Extrglctic Spectroscopy with SIRTF/IRS Bernhrd Brndl 1, Vssilis Chrmndris 1, Keven Uchid 1, nd Jim Houck 1 Cornell University, Ithc NY 14853, USA rxiv:stro-ph/9912216v1 10 Dec 1999 Astrct. The Infrred Spectrogrph (IRS) is one of the three instruments on ord the Spce Infrred Telescope Fcility (SIRTF) to e lunched in Decemer 2001. The IRS will provide high resolution spectr (R 600) from 10 37 µm nd low resolution spectr (R 60) from 5 40µm. Its high sensitivity nd spectrl mpping -mode mke it powerful instrument for oserving oth fint point-like nd extended sources. We discuss the performnce of the IRS on fint extrglctic trgets nd present simulted spectr of strursts nd AGNs t high redshift. In ddition, we discuss the determintion of redshifts from the low resolution spectr. 1 The Infrred Spectrogrph The Infrred Spectrogrph (IRS) (Houck & vn Cleve, 1995) will provide the Spce Infrred Telescope Fcility (SIRTF) (Fnson et l. 1998) with low nd moderte-spectrl resolution spectroscopic cpilities from 4 to 40 microns. The IRS (see Fig. 1) is composed of four seprte modules, with two of the modules providing R 50 spectrl resolution over 4 to 40 microns nd two modules providing R 600 spectrl resolution over 10 to 37 microns. Fig.1. The 4 IRS modules on their common se plte.
2 Brndl et l. Tle 1. Bsic IRS chrcteristics Module Detector Pixel Size Slit Size λ Resolving (128 128) (rcsec) (rcsec) (µm) Power (R) Short Low Si:As 1.8 3.6 54.5 5.3 7.5 62-124 7.5 14 Long Low Si:S 4.8 9.7 145.4 14 21 62-124 21 40 Short High Si:As 2.4 4.8 12.1 10 19.5 600 Long High Si:S 4.8 9.7 24.2 19 37 600 The IRS instrument hs no moving prts ( olt-nd-go philosophy). Ech module hs its own entrnce slit in the focl plne. The low-resolution modules employ long slit designs tht llow oth spectrl nd one-dimensionl sptil informtion to e cquired simultneously on the sme detector rry. Two smll imging su-rrys ( pek-up cmers ) in the so-clled shortlow module (SL) will lso llow infrred ojects with poorly known positions to e ccurtely plced into ny of the IRS modules entrnce slits. The high-resolution modules use cross-dispersed echelle design tht gives oth spectrl nd sptil mesurements on the sme detector rry. 2 The IRS Sensitivity The expected sensitivity of IRS is nerly 10 to 100 times etter thn tht of the Infrred Spce Oservtory. The theoreticl sensitivity plots for the four modules re presented in figures 2 nd 3. Fig. 2. The theoreticl sensitivity plots of the IRS short module (s of 10/99).
Extrglctic Spectroscopy with SIRTF/IRS 3 Fig. 3. The theoreticl sensitivity plots of the IRS long module (s of 10/99). The continuum point source (5σ, 500 seconds) sensitivity of the low resolution module is 1 mjy t 10µm. The line sensitivity of the high resolution module is 3 10 18 Wm 2 t 15µm. The two pek-up cmers hve sensitivity of out 0.5 mjy. The sturtion limits in 8 seconds for point (extended) sources re 5 Jy (0.4 Jyrcsec 2 ) t 10µm for the low resolution module nd 50 Jy (2.1 Jy rcsec 2 ) t 15µm for the high resolution module. The 4 s sturtion limits for the pek-up cmers re 0.5 Jy for point sources nd 40 mjyrcsec 2 for extended sources. 3 Extrglctic Science Two of the min res of extrglctic reserch where the IRS will e le to mke sustntil contriutions will e the mid-ir deep surveys s well s the study of the properties of Luminous Infrred Glxies (LIRGs). LIRGs hve een studied since the erly 70s, ut their importnce ecme evident in 1983 when IRAS reveled tens of thousnds of such infrred glxies glxies (i.e., Snders & Mirel 1996). More recently ISO mid-ir deep surveys (i.e., Elz et l. 1999) hve shown tht the numer of glxies in the distnt Universe exceeds model estimtes which were derived from opticl oservtions. These mid-ir surveys suggest strong evolution in glxy formtion, such tht more - nd perhps more luminous - glxies were formed t erlier epochs. As one cn clerly see in Fig. 4 the opticl identifiction of the glxies with detected mid-ir emission is miguous since the sptil resolution in the mid-ir is out n order of mgnitude inferior to wht cn e chieved in the opticl. The comintion of superior sensitivity nd good sptil resolution of the IRS will mke it possile to otin 5 40µm low-resolutionmid-ir spectr of fint sources in reltively short integrtion times. The distinct spectrum of the mid-ir emission fetures t 6.2, 7.7 8.6 nd 11.3 µm, s well s the presence of the silicte sorption nd t 9.7µm (restfrme wvelengths), cn e
4 Brndl et l. Fig.4. The HST Hule Deep Field North with n overly of the ISOCAM 15µm contours (yellow lines). The loction of 7 µm ISOCAM detections is indicted with green circles (Aussel et l. 1999). used to directly derive redshifts of individul sources s fint s 0.5 mjy. For illustrtion we show the simulted IRS spectr of prototypicl strurst (M82) nd ctive glctic nucleus (NGC1068) t redshift of 2 in Fig. 5 nd Fig. 6. Plese note tht the fluxes of the templte spectr hve een normlized to user-specified vlues which my differ from the fluxes of M 82 nd NGC1068 if they were t redshift of z = 2. Also note tht the specified time is the integrtion time per module while the full 5 40µm is covered y two modules with two settings ech. 4 Conclusions The pproch presented here provides n unised method of deriving directly the numer counts of oscured str forming glxies s function
Extrglctic Spectroscopy with SIRTF/IRS 5 c Fig.5. ) The IRS high-z simultor using s templte the ISO/SWS spectrum of M82. ) The expected IRS high-res spectrum of strurst with n IRAS 25µm flux of 5mJy locted t z = 2 fter n integrtion time of 128 seconds. c) The simulted IRS low-res spectrum of the sme source. c Fig.6. ) The IRS high-z simultor using s templte the ISO/SWS spectrum of NGC1068. ) The expected IRS high-res spectrum of n AGN with n IRAS 25µm flux of 5mJy locted t z = 2 fter n integrtion time of 128 seconds. c) The simulted IRS low-res spectrum of the sme source.
6 Brndl et l. of redshift to few tenths of mjy. Moreover, deep imging surveys with SIRTF or even eyond will revel the mid/fr-ir colors tht cn e used for photometric redshift determintions of the fintest IR glxies. The IRS oservtions will provide n importnt clirtion smple for these surveys. More informtion on the IRS cn e found t the following We-sites: http://strosun.tn.cornell.edu/sirtf/irshome.htm http://sirtf.cltech.edu/oserving/os frme.html. Acknowledgements We d like to thnk Dn Weedmn nd Jeffrey Wolovitz for providing the sis of the IRS simultor progrm, Jeffrey vn Cleve for the sensitivity plots nd EckhrdSturm for providingthe ISO-SWS dt on M82nd NGC1068prior to puliction. References 1. Aussel, H., Cesrsky, C. J., Elz, D., Strck, J. L. (1999) ISOCAM oservtions of the Hule Deep Field reduced with the PRETI method. A&A, 342, 313 336. 2. Elz, D. et l. (1999) Source Counts from the 15 microns ISOCAM Deep Surveys. A&A, (in press) (stro-ph/9910406). 3. Fnson, J.L., G. Fzio, J.R. Houck, T. Kelly, G.H. Rieke, D.J. Tenerelli, M. Whitten (1998) Spce Infrred Telescope Fcility (SIRTF). Proc. SPIE Vol. 3356, 478 491. 4. Houck, J.R. & J.E. vn Cleve (1995) IRS: An infrred spectrogrph for SIRTF. Proc. SPIE Vol. 2475, 456 463. 5. Snders, D.B., Mirel, I.F. (1996) Luminous Infrred glxies. ARA&A, 34 749 792.