The Utility of Zeta Potential Measurements in the Characterization of CMP Slurries David Fairhurst, Ph.D. Colloid Consultants, Ltd

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The Utility of Zeta Potential Measurements in the Characterization of CMP Slurries David Fairhurst, Ph.D. Colloid Consultants, Ltd HORIBA Scientific Webinar June 12 th 2013

Dispersed Systems An interface always exists when one component (phase I) is dispersed in a state of subdivision in a medium (phase II) Two fundamental parameters control the nature and behavior all dispersed systems Extent of Interface Interfacial Chemistry Stability and Structure System Properties The interfacial extent and interfacial chemistry are not independent parameters

Measurement Techniques used to Characterize Particulate Suspensions INTERFACIAL EXTENT INTERFACIAL CHEMISTRY Particle Size and Distribution* Surface Charge* Particle Shape and Morphology* Nature/type of group(s) Number and distribution Surface Area* (external/internal) Dissociation/ionization Porosity Preferential adsorption Hydrophobic/hydrophilic balance * Surface(interfacial)Tension Contact Angle

The Nature of Surface Charge in Water Mineral oxide crystal lattices are anisotropic charge development because of n and p defects in crystal structure results in hydroxyl groups (-OH) can undergo reaction with either H + or OH - difficult to control surface chemistry in manufacture and processing reactant impurities Metal Oxide Surfaces in Water Adsorption of protons and hydroxyl ions H + OH - MOH + 2 MOH MO - + H 2 O Formation of hydroxylated species M n+ + xoh - M(OH) (n-x)+ x M(OH) x (n-x)+ + OH- M(OH) x+1 (n-x-1)+ Dissociation driven by ph avoid swings in ph Equilibria driven by particle concentration constant %solids M(OH) x+1 (n-x-1)+ + H+ M(OH) x-1 (n-x+1)+

Nanoparticle Surface Chemistry 10nm particle size: ca 30% of molecules/atoms that comprise the molecular structure become surface moieties 1nm particle size: 80% of the atoms are on the surface A typical micellar solution containing 0.1M amphiphile has ~4x10 4 m 2 of micellar-water interfacial area per liter of solution! For nano-size systems surface charge effects play a dominant role in determining the physicochemical properties (surface chemical activity) of the system as a whole

The Electric Double Layer ψ = ψ d exp [- κx] κ is termed the Debye-Hückel parameter. Its value is dependent upon the concentration and valence of electrolytic species in solution

ψ 0 - cannot be measured ψ d - mathematical concept ζ - experimental parameter ζ ψ d ψ = ζ exp [- κx] The electric potential depends (through κ) on the ionic composition of the medium. If κ is increased (i.e. the electric double layer is compressed ) then the potential must decrease

Zeta Potential of Corundum (Al 2 O 3 ) in Solution of Various Electrolytes

Zeta Potential: The Effective Surface Charge in solution Depends upon: Fundamental surface sites how many, what type Solution conditions temperature, ph, electrolyte concentration Useless to quote a zeta potential value without specifying suspension conditions

Calculation of the zeta potential ζ is not determined directly Most common measurement technique: microelectrophoresis (ELS/PALS) Electrophoretic mobility, U E = V p /E x V p is the particle velocity (μm/s) and E x is the applied electric field (Volt/cm) Relation between ζ and U E is non-linear: U E = 2εε 0 ζ F(κa)/3η The Henry coefficient, F(κa), is a complex function of ζ All modern commercial instruments provide both the measured electrophoretic mobility and an estimation of the zeta potential

The Effect of ph on Zeta Potential Maximum dissociation/ionization of surface groups Zeta potential 0 0 positive negative Acidic Surface ph ISOELECTRIC ph Basic Surface Maximum dissociation/ionization of surface groups 7 14 Imperative to determine ZP vs ph profile for any CMP agent prior to use

Aqueous Isoelectric Points of Silica and Alumina Zeta Potential (mv) Titanium Dioxide Silica: iep <ph2 Alumina: iep ca. ph 9 Calcium Carbonate ph The IEP can vary batch-to-batch and lot-to-lot M. Kosmulski, Surface Charging and Points of Zero Charge, Boca Raton, FL, CRC Press; 2009

Zeta Potential of Two Commercial Colloidal Silicas Manufacturer 1 Treated Untreated Manufacturer 2 Always check ZP/pH profile when substituting material from different suppliers

Slurry Zeta Potential and the Polishing of Optical Glass Glass: Corning 7940 Fused Silica (IEP: 3.5) Polishing agents: CeO 2, ZrO 2 (monoclinic) and Al 2 O 3 (nanocrystalline) Polishing Agent IEP Surface Charge at ph 4 Surface Charge at ph 7 Surface Charge at ph 10 ZrO 2 6.3 ++ - --- CeO 2 8.8 ++++ ++ -- Al 2 O 3 9.3 +++++ +++ - The ZP of the polishing slurries varies with solution ph positive or negative depending upon the metal oxide IEP

Slurry Zeta Potential and Glass Surface Roughness The glass surface roughness depends upon the difference in fluid ph and the IEP of the polishing agent The more positive the difference the smoother the surface Solution ph must be > the polishing agent IEP Choose CMP agent whose IEP < Fluid ph

Zeta Potential of Non-oxides The ZP value affected by presence of surface impurities and contamination

In Conclusion Surface Charge is a fundamental parameter that impacts the performance of CMP agents The polishing efficiency of CMP slurries is dependent upon not just the metal oxide particle size but also the hydoxyl [OH] concentration and state of dissociation The Zeta Potential of aqueous suspensions of metal oxide polishing agents critically impacts polishing efficiency. It should be a basic QC measurement for all incoming material In practice, either the CMP IEP must be < fluid ph or the solution ph must be adjusted to a value > CMP IEP

Q&A Ask a question at labinfo@horiba.com Keep reading the monthly HORIBA Particle e-mail newsletter! Visit the Download Center to find the video and slides from this webinar. Jeff Bodycomb, Ph.D. P: 866-562-4698 E: jeff.bodycomb@horiba.com