SRMA Jannus-Saclay facility (GIS with Jannus-Orsay) High voltage electron microscopy facility Lucile Beck - JANNUS laboratory - SRMP Jean Henry SRMA CEA Saclay CEA 10 AVRIL 2012 PAGE 1
Programs and objectives of the JANNUS-Saclay facility JANNUS: Joint Accelerators for Nanosciences and NUclear Simulation Nuclear materials Fundamental mechanisms of irradiation damage Radiation-tolerant materials for nuclear energy production Simulation of damage accumulation processes induced by neutrons in nuclear materials Triple beam irradiation : 1 beam for dpa, 1 beam for He, A beam for H Advanced materials research and synthesis Fundamental mechanisms of irradiation damage Controlled synthesis of nanomaterials Physical and chemical property modification Teaching and training Master students and continuing education Irradiation/Implantation and IBA PAGE 2
JANNUS multiple beam ion source at CEA Saclay 3 accelerators PAGE 3
Flux (ions/s) 3 MV Pelletron "Épiméthée" Accelerator: 3 MV Pelletron NEC (National Electrostatics Corporation) with a ECR (Electron Cyclotron Resonance) source from Pantechnik 1.E+15 He Positive multicharged ions 1 <M< 209 200 kev <E< 40 MeV 1.E+14 1.E+13 1.E+12 1.E+11 1.E+10 Hydrogen Helium Carbon Oxygen Neon Argon Iron Nickel Xenon Tungsten 1.E+09 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 Charge state CEA 3 juillet 2012 PAGE PAGE PAGE 4 4 4
JANNUS multiple beam ion source at CEA Saclay 3 accelerators PAGE 5
2.5 MV Van de Graaff "Yvette" Accelerator: Van de Graaff HVE (High Voltage Engineering) 2.5 MV from 1965 Source: RF : Positive single-charged ions: H, D, 4 He 2 MeV To be replaced in 2014 He flux ~ 10 13 ions/s PAGE 6
JANNUS multiple beam ion source at CEA Saclay 3 accelerators PAGE 7
2 MV Tandem "Japet" Accelerator: 2 MV Tandem NEC (National Electrostatics Corporation) Source of Negative Ions by Cesium Sputtering (NEC) Negative single-charged ions Positive multi-charged ions after the gas/thin foil stripper)
3 complementary sources Epiméthée Source: ECR (Electronic Resonance Cyclotron) by Pantechnik multicharged positive ions 1 <M< 209, 200 kev <E< 60 MeV 3 He and 4 He Japet Yvette Possible Source: SNICS II (Source of Negative Ions by Cesium Sputtering) monocharged négatifve ions multicharged positive ions after stripping) Source: RF monocharged positive ions Impossible Utilization : Ballistic damage (~ 10 dpa/h) Ions H, D, He for implantation Material modification Ion Beam Analysis (RBS, ERDA, PIXE, NRA and HI-ERDA) Teaching and training 12 C and 13 C PAGE 9
JANNUS multiple beam ion source at CEA Saclay 3 accelerators 3 chambers PAGE 10
JANNUS multiple beam ion source at CEA Saclay 3 accelerators 2 chambers for irradiation/implantation (single, dual, triple-beam) PAGE 11
JANNUS multiple beam ion source at CEA Saclay 3 accelerators 2 chambers for ion beam analysis PAGE 12
Triple beam chamber Japet He from Epiméthée He from Yvette PAGE 13
Triple and single beam irradiation chambers Specifications: Beam incidence: 15 Lateral homogeneity: Scanning of the beams (2 x 2 cm 2 ) Depth homogeneity: Degraders on each beam (series of carbon or aluminium foils) Current measurement: Multi-Faraday cups (7 per beam) Vacuum: 10-7 to 10-9 mbar Temperature: Liquid nitrogen to 800 C Instrumentation: IR-camera and CCD camera CCD camera IR camera PAGE 14
G(H 2 ) Dedicated chamber for specific application Example 1: In-situ mechanical test (tensile test device) Example 2: Polymer irradiation A. Jankowiak, Ch. Colin (CEA/DM//SRMA) et coll. 4,5E-07 4,0E-07 3,5E-07 G(H2)oxy G(H2) He 3,0E-07 2,5E-07 2,0E-07 1,5E-07 1,0E-07 5,0E-08 0,0E+00 0,0E+00 5,0E+06 1,0E+07 1,5E+07 2,0E+07 2,5E+07 3,0E+07 Dose(Gy) Y. Ngono et coll., DSM/IRAMIS
IBA chambers IBA chamber connected to Yvette Versatile chamber connected to Epiméthée: Irradiation, IBA and and development RBS ERDA PIXE PIGE NRA 3 He profiles RBS HI-ERDA 4 He profiles PAGE 16
High voltage electron microscopy facility (THT) SRMA, CEA-Saclay Microscope EM7 (AEI/KRATOS)
1 er étage Accélérateur Générateur HT RdC Electron energy : 0,3 à 1,2 MeV Damage rate 5 10-3 dpa/s (in steels) Vacuum: < 5 10-8 Torr Sous-Sol Suspension Microscope (with variation of T, flux, dose)
Specifications Sample holders: Single tilt heating holder (RT to 1000K) Double tilt cooling holder (77 K to 323 K) Double tilt heating holder (RT to 900 K) Single tilt heating holder for Atom Probe tips In progress : heating holder for in-situ mechanical test Video camera for in-situ observations of irradiation-induced microstructural evolutions : New caméra (GATAN) in 2014
Expériences in-situ: détermination de la cinétique de croissance de boucles de dislocation Alliage FeMnNi irradié à 400 C (e - 1 MeV)
Next EMIR call HVM (SRMA) Open for EMIR 2014 call jean.henry@cea.fr JANNUS-Saclay (SRMP) Close for EMIR 2014 due to the replacement of one accelerator For specific request, lucile.beck@cea.fr Open for EMIR 2015 with a new accelerator!