mode. 6. Illegal if trcd is not satisfied. 7. Illegal if tras is not satisfied. 8. Must satisfy burst interrupt condition. 9. Must satisfy bus contention, bus turn around, and/or write recovery requirements. 10. Must mask preceding data which don't satisfy tdpl. 11. Illegal if trrd is not satisfied 12. Illegal for single bank, but legal for other banks in multi-bank devices. 13. Illegal for all banks. Rev 1.0 / Dec. 2010 20

CKE Enable(CKE) Truth TABLE (Sheet 2 of 1) State Self Refresh Power Down All Banks Idle Previous Cycle CKE Cycle Command CS RAS CAS WE BA0, BA1 ADDR Action H X X X X X X X INVALID 1 L H H X X X X X Exit Self Refresh with Device Deselect L H L H H H X X Exit Self Refresh with No Operation 2 L H L H H L X X ILLEGAL 2 L H L H L X X X ILLEGAL 2 L H L L X X X X ILLEGAL 2 L L X X X X X X Maintain Self Refresh H X X X X X X X INVALID 1 L H H X X X X X Power Down mode exit, L H H H X X all banks idle L X X X X L H L X L X X X ILLEGAL 2 X X L X X L L X X X X X X Maintain Power Down Mode H H H X X X Refer to the idle State section 3 H H L H X X of the State 3 H H L L H X Truth Table 3 H H L L L H X X Auto Refresh H H L L L L OP CODE Mode Register Set 4 H L H X X X Refer to the idle State section 3 H L L H X X of the State 3 H L L L H X Truth Table 3 H L L L L H X X Entry Self Refresh 4 H L L L L L OP CODE Mode Register Set L X X X X X X X Power Down 4 Notes 2 2 Rev 1.0 / Dec. 2010 21

CKE Enable(CKE) Truth TABLE (Sheet 2 of 2) State Any State other than listed above Previous Cycle CKE Cycle Command CS RAS CAS WE BA0, BA1 ADDR H H X X X X X X H L X X X X X X Action Refer to operations of the State Truth Table Begin Clock Suspend next cycle L H X X X X X X Exit Clock Suspend next cycle L L X X X X X X Maintain Clock Suspend Notes Note : 1. For the given current state CKE must be low in the previous cycle. 2. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting power down mode, a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high. 3. The address inputs depend on the command that is issued. 4. The Precharge Power Down mode, the Self Refresh mode, and the Mode Register Set can only be entered from the all banks idle state. 5. When CKE has a low to high transition, the clock and other inputs are re-enabled asynchronously. When exiting deep power down mode, a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes high and is maintained for a minimum 200usec. Rev 1.0 / Dec. 2010 22

PACKAGE INFORMATION DIE 1 C D1 E1 E 54 28 27 CP e B A2 L1 A A1 L Symbol millimeters inches Min Typ Max Min Typ Max A 0.991-1.194 0.0390 0.0470 A1 0.050 0.100 0.150 0.0020 0.0039 0.0059 A2 0.950 1.000 1.050 0.0374 0.0394 0.0413 B 0.300-0.400 0.012-0.016 C 0.120-0.210 0.0047-0.0083 CP 0.10 0.0039 D1 22.149 22.22 22.327 0.8720 0.8748 0.8790 E 11.735 11.76 11.938 0.4620 0.4630 0.4700 E1 10.058 10.16 10.262 0.3950 0.4 0.4040 e - 0.8 - - 0.0315 - L 0.406-0.597 0.0160-0.0235 L1-0.8 - - 0.0315 - alpha 0 / 5 (min / max) Rev 1.0 / Dec. 2010 23