OptiMOS -5 Power-Transistor

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BSS 223PW. ESD Class; JESD22-A114-HBM Class 0. Product Summary V DS -20 V R DS(on) 1.2 Ω I D A. Qualified according to AEC Q101

BSL211SP. Rev 2.0. Product Summary V DS -20 V R DS(on) 67 mω I D -4.7 A. Type Package Tape and reel BSL211SP P-TSOP6-6 H6327: 3000pcs/r.

BSS123. Rev K/W. R thja

14.5 Pulsed drain current. 200 Gate source voltage V GS ± 20 V ESD-Sensitivity HBM as per MIL-STD 883 Class 1 Power dissipation

Transcription:

OptiMOS -5 Power-Transistor Product Summary V DS 8 V R DS(on).2 m Features N-channel - Enhancement mode AEC qualified I D 3 A H-PSOF-8- Tab MSL up to 26 C peak reflow 75 C operating temperature Green product (RoHS compliant) Ultra low Rds(on) % Avalanche tested 8 8 Tab Type Package Marking IAUT3N8S5N2 P/G-HSOF-8-5N82 Maximum ratings, at T j =25 C, unless otherwise specified Parameter Symbol Conditions Value Unit Continuous drain current I D T C =25 C, V GS =V ) 3 A T C = C, V GS = V 2) 3 Pulsed drain current 2) I D,pulse T C =25 C 2 Avalanche energy, single pulse 2) E AS I D =5 A 87 mj Avalanche current, single pulse I AS - 3 A Gate source voltage V GS - ±2 V Power dissipation P tot T C =25 C 375 W Operating and storage temperature T j, T stg - -55... +75 C IEC climatic category; DIN IEC 68- - - 55/75/56 Rev.. page 26--29

Parameter Symbol Conditions Values Unit min. typ. max. Thermal characteristics 2) Thermal resistance, junction - case R thjc - - -.4 K/W Electrical characteristics, at T j =25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage 2) V (BR)DSS V GS = V, I D = ma 8 - - V Gate threshold voltage V GS(th) V DS =V GS, I D =275 µa 2.2 3 3.8 Zero gate voltage drain current 2) I DSS V DS =8 V, V GS = V, T j =25 C -. µa V DS =5 V, V GS = V, T j =85 C 2) - 2 Gate-source leakage current I GSS V GS =2 V, V DS = V - - na Drain-source on-state resistance R DS(on) V GS =6 V, I D =75 A -.3.7 mω V GS = V, I D = A -..2

Parameter Symbol Conditions Values Unit min. typ. max. Dynamic characteristics 2) Input capacitance C iss - 25 625 pf Output capacitance C oss V GS = V, V DS =4 V, f = MHz - 2 26 Reverse transfer capacitance C rss - 86 3 Turn-on delay time t d(on) - 3 - ns Rise time t r V DD =4 V, V GS = V, - 9 - Turn-off delay time t d(off) I D = A, R G =3.5-69 - Fall time t f - 55 - Gate Charge Characteristics 2) Gate to source charge Q gs - 56 73 nc Gate to drain charge Q gd V DD =4 V, I D = A, - 37 56 Gate charge total Q g V GS = to V - 78 23 Gate plateau voltage V plateau - 4.5 - V Reverse Diode Diode continous forward current 2) I S T C =25 C - - 3 A Diode pulse current 2) I S,pulse - - 2 Diode forward voltage V SD V GS = V, I F = A, T j =25 C -.9.2 V Reverse recovery time 2) t rr V R =4 V, I F =5A, - 86 - ns Reverse recovery charge 2) Q rr di F /dt = A/µs - 77 - nc ) Current is limited by bondwire; with an R thjc =.4 K/W the chip is able to carry 4A at 25 C. 2) Defined by design. Not subject to production test. Rev.. page 3 26--29

Power dissipation 2 Drain current P tot = f(t C ); V GS 6 V I D = f(t C ); V GS 6 V 4 35 3 3 25 P tot [W] 2 2 5 5 5 5 2 5 5 2 T C [ C] T C [ C] 3 Safe operating area 4 Max. transient thermal impedance I D = f(v DS ); T C = 25 C; D = Z thjc = f(t p ) parameter: t p parameter: D =t p /T µs µs.5 - µs ms Z thjc [K/W]..5-2. single pulse. V DS [V] -3-6 -5-4 -3-2 - t p [s] Rev.. page 4 26--29

5 Typ. output characteristics 6 Typ. drain-source on-state resistance I D = f(v DS ); T j = 25 C R DS(on) = (I D ); T j = 25 C parameter: V GS parameter: V GS 2 V 6.5 V 4 4.5 V 5 V 3.5 3 8 6 V 6 5.5 V R DS(on) [m ] 2.5 2 4 2 5 V 4.5 V.5 5.5 V 6 V 6.5 V V 2 3 4 5 6 7.5 2 3 V DS [V] 7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance I D = f(v GS ); V DS = 6V R DS(on) = f(t j ); I D = A; V GS = V parameter: T j 2-55 C 25 C 75 C 2..9 8.7 6 R DS(on) [m ].5.3 4..9 2.7 2 4 6 8 V GS [V].5-6 -2 2 6 4 8 T j [ C] Rev.. page 5 26--29

9 Typ. gate threshold voltage Typ. capacitances V GS(th) = f(t j ); V GS = V DS C = f(v DS ); V GS = V; f = MHz parameter: I D 4 5 3.5 Ciss 4 3 275 µa V GS(th) [V] 2.5 275 µa C [pf] 3 Coss 2 2 Crss.5-6 -2 2 6 4 8 T j [ C] 2 4 6 8 V DS [V] Typical forward diode characteristicis 2 Typ. avalanche characteristics IF = f(v SD ) I AS = f(t AV ) parameter: T j 4 parameter: T j(start) 3 25 C I F [A] 2 I AV [A] C 5 C 75 C 25 C.2.4.6.8.2.4 V SD [V] t AV [µs] Rev.. page 6 26--29

3 Typical avalanche energy 4 Drain-source breakdown voltage E AS = f(t j ) V BR(DSS) = f(t j ); I D_typ = ma parameter: I D 2 87 86 6 85 75 A 84 E AS [mj] 2 8 5 A V BR(DSS) [V] 83 82 8 8 79 4 3 A 78 77 25 75 25 75 T j [ C] 76-6 -2 2 6 4 8 T j [ C] 5 Typ. gate charge 6 Gate charge waveforms V GS = f(q gate ); I D = 3 A pulsed parameter: V DD 9 6 V V GS 8 7 4 V 64 V Q g 6 V GS [V] 5 4 3 2 Q gate Q gs Q gd 4 8 2 6 Q gate [nc] Rev.. page 7 26--29

Published by Infineon Technologies AG 8726 Munich, Germany Infineon Technologies AG 26 All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

Revision History Version Version. Date 29.2.26 Changes Final Data Sheet Rev.. page 9 26--29