X-ray Imaging and Spectroscopy of Individual Nanoparticles A. Fraile Rodríguez, F. Nolting Swiss Light Source Paul Scherrer Institut, Switzerland Intensity [a.u.] 1.4 1.3 1.2 1.1 D 8 nm 1 1 2 3 1.0 770 775 780 785 790 795 800 805 Photon Energy [ev] 2 3 J. Bansmann Dept of Surface Chemistry and Catalysis Universität Ulm, Germany A. Kleibert Institut für Physik, Universität Rostock, Germany U. Wiedwald Dept of Solid State Physics Universität Ulm, Germany
Magnetism in reduced dimensions Intrinsic properties Interparticle interactions Finite-size effects Nanomagnetism Size, aspect ratio distribution Surface effects
Magnetism in reduced dimensions Superparamagnetism Shape-dependent Thermal Switching Superparamagnetic Nanoislands K ani V particle k B T Superparamagnetic limit: time and thermal stability M. Bode et al. Phys. Rev. Lett. (2004) 92 067201
Magnetism in reduced dimensions Surface and core magnetic orders Surface effects spin glass? dead magnetic layer? bulk-like? high-field irreversibilities high saturation fields shifted hysteresis loops lower coordination number broken magnetic exchange bonds frustrated magnetic interactions surface spin disorder reduced M in ferri-, antiferrosystems enhanced M in metallic ferrosystems
Ensembles vs Single-Particle Properties Ensembles: Distributions with respect to nanoparticle size, aspect ratio crystalline structure, defect distribution and chemical composition Single Particle experiments: Correlate the electronic, magnetic and structural properties with the size, aspect ratio, crystalline structure, and chemical composition of each individual particle. The ability to manipulate a single nanoparticle has an increased potential in device manufacturing Courtesy of M. Farle, Uni Duisburg
Single Particle Detection: Techniques Available Technique Δx (nm) E-resolution (ev) SP-STM EELS Optical Fluorescence 0.5 0.5 < 5 < 0.2 0.5 0.02 Technique XPEEM Δx (nm) 50 System (Individual Particles) InAs (D~50 nm), ΔE/E=0.2 ev, Heun et al. Fe 2 O 3 (D ~ 10 nm), ΔE/E=0.5 ev, Rockenberger et al.
Soft x-ray x Spectromicroscopy Chemical Selectivity Magnetic Contrast: XMCD Intensity (a.u.) Fe Co 700 800 900 Photon Energy (ev) Surface and interface sensitivity Ni chemical bonding electronic properties TEY (a.u.) Intensity (a.u.) L 3 L 2 atomic magnetic moments 775 780 785 790 795 800 805 Photon energy (ev) S Magnetic Contrast: XMLD hn e - antiferromagnets
Soft x-ray x Spectromicroscopy Element specific imaging: PEEM Co Py Substrate Co islands, 778.1 ev Py film, 852.7 ev Magnetization Direction 5 μm S
X-ray PhotoEmission Electron Microscopy probing secondary/auger/photoemission spatial resolution: 50 nm electron energy resolution: 0.1 ev H A ~ 30 mt 100 K < T < 1500 K ultra high vacuum Energy Analyzer Magnetic Lenses MCP Phosphor 20kV x-rays Sample
Cobalt particles: Arc ion cluster source particle size tunable between 4-15nm size distribution: ΔD/D ~10-15% in situ deposition R. P. Methling et al., EPJD 16,, 173 (2001) Collaboration with J. Bansmann, Uni Ulm, and A. Kleibert, Uni Rostock
Particle Size: Scanning Electron Microscopy Co particles, no capping layer Co particles, Al capping layer 100 nm 1 µm D ~10 nm deposition of Co particles on Si substrates coverage: 5-10 particles/μm 2 lithographic markers on substrates low percentage dimers/trimers crystalline structure D ~ 8 nm Lithographic markers: L. J. Heyderman, PSI
Elemental Contrast: X-ray PEEM Co particles D 13 nm oxidized in air Photon energy 778 ev Photon energy 770 ev Image (778 ev) Image (770 ev) 2 μm 2 μm 2 μm
X-ray Imaging of Individual Nanoparticles Co particles D 8 nm / 8 nm Al capping layer PEEM Elemental Contrast Scanning Electron Microscopy 1 µm 1 µm1 µm 1 µm The lithographic markers are essential to correlate unambiguously the PEEM observations with the size of the particles imaged by the SEM Lithographic markers: L. J. Heyderman, PSI
Individual Particles: X-ray Absorption Spectra Co particles D 8 nm, no capping layer 1 μm particle/blank 770 775 780 790 795 800 805 810 Photon Energy (ev) Intensity (a.u.) particle blank Movie: 159 images Total acquisition time: 12 hours. 765 770 775 780 785 790 795 800 805 810 Photon Energy (ev)
Intensity (arb.units) X-ray Absorption: Particle-to-particle variation 1.4 1.3 Co particles D 8 nm, no capping layer B C D Particle 1 Particle 2 Particle 3 Reference CoO thin film B C D 1.2 A E A E 1.1 776 778 780 782 776 778 780 782 Adapted from Regan et al. PRB 64 (2001) 214422 1.0 770 775 780 785 790 795 800 805 Photon Energy [ev]
X-ray Absorption: Single-Particle vs Ensembles 1.4 1.3 Co particles D 8 nm, no capping layer B C D Particle 1 Particle 2 Particle 3 Ensemble Reference CoO thin film B C D Intensity (arb.units) 1.2 A E A E 1.1 776 778 780 782 776 778 780 782 Adapted from Regan et al. PRB 64 (2001) 214422 1.0 770 775 780 785 790 795 800 805 Photon Energy [ev]
Future: XMCD of individual nanoparticles in situ Fe clusters (~ 9 nm) supported on ferromagnetic thin films Fe clusters Fe, 708 ev Co, XMCD, 778 ev Co film 1 μm alloy systems, e.g. Fe x Co 1-x, Fe x Pt 1-x Magnetic transition temperatures on the nanoscale
Conclusions X-ray absorption spectra of individual Co particles as small as 8 nm Differences in oxide-related features between individual particles were observed Changes between the spectra of an individual particle and the ensemble were observed D 8 nm 1.4 1.3 1 1 2 3 Intensity [a.u.] 1.2 1.1 2 3 1.0 770 775 780 785 790 795 800 805 Photon Energy [ev]
Collaborators F. Nolting, Swiss Light Source Paul Scherrer Institut, Switzerland J. Bansmann, Dept of Surface Chemistry and Catalysis Universität Ulm, Germany A. Kleibert, Institut für Physik, Universität Rostock, Germany U. Wiedwald, Dept. Solid State Physics, Universität Ulm, Germany L. J. Heyderman,Laboratory for Micro- and Nanotechnology Paul Scherrer Institut, Switzerland