Digital Integrated Circuits. The Wire * Fuyuzhuo. *Thanks for Dr.Guoyong.SHI for his slides contributed for the talk. Digital IC.

Similar documents
The Wire. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. July 30, 2002

Digital Integrated Circuits (83-313) Lecture 5: Interconnect. Semester B, Lecturer: Adam Teman TAs: Itamar Levi, Robert Giterman 1

Lecture 9: Interconnect

The Wire EE141. Microelettronica

Interconnects. Wire Resistance Wire Capacitance Wire RC Delay Crosstalk Wire Engineering Repeaters. ECE 261 James Morizio 1

EE141-Spring 2007 Digital Integrated Circuits. Administrative Stuff. Last Lecture. Wires. Interconnect Impact on Chip. The Wire

CMPEN 411 VLSI Digital Circuits Spring 2012

Interconnects. Introduction

Integrated Circuits & Systems

Capacitance - 1. The parallel plate capacitor. Capacitance: is a measure of the charge stored on each plate for a given voltage such that Q=CV

EECS 151/251A Spring 2018 Digital Design and Integrated Circuits. Instructors: Nick Weaver & John Wawrzynek. Lecture 12 EE141

ECE260B CSE241A Winter Interconnects. Website:

VLSI GATE LEVEL DESIGN UNIT - III P.VIDYA SAGAR ( ASSOCIATE PROFESSOR) Department of Electronics and Communication Engineering, VBIT

Lecture 23. Dealing with Interconnect. Impact of Interconnect Parasitics

CARNEGIE MELLON UNIVERSITY DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING DIGITAL INTEGRATED CIRCUITS FALL 2002

EE141-Spring 2008 Digital Integrated Circuits EE141. Announcements EECS141 EE141. Lecture 24: Wires

ECE520 VLSI Design. Lecture 8: Interconnect Manufacturing and Modeling. Payman Zarkesh-Ha

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

! Crosstalk. ! Repeaters in Wiring. ! Transmission Lines. " Where transmission lines arise? " Lossless Transmission Line.

VLSI Design and Simulation

CPE/EE 427, CPE 527 VLSI Design I L13: Wires, Design for Speed. Course Administration

Digital Integrated Circuits A Design Perspective

Lecture 12 CMOS Delay & Transient Response

Announcements. EE141- Fall 2002 Lecture 25. Interconnect Effects I/O, Power Distribution

Very Large Scale Integration (VLSI)

Topics to be Covered. capacitance inductance transmission lines

Lecture 7 Circuit Delay, Area and Power

EE115C Digital Electronic Circuits Homework #5

Lecture 4: CMOS Transistor Theory

THE INVERTER. Inverter

Spiral 2 7. Capacitance, Delay and Sizing. Mark Redekopp

GMU, ECE 680 Physical VLSI Design 1

ENEE 359a Digital VLSI Design

Semiconductor Memories

Interconnect s Role in Deep Submicron. Second class to first class

ECE260B CSE241A Winter Interconnects. Website:

10/16/2008 GMU, ECE 680 Physical VLSI Design

Digital Integrated Circuits A Design Perspective. Semiconductor. Memories. Memories

Lecture 5: DC & Transient Response

Interconnect (2) Buffering Techniques.Transmission Lines. Lecture Fall 2003

Homework #2 10/6/2016. C int = C g, where 1 t p = t p0 (1 + C ext / C g ) = t p0 (1 + f/ ) f = C ext /C g is the effective fanout

5.0 CMOS Inverter. W.Kucewicz VLSICirciuit Design 1

The Inverter. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic

10. Performance. Summary

MOS Transistor Theory

Integrated Circuits & Systems

The Physical Structure (NMOS)

SEMICONDUCTOR MEMORIES

The CMOS Inverter: A First Glance

CMOS Transistors, Gates, and Wires

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

9/18/2008 GMU, ECE 680 Physical VLSI Design

The CMOS Inverter: A First Glance

Circuits. L5: Fabrication and Layout -2 ( ) B. Mazhari Dept. of EE, IIT Kanpur. B. Mazhari, IITK. G-Number

Lecture 4: DC & Transient Response

Hw 6 and 7 Graded and available Project Phase 2 Graded Project Phase 3 Launch Today

EE141- Fall 2002 Lecture 27. Memory EE141. Announcements. We finished all the labs No homework this week Projects are due next Tuesday 9am EE141

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Oldham Fall 1999

ELEN0037 Microelectronic IC Design. Prof. Dr. Michael Kraft

EE115C Digital Electronic Circuits Homework #6

Next, we check the race condition to see if the circuit will work properly. Note that the minimum logic delay is a single sum.

DC and Transient. Courtesy of Dr. Daehyun Dr. Dr. Shmuel and Dr.

CS/EE N-type Transistor

MOSFET: Introduction

Homework Assignment #5 EE 477 Spring 2017 Professor Parker

CMOS logic gates. João Canas Ferreira. March University of Porto Faculty of Engineering

ECE 497 JS Lecture - 18 Noise in Digital Circuits

Lecture 6: DC & Transient Response

Integrated Circuits & Systems

EEC 216 Lecture #3: Power Estimation, Interconnect, & Architecture. Rajeevan Amirtharajah University of California, Davis

Digital Integrated Circuits EECS 312. Review. Fringe vs. parallel plate capacitance. Rent s rule. Impact of inter-wire capacitance

Lecture Outline. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Review: 1st Order RC Delay Models. Review: Two-Input NOR Gate (NOR2)

and V DS V GS V T (the saturation region) I DS = k 2 (V GS V T )2 (1+ V DS )

Lecture 25. Semiconductor Memories. Issues in Memory

Low Power VLSI Circuits and Systems Prof. Ajit Pal Department of Computer Science and Engineering Indian Institute of Technology, Kharagpur

Lecture #39. Transistor Scaling

EE382M-14 CMOS Analog Integrated Circuit Design

ECE 497 JS Lecture - 18 Impact of Scaling

University of Pennsylvania Department of Electrical Engineering. ESE 570 Midterm Exam March 14, 2013 FORMULAS AND DATA

DesignConEast 2005 Track 4: Power and Packaging (4-WA1)

CMOS Cross Section. EECS240 Spring Dimensions. Today s Lecture. Why Talk About Passives? EE240 Process

MOSFET and CMOS Gate. Copy Right by Wentai Liu

A capacitor is a device that stores electric charge (memory devices). A capacitor is a device that stores energy E = Q2 2C = CV 2

Lecture 5: DC & Transient Response

Digital Microelectronic Circuits ( )

EE5780 Advanced VLSI CAD

EECS240 Spring Today s Lecture. Lecture 2: CMOS Technology and Passive Devices. Lingkai Kong EECS. EE240 CMOS Technology

Digital Integrated Circuits EECS 312. Midterm exam 1 II. Homework 3 walkthrough. Review. Rent s rule. Inter-wire capacitance

Fig. 1 CMOS Transistor Circuits (a) Inverter Out = NOT In, (b) NOR-gate C = NOT (A or B)

Semiconductor memories

EE 560 CHIP INPUT AND OUTPUT (I/0) CIRCUITS. Kenneth R. Laker, University of Pennsylvania

Switched-Capacitor Circuits David Johns and Ken Martin University of Toronto

Electrical Characterization of 3D Through-Silicon-Vias

University of Toronto. Final Exam

Fundamentals of ANALOG TO DIGITAL CONVERTERS: Part I.3. Technology

Analysis of TSV-to-TSV Coupling with High-Impedance Termination in 3D ICs

VLSI Design I; A. Milenkovic 1

Practice 7: CMOS Capacitance

EECS 141: FALL 05 MIDTERM 1

LAYOUT TECHNIQUES. Dr. Ivan Grech

Transcription:

Digital Integrated Circuits The Wire * Fuyuzhuo *Thanks for Dr.Guoyong.SHI for his slides contributed for the talk Introduction

The Wire transmitters receivers schematics physical 2

Interconnect Impact on Chip 3

Wire Models All-inclusive model Capacitance-only 4

Impact of Interconnect Parasitics Interconnect parasitics(cap./r./inductive) reduce reliability/performance/power Inductive ignored condition resistance of the wire is substantial enough long metal wire with a small cross section,or if the rise and fall times of the applied signal are slow Wires are short,cross section of the wire is large,or the interconnection has a low resistivity Interwire capacitance ignored condition Separation between neighboring wires is 5

Source: Intel Nature of Interconnect Local Interconnect Pentium Pro (R) Pentium(R) II Pentium (MMX) Pentium (R) Pentium (R) II No of nets (Log Scale) S Local = S Technology Global Interconnect S Global = S Die 10 100 1,000 10,000 100,000 Length (u) 6

INTERCONNECT Capacitance Introduction 7

Capacitance of Wire Interconnect V DD V DD V in C gd12 M2 C db2 V out C g4 M4 V out2 M1 C db1 C w Interconnect C g3 M3 Fanout Simplified Model V in V out C L 8

Capacitance: The Parallel Plate Model Too simplistic when W/H ratio become small c int t εdi = kε 0 di di WL H t di L W Current flow Dielectric Electrical-field lines k = 3.9 for SiO 2 Processes are starting to use low-k dielectrics k 3 (or less) as dielectrics use air pockets Substrate S Cwire S S S L 1 S L 9

Permittivity 10

Fringing Capacitance Over the years, a steady reduction in the W/H ratio which has even dropped below 1 (a) H W - H/2 + (b) 11

Fringing versus Parallel Plate Including fringing cap. Gap (from [Bakoglu89]) 12

Interwire Capacitance fringing parallel 13

Impact of Interwire Capacitance Interwire capacitance starts to dominate when W becomes smaller than 1.75H (from [Bakoglu89]) 14

Wiring Capacitances (0.25 mm CMOS) Area cap. af/um2 Fringing cap. af/um 15

Example Wire Capacitance Example 4.1: a global clock wire for 1 to 2 cm die size can reach a length of 10 cm. if the wire width is 1um and uses AL1. the wire capacitance is calculated as follows: 16

MIMI and fringe capacitor Poly-insulator-poly(PIP) Metal-insulator-Metal(MIM) Fringe capacitor 17

INTERCONNECT Resisitance Introduction 18

Wire Resistance R = L H W H L Sheet Resistance R o W R 1 R 2 19

Two conductor with equal R 20

Interconnect Resistance 21

Example Wire Resistance Example 4.2: A 10 cm long and 1 μm wide aluminum wire is routed on the first aluminum layer. Assuming a sheet resistance for Al of 0.075 Ω/. The total wire resistance is calculated as follows: 22

Resistance Estimation 23

Example : Parasitic R&C (1/5) 24

Example : Parasitic R&C (2/5) 25

Example : Parasitic R&C (3/5) 26

Example : Parasitic R&C (4/5) 27

Example : Parasitic R&C (4/5) 28

Example : Parasitic C (1/5) 29

Example : Parasitic C (2/5) 30

Example : Parasitic C (3/5) 31

Example : Parasitic C (4/5) 32

Example : Parasitic C (5/5) 33

Interconnect Scaling Effect Assume W (wire width), H (wire thickness), t (oxide thickness) all scaled down by S (S > 1). Assume local wire length L scaled down by S ( S > 1) and global wire scaled up by Sg(Sg< 1). 34

Interconnect Design Selective Scaling Try not to scale the wire thickness (H) Better interconnect material Copper (Cu) or silicides (better conductivity) Low-k material (lower capacitance) Advanced interconnect topology more interconnect layers thin-denseat lower layers; fat-widely-spacedat higher layers 35

Sheet Resistance 36

Modern Interconnect 37

Resistor layout Meander structure Undoped high-resistivity polysilicon 300-1000ohm/square 38

Crosstalk Floating line Driven line Miller effect Shielding Routing Low-k interconnect Encoding 39

Capacitive Coupling to Floating Line 40

Capacitive Crosstalk 41

Coupling Disturbance 42

Capacitive Coupling to Driven Line A step voltage change on line-x results in a transient on line-y For a step VX= 0->2.5V, VY is first charged to ΔV k = Y τ = τ C Y aggressor victim CXY + C = XY R R 1 1+ k aggressor victim + C Then discharges via R Y to 0 with time const (C (C ΔV Y X X + C XY XY ) ) 43

ΔV k Capacitive Coupling to Driven Line A step voltage change on line-x results in a transient on line-y For a step VX= 0->2.5V, VY is first charged to = Y τ = τ C Y aggressor victim CXY + C = XY R R 1 1+ k aggressor victim (C (C ΔV Y X X + C + C XY XY ) ) 1.8 1.5 1.2 0.9 Aggressor Victim (undriven): 50% 0.6 0.3 Victim (half size driver): 16% Victim (equal size driver): 8% Victim (double size driver): 4% 0 0 200 400 600 800 1000 1200 1400 1800 2000 t (ps) 44

Design Tips for Crosstalk Avoid floating nodes Floating nodes vulnerable to crosstalk Do not run wires in parallel for too long Increase the rise and fall time if possible Use differential signaling Less sensitive to noise Using shielding wires or layers to isolate signal lines 45

Shielding 46

Miller Effect of Crosstalk Delay depends on activity in neighboring wires When aggressor & victim lines switch in opposite directions, there exists Miller effect. 47

Impact of Crosstalk on Delay 48

Avoid Crosstalk by Encoding Delay variation is reduced to 2%. Area & capacitance increase by 5%. 49

Interconnect Organization Dense Wire Fabric ([Kathri2001]) Wires on adjacent layers are routed orthogonally. Signals on the same layer are separated by VDD and GND shields(used in FPGAs) V = V DD, S = Signal, G = GND 50

Interconnect Modeling 51

The Lumped C Model V out Driver c wire C lumped dv dt out V R out V driver in 0 V out ( t) (1 e t ) V, R driver C lumped R driver V out t pd = RCln 2 = 0.69RC = R'C V in C lumped 52

Lumped RC Model 53

Elmore Delay of RC-Network 54

Delay Elmore Delay Another Solution 55

Elmore Delay of RC Chain 56

Distributed versus Lumped 57

Distributed RC Distributed RC-line 58

Distributed Wire Model 59

Step Step-response of Diffusion response of Diffusion Eqn 60

Lumped vs Distributed Models Table 4-7 Step Response of Lumped and Distributed RC Networks: Points of Interest 61

Lumped & Distributed Together 62

example 63

Delay 64

Example Consider a 5mm long, 0.32um wide metal2 wire in a 180nm process. The sheet resistance is 0.05ohm/sheet and the capacitance is 0.2fF/um. Construct a 3-segment π-model for the wire Solution:The wire is 5000um/0.32um=15625 squares in length. The total resistance is (0.05ohm/Π)(15625Π)=781ohm. The total capacitance is (0.2fF/um).5000um=1pF. Each π-segment has onethird of this resistance and capacitance. The π-model is shown 65

Example -elmore model RC tree Figure shows a gate driving wires to two destinations. The gate is represented as a voltage source with effective resistance R1. the two receivers are located at nodes 3 and 4. the wire to node 3 is long enough that it is represented with a pair of π-segments, while the wire to node 4 is represented with a single segment. Find the Elmore delay from input x to each receiver The Elmore delays are T D3 =R 1 C 1 +(R 1 +R 2 )C 2 +(R 1 +R 2 +R 3 )C 3 +R 1 C 4 T D4 =R 1 C 1 +R 1 C 2 +R 1 C 3 +(R 1 +R 4 )C 4 66

Design rules 67

A close solution Delay time is τ ( V Break chain and Insert buffer n ) n CR k 0 eq k CR eq n( n 1) 2 68

Transmission gate delay optimization Total delay time Assume all has n transmission gate,break chain every m switchs,buffer delay time is t buf t p 0.69[ 0.69CR n m eq m( m 1) CReq ] ( 2 n( m 1) n ( 1) t 2 m n m buf 1) t buf 69

Optimal number of switch m optimal m optimal t p m t p 0 m n ntbuf 0.69CReq 2 2 m tbuf 1. 7 1. 7 CR eq 0 It is independent with n 70

Samsung DDR-3 4Gb 71

homework 72