Electron Microscopy I

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Characterization of Catalysts and Surfaces Characterization Techniques in Heterogeneous Catalysis Electron Microscopy I Introduction Properties of electrons Electron-matter interactions and their applications krumeich@inorg.chem.ethz.ch Frank Krumeich www.microscopy.ethz.ch How do crystals look like? Shape? SEM images of zeolithes (left) and metal organic frameworks (MOF, right) Examples: electron microscopy for catalyst characterization 1

How does the Structure of catalysts look like? Size of the particles? HRTEM image of an Ag particle on ZnO BF-STEM image of Pt particles on CeO 2 Examples: electron microscopy for catalyst characterization Pd and Pt supported on alumina: Size of the particles? Alloy or separated? STEM + EDXS: Point Analyses Al C O Pt Pd Cu Pt Pt C Al HAADF-STEM image O Pt Pd Cu Pt Pt Examples: electron microscopy for catalyst characterization 2

Electron Microscopy Methods (Selection) STEM Electron diffraction HRTEM X-ray spectroscopy SEM Discovery of the Electron 1897 J. J. Thomson: Experiments with cathode rays hypotheses: (i) Cathode rays are charged particles ("corpuscles"). (ii) Corpuscles are constituents of the atom. Joseph John Thomson (1856-1940) Nobel prize 1906 Electron 3

Properties of Electrons Dualism wave-particle De Broglie (1924): = h/p = h/mv Accelerated electrons: E = ev = m 0 v 2 /2 : wavelength; h: Planck constant; p: momentum V: acceleration voltage e / m 0 / v: charge / rest mass / velocity of the electron p = m 0 v = (2m 0 ev) 1/2 = h / (2m 0 ev) 1/2 ( 1.22 / V 1/2 nm) Relativistic effects: = h / [2m 0 ev (1 + ev/2m 0 c 2 )] 1/2 Electron Properties of Electrons V acc kv Nonrel. pm Rel. pm Mass x m 0 V nonrel x 10 8 m/s v rel x 10 8 m/s 100 3.86 3.70 1.20 1.88 1.64 200 2.73 2.51 1.39 2.65 2.09 300 2.23 1.97 1.59 3.25 2.33 400 1.93 1.64 1.78 3.75 2.48 1000 1.22 0.87 2.96 5.93 2.82 Rest mass of an electron: m 0 = 9.109 x 10-31 kg Speed of light in vaccuum: c = 2.998 x 10 8 m/s Electron 4

Interactions of Electrons with Matter SEM EDXS (EDX, EDS), WDS, EPMA AES SEM elastic scattering: TEM, HRTEM, STEM, SAED, CBED Electron-matter interactions inelastic scattering: EELS, ESI Interactions of Electrons with Matter Elastic interactions Incident electrons with energy E 0 pass through a sample or are scattered without energy transfer. E el = E 0 Inelastic interaction Transfer of energy from the electron to the matter, causing various effects, e.g., ionization. E el < E 0 Electron-matter interactions 5

Elastic Electrons-Matter Interactions Elastic scattering of a incoming coherent electron wave: Scattering of electrons by individual atoms scattered waves are incoherent Scattering of electrons by a collective of atoms (crystal) scattered waves are coherent Coherent waves have the same wavelength and are in phase with each other period: time for one complete cycle for an oscillation frequency: periods per unit time (measured in Hertz) Incoherent waves Elastic interactions Elastic Scattering of Electrons by an Atom F = Q 1 Q 2 / 4πε 0 r 2 ε 0 : dielectric constant Weak Coulomb interaction within the electron cloud low-angle scattering Elastic interactions Strong Coulomb interaction close to the nucleus The high-angle interaction scattering or of even backscattering Rutherford regime atomic-number (Z) contrast electrons with matter is strong! Much stronger than that of X-rays dσe Z d 2 6

Electron Scattering Interaction cross section σ = probability that a scattering event will occur σ total = σ elastic + σ inelastic Differential cross section dσ/dω = angular distribution of scattering often: measured quantity Elastic interactions Elastic Scattering of Electrons Cu Z=29 Monte-Carlo simulations of paths of scattered electrons Elastic interactions Amount of high-angle scattering or even backscattering of incident electrons increases with increasing atomic number (e. g., scattering cross section Au >> Cu ) decreases with increasing electron energy Au Z=79 As a general effect of scattering events, the incoming electron beam is weakened and broadened brightness of the direct beam depends on the material contrast between different materials 7

Contrast Formation Elastic interactions A strong decrease of incoming electron beam intensity occurs if many atoms scatter, i.e. in thick areas if heavy atoms scatter Mass-Thickness Contrast Dark contrast in BF-TEM images appears if many atoms scatter (thick areas darker than thin areas) if heavy atoms scatter (areas with heavy atoms darker than such with light atoms) Elastic interactions 8

Bright Field TEM Images thin C thick Amorphous SiO 2 on C foil Mainly thickness contrast Au particles on TiO 2 Mainly mass contrast Elastic interactions Elastic Scattering of Electrons by an Atom 50 nm Applications HAADF-STEM of Au particles on titania (Z contrast imaging) Elastic interactions dσe d Z 2 SEM of Pt particles on alumina: imaging with secondary electrons (left) and back-scattered electron (right) 9

Image of quartz crystals Crystals A crystal is characterized by an array of atoms that is periodic in three dimensions. Its smallest repeat unit is the unit cell with specific lattice parameters, atomic positions and symmetry. Crystal structure of quartz SiO 2 Unit cell outlined; Si blue; O red Crystallographic data of quartz symmetry: trigonal; space group: P3 2 21 lattice parameters: a = b = 4.892, c = 5.388 Å = 90, 120 atomic positions: Si 0.468; 0.0; 0.667 O 0.413; 0.271; 0.784 Interference of Waves linear superposition waves in phase constructive interference waves not in phase destructive interference Elastic interactions 10

Coherent Scattering Scattering of electrons at atoms generation of secondary spherical wavelets Interference of secondary wavelets strong direct beam (0 th order) and diffracted beams at specific angles Elastic interactions Coherent Scattering Plane electron wave generates secondary wavelets from periodically ordered scattering centers (atoms in a crystal lattice). Constructive interference of these wavelets leads to scattered beams. Electron Diffraction 0 th order 11

Coherent Scattering 1 th order Plane electron wave generates secondary wavelets from periodically ordered scattering centers (atoms in a crystal lattice). Constructive interference of these wavelets leads to scattered beams. Electron Diffraction 0 th order Coherent Scattering 2 th order 1 th order Plane electron wave generates secondary wavelets from periodically ordered scattering centers (atoms in a crystal lattice). Constructive interference of these wavelets leads to scattered beams. Electron Diffraction 0 th order 12

Bragg Description of Diffraction Constructive interference between the waves reflected with an angle at atom planes of spacing d occurs if the path difference between the two waves is 2d sin. Bragg law: 2dsin = n Electron Diffraction Electron Diffraction Bragg law: 2dsin = n el = 0.00197 nm (1.97 pm) for 300 kv If d = 0.2 nm = 0.28 0 > > 1 Reflecting lattice planes are almost parallel to the direct beam Electron Diffraction 13

Electron Diffraction on a Lattice Crystal Because of small diffraction angles, the electron beam is parallel to the zone axis of the diffracting lattice planes Diffraction pattern Elastic interactions Electron diffraction pattern of a single crystal of Al along [111] Electron Diffraction: Examples SAED patterns of single micro-crystals of Ta 97 Te 60 (tetragonal; a = 2.76 nm, c = 2.06 nm) Electron Diffraction http://www.microscopy.ethz.ch/tem_ed_examples.htm 14

Diffraction of Polycrystalline Samples Crystals Reciprocal lattice FT Superposition of the diffractograms of many small crystals gives rise to a ring pattern (powder diffractogram). Electron Diffraction Electron Diffraction: Examples SAED patterns of polycrystalline platinum (left) and gold (right). Electron Diffraction http://www.microscopy.ethz.ch/tem_ed_examples.htm 15

Diffraction of Polycrystalline Samples Rotational averaging of intensity scattering angle vs. intensity (cf. XRD) Applications of electron diffraction - determination of Phases - sample crystallinity - lattice parameters - crystal symmetry Bragg or Diffraction Contrast Coherent scattering Diffracted beams lead to a decreased intensity of crystalline areas (crystalline areas appear darker than amorphous areas) Elastic interactions 16

BF-TEM Image Increasing thickness Elastic interactions ZrO 2 micro crystals; crystals orientated close to zone axis appear dark Mainly Bragg contrast Electron Diffraction + High Resolution Transmission Electron Microscopy Elastic interactions Nb 7 W 10 O 47 threefold superstructure of the tetragonal tungsten bronze type 17

Inelastic Electron-Matter Interactions Energy is transferred from the electron to the specimen causing: 1. Bremsstrahlung uncharacteristic X-rays 2. Inner-shell ionisation generation of characteristic X-rays and Auger Electrons 3. Secondary electrons low energy (< 50 ev) loosely bound electrons (e.g., in the conduction band) can easily be ejected (application: SEM) 4. Phonons lattice vibrations (heat) ( beam damage) 5. Plasmons oscillations of loosely bound electrons in metals 6. Cathodoluminescence photon generated by recombination of electron-hole pairs in semiconductors Bremsstrahlung (Braking Radiation) Deceleration of electrons in the Coulomb field of the nucleus Emission of X-ray carrying the surplus energy E (Bremsstrahlung, continuum X-rays) X-ray intensity theoretical Characteristic X-ray peaks Bremsstrahlung E/keV X rays of low energy are completely absorbed in the sample and the detector 18

Generation of Characteristic X-rays 1. Ionization 2. X-ray emission Generation of Characteristic X-rays 1 1. Ionization 2. X-ray emission 1 2 1 19

Electron Configuration of Ti: 1s 2 2s 2 2p 6 3s 2 3p 6 4s 2 3d 2 energy N 4s 4p 3d M 3s 3p L 2s 2p K 1s Electron Configuration of Ti: 1s 2 2s 2 2p 6 3s 2 3p 6 4s 2 3d 2 energy N 4s 4p 3d M 3s 3p L 2s 2p K K K 1s 20

Electron Configuration of Ti: 1s 2 2s 2 2p 6 3s 2 3p 6 4s 2 3d 2 energy N 4s 4p 3d M 3s L 3p L 2s 2p K 1s Energy-Dispersive X-ray Spectroscopy (EDXS) Intensity / counts Au-Particles on TiO 2 Ti L Energy / kev 21

Possible Transitions Between Electron Shells Causing Characteristic K, L, and M X-rays Generation of Auger Electrons 1. Ionization 2. Electron hole is filled by L 1 electron that transfers surplus energy to another electron (here: L 3 ) 3. Auger electron emission Energy of Auger electron is low (ca. 100 to some 1000 ev). Strong absorption in sample Surface technique 22

Cathodoluminescence 1. Incoming electron interacts with electrons in the valence band (VB) 2. Electron is promoted from the VB to the conduction band (CB), generating electron-hole pairs 3. Recombination: hole in the VB is filled by an electron from the CB with emission of surplus energy as photon (CL) incoming electron 1 2 3 CB band gap VB e - h energy loss electron Important in semiconductor research: determination of band gaps Inelastic Scattering of Electrons Energy is transferred from the electron to the specimen causing: 1. Inner-shell ionization 2. Bremsstrahlung 3. Secondary electrons 4. Phonons 5. Plasmons 6. Cathodoluminescence Because of energy transfer to the specimen, the electron has a diminished kinetic energy E < E 0 after any inelastic scattering event. 23

Electron Energy Loss Spectroscopy Generation of Characteristic X-rays 1. Ionization 2. X-ray emission 24

Threshold Energy in EELS Threshold (or binding) energy: Minimum energy necessary to transfer an electron from its initial to the lowest unoccupied state This excited electron can carry any amount of excess energy (kinetic energy of ejected electrons) signal is extended above the threshold energy building up an edge EELS: Observable Ionization Edges Edge intensity drops with increasing energy loss EELS is limited to the appr. energy range 50-2000 ev Almost all elements have observable edges in this energy range: K edges: Li-Si L edges: Mg-Sr M edges: Se-Os N edges: Os-U 25

Electron Energy Loss Spectroscopy Electron Energy Loss Spectroscopy Relationship between the EEL Spectrum and a Core-Loss Exication within the Band Structure N(E) Filled states E F Near edge fine structure Empty states E Extended fine structure ELNES: Electron Energy Loss Near Edge Structure - reflects local density of unoccupied states (DOS) - corresponds to XANES in X-ray absorption spectroscopy EXELFS: Extended Energy Loss Fine Structure - information on local atomic arrangements - corresponds to EXAFS in X-ray absorption spectroscopy 26

Observation of Fine Structures in EELS * sp 2 sp 3 Characteristics of the C_K edge depend on hybridization Characteristics of the Cu_L 2,3 edges depend on oxidation state of Cu Interactions of Electrons with Matter SEM EXDS (EDX, EDS), WDS, EPMA AES SEM elastic scattering: TEM, HRTEM, STEM, SAED, CBED Electron-matter interactions inelastic scattering: EELS, ESI 27

Interaction Volume in Compact Samples Secondary electrons (SE) Low energy < 50 ev (inelastic interactions) Information about topology and morphology Back-scattered electrons (BSE) High energy E 0 (mostly elastic interactions) Morphology and chemical information Electron-matter interactions Dependence of Interaction Volume on Electron Energy 10 kev Penetration depth increases with increasing electron energy 20 kev 30 kev www.matter.org.uk/tem/electron_scattering.htm Electron-matter interactions Monte-Carlo simulations of electron trajectories in Fe 28

Radiolysis Beam Damage Ionization breaking of chemical bonds (e.g., in polymers) Knock-on damage Displacement of atoms in crystal lattice point defects (metals) Phonon generation Charging Specimen heating sample drift, structure destruction, melting Electron-matter interactions Summary Elastic interactions no energy transfer coherent scattering on crystals (diffraction) incoherent scattering on atoms energy is transferred from the incident electron to the sample X-rays secondary electrons (low energy SE, Auger electrons) phonons, plasmons, cathodoluminescence Electron-matter interactions 29