Mapping Elastic Properties of Heterogeneous Materials in Liquid with Angstrom-Scale Resolution

Similar documents
Lorentz Contact Resonance for viscoelastic measurements of polymer blends

Optimization of phase contrast in bimodal amplitude modulation AFM

Lorentz Contact Resonance for viscoelastic measurements of polymer blends

Optimal Design and Evaluation of Cantilever Probe for Multifrequency Atomic Force Microscopy

Systematic Multidimensional Quantification of Nanoscale Systems From. Bimodal Atomic Force Microscopy Data

Improving the accuracy of Atomic Force Microscope based nanomechanical measurements. Bede Pittenger Bruker Nano Surfaces, Santa Barbara, CA, USA

SUPPLEMENTARY INFORMATION

Point mass approximation. Rigid beam mechanics. spring constant k N effective mass m e. Simple Harmonic Motion.. m e z = - k N z

In amplitude modulation atomic force

Application Note #149 Improving the Accuracy of Nanomechanical Measurements with Force-Curve-Based AFM Techniques

Fundamentals of Atomic Force Microscopy Part 2: Dynamic AFM Methods

Mapping the mechanical stiffness of live cells with the scanning ion conductance microscope

VEDA - Virtual Environment for Dynamic Atomic Force Microscopy

Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy

SUPPLEMENTARY NOTES Supplementary Note 1: Fabrication of Scanning Thermal Microscopy Probes

Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods

Digital processing of multi-mode nano-mechanical cantilever data

Lecture 4 Scanning Probe Microscopy (SPM)

AFM Studies of Pristine PCBM Changes Under Light Exposure. Erin Chambers

Size dependence of the mechanical properties of ZnO nanobelts

Lecture Note October 1, 2009 Nanostructure characterization techniques

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Atomic Force Microscopy imaging and beyond

Noninvasive determination of optical lever sensitivity in atomic force microscopy

STM: Scanning Tunneling Microscope

Micro-Rheology Measurements with the NanoTracker

MSE640: Advances in Investigation of Intermolecular & Surface Forces

Measurement of hardness, surface potential, and charge distribution with dynamic contact mode electrostatic force microscope

Instrumentation and Operation

Material Anisotropy Revealed by Phase Contrast in Intermittent Contact Atomic Force Microscopy

Scanning Force Microscopy

BioAFM spectroscopy for mapping of Young s modulus of living cells

Theory of higher harmonics imaging in tapping-mode atomic force microscopy

Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM

Application Note #148 Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR

Quality Factor Thickness (nm) Quality Factor Thickness (nm) Quality Factor 10

Force-distance studies with piezoelectric tuning forks below 4.2K

Intermittent-Contact Mode Force Microscopy & Electrostatic Force Microscopy (EFM)

Module 26: Atomic Force Microscopy. Lecture 40: Atomic Force Microscopy 3: Additional Modes of AFM

Supplementary Material

Characterization of MEMS Devices

AFM Imaging In Liquids. W. Travis Johnson PhD Agilent Technologies Nanomeasurements Division

Quantitative Nanomechanical Measurements in HybriD TM Mode Atomic Force Microscopy

NIS: what can it be used for?

Supporting information

Supporting Information

Design and Analysis of Various Microcantilever Shapes for MEMS Based Sensing

Micro-rheology of cells and soft matter with the NanoTracker

Determining the Elastic Modulus and Hardness of an Ultrathin Film on a Substrate Using Nanoindentation

Outline Scanning Probe Microscope (SPM)

Atomic Force Microscopy (AFM) Part I

Lecture: P1_Wk5_L1 Force-Distance Simulations with VEDA

The Powerful Diversity of the AFM Probe

Nature Methods: doi: /nmeth Supplementary Figure 1. Principle of force-distance (FD) curve based AFM.

Effect of AFM Cantilever Geometry on the DPL Nanomachining process

BDS2016 Tutorials: Local Dielectric Spectroscopy by Scanning Probes

Dynamic Mechanical Analysis (DMA) of Polymers by Oscillatory Indentation

SUPPLEMENTARY INFORMATION

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010

Supplementary Information for. Effect of Ag nanoparticle concentration on the electrical and

MECHANICAL TESTS ON EPOXY RESIN NANOSCALE MODULUS MEASUREMENT AND LONG TERM CREEP BEHAVIOR

AFM for Measuring Surface Topography and Forces

Lecture 12: Biomaterials Characterization in Aqueous Environments

Chapter 2 Correlation Force Spectroscopy

Nitride HFETs applications: Conductance DLTS

Unlocking higher harmonics in atomic force microscopy with gentle interactions

Supplementary Information. Characterization of nanoscale temperature fields during electromigration of nanowires

Chapter 5 Nanomanipulation. Chapter 5 Nanomanipulation. 5.1: With a nanotube. Cutting a nanotube. Moving a nanotube

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

AFM-IR: Technology and applications in nanoscale infrared spectroscopy and chemical imaging

Characterization of ultrathin films by laser-induced sub-picosecond photoacoustics with coherent extreme ultraviolet detection

The Fluid-Coupled Motion of Micro and Nanoscale Cantilevers

Performance and Control of the Agilent Nano Indenter DCM

3.052 Nanomechanics of Materials and Biomaterials Thursday 02/08/06 Prof. C. Ortiz, MIT-DMSE I LECTURE 2 : THE FORCE TRANSDUCER

Theoretical basis of parametric-resonance-based atomic force microscopy

BMB November 17, Single Molecule Biophysics (I)

RHK Technology Brief

FEM-SIMULATIONS OF VIBRATIONS AND RESONANCES OF STIFF AFM CANTILEVERS

SUPPLEMENTARY INFORMATION. microscopy of membrane proteins

Enhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency

Atomic and molecular interactions. Scanning probe microscopy.

Rheological measurements using microcantilevers

Supplementary Information. Fast, multi-frequency, and quantitative nanomechanical imaging of live cells using the atomic force microscope

CNPEM Laboratório de Ciência de Superfícies

SUPPLEMENTARY INFORMATION

General concept and defining characteristics of AFM. Dina Kudasheva Advisor: Prof. Mary K. Cowman

Multi-frequency atomic force microscopy: A system-theoretic approach

Structural investigation of single biomolecules

2 Atomic Force Acoustic Microscopy

Calibration of higher eigenmodes of cantilevers

Amplitude curves and operating regimes in dynamic atomic force microscopy

IN 1986, Binnig, Quate, and Gerber invented the atomic force

Magnetic dissipation force microscopy studies of magnetic materials invited

ME 475 Modal Analysis of a Tapered Beam

Practical Method to Limit Tip Sample Contact Stress and Prevent Wear in Amplitude Modulation Atomic Force Microscopy

File name: Supplementary Information Description: Supplementary Figures, Supplementary Notes and Supplementary References

EE C247B / ME C218 INTRODUCTION TO MEMS DESIGN SPRING 2014 C. Nguyen PROBLEM SET #4

Research Article Semi-Active Pulse-Switching Vibration Suppression Using Sliding Time Window

Magnetic nanoparticles containing soft-hard diblock

Measurement Techniques for Engineers. Motion and Vibration Measurement

Transcription:

Supporting information Mapping Elastic Properties of Heterogeneous Materials in Liquid with Angstrom-Scale Resolution Carlos A. Amo, Alma. P. Perrino, Amir F. Payam, Ricardo Garcia * Materials Science Factory Instituto de Ciencia de Materiales de Madrid, CSIC c/ Sor Juana Inés de la Cruz, 8049 Madrid, Spain List of contents Numerical Simulator Probe calibration Data processing Purple membrane height Figure S1 Figure S Figure S3 Figure S4 Figure S5 Figure S6 Figure S7 Supporting references 1

Numerical Simulator To test the bimodal AM-FM theory and its range of applicability we have developed a numerical platform that simulates the operation of bimodal AM-FM. The numerical simulation software calculates the tip trajectory (time dependent deflection) z(t) = z 0 + z 1 (t) + z (t) (S1) which satisfies the following differential equation system given by both the dynamics of the cantilever and the feedbacks of the second mode for a given mean tip sample distance z c, effective Young Modulus and tip radius: + + = + + + + + + + = + + + + + (S) (S3) where z 0, z n, ω 0n, k n, Q n and F n are respectively the mean deflection (in our case is negligible), the deflection, the angular frequency, the stiffness, the quality factor and the driving force. The subscript n refers to the n th mode and m is the effective mass of the cantilever. Fn, ω and Fts are defined as: = / = + = + + = / = +, + 0 otherwise (S4) (S5) (S6) (S7) (S8) Here A n, A 0n and ϕ n are respectively the amplitude, the free amplitude and the phase shift between the deflection sinusoidal component and the excitation force of the n-th mode. A sp, ϕ sp and ω =π f are the amplitude set point, the phase set point and the frequency shift of the second mode; r and q are the proportional and integral gains of the amplitude gain controller (AGC) and K is the gain of the phase-locked loop (PLL) 1

(Figure S1). Regarding the force model, is the effective Young s modulus of the interaction (provided by eq 3), R is the tip radius, δ(t) is the time-dependent indentation and a 0 is the intermolecular distance. The AGC keeps the amplitude of the second mode fixed at A = A sp at the same time that the PLL keeps the phase shift between z (t) and the second mode driving force fixed to ϕ = ϕ sp. We perform the AM FM simulations by setting ϕ sp = π/ and solving eq S and S3 and with a fourth order Runge Kutta algorithm for a given, obtaining the observables distance curves (A (0) (0) 1 (z c ), ϕ 1 (z c ), A (0) (z c ), F (0) (z c ), ϕ (0) (z c ), f (0) (z c )), where the superscript denotes steady state. Using the A 1 (z c ) and f (0) (z c ) curves to obtain f (0) (A 1 ) the effective modulus and indentation are calculated respectively from eq 9 and eq 10. The sample Young s Modulus is obtained through the effective modulus by using eq 3. Figure S1 shows the block diagram of an AM-FM experiment modelled by the simulator. First, the total deflection is computed while the tip interacts with the sample. Then, the two components of the signal are treated separately. The amplitude of the first mode, A 1, is compared with the set point amplitude A sp1. The difference between both (error signal) is processed by a proportional-integral-derivative module (PID) to adjust the mean tip sample distance in order to get A 1 =A sp1. The phase shift ϕ 1 is also obtained but is not required for the eq 9 and eq 10. The bottom panel illustrates the main processing steps performed on the nd mode. The amplitude A is compared to its set point amplitude A sp and the resulting error signal is used to adjust the driving force of the second mode to achieve A =A sp. At the same time, the phase shift between the second eigenmode and its driving force is processed independently to keep its value fixed at π/. This is achieved by using a phase-locked-loop (PLL) that adjusts the frequency of the driving force to keep the oscillation at resonance. The changes in the frequency of the driving force of the second mode f are recorded. Then, for a tipsample force model the results given by eq 9 and eq 10 are compared with the numerical values produced by the simulator. Probe calibration To measure the Young s modulus requires the knowledge of the force constants and the quality factors of the cantilever. The optical lever sensitivity of the 1 st mode s 1 is determined by acquiring a force curve on a stiff surface (Muscovite mica). The optical 3

lever sensitivity of the second mode s is calculated from the relationship between the first and second mode optical lever sensitivities for a rectangular Euler-Bernoulli beam.,3 s = s1 3.47 (S9) The force constant of the 1 st mode and nd mode are determined by using the thermal noise method. 3,4 Figure S3 depicts the power spectral density (PSD) of the thermal motion of the AC- 40TS cantilever (Olympus, Japan). The PSD is fitted with the single harmonic oscillator (SHO) with white noise floor added, ω0 A0 A ( ) ω ω = + A White (S10) ω 0 ω 1 + ω ω0 Q where A 0 is the amplitude, ω 0 =πf 0 is the angular resonant frequency, ω the angular driving frequency, Q the quality factor and A white the white noise. The fittings applied to deduce the quality factor and the force constant of the cantilever (1 st and nd flexural mode) are showed in red. The value s extracted from eq S9 is locked in the SHO fit for the nd mode spring constant evaluation. For AC-40TS (Olympus) and the Arrow-UHF (Nanoworld AG) cantilevers, the force constant of the nd mode is calculated by using the thermal noise method and fitting the thermal curve with the theoretical optical lever sensitivity value of the nd mode as determined from eq S9. For the PPP-NCH cantilevers (Nanosensors), the force constant of the nd mode is determined by the theoretical relationship between the force constant of the 1 st mode, k 1, and the nd mode, 4 k, given by: 4

ζ f 0 k = k1 (S11) f 01 where f 01 and f 0 are the resonant frequencies of the 1 st mode and nd mode, respectively. We have used the corrected exponent ζ=.17 for this type of cantilevers. 5 Data processing Images analysis has been performed by using either the SPIP (Image Metrology) or the Gwyddion (http://gwyddion.net/) programs. Raw images have been plane-leveled and flattened by using the substrate as reference. In order to remove high frequency noise a Gaussian filter (Figure S6 a and b) or a Fourier transform (Figure 3 f and g) has been applied. The stiffness values showed in Figure 6 have been calculated by using the eq S11, k Hertz = E Rδ (S1) s where E s is the Young modulus as determined by eq 9, R is the tip radius used for the determination of the nanomechanical maps showed in Figure 5 d and e and δ is the indentation as obtained by eq 10. The cross-correlation averaging performed in Figure 6 has been performed as follows. First, one BR trimer was selected and cross-correlated with the topography image. From the cross-correlation each individual BR trimer was located. Second, the coordinates of each BR trimer were merged with the elastic modulus, deformation and dissipation channels. Finally, each unit cell is superimposed, averaged and three-fold symmetrized to obtain the corresponding insets (n=10). The code was written in Matlan. The structural model of the BR protein was obtained from the Protein Data Bank (code at9). The Chimera package 6 was used to represent the BR model. 5

Purple membrane height The cross-section (Figure S7 b) shows the height variation across different regions of the PM patches. Three different heights are obtained (from left to right) 7.0±0.1, 6.0±0.1 and 8.1±0.1 nm. Those height changes have been attributed to the imaging of different sides of the PM, cytoplasmic (CP) and extracellular (EC). 7 The lowest region as measured from the mica surface corresponds to a nonordered region of the PM. 8 The above height values exceed the structural thickness of the native PM (5.6-6.0 nm). This height anomaly has been attributed to the effect of long-range electrostatic double-layer forces 7. 6

SUPPORTING INFORMATION FIGURES Supporting Figure 1. Scheme of the bimodal AM-FM feedbacks. The bimodal signal is separated in the 1st and nd components. The component corresponding to the 1 st mode is processed with a PID controller. The amplitude A is kept at a fixed value (A sp ) by changing the driving force of the second mode. The phase shift ϕ is processed independently to keep its value at π/. 7

Supporting Figure. Observables computed from simulations for compliant and stiff samples. (a), (b) and (c) shows the amplitudes of the first and second modes for the Hertz model characterized respectively by E s = 1MPa, E s = 1GPa and E s = 100GPa. The amplitude of the second mode is locked to A = A sp. (d), (e) and (f) depicts the corresponding phase shifts of the first and second mode and the frequency shift for the soft and stiff sample, respectively. The phase shift of the second mode is locked to ϕ = π/. All observables are calculated in the steady state (t >> f -1 01 ). Simulation parameters: Soft material (E s = 1 MPa): A 01 = 50 nm, A 0 = 0.5 nm, k 1 = 0.01 Nm -1, k = Nm -1, Q 1 =.3, Q = 4.6, f 01 = 31.7 khz, f 0 = 63.5 khz, P = 0, I = 0.5 N/m Hz, K = 0.4 Hz. Stiff material (E s = 1 GPa): A 01 = 10 nm, A 0 = 1 nm, k 1 = 5 Nm -1, k = 40 Nm -1, Q 1 =.3, Q = 4.6, f 01 = 100 khz, f 0 = 68 khz, P = 0, I = 0.5 N/m Hz, K = 0.6 Hz. Stiff material (E s = 100 GPa): A 01 = 5 nm, A 0 = 0.1 nm, k 1 = 30 Nm -1, k = 1313 Nm -1, Q 1 =.3, Q = 4.6, f 01 = 19 khz, f 0 = 876 khz, r = 0, q = 0.1 N/m Hz, K = 0.5 Hz. In all cases, E t = 170 GPa, R = 5nm, ν t = ν s = 0.3. 8

Supporting Figure 3. Power spectral density (PSD) of the thermal motion of the cantilever. (a) PSD (arbitrary units) showing the SHO fit to calibrate the 1 st and nd force constants of the cantilever. (b) PSD and SHO fit for the 1 st eigenmode frequency of the cantilever. The red line depicts the SHO fit done to calibrate k 1 with the optical lever sensitivity s 1 as one of the inputs in the fitting. (c) PSD and SHO fit for the nd eigenmode frequency of the cantilever. The red line depicts the SHO fit done to calibrate k with the optical lever sensitivity s as one of the inputs in the fitting. The data has been obtained with an AC-40TS cantilever (Olympus, Japan). 9

Supporting Figure 4. Nanomechanical maps of a polymer (PS-LDPE ) blend in air. (a) Topography map taken in AM-FM bimodal AFM. (b) map of the elastic modulus. Two regions are observed. The softer region in the dark circles corresponds to the LDPE while the stiffer region in the rest of the surface corresponds to the PS (see histogram in d. (c) Map of the indentation (see histogram in e). (d) histogram of the E s values. (e) histogram of the indentation. The data has been recorded in minutes. 10

Supporting Figure 5. Simulation results for the Young Modulus and indentation in the polymer blend sample. (a) shows the Young Modulus result (eq 3) from the simulation observables in the LDPE regions, characterized by a modulus of E s = 100 MPa. (b) indentation (eq 4) in the LDPE regions. (c) Young Modulus in the stiffer PS regions, characterized by a modulus of E s = GPa. (d) indentation in the PS regions. Simulation parameters: R = 6nm, ν t = ν s = 0.3, A 01 = 0 nm, A 0 = 0.5 nm, k 1 = 40 Nm -1, k = 1399 Nm -1, Q 1 = 300, Q = 500, f 01 = 335.6 khz, f 0 =.073 MHz, P = 0, I = 0.05 N/m Hz, K = 0.06 Hz. 11

Supporting Figure 6. Angstrom-resolved maps on a mica surface. (a) topography channel taken at A 01 = 1.8 nm and A 0 =0.14 nm. (b) map of the elastic modulus. The mica structure (001) is overlaid; Oxygen (red), silicon or aluminum (yellow). (c) crosssection along the dashed line shown in (b). 1

Supporting Figure 7. Purple membrane (PM) observed in buffer solution using bimodal AM-FM. (a) topography of a patch of PM exhibiting the cytoplasmic and extracellular surface. (b) cross-section along the dashed line shown in (a). 13

SUPPORTING INFORMATION REFERENCES 1. Polesel Maris J.; Gauthier S. A Virtual Dynamic Atomic Force Microscope for Image Calculations. J. Appl. Phys, 005, 97, 04490-1 04490 6.. Garcia, R.; Herruzo, E.T. The Emergence of Multifrequency AFM. Nat. Nanotechnol. 01, 7, 17-6. 3. Lozano, J. R.; Kiracofe, D.; Melcher, J.; García, R.; Raman, A. Calibration of Higher Eigenmode Spring Constants of Atomic Force Microscope Cantilevers. Nanotechnology 010, 1, 46550. 4. Butt, H.J.; Jascke, M. Calculation of Thermal Noise in Atomic Force Microscopy. Nanotechnology 1995, 6, 1-7. 5. Labuda, A.; Kocun, M.; Lysy, M.; Walsh, T.; Meinhold, J.; Proksch, T.; Meinhold, W.; Anderson, C.; Proksch, R. Calibration of Higher Eigenmodes of Cantilevers. Rev. Sci. Instrum. 016, 87, 073705. 6. Pettersen, E.F.; Goddard, T.D.; Huang, C.C.; Couch, G.S.; Greenblatt, D.M.; Meng, E. C.; Ferrin, T.E. UCSF Chimera-A Visualization System for Exploratory Research and Analysis. J. Comput. Chem. 004, 5, 1605 161. 7. Medalsy, I.; Hensen, U.; Müller, D.J. Imaging and Quantifying Chemical and Physical Properties of Native Proteins at Molecular Resolution by Force Volume AFM. Angew. Chem. Int. Ed. 011, 50, 1103-1108. 8. Voïtchovsky, K.; Contera, S.A.; Kamihira, M.; Watts, A.; Ryan, J. Differential Stiffness and Lipid Mobility in The Leaflets of Purple Membranes. Biophys. J 006, 90, 075-085. 14