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Electronic Supplementary Material (ESI) for Nanoscale. This journal is The oyal Society of Chemistry 017 Supporting Information Transparent, flexible, and stretchable WS based humidity sensors for electronic skin Huayang Guo 1, Changyong Lan 1, Zhifei Zhou 1, Peihua Sun 1, Dapeng Wei, and Chun Li 1 1 State Key Laboratory of Electronic Thin Films and Integrated Devices, and School of Optoelectronic Information, University of Electronic Science and Technology of China No.4, Section, North Jianshe oad, Chengdu, 610054, China Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences Fangzheng Avenue, Shuitu Hi-tech Industrial Park, 400714, China Figure S1. Schematic illustration of the humidity measurement system. In order to increase the H level gradually, we first open valve V1 but close valve V so that the residual mositure gas can be exhausted by the pure N gas. Then we close valve V1 but open valve V. The H level will increase because water molecules will get into the chamber with flowing N gas. During the process, the H level can be monitor by the standard hygrometer. For the time-dependent sensing performance test, we exposed the sensor to air by instantly opening the chamber lid and closing the lid following with rapid moisture injection. In this way, the humidity can be changed quickly. Author to whom any correspondence should be addressed. E-mail: lichun@uestc.edu.cn

Figure S. (a) aman spectrum of the as-synthesized WS film. WS characteristic aman peaks of the E 1 g and A 1g phonon modes locates at 353.3 and 419.7 cm -1, respectively. The difference between the two modes is about 66.4 cm -1, further confirming multilayer feature of the as-synthesized WS. (b) XPS survey spectrum of WS sample. Full scan spectrum shows that except the main peaks of W and S, Si signal from the substrate was also observed, suggesting the WS film is thin enough to allow escape of photoelectrons originating from substrate. (c) XPS scan for W. The detailed W 4f scan reveals two peaks, attributed to doublet W 4f 7/ and W 4f 5/, are located at 3.98 and 35.13 ev, respectively. (d) XPS scan for S. The detailed S p scan also shows two peaks, corresponding to S p 3/ and S p 1/ orbital of divalent sulfide ions, are observed at 16.6 and 163.8 ev, respectively.

Figure S3. Structural characterization and sensing performance of the CVD-grown well-crystallized WS. (a) HTEM of the well-crystallized WS. Lattice fringes can be clearly seen. (b) SAED of the as-grown WS sample, which suggest the high quality of the WS sample. (c) esponses of the well-crystallized WS and polycrystal WS in different relative humidity, respectively. Top inset: magnified curve of the well-crystallized WS. Bottom inset: photo image of the as-fabricated sensor. It is obvious that the well-crystallized WS has poor humidity sensing performance compared with the sulfurization-grown polycrystalline WS sample. (d) Dynamic response of the well-crystallized WS to humid gas between 35% and 40% H. ed dash line indicates the trend of sensor s response to humid gas. The signals are mostly submerged by noise.

Figure S4. Comparision of humidity sensing performance between the fabricated WS gas sensor and a comericial avaible humidiy sensor (AOSONG Mod. H0L). (a) Photo image and (b) humid gas response of a WS humidity sensor and a commercial humidity sensor contacted to a testing stage. Figure S5. Comparision of the device sensing response to different gases. Clearly, the WS film shows current increase response to water mositure, while it shows current decrease response to ethanoal and acetone, and no observable current response to dry dair.

Figure S6. aman characterization of the as-fabricated transparent humidity sensor with graphene IDEs attached onto WS film. (a) aman spectrum of the graphene IDE/WS film. The black line belongs to the area with graphene attached onto WS thin film. The red line belongs to the WS area only. (b) Enlarged spectrum of high wavenumber region shown in (a). The G band and D band of graphene can be clearly seen. (c) Enlarged spectrum of low wavenumber region shown in (a). Because of the graphene attached onto WS film, the intensity of A 1g band of the WS with graphene attaching is slightly small than that of pure WS film only. (d) aman mapping of the device. The mapping is formed by recording the intensity of the E 1 g E 1 g and band of WS. Clearly, the region with graphene IDEs covering shows lower aman intensity than that of WS film without graphene covering.

Table S1. Sensing performance of the reported humidity sensors based on D materials. Material Sensitivity t res t rec Δ Graphene 1 S(50%) 0.9% NA NA NA 0 GO NA 30 ms 30 ms I MoS /GO 3 humidity S(85%) 1600 43 s 37 s I baseline MoS 4 (84%) S(84%) 7.5 >500 s >000 s (11%) MoS 5 60% 0 S(60%) 100% 130% 9 s 17 s 0 MoS 6 H S(60%) 3 9 s 17 s D MoS 7 H S(95%) 14 NA NA dry VS 8 H S 30 30-40 s 1-50 s dry black 11% H S(97%) 100% 51% 101 s 6 s phosphorus 9 H WS 10 80% S I5% WS 11 11% 97.3% S 97.3% WS (our work) I (80%) 37.5 13 s 17 s (97.3%) 100% 469% 1 s 13 s 0% S(90%) 357 5s 6s 90% efrences 1. Y. H. Kim, S. J. Kim, Y.-J. Kim, Y.-S. Shim, S. Y. Kim, B. H. Hong and H. W. Jang, ACS Nano, 015, 9, 10453-10460.. S. Borini,. White, D. Wei, M. Astley, S. Haque, E. Spigone, N. Harris, J. Kivioja and T. yhanen, ACS Nano, 013, 7, 11166-11173. 3. D. Burman,. Ghosh, S. Santra and P. Guha, SC Adv., 016. 4. D. J. Late, Y. K. Huang, B. Liu, J. Acharya, S. N. Shirodkar, J. Luo, A. Yan, D. Charles, U. V. Waghmare, V. P. Dravid and C. N. ao, ACS Nano, 013, 7, 4879-4891. 5. S.-L. Zhang, H. Jung, J.-S. Huh, J.-B. Yu and W.-C. Yang, J. Nanosci. Nanotechnol., 014, 14, 8518-85. 6. S.-L. Zhang, H.-H. Choi, H.-Y. Yue and W.-C. Yang, Curr. Appl. Phys., 014, 14, 64-68.

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