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1 Observation of the room-temperature local ferromagnetism and its nanoscale expansion in the ferromagnetic semiconductor Ge 1 xfe x Yuki K. Wakabayashi 1 and Yukio Takahashi 2 1 Department of Electrical Engineering and Information Systems, Tanaka-Ohya lab. 2 Department of Physics, Fujimori lab. ( 2 currently:department of Physics, Komori lab.) 1. Authors Yuki K. Wakabayashi:His major is semiconductor spintronics. He is investigating physical properties and device applications of the magnetic thin films which have high compatibility with the Si technology. Yukio takahashi:his major is nanoscale magnetics. He is investigating magnetic materials by using X-ray magnetic circular dichroism (XMCD) and scanning Tunneing Microscope. 2. Introduction A major issue that must be addressed for the realization of semiconductor spintronic devices is to achieve room-temperature ferromagnetism in ferromagnetic semiconductors (FMSs) based on the widely used III-V and group-iv materials. Recently, however, the group-iv-based FMS, Ge 1 xfe x (GeFe) [1-6], has been reported to exhibit several attractive features. It can be grown epitaxially on Si and Ge substrates without the formation of intermetallic precipitates (Fig. 1), and is therefore compatible with mature Si process technology. The Curie temperature (T C) can be easily increased to above 200 K by thermal annealing [4]. Furthermore, T C does not depend on the carrier concentration, and thus T C and resistivity can be controlled separately [3], which is a unique feature that is only observed in GeFe and is a considerable advantage in overcoming the conductivity mismatch problem between ferromagnetic metals and semiconductors in spin-injection devices. Despite these attractive features, a detailed microscopic understanding of the ferromagnetism in GeFe, which is Figure 1. Transmission electron microscopy (TEM) lattice image of the Ge 0.935Fe film. vitally important for room-temperature applications, is lacking. 3. Purpose of the study Here, we investigate the local electronic and magnetic properties of GeFe using X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD), which are powerful techniques for element-specific detection of local electronic states and magnetic moments [6]. We find that nanoscale local ferromagnetic regions remain in the GeFe films even at room temperature, i.e., well above T C; it follows that GeFe potentially has strong ferromagnetism, which persists even at room temperature. Furthermore, we observe the intriguing feature that ferromagnetic regions, which are formed above T C via the ferromagnetic exchange interaction in high-fe concentration regions of the films, develop and expand as the temperature decreases, and that all of them coalesce at temperatures below T C. Such a nanoscale
2 Figure 2. (a), (b) Schematic sample structures for sample A (a) and sample (b). expansion of the ferromagnetic regions is a key feature in understanding materials that exhibit single-phase ferromagnetism despite the inhomogeneous distribution of magnetic atoms in the film. 4. Basic properties of our GeFe films We carried out XMCD measurements on two samples (labeled A and B) consisting of a 120-nm-thick Ge 0.935Fe layer grown on a Ge(001) substrate by low-temperature molecular beam epitaxy (LT-MBE). The Ge 0.935Fe layer of sample A was grown at 160 C, whereas that of sample B was grown at 240 C (Fig. 2). We found T C = 20 K and 100 K for samples A and B, respectively. Detailed crystallographic analyses, including in situ reflection high-energy electron diffraction (RHEED), high-resolution transmission electron microscopy (TEM), spatially resolved transmission-electron diffraction (TED) combined with energy-dispersive X-ray spectroscopy (EDX) and X-ray diffraction (XRD), showed that the GeFe films have a diamond-type single-crystal structure without any ferromagnetic precipitates and with nanoscale spatial Fe concentration fluctuations of 4% 7% (sample A) and 3% 10% (sample B) (Fig. 3). We found that T C is higher when the fluctuations in the Fe concentration are larger. In addition, channeling Rutherford backscattering (c-rbs) and channeling particle-induced X-ray emission (c-pixe) measurements showed that ~85% (~15%) of the doped Fe atoms exist at the substitutional (tetrahedral interstitial) sites in both samples A and B, and that the interstitial Fe Figure 3. The TEM lattice images (left figures) and the TED patterns (right figures) for samples A and B. concentration is not related to T C. This also indicates that there are no ferromagnetic precipitates with different crystal structures in our films. 5. Results We measured the Fe L 2,3-edge XAS spectra [μ +, μ and (μ + + μ )/2] of samples A [Fig. 4(a)] and B [Fig. 4(b)] at 5.6 K with μ 0H = 5 T applied perpendicular to the film surface. Here, μ + and μ refer to the absorption coefficients for photon helicity parallel and antiparallel to the Fe 3d majority spin direction, respectively. In both films, three peaks a, b and c are observed at the Fe L 3 edge in the XAS spectra [see also the insets in Fig. 4(a),(b)]. We found that the small peak c was suppressed by etching the surface with dilute HF, indicating that this peak, which can be assigned to the Fe 3+ state, originates from a small quantity of surface Fe oxide, which remains even after surface cleaning. Meanwhile, peaks a and b are assigned to the Fe atoms in GeFe. Peaks a and b can be assigned to the Fe 2+ state. We measured the Fe L 2,3-edge XMCD (= μ + μ )
3 Figure 5. The H dependence of the XMCD intensity at X shown in Fig. 1 ( ev) at 5.6 K, the MCD intensity at 5 K with a photon energy of 2.3 ev corresponding to the L-point energy gap of bulk Ge, and the magnetization measured using a SQUID at 5 K for sample B. Figure 4. (a), (b) The dependence of the XMCD intensity measured at X on the effective magnetic field H eff for sample A (a) and sample B (b) at various temperatures. The total magnetization (M = m spin + m orb) obtained using the XMCD sum rules is also plotted (filled red symbols). We scaled the vertical axis of the XMCD intensity so that it represents M at each temperature. In all measurements, H was applied perpendicular to the film surface. spectra of samples A [Fig. 4(c)] and B [Fig. 4(d)] at 5.6 K with various H applied perpendicular to the film surface. Here, we discuss the XMCD intensities at ev (X) and ev (Y), which correspond to the photon energies of peaks a and b in the XAS spectra, respectively. When normalized to ev, the XMCD spectra with various H differ, and the intensity at X grows faster than that at Y as H increases, as shown in the insets of Fig. 4(c),(d). As shown in Fig. 4(a),(b), the shapes of the XAS spectra at the Fe L 3 edge are similar between samples A and B, which have almost the same interstitial Fe concentrations (i.e., 15% of the total Fe content 6 ); therefore, we can assign the XMCD intensity at X to the substitutional Fe atoms and the paramagnetic component of the XMCD intensity at Y to the interstitial Fe atoms. We do not observe fine structures due to multiplet splitting at the Fe L 3 edge in both samples, which would be observed if the 3d electrons were localized and were not strongly hybridized with other orbitals. These observations indicate that the Fe 3d electrons are strongly hybridized with the Ge 4p states. Figure 5 shows the H dependence of the XMCD intensity at energy X and a temperature of 5.6 K, the MCD intensity measured with visible light of 2.3 ev at 5 K, and the magnetization measured using a SQUID at 5 K for sample B. The shapes of these curves show excellent agreement with each other; it follows that the spin splitting of the valence band composed of the Ge 4p orbitals is induced by the Fe 3d magnetic moment, which originates from the substitutional Fe atoms, through the p-d hybridization. Figure 6(a),(b) shows the effective magnetic-field (H eff) dependence of the XMCD intensity measured at X for samples A (a) and B (b) at various temperatures. Here, M is also plotted (filled red symbols), and μ 0H eff
4 Figure 7. (a), (b) The temperature dependence of the best-fit parameters f SPM and m SPM obtained for sample A (a) and sample B (b). The red, grey, and white areas indicate ferromagnetic (FM), FM + SPM + paramagnetic (PM), and SPM + PM regions, respectively. respectively. Also, C is the Curie constant per substitutional Fe atom, and L is the Langevin function. Here, 4.4μ B is the ideal saturated value of M; i.e., M = m spin + (m orb/m spin) m spin, where m spin = 4 μ B (for Fe 2+ ) and m orb/m spin 0.1 when all the substitutional Fe atoms are magnetically active. Here, the Curie constant per substitutional Fe atom is obtained using the following equations: C = μ B 2 3k B n B 2, (2) Figure 6. (a), (b) the effective magnetic-field (H eff) dependence of the XMCD intensity measured at X for samples A (a) and B (b) at various temperatures. is obtained by subtracting the product of M and the density of the substitutional Fe atoms from μ 0H to eliminate the influence of the demagnetization field. The insets show clear hysteresis below T C in both samples. The XMCD H eff curves show large curvature above T C in both samples [see the main panels of Fig. 6(a),(b)], indicating that part of the film is superparamagnetic (SPM) above T C. It indicates that local ferromagnetic regions form in nanoscale high-fe concentration regions at temperatures above T C, and thus M can be described by M = 4.4μ B f SPM L( m SPMμ 0 H eff ) + (1-f k B T SPM ) C μ T 0H eff, (1) where f SPM and m SPM are fitting parameters expressing the fraction of SPM substitutional Fe atoms and the magnetic moment per local ferromagnetic region, n B = [ 3 2 S(S+1) L(L+1) + ] J(J + 1), (3) 2J(J + 1) where μ B, k B, n B, S, L and J represent the Bohr magneton, the Boltzmann constant, the effective Bohr magneton number, the spin angular momentum, the orbital angular momentum and the total angular momentum, respectively. Here, S = 2 (for Fe 2+ ), and L = 0.4 (L = 2S m orb/m spin, where m orb/m spin 0.1), and J = 2.4 (= L + S because the spin and orbital angular momenta of a substitutional Fe atom are parallel) in equation (3). Thus, n B is estimated to be The first and second terms in equation (1) correspond to the SPM and paramagnetic components, respectively. In Fig. 6(a),(b), the thin black solid curves correspond to the best fit obtained with equation (1). For sample B, the M H eff curves at temperatures in the range K are well reproduced by equation (1), which indicates that the ferromagnetic SPM transition occurs at T C = 100 K. With sample A, the M H eff curves at
5 temperatures above T C (i.e., T 20 K) are well reproduced by equation (1), except for T = 20 K, which is probably due to the onset of ferromagnetism. These good fits up to room temperature indicate that ferromagnetic interactions within the nanoscale high-fe concentration regions remain at room temperature in both samples. Figure 8. (a) (c) Schematic diagrams showing the most likely picture of the magnetic states in the Ge 0.935Fe films with zero magnetic field at room temperature (i.e., T = 300 K) (a), T C < T < 300 K (b) and T < T C (c). The small black and red arrows correspond to the magnetic moments of the paramagnetic and ferromagnetic substitutional Fe atoms, respectively. The red areas indicate ferromagnetic regions. We see a similar trend in the temperature dependence of the fitting parameters f SPM and m SPM in both films; i.e., f SPM and m SPM both increase with decreasing temperature (Figs. 7(a) and 7(b)). This result implies that the ferromagnetic regions, which form only in the nanoscale high-fe concentration regions at room temperature [Fig. 8(a)], expand toward lower Fe concentration regions with decreasing temperature [Fig. 8(b)], and finally the entire film becomes ferromagnetic at T C [Fig. 8(c)]. This appears to be a characteristic feature of materials that exhibit single-phase ferromagnetism, despite the inhomogeneous distribution of magnetic atoms in the film. As shown in Fig. 7(a),(b), f SPM and m SPM are larger in sample B than in sample A, which can be attributed to the difference in spatial fluctuations of the Fe concentration, which are 4% 7% in sample A and 3% 10% in sample B. The larger the nonuniformity of the Fe distribution is, the larger each local ferromagnetic region, f SPM, and m SPM become, and the local ferromagnetic regions can be more easily connected magnetically, resulting in a higher T C. 6. Summary We have investigated the local electronic structure and magnetic properties of the doped Fe atoms in the Ge 0.935Fe films, which have a diamond-type singlecrystal structure without any ferromagnetic precipitates and with nanoscale spatial Fe concentration fluctuations, using XAS and XMCD. The fitting results clearly show that the local ferromagnetic regions, which exist at room temperature, expand with decreasing temperature, leading to a ferromagnetic transition of the entire system at T C. The nonuniformity of the Fe concentration seems to play a crucial role for the formation of the ferromagnetic regions, and our results indicate that strong ferromagnetism is inherent to GeFe, and persists at room temperature. Such a nanoscale expansion of the ferromagnetic regions is a key feature in understanding materials that exhibit single-phase ferromagnetism (i.e., where the film is free from any ferromagnetic precipitates) despite the inhomogeneous distribution of magnetic atoms in the film. 7. Acknowledgements We would like to special thanks our supervisors, Assoc. prof. S. Ohya, prof. A. Fujimori, Assoc. prof. K. Ishizaka and prof H. Takagi for their great supports and advises. We would thank MERIT program for providing the valuable collaborative research. 8. Publication and Award related to this study [Award] 若林勇希 第 62 回 (2015 年春季 ) 応用物理学会学術講演会第三回英語講演奨励賞 [Publication] Y. K. Wakabayashi, S. Sakamoto, Y. Takeda, K.
6 Ishigami, Y. Takahashi, Y. Saitoh, H. Yamagami, A. Fujimori, M. Tanaka, and S. Ohya, Room-temperature local ferromagnetism and nanoscale domain growth in the ferromagnetic semiconductor GeFe, Scientific Reports, (2016). References [1] Y. Shuto, M. Tanaka, and S. Sugahara, phys. stat. sol. 3, 4110 (2006). [2] Y. K. Wakabayashi, S. Ohya, Y. Ban, and M. Tanaka, J. Appl. Phys. 116, (2014). [3] Y. Ban, Y. Wakabayashi, R. Akiyama, R. Nakane, and M. Tanaka, AIP Advances 4, (2014). [4] Y. K. Wakabayashi, Y. Ban, S. Ohya and M. Tanaka, Phys. Rev. B 90, (2014). [5] Y. K. Wakabayashi, S. Ohya, Y. Ban, and M. Tanaka, Appl. Phys. Express 9, (2016). [6] Y. K. Wakabayashi, S. Sakamoto, Y. Takeda, K. Ishigami, Y. Takahashi, Y. Saitoh, H. Yamagami, A. Fujimori, M. Tanaka, and S. Ohya, Scientific Reports, (2016).
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