Supporting Information. for. A robust AFM-based method for locally measuring the elasticity of. samples
|
|
- Laureen Chambers
- 5 years ago
- Views:
Transcription
1 Supporting Information for A robust AFM-based method for locally measuring the elasticity of samples Alexandre Bubendorf 1 Stefan Walheim 23 Thomas Schimmel 2 and Ernst Meyer 1 Address: 1 Department of Physics University of Basel Klingelbergstrasse Basel Switzerland and 2 Institute of Nanotechnology (INT and Institute of Applied Physics (Karlsruhe Institute of Technology (KIT Karlsruhe Germany and 3 Karlsruhe Nano Micro Facility (KNMF Karlsruhe Germany alexander.bubendorf@outlook.fr Corresponding author Analytical expression for normal sample stiffness
2 The following computation steps establish the analytical expression for normal sample stiffness [1]. The formula is derived from the equations stated by Hurley and Turner [2] for the numerical determination of normal sample stiffness. These equations i.e. equations (1 (2 (3 (4 (5 (6 and (7 are based on the description of the dynamics of a clamped ideally beam-shaped cantilever elastically coupled to a sample by its tip published by Rabe [3] and Rabe and co-workers [4]. The model takes into account characteristics of the cantilever such as tilt angle α and dimensions namely total length L length from the clamped end to the tip L 1 length from the tip to the free end L 2 tip height h but also characteristics of the sample i.e. normal sample stiffness k samplenorm and lateral sample stiffness k samplelat represented by two springs coupled to the cantilever tip as shown in Figure S1. Figure S1: Modelization of clamped beam-shaped cantilever elastically coupled to a sample by its tip and used for the computation of normal sample stiffness. The cantilever characteristics i.e. L L 1 L 2 h and α correspond respectively to cantilever length length from the clamped end to the tip length from the tip to the free end tip height and tilt angle. The springs k samplenorm and k samplelat stand respectively for normal and lateral sample stiffnesses. Wavenumbers x n and y n associated with the measured n th flexural contact resonance f n and torsional contact resonances t n are computed by x n L = xnl 0 f n fn 0 S1
3 f 0 n is the cantilever resonance of n th flexural mode in free space and x 0 n the associated wavelength (values given in Rabe [3] obtained from the resolution of the characteristic equation cos(x n Lcosh(x n L + 1 = 0 and y n = (2n 1π 2 t n tn 0 t 0 n is the cantilever resonance of n th torsional mode in free space. The normalized lateral contact stiffness is determined by k samplelat = y nlcos(y n L sin(y n L 1 cos(y n L 2 k lat k lat is the lateral cantilever stiffness constant. The normal contact stiffness normalized with the cantilever flexural stiffness constant k 1 is obtained from the expression k samplenorm = B ± B 2 4AC (1 k 1 6A the positive root corresponds to the normalized contact stiffness and parameters A B and C are defined by A = k samplelat k samplenorm A (2 ( 2( ( A h = L 1 1 cos(x n L 1 cosh(x n L cos(x n L 2 cosh(x n L 2 S2
4 B = B 1 + B 2 + B 3 (3 with B 1 = [ ( ] sin 2 ksamplelat (α + cos 2 (α B k 1 (4 samplenorm ( B h 2 [( ( 1 = (x n L cos(x n L 2 cosh(x n L 2 sin(x n L 1 cosh(x n L 1 + cos(x n L 1 sinh(x n L 1 L 1 ( ( ] 1 cos(x n L 1 cosh(x n L 1 sin(x n L 2 cosh(x n L 2 + cos(x n L 2 sinh(x n L 2 B 2 = [( ] ksamplelat 1 cos(αsin(α B k 2 (5 samplenorm ( [ B h ( 2 = 2 (x n L cos(x n L 2 cosh(x n L 2 sin(x n L 1 sinh(x n L 1 L 1 ( ] + 1 cos(x n L 1 cosh(x n L 1 sin(x n L 2 sinh(x n L 2 Factor 2 that does not appear in Hurley and Turner [2] is actually a necessary correction as introduced by Steiner et al. [5] S3
5 [ ( ] B 3 = cos 2 ksamplelat (α + sin 2 (α B k 3 (6 samplenorm [ ( ( B 3 = x n L cos(x n L 2 cosh(x n L 2 sin(x n L 1 cosh(x n L 1 cos(x n L 1 sinh(x n L 1 ( ( 1 cos(x n L 1 cosh(x n L 1 sin(x n L 2 cosh(x n L 2 cos(x n L 2 sinh(x n L 2 ] and C = 2(x n L 1 4 (1 + cos(x n Lcosh(x n L. (7 Parameter B can be split into two terms one with k samplenorm and the other without; B = β 1 + β 2 k samplelat k samplenorm with β 1 = sin 2 (αb 1 cos(αsin(αb 2 + cos 2 (αb 3 and β 2 = cos 2 (αb 1 + cos(αsin(αb 2 + sin 2 (αb 3. S4
6 By setting a new variable ε of expression ε = 6A k samplelat k 1 we can rewrite equation (1 as ε + B = ± B 2 4AC. Finally by squaring each side of the equation and isolating k samplenorm we find the following expression for the normal sample stiffness k samplenorm = 2A Cε 1 + β 2 0.5ε + β 1 k samplelat. References 1. Bubendorf A. Elasticity of Polymers Investigated by Atomic Force Microscopy. Ph. D. Thesis University of Basel Basel Switzerland Hurley D. C.; Turner J. A. J. Appl. Phys doi: / Rabe U. Atomic Force Acoustic Microscopy. In Applied Scanning Probe Methods II; Bhushan B. Fuchs H. Eds.; Springer: Berlin Heidelberg Germany 2006; pp doi: / _2. 4. Rabe U.; Turner J. A.; Arnold W. Appl. Phys. A doi: / s Steiner P.; Roth R.; Gnecco E.; Glatzel T.; Baratoff A.; Meyer E. Nanotechnology doi: / /20/49/ S5
FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS
FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS Kai GENG, Ute RABE, Sigrun HIRSEKORN Fraunhofer Institute for Nondestructive Testing (IZFP); Saarbrücken, Germany Phone: +49 681 9302
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3 and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationLorentz Contact Resonance for viscoelastic measurements of polymer blends
The world leader in nanoscale IR spectroscopy for viscoelastic measurements of polymer blends (LCR) reliably compares viscoleastic properties with nanoscale spatial resolution With no moving parts in the
More informationImproving the accuracy of Atomic Force Microscope based nanomechanical measurements. Bede Pittenger Bruker Nano Surfaces, Santa Barbara, CA, USA
Improving the accuracy of Atomic Force Microscope based nanomechanical measurements Bede Pittenger Bruker Nano Surfaces, Santa Barbara, CA, USA How can we improve accuracy in our nanomechanical measurements?
More informationLorentz Contact Resonance for viscoelastic measurements of polymer blends
The nanoscale spectroscopy company The world leader in nanoscale IR spectroscopy Lorentz Contact Resonance for viscoelastic measurements of polymer blends Lorentz Contact Resonance (LCR) reliably compares
More informationRP 2.7. SEG/Houston 2005 Annual Meeting 1525
Manika Prasad, Ronny Hofmann, Mike Batzle, Colorado School of Mines; M. Kopycinska-Müller, U. Rabe, and W. Arnold, Fraunhofer Institute for Nondestructive Testing, IZFP, Saarbrücken Summary Seismic wave
More informationPositioning, Structuring and Controlling with Nanoprecision
Positioning, Structuring and Controlling with Nanoprecision Regine Hedderich 1,2, Tobias Heiler 2,3, Roland Gröger 2,3, Thomas Schimmel 2,3, and Stefan Walheim 2,3 1 Network NanoMat 2 Institute of Nanotechnology,
More informationBridge between research in modern physics and entrepreneurship in nanotechnology. Quantum Physics
Bridge between research in modern physics and entrepreneurship in nanotechnology Quantum Physics The physics of the very small with great applications Part 2 QUANTUM PROPERTIES & TECHNOLOGY TRANSLATION
More informationAFM-IR: Technology and applications in nanoscale infrared spectroscopy and chemical imaging
Supporting Information AFM-IR: Technology and applications in nanoscale infrared spectroscopy and chemical imaging Alexandre Dazzi 1 * and Craig B. Prater 2 1 Laboratoire de Chimie Physique, Univ. Paris-Sud,
More informationDynamic Analysis of AFM in Air and Liquid Environments Considering Linear and Nonlinear Interaction Forces by Timoshenko Beam Model
Int J Advanced Design and Manufacturing Technology, Vol. 8/ No. / June - 15 7 Dynamic Analysis of AFM in Air and Liquid Environments Considering Linear and Nonlinear Interaction Forces by Timoshenko Beam
More informationDiameter- and Loading Mode Effects of Modulus in ZnO Nanowires
Diameter- and Loading Mode Effects of Modulus in ZnO Nanowires In Situ Measurements & Theoretical Understanding Mo-rigen H, CQ Chen, Y Shi, YS Zhang, W Zhou, JW Chen, YJ Yan, J Zhu* Beijing National Center
More informationFeatures of static and dynamic friction profiles in one and two dimensions on polymer and atomically flat surfaces using atomic force microscopy
Features of static and dynamic friction profiles in one and two dimensions on polymer and atomically flat surfaces using atomic force microscopy Author Watson, Gregory, Watson, Jolanta Published 008 Journal
More informationEffect of AFM Cantilever Geometry on the DPL Nanomachining process
Int J Advanced Design and Manufacturing Technology, Vol. 9/ No. 4/ December 2016 75 Effect of AFM Cantilever Geometry on the DPL Nanomachining process A. R. Norouzi Department of New Sciences and Technologies,
More informationHyperbolics. Scott Morgan. Further Mathematics Support Programme - WJEC A-Level Further Mathematics 31st March scott3142.
Hyperbolics Scott Morgan Further Mathematics Support Programme - WJEC A-Level Further Mathematics 3st March 208 scott342.com @Scott342 Topics Hyperbolic Identities Calculus with Hyperbolics - Differentiation
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/08/06 Prof. C. Ortiz, MIT-DMSE I LECTURE 2 : THE FORCE TRANSDUCER
I LECTURE 2 : THE FORCE TRANSDUCER Outline : LAST TIME : WHAT IS NANOMECHANICS... 2 HOW CAN WE MEASURE SUCH TINY FORCES?... 3 EXAMPLE OF A FORCE TRANSDUCER... 4 Microfabricated cantilever beams with nanosized
More information2 Atomic Force Acoustic Microscopy
2 Atomic Force Acoustic Microscopy Ute Rabe Abbreviations a 1, a 2, a 3, a 4 and A 1, A 2, A 3, A 4 Constants in the shape function y(x) a C Contact radius α Wave number of the flexural waves A Cross-section
More informationEnrico Gnecco Department of Physics. University of Basel, Switzerland
AOSCIECES AD AOTECHOOGIES anotribology - Enrico Gnecco AOTRIBOOGY Enrico Gnecco Department of Physics. University of Basel, Switzerland Keywords: Atomic stick-slip, Friction force microscopy, oad dependence
More informationChapter 13: General Solutions to Homogeneous Linear Differential Equations
Worked Solutions 1 Chapter 13: General Solutions to Homogeneous Linear Differential Equations 13.2 a. Verifying that {y 1, y 2 } is a fundamental solution set: We have y 1 (x) = cos(2x) y 1 (x) = 2 sin(2x)
More informationSupporting data for On the structure and topography of free-standing chemically modified graphene
1 Supporting data for On the structure and topography of free-standing chemically modified graphene N R Wilson 1, P A Pandey 1, R Beanland 1, J P Rourke 2, U Lupo 1, G Rowlands 1 and R A Römer 1,3 1 Department
More informationMaterial Anisotropy Revealed by Phase Contrast in Intermittent Contact Atomic Force Microscopy
University of Pennsylvania ScholarlyCommons Departmental Papers (MEAM) Department of Mechanical Engineering & Applied Mechanics 5-17-2002 Material Anisotropy Revealed by Phase Contrast in Intermittent
More informationModule 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM
Module 26: Atomic Force Microscopy Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM 1 The AFM apart from generating the information about the topography of the sample features can be used
More informationSupporting Information
Supporting Information Thickness of suspended epitaxial graphene (SEG) resonators: Graphene thickness was estimated using an atomic force microscope (AFM) by going over the step edge from SiC to graphene.
More informationScanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010
Scanning Probe Microscopy Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010 Scanning Probe Microscopy High-Resolution Surface Analysis
More informationSuperlubricity on the nanometer scale
Friction 2(2): 106 113 (2014) ISSN 2223-7690 DOI 10.1007/s40544-014-0052-4 CN 10-1237/TH REVIEW ARTICLE Superlubricity on the nanometer scale Ernst MEYER 1,*, Enrico GNECCO 2 1 Department of Physics, University
More informationIntroduction to Scanning Probe Microscopy Zhe Fei
Introduction to Scanning Probe Microscopy Zhe Fei Phys 590B, Apr. 2019 1 Outline Part 1 SPM Overview Part 2 Scanning tunneling microscopy Part 3 Atomic force microscopy Part 4 Electric & Magnetic force
More informationDETERMINATION OF THE ADHESION PROPERTIES OF MICA VIA ATOMIC FORCE SPECTROSCOPY
2nd International Conference on Ultrafine Grained & Nanostructured Materials (UFGNSM) International Journal of Modern Physics: Conference Series Vol. 5 (2012) 33 40 World Scientific Publishing Company
More informationRolling, Sliding and Torsion friction of single silica microspheres: Comparison of nanoindentation based experimental data with DEM simulation Part A
Faculty of Science and Technology Chair of Surface and Materials Technology Institute of Materials Engineering Rolling, Sliding and Torsion friction of single silica microspheres: Comparison of nanoindentation
More informationDynamic response of a cracked atomic force microscope cantilever used for nanomachining
NANO EXPRESS Open Access Dynamic response of a cracked atomic force microscope cantilever used for nanomachining Haw-Long Lee and Win-Jin Chang * Abstract The vibration behavior of an atomic force microscope
More informationAmplitude dependence of image quality in atomically-resolved bimodal atomic microscopy
Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy Hiroaki Ooe, 1,2 a) Dominik Kirpal, 1 Daniel S. Wastl, 1 Alfred J. Weymouth, 1 Toyoko Arai, 2 and Franz J. Giessibl
More informationf(g(x)) g (x) dx = f(u) du.
1. Techniques of Integration Section 8-IT 1.1. Basic integration formulas. Integration is more difficult than derivation. The derivative of every rational function or trigonometric function is another
More informationSPM 150 Aarhus with KolibriSensor TM
Surface Analysis Technology Vacuum Components Surface Analysis System Software Computer Technology SPM 150 Aarhus with KolibriSensor TM Acquisition of atomic site specific force spectroscopy and two-dimensional
More informationELECTROMAGNETIC-RESONANCE-ULTRASOUND MICROSCOPY (ERUM) FOR QUANTITATIVE EVALUATION OF LOCALIZED ELASTIC CONSTANTS OF SOLIDS
ELECTROMAGNETIC-RESONANCE-ULTRASOUND MICROSCOPY (ERUM) FOR QUANTITATIVE EVALUATION OF LOCALIZED ELASTIC CONSTANTS OF SOLIDS J. Tian, H.Ogi, T. Tada and M. Hirao Graduate School of Engineering Science,
More informationLecture 4 Scanning Probe Microscopy (SPM)
Lecture 4 Scanning Probe Microscopy (SPM) General components of SPM; Tip --- the probe; Cantilever --- the indicator of the tip; Tip-sample interaction --- the feedback system; Scanner --- piezoelectric
More informationMSE640: Advances in Investigation of Intermolecular & Surface Forces
MSE640: Advances in Investigation of Forces Course Title Advances in investigation of Intermolecular & surface forces Course Code MSE640 Credit Hours 3 Pre-requisites (if any) MSE507, MSE508 or equivalent
More informationCharacterization of MEMS Devices
MEMS: Characterization Characterization of MEMS Devices Prasanna S. Gandhi Assistant Professor, Department of Mechanical Engineering, Indian Institute of Technology, Bombay, Recap Characterization of MEMS
More informationAFM Studies of Pristine PCBM Changes Under Light Exposure. Erin Chambers
AFM Studies of Pristine PCBM Changes Under Light Exposure Erin Chambers Faculty of health, science, and technology Department of engineering and physics 15 cr Krister Svensson Lars Johansson 28 March 2013
More informationa. y= 5x 2 +2x 3 d. 2x+5=10 b. y= 3 x 2 c. y= 1 x 3 Learning Goal QUIZ Trigonometric Identities. OH nooooooo! Class Opener: March 17, 2015
DAY 48 March 16/17, 2015 OH nooooooo! Class Opener: Find D and R: a. y= 5x 2 +2x 3 b. y= 3 x 2 c. y= 1 x 3 +2 d. 2x+5=10 Nov 14 2:45 PM Learning Goal 5.1.-5.2. QUIZ Trigonometric Identities. Mar 13 11:56
More informationThe New Boundary Condition Effect on The Free Vibration Analysis of Micro-beams Based on The Modified Couple Stress Theory
International Research Journal of Applied and Basic Sciences 2015 Available online at www.irjabs.com ISSN 2251-838X / Vol, 9 (3): 274-279 Science Explorer Publications The New Boundary Condition Effect
More informationMay the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa
May the Force be with you: High-speed Atomic Force Microscopes for Synchrotron Sample Holders Luca Costa ESRF, The European Synchrotron 71 Rue des Martyrs, 38000 Grenoble, France EXP DIV - THE SURFACE
More informatione y [cos(x) + i sin(x)] e y [cos(x) i sin(x)] ] sin(x) + ey e y x = nπ for n = 0, ±1, ±2,... cos(nπ) = ey e y 0 = ey e y sin(z) = 0,
Worked Solutions 83 Chapter 3: Power Series Solutions II: Generalizations Theory 34 a Suppose that e z = 0 for some z = x + iy Then both the real imaginary parts of e z must be zero, e x cos(y) = 0 e x
More informationOptimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy
11 th World Congress on Structural and Multidisciplinary Optimisation 07 th -12 th, June 2015, Sydney Australia Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy
More informationThe Fluid-Coupled Motion of Micro and Nanoscale Cantilevers
IOSR Journal of Mechanical and Civil Engineering (IOSR-JMCE) e-issn: 2278-1684,p-ISSN: 2320-334X PP. 54-58 www.iosrjournals.org The Fluid-Coupled Motion of Micro and Nanoscale Cantilevers T Paramesh Associate
More informationChapter 2 Correlation Force Spectroscopy
Chapter 2 Correlation Force Spectroscopy Correlation Force Spectroscopy: Rationale In principle, the main advantage of correlation force spectroscopy (CFS) over onecantilever atomic force microscopy (AFM)
More informationGDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers
Int. J. Nanosci. Nanotechnol., Vol. 10, No. 4, Dec. 2014, pp. 205-214 GDQEM Analysis for Free Vibration of V-shaped Atomic Force Microscope Cantilevers M. H. Korayem 1*, A. Karimi 1, S. Sadeghzadeh 1,2
More informationSUPPLEMENTARY INFORMATION
SUPPLEMENTARY INFORMATION DOI: 10.1038/NNANO.2011.123 Ultra-strong Adhesion of Graphene Membranes Steven P. Koenig, Narasimha G. Boddeti, Martin L. Dunn, and J. Scott Bunch* Department of Mechanical Engineering,
More informationMAS113 CALCULUS II SPRING 2008, QUIZ 5 SOLUTIONS. x 2 dx = 3y + y 3 = x 3 + c. It can be easily verified that the differential equation is exact, as
MAS113 CALCULUS II SPRING 008, QUIZ 5 SOLUTIONS Quiz 5a Solutions (1) Solve the differential equation y = x 1 + y. (1 + y )y = x = (1 + y ) = x = 3y + y 3 = x 3 + c. () Solve the differential equation
More informationFoundations of Ultraprecision Mechanism Design
Foundations of Ultraprecision Mechanism Design S.T. Smith University of North Carolina at Charlotte, USA and D.G. Chetwynd University of Warwick, UK GORDON AND BREACH SCIENCE PUBLISHERS Switzerland Australia
More informationVibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle Interaction
Journal of Novel Applied Sciences Available online at www.jnasci.org 2013 JNAS Journal-2013-2-S/806-811 ISSN 2322-5149 2013 JNAS Vibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle
More informationDevelopment of a nanostructural microwave probe based on GaAs
Microsyst Technol (2008) 14:1021 1025 DOI 10.1007/s00542-007-0484-0 TECHNICAL PAPER Development of a nanostructural microwave probe based on GaAs Y. Ju Æ T. Kobayashi Æ H. Soyama Received: 18 June 2007
More informationApplication Note #148 Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR
CR Storage Modulus CR Loss Modulus FSTForce Volume CR diagram pplication Note #148 Quantitative Measurements of Elastic and Viscoelastic Properties with FSTForce Volume CR Quantitatively characterizing
More informationChapter 12. Nanometrology. Oxford University Press All rights reserved.
Chapter 12 Nanometrology Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands in relation to a meter and sub divisions of meter. Nanometrology
More informationMath Spring 2014 Solutions to Assignment # 6 Completion Date: Friday May 23, 2014
Math 11 - Spring 014 Solutions to Assignment # 6 Completion Date: Friday May, 014 Question 1. [p 109, #9] With the aid of expressions 15) 16) in Sec. 4 for sin z cos z, namely, sin z = sin x + sinh y cos
More informationLateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
University of Pennsylvania ScholarlyCommons Departmental Papers (MEAM) Department of Mechanical Engineering & Applied Mechanics 5--006 Lateral force calibration in atomic force microscopy: A new lateral
More informationAcoustics and atomic force microscopy for the mechanical characterization of thin films
Anal Bioanal Chem (2010) 396:2769 2783 DOI 10.1007/s00216-009-3402-8 REVIEW Acoustics and atomic force microscopy for the mechanical characterization of thin films Daniele Passeri & Andrea Bettucci & Marco
More informationSize dependence of the mechanical properties of ZnO nanobelts
Philosophical Magazine, Vol. 87, Nos. 14 15, 11 21 May 2007, 2135 2141 Size dependence of the mechanical properties of ZnO nanobelts M. LUCAS*y, W. J. MAIz, R. S. YANGz, Z. L WANGz and E. RIEDO*y yschool
More informationEnhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency
PHYSICAL REVIEW B 71, 125416 2005 Enhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency M. Balantekin* and A. Atalar Bilkent University, Electrical
More informationOutline Scanning Probe Microscope (SPM)
AFM Outline Scanning Probe Microscope (SPM) A family of microscopy forms where a sharp probe is scanned across a surface and some tip/sample interactions are monitored Scanning Tunneling Microscopy (STM)
More information3.052 Nanomechanics of Materials and Biomaterials Thursday 02/15/07 Prof. C. Ortiz, MIT-DMSE I LECTURE 4: FORCE-DISTANCE CURVES
I LECTURE 4: FORCE-DISTANCE CURVES Outline : LAST TIME : ADDITIONAL NANOMECHANICS INSTRUMENTATION COMPONENTS... 2 PIEZOS TUBES : X/Y SCANNING... 3 GENERAL COMPONENTS OF A NANOMECHANICAL DEVICE... 4 HIGH
More informationIntroduction to Nanomechanics: Magnetic resonance imaging with nanomechanics
Introduction to Nanomechanics: Magnetic resonance imaging with nanomechanics Martino Poggio Swiss Nanoscience Institute Department of Physics University of Basel Switzerland Nano I, Herbstsemester 2009
More informationMeasurements of interaction forces in (biological) model systems
Measurements of interaction forces in (biological) model systems Marina Ruths Department of Chemistry, UMass Lowell What can force measurements tell us about a system? Depending on the technique, we might
More informationApplication of electrostatic force microscopy in nanosystem diagnostics
Materials Science, Vol., No. 3, 003 Application of electrostatic force microscopy in nanosystem diagnostics TEODOR P. GOTSZALK *, PIOTR GRABIEC, IVO W. RANGELOW 3 Fulty of Microsystem Electronics and Photonics,
More informationHybrid Numerical Simulation of Electrostatic Force Microscopes Considering Charge Distribution
PIERS ONLINE, VOL. 3, NO. 3, 2007 300 Hybrid Numerical Simulation of Electrostatic Force Microscopes Considering Charge Distribution U. B. Bala, M. Greiff, and W. Mathis Institute of Electromagnetic Theory
More informationAnd Manipulation by Scanning Probe Microscope
Basic 15 Nanometer Scale Measurement And Manipulation by Scanning Probe Microscope Prof. K. Fukuzawa Dept. of Micro/Nano Systems Engineering Nagoya University I. Basics of scanning probe microscope Basic
More informationMagnetic nanoparticles containing soft-hard diblock
Electronic Supplementary Material (ESI) for Nanoscale. This journal is The Royal Society of Chemistry 2018 Electronic Supplementary Information Magnetic nanoparticles containing soft-hard diblock copolymer
More informationTECHNIQUE TO EVALUATE NANOMECHANICS OF CANTILEVER AT NANOSCALE BY USING AFM
TECHNIQUE TO EVALUATE NANOMECHANICS OF CANTILEVER AT NANOSCALE BY USING AFM Upendra Sharan Gupta 1, Rahul Singh 2, Savan Parmar 3, Prasanna Gupta 4, Vipul Pandey 5 1 Reader Dept. of Mech. Engineering,
More informationForce-distance studies with piezoelectric tuning forks below 4.2K
submitted to APPLIED SURFACE SCIENCE nc-afm 99, Pontresina Force-distance studies with piezoelectric tuning forks below 4.2K J. Rychen, T. Ihn, P. Studerus, A. Herrmann, K. Ensslin Solid State Physics
More informationNitride HFETs applications: Conductance DLTS
Nitride HFETs applications: Conductance DLTS The capacitance DLTS cannot be used for device trap profiling as the capacitance for the gate will be very small Conductance DLTS is similar to capacitance
More informationComplex Trigonometric and Hyperbolic Functions (7A)
Complex Trigonometric and Hyperbolic Functions (7A) 07/08/015 Copyright (c) 011-015 Young W. Lim. Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation
More informationMATH 251 Examination I October 9, 2014 FORM A. Name: Student Number: Section:
MATH 251 Examination I October 9, 2014 FORM A Name: Student Number: Section: This exam has 14 questions for a total of 100 points. Show all you your work! In order to obtain full credit for partial credit
More informationSliding Mode Control of AFM in Contact Mode during Manipulation of Nano-Particle
Int J Advanced Design and Manufacturing Technology, Vol. 6/ No. 4/ December 2013 83 Sliding Mode Control of AFM in Contact Mode during Manipulation of Nano-Particle M. H. Korayem* Department of Mechanical
More informationAtomic Force Microscopy imaging and beyond
Atomic Force Microscopy imaging and beyond Arif Mumtaz Magnetism and Magnetic Materials Group Department of Physics, QAU Coworkers: Prof. Dr. S.K.Hasanain M. Tariq Khan Alam Imaging and beyond Scanning
More informationNonlinear Vibration of the Double-Beams Assembly Subjected to A.C. Electrostatic Force
Copyright 21 Tech Science Press CMES, vol.6, no.1, pp.95-114, 21 Nonlinear Vibration of the Double-Beams Assembly Subjected to A.C. Electrostatic Force Shueei-Muh Lin 1 Abstract: In this study, the mathematical
More informationSUPPLEMENTARY INFORMATION
Supplementary Information for Manuscript: Nanoscale wear as a stress-assisted chemical reaction Supplementary Methods For each wear increment, the diamond indenter was slid laterally relative to the silicon
More informationNanomechanics Measurements and Standards at NIST
Nanomechanics Measurements and Standards at NIST Robert F. Cook Deputy Chief, Ceramics Division Leader, Nanomechanical Properties Group robert.cook@nist.gov NIST Mission Promote U.S. innovation and industrial
More informationModeling, Simulation and Optimization of the Mechanical Response of Micromechanical Silicon Cantilever: Application to Piezoresistive Force Sensor
Available online at www.sciencedirect.com ScienceDirect Physics Procedia 55 (2014 ) 348 355 Eight International Conference on Material Sciences (CSM8-ISM5) Modeling, Simulation and Optimization of the
More informationSTM: Scanning Tunneling Microscope
STM: Scanning Tunneling Microscope Basic idea STM working principle Schematic representation of the sample-tip tunnel barrier Assume tip and sample described by two infinite plate electrodes Φ t +Φ s =
More information2 Transformation Optics
2 Transformation Optics Martin Wegener Abstract We briefly reviewed the concept of transformation optics for designing functionalities. We also gave recent experimental examples from different areas of
More informationNanotube AFM Probe Resolution
Influence of Elastic Deformation on Single-Wall Carbon Nanotube AFM Probe Resolution Ian R. Shapiro, Santiago D. Solares, Maria J. Esplandiu, Lawrence A. Wade, William A. Goddard,* and C. Patrick Collier*
More informationEcole Franco-Roumaine : Magnétisme des systèmes nanoscopiques et structures hybrides - Brasov, Modern Analytical Microscopic Tools
1. Introduction Solid Surfaces Analysis Group, Institute of Physics, Chemnitz University of Technology, Germany 2. Limitations of Conventional Optical Microscopy 3. Electron Microscopies Transmission Electron
More informationElectron Interferometer Formed with a Scanning Probe Tip and Quantum Point Contact Supplementary Information
Electron Interferometer Formed with a Scanning Probe Tip and Quantum Point Contact Supplementary Information Section I: Experimental Details Here we elaborate on the experimental details described for
More informationEE C245 ME C218 Introduction to MEMS Design
EE C245 ME C218 Introduction to MEMS Design Fall 2007 Prof. Clark T.-C. Nguyen Dept. of Electrical Engineering & Computer Sciences University of California at Berkeley Berkeley, CA 94720 Lecture 16: Energy
More informationThe velocity dependence of frictional forces in point-contact friction
Appl. Phys. A, S3 S7 (199) Applied Physics A Materials Science & Processing Springer-Verlag 199 The velocity dependence of frictional forces in point-contact friction O. Zwörner, H. Hölscher, U. D. Schwarz,
More informationAtomic force microscopy study of polypropylene surfaces treated by UV and ozone exposure: modification of morphology and adhesion force
Ž. Applied Surface Science 144 145 1999 627 632 Atomic force microscopy study of polypropylene surfaces treated by UV and ozone exposure: modification of morphology and adhesion force H.-Y. Nie ), M.J.
More informationTitle Single Row Nano-Tribological Printing: A novel additive manufacturing method for nanostructures
Nano-Tribological Printing: A novel additive manufacturing method for nanostructures H.S. Khare, N.N. Gosvami, I. Lahouij, R.W. Carpick 1 Mechanical Engineering and Applied Mechanics, University of Pennsylvania,
More informationMolecular and carbon based electronic systems
Molecular and carbon based electronic systems Single molecule deposition and properties on surfaces Bottom Up Top Down Fundamental Knowledge & Functional Devices Thilo Glatzel, thilo.glatzel@unibas.ch
More informationRHK Technology Brief
The Atomic Force Microscope as a Critical Tool for Research in Nanotribology Rachel Cannara and Robert W. Carpick Nanomechanics Laboratory, University of Wisconsin Madison Department of Engineering Physics,
More informationINTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY
INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY SECOND EDITION C. JULIAN CHEN Department of Applied Physics and Applied Mathematics, Columbia University, New York OXFORD UNIVERSITY PRESS Contents Preface
More informationChapter 10. Nanometrology. Oxford University Press All rights reserved.
Chapter 10 Nanometrology Oxford University Press 2013. All rights reserved. 1 Introduction Nanometrology is the science of measurement at the nanoscale level. Figure illustrates where nanoscale stands
More informationLecture 12: AFM measurement of chemical bonding forces (and molecule weight)
Lecture 12: AFM measurement of chemical bonding forces (and molecule weight) Chemical bonding (Atomic force) measured by atomic force microscope; What are the challenges? Direct measurement of single-covalent
More informationNoncontact lateral-force gradient measurement on Si 111-7Ã 7 surface with small-amplitude off-resonance atomic force microscopy
Noncontact lateral-force gradient measurement on Si 111-7Ã 7 surface with small-amplitude off-resonance atomic force microscopy Mehrdad Atabak a Department of Physics, Bilkent University, Bilkent, Ankara
More informationSimple Harmonic Motion and Damping
Simple Harmonic Motion and Damping Marie Johnson Cabrices Chamblee Charter High School Background: Atomic Force Microscopy, or AFM, is used to characterize materials. It is used to measure local properties,
More informationQUINTIC SPLINE SOLUTIONS OF FOURTH ORDER BOUNDARY-VALUE PROBLEMS
INTERNATIONAL JOURNAL OF NUMERICAL ANALYSIS AND MODELING Volume 5, Number, Pages 0 c 2008 Institute for Scientific Computing Information QUINTIC SPLINE SOLUTIONS OF FOURTH ORDER BOUNDARY-VALUE PROBLEMS
More informationMATH Test II
MATH 3113-008 Test II Dr. Darren Ong March 25, 2015 2:30pm-3:20pm Answer the questions in the spaces provided on the question sheets. If you run out of room for an answer, continue on the back of the page.
More informationNew concept of a 3D-probing system for micro-components
Research Collection Journal Article New concept of a 3D-probing system for micro-components Author(s): Liebrich, Thomas; Kanpp, W. Publication Date: 2010 Permanent Link: https://doi.org/10.3929/ethz-a-006071031
More informationNanoscale Chemical Imaging with Photo-induced Force Microscopy
OG2 BCP39nm_0062 PiFM (LIA1R)Fwd 500 279.1 µv 375 250 nm 500 375 250 125 0 nm 125 219.0 µv Nanoscale Chemical Imaging with Photo-induced Force Microscopy 0 Thomas R. Albrecht, Derek Nowak, Will Morrison,
More informationNanoscale IR spectroscopy of organic contaminants
The nanoscale spectroscopy company The world leader in nanoscale IR spectroscopy Nanoscale IR spectroscopy of organic contaminants Application note nanoir uniquely and unambiguously identifies organic
More informationDesign and Analysis of Various Microcantilever Shapes for MEMS Based Sensing
ScieTech 014 Journal of Physics: Conference Series 495 (014) 01045 doi:10.1088/174-6596/495/1/01045 Design and Analysis of Various Microcantilever Shapes for MEMS Based Sensing H. F. Hawari, Y. Wahab,
More informationVEDA - Virtual Environment for Dynamic Atomic Force Microscopy
VEDA - Virtual Environment for Dynamic Atomic Force Microscopy John Melcher, Daniel Kiracofe, doctoral students Steven Johnson, undergraduate Shuiqing Hu, Veeco Arvind Raman, Associate Professor Mechanical
More informationMODELING OF T-SHAPED MICROCANTILEVER RESONATORS. Margarita Narducci, Eduard Figueras, Isabel Gràcia, Luis Fonseca, Joaquin Santander, Carles Cané
Stresa, Italy, 5-7 April 007 MODELING OF T-SHAPED MICROCANTILEVER RESONATORS Margarita Narducci, Eduard Figueras, Isabel Gràcia, Luis Fonseca, Joaquin Santander, Carles Centro Nacional de Microelectrónica
More informationScanning Probe Microscopy. EMSE-515 F. Ernst
Scanning Probe Microscopy EMSE-515 F. Ernst 1 Literature 2 3 Scanning Probe Microscopy: The Lab on a Tip by Ernst Meyer,Ans Josef Hug,Roland Bennewitz 4 Scanning Probe Microscopy and Spectroscopy : Theory,
More information