Carrier Action under Perturbation

Similar documents
Periodic Table of Elements. EE105 - Spring 2007 Microelectronic Devices and Circuits. The Diamond Structure. Electronic Properties of Silicon

Diode DC Non-ideal Characteristics

Semiconductor Device Physics

Solid State Device Fundamentals

ECE 595, Section 10 Numerical Simulations Lecture 19: FEM for Electronic Transport. Prof. Peter Bermel February 22, 2013

The E vs k diagrams are in general a function of the k -space direction in a crystal

ECE606: Solid State Devices Lecture 13 Solutions of the Continuity Eqs. Analytical & Numerical

UNIVERSITY OF CALIFORNIA, BERKELEY DEPARTMENT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES. Midterm I

Space charge. Lecture 8 09/11/2011. p-n junction with gradient. p-n junction with gradient. V. p-n junction. Space charge

Lecture #13. Diode Current due to Generation

EE105 - Fall 2006 Microelectronic Devices and Circuits. Your EECS105 Week

6.4.5 MOS capacitance-voltage analysis

Functions of Random Variables

( ) Thermal noise ktb (T is absolute temperature in kelvin, B is bandwidth, k is Boltzamann s constant) Shot noise

Module 1 : The equation of continuity. Lecture 5: Conservation of Mass for each species. & Fick s Law

CHAPTER VI Statistical Analysis of Experimental Data

Block-Based Compact Thermal Modeling of Semiconductor Integrated Circuits

Homework #2 Solutions, EE/MSE 486, Spring 2017 Problem 1:

Third handout: On the Gini Index

{ }{ ( )} (, ) = ( ) ( ) ( ) Chapter 14 Exercises in Sampling Theory. Exercise 1 (Simple random sampling): Solution:

We have already referred to a certain reaction, which takes place at high temperature after rich combustion.

Introduction. Free Electron Fermi Gas. Energy Levels in One Dimension

Physics 114 Exam 2 Fall Name:

ECE606: Solid State Devices Lecture 11 Interface States Recombination Carrier Transport

Chapter 5 Properties of a Random Sample

C-1: Aerodynamics of Airfoils 1 C-2: Aerodynamics of Airfoils 2 C-3: Panel Methods C-4: Thin Airfoil Theory

Arithmetic Mean Suppose there is only a finite number N of items in the system of interest. Then the population arithmetic mean is

X ε ) = 0, or equivalently, lim

PHYS Look over. examples 2, 3, 4, 6, 7, 8,9, 10 and 11. How To Make Physics Pay PHYS Look over. Examples: 1, 4, 5, 6, 7, 8, 9, 10,

Ellipsometry Overview

Lecture 3. Sampling, sampling distributions, and parameter estimation

Summary of the lecture in Biostatistics

Lecture 7: Properties of Materials for Integrated Circuits Context

hp calculators HP 30S Statistics Averages and Standard Deviations Average and Standard Deviation Practice Finding Averages and Standard Deviations

Long Tailed functions

Analysis of System Performance IN2072 Chapter 5 Analysis of Non Markov Systems

MOLECULAR VIBRATIONS

Lecture 2 - What are component and system reliability and how it can be improved?

best estimate (mean) for X uncertainty or error in the measurement (systematic, random or statistical) best

Outline. Point Pattern Analysis Part I. Revisit IRP/CSR

Section l h l Stem=Tens. 8l Leaf=Ones. 8h l 03. 9h 58

External Electric Field Influence on Charge Carriers and Electrical Parameters of Polycrystalline Silicon Solar Cell

Chapter 2 Motion and Recombination of Electrons and Holes

Econometric Methods. Review of Estimation

Simple Linear Regression

Analysis of Variance with Weibull Data

1. MOS: Device Operation and Large Signal Model

d dt d d dt dt Also recall that by Taylor series, / 2 (enables use of sin instead of cos-see p.27 of A&F) dsin

THE ROYAL STATISTICAL SOCIETY HIGHER CERTIFICATE

D. VQ WITH 1ST-ORDER LOSSLESS CODING

Estimation of Stress- Strength Reliability model using finite mixture of exponential distributions

STA 108 Applied Linear Models: Regression Analysis Spring Solution for Homework #1

A New Measure of Probabilistic Entropy. and its Properties

First Law of Thermodynamics

d b c d a c a a a c d b

Lecture 07: Poles and Zeros

Lecture 9: Tolerant Testing

Absorption in Solar Atmosphere

Multiple Regression. More than 2 variables! Grade on Final. Multiple Regression 11/21/2012. Exam 2 Grades. Exam 2 Re-grades

Applying the condition for equilibrium to this equilibrium, we get (1) n i i =, r G and 5 i

Introduction to local (nonparametric) density estimation. methods

Stationary states of atoms and molecules

Chapter 3 Sampling For Proportions and Percentages

ECE 421/599 Electric Energy Systems 7 Optimal Dispatch of Generation. Instructor: Kai Sun Fall 2014

STK4011 and STK9011 Autumn 2016

UNIVERSITY OF OSLO DEPARTMENT OF ECONOMICS

Cross-plane Seebeck coefficient and Lorenz number in superlattices

Silicon solar cell under electromagnetic wave in steady state: effect of the telecommunication source's power of radiation

Lecture Notes Types of economic variables

Chapter Business Statistics: A First Course Fifth Edition. Learning Objectives. Correlation vs. Regression. In this chapter, you learn:

III-16 G. Brief Review of Grand Orthogonality Theorem and impact on Representations (Γ i ) l i = h n = number of irreducible representations.

Manipulator Dynamics. Amirkabir University of Technology Computer Engineering & Information Technology Department

Uniform magnetic susceptibilities

Intrinsic Carrier Concentration

CLASS NOTES. for. PBAF 528: Quantitative Methods II SPRING Instructor: Jean Swanson. Daniel J. Evans School of Public Affairs

( ) = ( ) ( ) Chapter 13 Asymptotic Theory and Stochastic Regressors. Stochastic regressors model

Solutions to Homework Problems for the Complexity Explorer Course on Random Walks

DIFFERENTIAL GEOMETRIC APPROACH TO HAMILTONIAN MECHANICS

CIS 800/002 The Algorithmic Foundations of Data Privacy October 13, Lecture 9. Database Update Algorithms: Multiplicative Weights

Lecture 7. Confidence Intervals and Hypothesis Tests in the Simple CLR Model

arxiv:cond-mat/ v2 11 Dec 2000

Lecture 8: Linear Regression

Bounds on the expected entropy and KL-divergence of sampled multinomial distributions. Brandon C. Roy

EP2200 Queueing theory and teletraffic systems. Queueing networks. Viktoria Fodor KTH EES/LCN KTH EES/LCN

ECSE-6300 IC Fabrication Laboratory Lecture 6 Diffusion in Silicon. Lecture Outline

SOLUTIONS: ECE 606 Homework Week 7 Mark Lundstrom Purdue University (revised 3/27/13) e E i E T

THE ROYAL STATISTICAL SOCIETY GRADUATE DIPLOMA

2SLS Estimates ECON In this case, begin with the assumption that E[ i

Sampling Theory MODULE V LECTURE - 14 RATIO AND PRODUCT METHODS OF ESTIMATION

Lecture 3 Probability review (cont d)

Fitting models to data.

Idea is to sample from a different distribution that picks points in important regions of the sample space. Want ( ) ( ) ( ) E f X = f x g x dx

Dopant Compensation. Lecture 2. Carrier Drift. Types of Charge in a Semiconductor

A Study of the Reproducibility of Measurements with HUR Leg Extension/Curl Research Line

Transport Equation. For constant ε, the force per unit fluid volume due to electric field becomes,

Mean is only appropriate for interval or ratio scales, not ordinal or nominal.

Discrete Mathematics and Probability Theory Fall 2016 Seshia and Walrand DIS 10b

Chapter 2 - Free Vibration of Multi-Degree-of-Freedom Systems - II

Chapter 11 Systematic Sampling

EE3310 Class notes Part 2. Solid State Electronic Devices - EE3310. Class notes. p-n junctions

Transcription:

Carrer Acto uder Perturbato Eulbrum: o curret ad o formato ca be represeted. Ferm-level s flat! Perturbato s ecessary to artfcally ecode formato perturbed states: electrc feld (drft), cocetrato gradet (dffuso), temperature gradet (thermal dffuso) ad excess carrers (R-G), ad radato (photoelectrc R-G). Ferm-level s ot flat! Drft curret: whe the carrers semcoductor s uder eulbrum, all radom moto k (phase) space s exactly cacelled: o curret flowg ad the system has a costat Ferm eergy However, whe there s a electrc feld F, the forward moto s preferred amog all radomzg scatterg: a skew dstrbuto Electros fucto of k space wll result et curret. dv dk wth all sort F m h ef eergy k y k y dt dt below E F eft F kt () k(0) move all h drectos. k x k x v0 Ferm sphere at t0 Ferm sphere at t Chapter

Quas Ferm Levels Whe we dsturb our system from eulbrum, our mathematcal treatmet wll employ aother cocept Quas Ferm level. Smlar to the Ferm-level used descrbg the occupato probablty eulbrum, uas Ferm-level s used to descrbe the carrer occupato probablty uder o-eulbrum codto. uder eulbrum, p ; uder o-eulbrum p E F splts to E FN ad E FP where E FN ad E FP follow the carrer relatoshp: EFN E c ( EFN Ec )/ kbt ( EFN E )/ kbt Nc F/ Nce e f Ec EFN 3kBT π kt B Ev E FP ( Ev EFP) / kbt ( Ev EFP) / kbt p Nv F/ Nve e f EFP Ev 3kBT π kt B Chapter

Drft Velocty ad Carrer Moblty J p drft p v p p μ p F wth v p μ p F J drft - v μ F wth v -μ F The moblty μ s the ut of cm /Vs ad s the same as the Ohm s law. Actual pcture s: accelerato, scatterg J drft (p μ p + μ )F A L J drft (/ρ) A L F ρ L I (A/ρ L) VR V μ + pμ p Moblty aga takes to accout all QM scatterg processes E < τ > F E a v a< τ > E μe * * m m l where < τ > s the mea tme betwee collso ν Chapter th 3 A

Carrer Scatterg The major scatterg evets semcoductors: phoo scatterg (lattce vbrato) mpurty scatterg (ozed ad eutral mpurty) surface scatterg (termato of perodc potetal) Matthesse s rule: μ total μ phoo + μ mpurty + μ surface +... μ μ mpurty σ Moblty reducto μ total Dopat freeze-out μ phoo T T Chapter 4

Hgh-feld Moblty: Velocty Saturato Velocty Saturato: pheomeologcal expressos, sce the physcal effects behd the velocty saturato s too complex to gve good physcal fuctos drectly optcal phoo scatterg s stroger whe the carrer has larger ketc eergy. May popular semcoductors have velocty saturato aroud 0 7 cm/s (/3,000 of speed of lght) μ μ 0 / ( + (μ 0 F/v sat ) β ) /β, where v sat s the saturato velocty coducto moblty s derved from the effectve mass of coducto ad the mea free tme of collso. For S, μ 360 cm /Vs ad μ p 460 cm /Vs at room temperature for trsc samples v drft v sat μ F Chapter 5 F

Dffuso - Fck s Frst Law F F C(l) C(0) C(-l) X0 F: Flux; ½ represets eual probablty to move to left or rght C(x,t): cocetrato V th : thermal velocty l: mea free path F C ( l ) vth F C () l vth F F [ ] F vth C( l) C( l) Cxt (, ) Cxt (, ) vth C(0) l C(0) l x + x Cxt (,) Cxt (,) vl th D x x Taylor seres D s dffuso coeffcet Chapter 6

Dffuso (Perturbato from Carrer Numbers) Carrer dffuso J pdff - D p p; J dff D D, D p are dffuso coeffcet wth uts of cm /s Thermal dffuso J ptdff - p D Tp T; J Tdff D T T; to tell the type of carrer coducto, ether thermal or Halleffect duced curret has to be used. Carrer Curret Euatos: J p J pdrft + J pdff + J ptdff pμ p F - D p p - p D Tp T J J drft + J dff + J Tdff μ F + D + D T T If oly homogeeous lattce temperature s cosdered, the eulbrum codto AND Boltzma statstcs (odegeerate cases) wll result the Eeste relatoshp betwee μ ad D Chapter 7

Este Relato < τ > μ m D ν l th D μ * * m ν * th l mν th From K.E. a oe-dmesoal case, * mν th kt Therefore, D μ kt Chapter 8

Este Relato The electrc feld F ca be cosdered as bad bedg (except whe there s heterojucto): F / E / E C / E V For homogeeous T, eulbrum -D, o-degeerate dopg e ( E E )/ k T F B d de de dx k T dx dx B F D μ Dp μ p kt B d de de de J F D F dx dx dx dx F F N 0 μ + μ μ μ I eulbrum de F /dx 0; Ferm-level s flat! Out of eulbrum de F /dx 0 def E EF EFp 0 J μ ψf 0 ψf dx Chapter 9 F

Electro-Hole Par Geerato-Recombato Fck slaw for carrer coservato (or the cotuty euato): v J + G R p(x)v t d A p(x+dx) v d A p v J p + Gp Rp t G p R The geerato-recombato evets semcoductors ca be categorzed by bad-to-bad, bad-to-trap ad trap-to-trap. The reured coservato of total mometum ad eergy wll be completed by teracto wth phoos (thermal), photos (lght) or aother carrer (mpact ozato ad Auger recombato) Remember that traps are localzed allowable states wth the badgap for electros ad/or holes. Sce trap states are local space, they caot cause drft curret drectly, but ther charge states wll affect the Posso euato ad cotuty euatos Chapter 0

Category of Geerato-Recombato Geerato- Recombato bad-to-bad bad-to-trap trap-to-trap thermal optcal carrer (elec. capture) (elec. capture) (chage locato) (trap hoppg/tuelg) (chage eergy) (mpact ozato) Photos have large eergy but small mometum, ot effectve for drect badgap Phoos have small eergy (kt/) but large mometum, ot effectve for.ev badgap Trap asssted geeratorecombato s most effcet at mdgap (Au, Cu, M, Cr, Fe S) Chapter

Shockley-Read-Hall (SRH) processes Two thermal bad-to-trap processes that complete a bad-to-bad electro-hole par geerato or recombato are called SRH (Shockley-Read-Hall) processes, whch s most mportat S. p p cnp cnp ep p cnp t t p p T 0 p T p T T p T C E T 0 Capture rate s proportoal to the umber of carrers (p), umber of traps (N T ) ad capture coeffcet (c p ), whch has the ut of a cross secto (cm ) the thermal velocty (cm/s). I eulbrum, geerato has to cacel recombato (detaled balace). Off eulbrum, the et geerato-recombato s the: p t R G c p N T ( p p0) c A more geeral expresso preservg the low-jecto lmt: p N T 0 Δp Δp τ p Detal balace t R G Δ τ p t R G t R G p τ ( + ) + τ ( p + p p ) e ( E T E ) / kt p e ( E E T ) / kt Chapter

Sx Shockley Euatos of States Most classcal devce models are derved from these euatos Frst put together by Wllam Shockley for semcoductor classcal devce aalyss (o QM effects such as tuelg yet) ρ ψ ( ψ) F ε Posso E. curvature + + ε ε s J μ F + D p p p 0 J pμ F D p v J + G R t p v J + G R t p t t t ( + p N ) D NA T p p p T Chapter 3 R G R G Elec. Curret E. Hole Curret E. Elec. Cotuty E. Hole Cotuty E. Trap Charge E.

Posso Euato ad Bad Bedg Majorty charge dstrbuto ρ(x) s perturbed. E E c E F E E v x E E c E F E E v x e Ne c ( E E )/ k T F B ( E E )/ k T c F B I -D, E ψ E : eletrostatc (electro) eergy + + p N + N + ( N ) ψ ( ) dx s d x ( ) ψ ε ε ε ε D A T D 0 s 0 ε ε ( ψ( x) ψf )/ kbt ( e ND) Chapter s 0 4

The Debye Legth from the Posso Euato d ψ ( x) ( ψ( x) ψf )/ kbt ( e ND) dx εsε0 d ( ψ( x) ψ( )) ( ( x) ( ))/ kbt ( ( ) F )/ kbt ( ) ψ ψ ψ ψ e e ND dx εsε0 d Δψ ND ( )/ kbt ( ) e Δψ dx εsε0 L D s the Debye legth. It takes L D to resolve the potetal perturbato from the chage et majorty charge. For example, L D 0.04μm for N D 0 6 cm -3 S. Chapter 5 E E c E F E E v x e Ne c ( E E )/ k T F B ( E E )/ k T c F B Assume ( Ψ )/k B T << Ψ << k B T/ uas-eutralty codto Expad the expoetal fucto a Taylor seres ad stop after the secod term. d Δψ N N Δ Δψ dx kt kt D D ( ψ ) εsε0 B εsε0 B x Δψ exp LD LD εsε0kt B N D

Delectrc Relaxato Tme I -D -type materals, there s a small charge desty dsturbace ad we ow wat to fd out about how log t takes to reestablsh a steady state Cotuty E. Δ J t x J F+ D x Curret E. μ Posso E. F x Δ ε ε s 0 F ρ Ψ << kbt/ uas-eutralty codto (t) exp(-t/ρ ε s ε 0 ), where ρ ε s ε 0 s called the delectrc relaxato tme, or the majorty-carrer respose tme, ad s typcally < 0 - s. Chapter 6

Dffuso Legth ad Morty Carrer Lfetme I -D p-type materals, the morty carrers ( 0 /N A ) t J x ( ) τ 0 J μ F + D If J s eglgble (o carrer jecto), the morty carrer decays the order of τ (morty carrer lfetme), 0-4 to 0-9 s depedg o the ualty of the slco crystal. I steady state (o tme varato, costat jecto) ad the drft curret s small for morty carrers exp(-x/l) wth L(D τ ) / beg the dffuso legth (usually o the order of 0-00μm S). x Chapter 7

Tme ad Legth Scale Semcoductor For electro: Debye Legth Delectrc Relaxato Tme τ Morty Carrer Lfetme τ Dffuso Legth L D L εsε0kt B N Dτ D ρ ε ε D s 0 ~ m majorty carrer ~ ps > μs > μm morty carrer L Dτ D D I both majorty ad morty carrer cases, the tmes ad legths gve the umbers for how fast a devato from the carrer eulbrum wll be eualzed ad over whch dstaces small devatos are felt. Chapter 8