IEC TC 113 Nanotechnology for electrical and electronic products and systems

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Transcription:

IEC TC 113 Nanotechnology for electrical and electronic products and systems Mike Leibowitz TC 113 USNC TAG Secretary mike.leibowitz@nema.org February 28, 2017 ANSI NSP Arlington, VA

- Background - Liaisons - Graphene work - US stakeholder involvement

TC 113 History - IEC Advisory Group formed to consider new area of standardization work in nano-electrotechnology in light of growth in nano-enabled electronics - IEC established new TC 113 in 2006 - First plenary meeting in Frankfurt in 2007

TC 113 Priorities - Determine top standardization needs in the market - Establish liaisons with TC s and allied organizations - First deliverable Blank detail specification for CNT s

- JWG1, Terminology TC 113 Working Group Structure - JWG2, Measurement and characterization - WG3, Performance assessment - WG7, Reliability assessment

TC 113 Working Group Structure - WG8, Graphene related materials, CNT materials - WG9, Nano-enabled photovoltaics, thin film organic nano-electronics, nanoscale contacts and interconnects - WG10, Luminescent nanomaterials - WG11, Nano-enabled energy storage

TC 113 Liaisons - ISO TC 229, Nanotechnologies (JWG1, JWG2) - IEC TC 1, Terminology (JWG1) - IEC TC 21, Secondary cells and batteries (WG11) - IEC TC 47, Semiconductor devices - IEC TC 82, Solar photovoltaic energy systems (WG9) - IEC TC 119, Printed electronics - IEEE, SEMI, ANF

Blank detail specifications Graphene work in TC 113 - IEC 62565-3-1, Nanomanufacturing Material specifications, Part 3-1, Blank detail specification for graphene for electrotechnical applications (Committee Draft (CD) stage) - IEC 62565-3-2, Nanomanufacturing Material specifications, Part 3-2, Sectional blank detail specification for nano-ink (Potential work item (PWI) stage)

Graphene work in TC 113 Detail specifications - IEC/TS 62565-3-3, Nanomanufacturing Material specifications, Part 3-3, Detail specification for singlelayer graphene (PWI) - IEC/TS 62565-3-4, Nanomanufacturing Material specifications, Part 3-4, Detail specification for bi-layer graphene (PWI)

Key control characteristics Graphene work in TC 113 - IEC/TS 62607-6-1: Graphene - Measurement of sheet resistance of commercial graphene powders by the Four Probe Method (approved work item) - IEC/TS 62607-6-2: Graphene Evaluation of the number of layers of graphene (approved work item) - IEC/TS 62607-6-3: Graphene-Characterization of CVD graphene domains (CD)

Key control characteristics Graphene work in TC 113 - IEC/TS 62607-6-4: Graphene - Surface conductance measurement using resonant cavity (published) - IEC/TS 62607-6-5: Graphene sheet resistance and contact resistance measurement using the transmission line method (PWI) - IEC/TS 62607-6-6: Graphene - Uniformity of strain in graphene analyzed by Raman spectroscopy (PWI)

Key control characteristics Graphene work in TC 113 - IEC/TS 62607-6-7: Determination of specific surface area of graphene materials using methylene blue adsorption method (PWI) - IEC/TS 62607-6-8: Graphene - Measurement of sheet resistance by the four-point probe method (PWI) - IEC/TS 62607-6-9: Graphene - Measurement of sheet resistance by the non-contact Eddy current method (PWI)

Key control characteristics Graphene work in TC 113 - IEC/TS 62607-6-10: Graphene - Measurement of sheet resistance by terahertz time-domain spectroscopy (PWI) - IEC/TS 62607-6-11: Graphene - Defect level of graphene analyzed by Raman spectroscopy (PWI) - IEC/TS 62607-6-13: Determination of content of functional group of graphene materials using Boehm's titration method (PWI)

Key control characteristics Graphene work in TC 113 - IEC/TS 62607-6-14: Graphene - Defect level analysis of graphene powder using Raman spectroscopy (PWI) - ISO/TR 19733: Matrix of characterization and measurement methods for Graphene (PWI) - ISO/TS 80004-13: Nanotechnologies - Vocabulary - Part 13: Graphene and other two dimensional materials (Draft Technical Specification (DTS) stage)

Participate! - Standards drive markets, so drive the standards! - Manufacturer and customer stakeholders are critical - Join the TC 113 TAG

Thank you! Mike Leibowitz IEC TC 113 USNC TAG Secretary mike.leibowitz@nema.org T: +1 703.841.3264 M: +1 443.812.6051