Lecture 12: MOSFET Devices

Similar documents
EE105 - Fall 2006 Microelectronic Devices and Circuits

ECE 342 Electronic Circuits. Lecture 6 MOS Transistors

EE105 - Fall 2005 Microelectronic Devices and Circuits

ECE 342 Electronic Circuits. 3. MOS Transistors

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

Practice 3: Semiconductors

Microelectronics Part 1: Main CMOS circuits design rules

ECE 546 Lecture 10 MOS Transistors

Integrated Circuits & Systems

MOS Transistor Properties Review

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.

EE 560 MOS TRANSISTOR THEORY

MOSFET: Introduction

MOS Transistors. Prof. Krishna Saraswat. Department of Electrical Engineering Stanford University Stanford, CA

ECE315 / ECE515 Lecture-2 Date:

Section 12: Intro to Devices

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

The Devices. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. July 30, 2002

FIELD-EFFECT TRANSISTORS

EEC 118 Lecture #2: MOSFET Structure and Basic Operation. Rajeevan Amirtharajah University of California, Davis Jeff Parkhurst Intel Corporation

Lecture 11: MOS Transistor

Lecture 12: MOS Capacitors, transistors. Context

Lecture Outline. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Review: MOSFET N-Type, P-Type. Semiconductor Physics.

! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.

Lecture 4: CMOS Transistor Theory

ECEN474/704: (Analog) VLSI Circuit Design Spring 2018

ELEC 3908, Physical Electronics, Lecture 23. The MOSFET Square Law Model

MOS Transistor I-V Characteristics and Parasitics

Lecture 9 MOSFET(II) MOSFET I V CHARACTERISTICS(contd.)

Lecture 15: MOS Transistor models: Body effects, SPICE models. Context. In the last lecture, we discussed the modes of operation of a MOS FET:

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

Lecture 3: CMOS Transistor Theory

Lecture 04 Review of MOSFET

CMPEN 411 VLSI Digital Circuits. Lecture 03: MOS Transistor

MOSFET Physics: The Long Channel Approximation

The Devices: MOS Transistors

Device Models (PN Diode, MOSFET )

Introduction and Background

Device Models (PN Diode, MOSFET )

Electronic Circuits 1. Transistor Devices. Contents BJT and FET Characteristics Operations. Prof. C.K. Tse: Transistor devices

Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. The Devices. July 30, Devices.

Lecture Outline. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Review: MOS Capacitor with External Bias

Chapter 4 Field-Effect Transistors

ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems. Today. Refinement. Last Time. No Field. Body Contact

! PN Junction. ! MOS Transistor Topology. ! Threshold. ! Operating Regions. " Resistive. " Saturation. " Subthreshold (next class)

SECTION: Circle one: Alam Lundstrom. ECE 305 Exam 5 SOLUTIONS: Spring 2016 April 18, 2016 M. A. Alam and M.S. Lundstrom Purdue University

Extensive reading materials on reserve, including

Fundamentals of the Metal Oxide Semiconductor Field-Effect Transistor

ECE 497 JS Lecture - 12 Device Technologies

The Gradual Channel Approximation for the MOSFET:

MOS Transistor Theory

6.012 Electronic Devices and Circuits Spring 2005

MOS Transistor Theory

VLSI Design The MOS Transistor

Lecture 29 - The Long Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 20, 2007

MOS Capacitor MOSFET Devices. MOSFET s. INEL Solid State Electronics. Manuel Toledo Quiñones. ECE Dept. UPRM.

Part 4: Heterojunctions - MOS Devices. MOSFET Current Voltage Characteristics

The Devices. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. July 30, 2002

ELEC 3908, Physical Electronics, Lecture 26. MOSFET Small Signal Modelling

Chapter 2 CMOS Transistor Theory. Jin-Fu Li Department of Electrical Engineering National Central University Jungli, Taiwan

Lecture 13 MOSFET as an amplifier with an introduction to MOSFET small-signal model and small-signal schematics. Lena Peterson

EE5311- Digital IC Design

Operation and Modeling of. The MOS Transistor. Second Edition. Yannis Tsividis Columbia University. New York Oxford OXFORD UNIVERSITY PRESS

ELEC 3908, Physical Electronics, Lecture 27. MOSFET Scaling and Velocity Saturation

Field-Effect (FET) transistors

EE105 - Fall 2006 Microelectronic Devices and Circuits. Some Administrative Issues

Figure 1: MOSFET symbols.

Lecture 28 - The Long Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 18, 2007

MOS CAPACITOR AND MOSFET

Introduction to CMOS VLSI. Chapter 2: CMOS Transistor Theory. Harris, 2004 Updated by Li Chen, Outline

Today s lecture. EE141- Spring 2003 Lecture 4. Design Rules CMOS Inverter MOS Transistor Model

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor

Lecture 5: CMOS Transistor Theory

The Devices. Jan M. Rabaey

P. R. Nelson 1 ECE418 - VLSI. Midterm Exam. Solutions

Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes

Metal-oxide-semiconductor field effect transistors (2 lectures)

Semiconductor Devices. C. Hu: Modern Semiconductor Devices for Integrated Circuits Chapter 5

an introduction to Semiconductor Devices

6.012 Electronic Devices and Circuits

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor

Section 12: Intro to Devices

Lecture 11: J-FET and MOSFET

EE 330 Lecture 16. MOS Device Modeling p-channel n-channel comparisons Model consistency and relationships CMOS Process Flow

Choice of V t and Gate Doping Type

ECE315 / ECE515 Lecture 11 Date:

Chapter 13 Small-Signal Modeling and Linear Amplification

Microelectronic Devices and Circuits Lecture 9 - MOS Capacitors I - Outline Announcements Problem set 5 -

Quantitative MOSFET. Step 1. Connect the MOS capacitor results for the electron charge in the inversion layer Q N to the drain current.

The Devices. Devices

MOSFET. Id-Vd curve. I DS Transfer curve V G. Lec. 8. Vd=1V. Saturation region. V Th

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. EECS 130 Professor Ali Javey Fall 2006

Electronics Fets and Mosfets Prof D C Dube Department of Physics Indian Institute of Technology, Delhi

ECE 305 Exam 5 SOLUTIONS: Spring 2015 April 17, 2015 Mark Lundstrom Purdue University

Lecture 11: MOSFET Modeling

EE 330 Lecture 16. Devices in Semiconductor Processes. MOS Transistors

N Channel MOSFET level 3

Microelectronics Main CMOS design rules & basic circuits

ECE-305: Fall 2017 MOS Capacitors and Transistors

Transcription:

Lecture 12: MOSFET Devices Gu-Yeon Wei Division of Engineering and Applied Sciences Harvard University guyeon@eecs.harvard.edu Wei 1

Overview Reading S&S: Chapter 5.1~5.4 Supplemental Reading Background We are now going to switch gears and look at a different of transistor device called a MOSFET. Most modern ICs are built using these transistors. While they are commonly used to implement digital circuits, we will look at their analog characteristics and talk about how to build amplifiers equivalent to ones built with BJTs. We begin with the physical structure and a qualitative understanding of how MOSFETs operate. We will derive some current-voltage equations for the transistor. We will also use band diagrams to provide some theoretical rigor to our initial qualitative understanding. Then, we will look at some non-ideal characteristics of the transistor. Lastly, we will analyze the DC operation of MOSFETs. 2

Enhancement-Type MOSFET Most widely used field effect transistor (enhancement type) Let s look at its structure and physical operation 3 terminal device like the BJT but different names Additional body (or bulk) terminal (generally at DC and not used for signals) No connection between the gate and drain/source (separated by oxide) Voltage on gate controls current flow between source and drain 3

Device Operation No gate voltage (v GS = 0) Two back to back diodes both in reverse bias no current flow between source and drain when voltage between source and drain is applied (v DS >0) There is a depletion region between the p (substrate) and n + source and drain regions Apply a voltage on v GS > 0 Positive potential on gate node pushes free holes away from the region underneath the gate and leave behind a negatively charged carrier depletion region transistor in depletion mode As v GS increases, electrons start to gather at the surface underneath the gate (onset of inversion) When v GS is high enough, a n-type channel is induced underneath the gate oxide with electrons supplied by the n + source and drain regions This induced region is called an inversion layer (or channel) and forms when v GS > some threshold voltage V t and current can flow between S & D Transistor is in inversion mode When v DS = 0, no current flows between source and drain 4

Linear Operation i D v GS = V t + 3 V v GS = V t + 2 V v GS = V t + V v GS <= V t v DS (small) With v GS large enough to induce a channel, apply a small potential v DS Causes current to flow between source and drain (electrons flow from source to drain) Magnitude of i D depends on density of electrons in channel which depends on v GS (larger v GS = higher density of electrons) Conductance of channel is proportional to v GS -V t (called excess gate voltage or effective voltage or gate overdrive) Current is proportional to v GS -V t and v DS that causes current to flow i-v curve shows the transistor operates like a voltage-controlled linear resistor Notice i D = i S and i G = 0 due to the gate oxide 5

Triode to Saturation Region Assume v GS is at a constant value > V t and increase v DS v DS appears as a voltage drop across the channel and at different points along the channel, the voltage is different Voltages between the gate and points along the channel are also different ranging from v GS at the source to v GS -v DS at the drain Induced channel is a function of voltage across the oxide at the different points and so channel depth varies across the length of the transistor i-v curve bends over as v DS increases due to the smaller channel depth At v DS = v GS -V t channel depth is almost zero at the drain side Current stays flat for higher voltages v DS > v GS -V t The transistor is said to now operate in the saturation region (not to be confused with the saturation region in BJTs) 6

Saturation Region v DS >= v GS - V t source channel v DS drain v DS = 0 As v DS increases, the channel gets smaller and smaller on the drain side until v DS = v GS V t at which point the channel is said to be pinched off Increasing v DS beyond this point as little (ideally no) effect on the channel shape Current remains constant and said to saturate Transistor enters saturation at v DSsat = v GS V t 7

Deriving the i D -v DS Relationship First consider the linear (triode) region of operation v DS < v GS - V t (v GS > V t is assumed) Consider a point along the channel of infinitesimal width dx at x and voltage v(x) The electron charge at this point is: dq( x) = C ox Wdx[ v GS v( x) V t ] where C ox is the parallel-plate cap formed by the gate electrode and channel ox Cox = tox v DS produces as electric field along the channel (in the negative x direction) dv x E x = ( ) 8 ε ( ) dx

The electric field causes electron charge dq(x) to drift with a velocity dx/dt dx dt Where µ n is the electron mobility in the channel Current is the movement of charge and so i D dx = dq µ n dt Rearrange the equation and integrate along the length of the channel i D dx ( x) = µ E = n µ n dv( x) dx ( x) = C Wdx[ v v( x) V ] Gives the current in the linear (triode) region: ( x) dx W 1 2 i D = µ ncox ( vgs Vt ) vds vds L 2 When v DS =v GS -V t, we get the saturation current equation ox GS L = µ C Wdx[ v v( x) V ] dv( x) i dx = vds µ C Wdx[ v v( x) V ] dv( x) n ox GS i D t 1 = µ nc 2 ox W L 0 D ( v V ) 2 GS t t 0 dv n ox GS t 9

nmos and pmos We ve just seen how current flows in nmos devices. A complementary version of the nmos device is a pmos shown above pmos operation and current equations are the same except current is due to drift of holes The mobility of holes (µ p ) is lower than the mobility of electrons (µ n ) Current is lower in pmos devices given the same dimension and voltages. 10

MOSFET Band Diagrams A more rigorous look at MOSFETs requires us to again use band diagrams energy diagram drawn relative to the vacuum level at equilibrium (no voltage applied) metal work function, Φ M, energy required to completely free an electron from the metal electron affinity, Χ, is the energy between the conduction band and vacuum level Vacuum Level Φ M Χ E f E i metal oxide semiconductor 11

Block Charge diagram Provides information about the charge distribution inside a MOS structure no charges at equilibrium when bias is applied, charge appears within the metal and semiconductor at the interfaces to the oxide voltage drop across the oxide and there is an electric field due to the +Q and Q charge separated by the oxide +Q charge position -Q M O S We will use band diagrams and block charge diagrams to better understand how MOS devices work 12

Applying Bias Look at a pmos device and see how applying a bias on the gate affects the band and block charge diagrams Accumulation (V G > 0) +Q M O S -Q Onset of Inversion (V G = V t ) -Q M O S +Q Depletion (small V G < 0) -Q +Q Inversion (V G < V t ) -Q holes +Q M O S M O S 13

Circuit Symbols nmos or nfet pmos or pfet We represent MOSFETs with the following symbols The book specifies nmos vs. pmos with arrows I will use bubbles b/c they are easier to distinguish quickly a digital circuit designers way of drawing symbols These are symmetric devices and so drain and source can be used interchangeably 14

i-v Characteristics For small values of v DS, v DS2 is small and so near the origin, we can approximate the transistor as a linear resistor W 1 2 W D = ncox ( vgs Vt ) vds vds L i D µ n C ox v GS V t v DS when v DS is 2 L i µ ( ) small vds r DS = µ nc id ( v V ) 15 ox W L GS t 1

We can get a relationship between i D and v GS when the transistor is in saturation Let v GS -V t = V DS i D 1 = µ nc 2 ox W L ( v V ) 2 GS t 1 i D = µ nc 2 ox W L v 2 DS MOS vs. BJT Current is quadratic with voltage in MOS vs. exponential relationship in BJT 16

Some Non-Ideal Characteristics Channel-length modulation Body effect Velocity saturation 17

Channel-Length Modulation Like the Early effect in BJTs, there is an effect in MOSFETs that causes drain current to vary with v DS in saturation (finite output resistance) As v DS increases beyond v DSsat, the pinch off point moves away from the drain by L and has the effect of changing the effective channel length in the transistor Account for this effect with a (1+λv DS ) term in the saturation current equation 1 W 2 id = µ ncox ( vgs Vt ) ( 1+ λvds ) 2 L 18

Channel-length modulation makes the output resistance in saturation finite o id vds 1 2 r ( ) [ ] 1 v GS = constant 1 W 1 = o λ µ ncox vgs Vt λi D r V r o = I A D 2 L 19

Body Effect So far, we have been ignoring the substrate (or bulk or body) of the transistor and assumed that is it tied to the source. However, we cannot always make that assumption. In integrated circuits, body is common to many MOS transistors and channel is connected to most negative (positive) supply for nmos (pmos) transistors. The resulting reverse-bias voltage between the source and substrate affects device operation. Reverse bias will widen the depletion region and reduces channel depth which can be modeled as changing the threshold voltage V t = V [ 2φ + V φ ] t0 + f SB + γ 2 where V t0 is the threshold voltage when V SB =0, ff is a physical parameter, γ is a fabrication-process parameter γ = 2qN ε γ is typically 0.5-V 1/2 As V SB increases, V t increases which affects the transistor s i-v characteristics C ox A s f 20

Temperature Effects V t and mobility µ n,p are sensitive to temperature V t decreases by 2-mV for every 1ºC rise in temperature mobility µ n,p decreases with temperature Overall, increase in temperature results in lower drain currents 21

Velocity Saturation So far, the saturation current equation is quadratic with overdrive voltage (v GS -V t ) and said to obey the square law which is valid for long channel length (>1-µm) devices As transistor dimensions decrease, gate oxide gets thinner and there is a higher vertical electrical field that the electrons moving through the channel experience Causes electrons to bounce up to the oxide (more scattering) and saturates the velocity at which current flows across the channel Can approximate the effect of velocity saturation with the following powerlaw equation for saturation current i D = 2 1 W L ( v V ) α µ ncox GS t α ranges from 1 to 2 depending on process technology (transistor length) This approximation is not rigorous, but convenient to use. More accurate models of the velocity saturation equation can be found in the literature 22

Depletion-type MOSFETs Depletion-type MOSFETs have a channel implant and has a channel with zero v GS (symbol is drawn with channel) must apply negative v GS to turn off device 23

MOSFETs at DC Examples Example 5.1~3 Current Mirror Example What is v GS? How is I D related to I SRC? What is I D vs. V D? I D I SRC V D v GS 24

Example 5.2 25

Example 5.3 26

Current Mirror Example 27