Günter Zschornack Handbook of X-Ray Data

Günter Zschornack Handbook of X-Ray Data

Günter Zschornack Handbook of X-Ray Data With 113 Figures and 161 Tables 123

Ass.-Prof. Dr. rer. nat. habil. Günter Zschornack Technische Universität Dresden Institut für Angewandte Physik Mommsenstraße 13 01062 Dresden g.zschornack@fz-rossendorf.de Library of Congress Control Number: 2006937001 ISBN 978-3-540-28618-9 Springer Berlin Heidelberg New York This work is subject to copyright. All rights are reserved, whether the whole or part of the material is concerned, specifically the rights of translation, reprinting, reuse of illustrations, recitation, broadcasting, reproduction on microfilm or in any other way, and storage in data banks. Duplication of this publication or parts thereof is permitted only under the provisions of the German Copyright Law of September 9, 1965, in its current version, and permission for use must always be obtained from Springer. Violations are liable for prosecution under the German Copyright Law. Springer is a part of Springer Science+Business Media springer.com Springer-Verlag Berlin Heidelberg 2007 The use of general descriptive names, registered names, trademarks, etc. in this publication does not imply, even in the absence of a specific statement, that such names are exempt from the relevant protective laws and regulations and therefore free for general use. Typesetting: PTP -Berlin GmbH, Berlin Production: LE-TEXJelonek,Schmidt&VöcklerGbR,Leipzig Cover: WMXDesign, Heidelberg Printed on acid-free paper 57/3100/YL - 543210

Preface Today, with energy-dispersive and wavelengthdispersive techniques, modern methods in X-ray analysis are used in a wide range of applications, as for example in X-ray fluorescence analysis, electron microbeam analysis,x-ray fluorescence analysis with charged particles, and so on. In many applications for instance in metallurgy, mining, microelectronics, medicine, biology, environmental protection, chemistry, archeology, X-ray astronomy, and so on fast and effective information about the probes under investigation can be obtained by simultaneous multielement analysis. Therefore, it is of outstanding importance for every analyst to have a carefully edited collection of basic atomic data. This is also true in the age of the communication society, where a large quantity of data is available via the Internet. Practical experience shows that it is still important to have data sets in the form of printed matter. This is even more important, because much of the data available in the Internet are given without correct citation of data sources and without any evaluation. Accurate sets of atomic data are necessary for the calibration of energy- and wavelength-dispersive X- ray spectrometers and serve as basic data for applications in atomic physics, nuclear physics and astrophysics,aswellasdatafordiagnosticsandmodelling of different plasmas, as for instance in fusion research and ion source physics. The present book characterizes, in a compact and informative form, the most important processes and facts connected with the emission of X-rays. Beginning with the description of the atomic shell structure, classification of atomic electron transitions is given, and important details about these processes are discussed. Subsequently, an overview of the basic processes of the interaction of X-rays with matter and of the most common detection systems for the detection of X-rays are summarized. Individual sets of experimental atomic data, known from the literature, are compared between themselves and with theoretical results. In this way it becomes possible to reach conclusions about the consistency of the data sets to be used. In describing the procedures for energy and intensity calibration of energy- and wavelength-dispersive X-ray spectrometers, guidance in the application of atomic data for the calibration of the detection systems to be used and for transition line identification is given. The present book fills a gap in the existing scientific literature in a field important for commercial and technological applications, as well as for basic and applied research. It is offered to all scientists and engineers using X-rays in research, technology, process control, and in other fields. The spectrum of working areas includes spheres of activity such as X-ray and solid-state physics, atomic and nuclear physics, plasma physics, astrophysics, physical chemistry, as well as special applications in such fields as metallurgy, microelectronics, geology, silicate techniques, environment protection, medicine, and so on. The tables in the present book contain a wide range of data contributingto the value of the book by their easy availability. From my own investigations I know how costly the search for data can be. During the writing of this book I have made an effort to summarize all the data in a transparent way. When, for a certain quantity,different data are known in the literature, as a rule I have given all known information to characterize the actual knowledge in a definite objec-

VI Preface tive way. Here, readers should judge for themselves how successful I have been. I would be grateful to receive comments from users of the book, in order to help me improve its conception and content for further editions. During the preparation of the first edition published in 1989 by Verlag für Grundstoffindustrie, Leipzig and in the same year as licence edition by the Springer publishing house, my colleagues Dr. S.Fritzsche,Dr.I.Reiche,Dipl.-Phys.K.Mädler,Dipl.- Phys. R. Paul and Dipl.-Phys. J.-U. Uhlenbrok supported me in different ways. I express my gratitude to all of them.during the preparation of the new edition the support given by Dipl.-Phys. G. Beulich, who updated the extensive data set, was of extraordinary value. Dr. D. Küchler and Dr. A. El-Shemi, as well as Dipl.-Phys. T. Werner and Dr. F. Ullmann, gave me a lot of valuable tips for the improvement of the first edition. Furthermore, the comprehensive technical assistance from Mrs. K. Arndt is acknowledged. Last but not least, my gratitude is directed not only to those actively contributing to the success of the present book, but also to those contributing, via appreciation and passive tolerance, to the finishing of the present book my family. Dresden, October 2006 Günter Zschornack

Contents Part I Atomic Structure, X-ray Physics and Radiation Detection 1 X-Ray Physics and Practice... 3 1.1 HistoricalDevelopmentofX-RayPhysics... 3 1.2 SignificanceofAtomicDataforPractice... 5 2 Physical Fundamentals... 9 2.1 ElectronicConfigurationsandAtomicGroundStates... 9 2.1.1 OccupationofElectronicLevels... 9 2.1.2 SystematicsofElectronEnergyLevels... 11 2.1.3 ElectronShellStructure... 22 2.2 CharacteristicX-Rays... 24 2.2.1 Classification... 24 2.2.2 LineProfileandLineBroadening... 36 2.2.3 X-RayEmissionRates... 46 2.2.4 X-RayEnergyShifts... 54 2.3 FluorescenceYields... 74 2.3.1 ImplicationsforBasicResearchandPractice... 74 2.3.2 NotationsandDefinitions... 74 2.3.3 NaturalLevelWidthsandFluorescenceYields... 79 2.4 Ionization... 79 2.4.1 ElectronImpactionization... 79 2.4.2 IonizationinIon AtomandIon IonCollisions... 82 2.4.3 MultipleIonizationProcesses... 82 2.5 X-RaySpectraandtheAuger-Effect... 86 2.5.1 AugerElectronsandInner-ShellIonization... 86 2.5.2 Auger Effect and Energetic Width of X-Ray Emission Lines and Absorption Edges... 87 2.5.3 AugerEffectandIntensitiesofX-RayEmissionLines... 87 2.6 X-RayAtomicScatteringFactors... 88 2.7 X-RayAbsorption... 88 2.8 ContinuousX-Rays... 91 2.8.1 PropertiesofElectronBremsstrahlung... 93 2.8.2 BremsstrahlungCross-Sections... 93 2.8.3 RadiationLengthandRadiationDensity... 94 2.8.4 ElectronBremsstrahlungfromX-RayTubes... 94 2.8.5 BremsstrahlungIntensityDistribution... 95

VIII Contents 2.8.6 PolarizationalBremsstrahlung... 96 2.8.7 BremsstrahlungEmissionfromPlasmas... 96 3 Energy and Intensity Measurements... 99 3.1 CalibrationNormalsforElectromagneticRadiation... 99 3.1.1 ClassificationoftheCalibrationNormals... 99 3.1.2 X-RayCalibrationNormals... 100 3.2 EnergyandIntensityCalibration... 103 3.2.1 CalibrationofWavelength-DispersiveSpectrometers... 103 3.2.2 CalibrationofEnergy-DispersiveSpectrometers... 104 3.3 X-RayDetectors... 106 3.3.1 Energy-andWavelength-DispersiveX-RaySpectroscopy... 106 3.3.2 GasIonizationDetectors... 107 3.3.3 Scintillationdetectors... 116 3.3.4 SemiconductorDetectors... 123 3.3.5 CrystalDiffractionSpectrometers... 129 3.3.6 CryogenicDetectors... 144 4 DataBase... 147 4.1 ElectronBindingEnergies... 147 4.2 X-RayTransitionEnergies... 158 4.2.1 StandardEnergyRange... 158 4.2.2 SoftX-RayEnergyRegion... 163 4.3 X-RayFluorescenceYields... 163 4.3.1 K-ShellX-rayfluorescenceYields... 163 4.3.2 LX-RayFluorescenceYields... 164 4.3.3 MX-RayFluorescenceYields... 164 4.4 EnergeticLevelandLinewidths... 168 4.5 X-RayEmissionRates... 170 4.6 MassAttenuationCoefficients... 173 Part II X-Ray Reference Data 5 X-Ray Emission Lines and Atomic Level Characteristics... 179 6 X-Ray Transition Energies: Ordered by Energy/Wavelength... 611 7 K-Shell Intensity Ratios and K-Vacancy Decay Rates... 691 8 Atomic Scattering Factors... 695 9 Analytical approximation of Atomic Scattering Factors... 723 10 Mass Attenuation Coefficients... 735 11 Fit Parameters for the Calculation of Mass Attenuation Coefficients... 889

Contents IX 12 Atomic Weights and Isotope Masses... 909 13 Parameters of Stable Isotopes... 917 14 Parameters of Long-Live Radioactive Isotopes... 925 15 Mean X-Ray Transition Energies... 943 References... 953