ME 237: Mechanics of Microsystems : Lecture. Modeling Squeeze Film Effects in MEMS

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ME 237: Mechanics of Microsystems : Lecture Squeeze Film Effects in MEMS Anish Roychowdhury Adviser : Prof Rudra Pratap Department of Mechanical Engineering and Centre for Nano Science and Engineering Indian Institute of Science, Bangalore, India

Outline : What is Squeeze Film and when does it occur? : Why is it important to study? Various MEMS devices showing Squeeze Film Effects Modelling : The Reynolds Equation The Eigen expansion Method Understanding the Results

: What is Squeeze Film Effect Schematic of Squeeze flow* Stiffness effect Damping effect F= PdA F= F exp(i (ωt φ)) Fs= F cos(φ) Fd= F sin(φ) Ksq=Fs/δh Csq=Fs/δhω a * Animation courtesy : Siddartha Patra, ME 2011, Mechanical Engineering, IISC Bangalore Resonator*** 3

: Squeeze Flow Side view Air gap Side view Air gap Fluid flow Side view Air gap Top view Top view Top view Fluid flow Fluid flow

: Relevant Conditions for Squeeze Film Effects Continuum Flow regime Vibration normal to a fixed substrate* Si (High Q) based MEMS devices Knudsen Number (Kn) Flow Regime Division λ = mean free path h = characteristic flow length L L,W >> h Geometry aspect h Type of motion Materials aspect * Animation ( MEMS Tuning Gyro )Courtesy JP Reddy, CeNSE, IISC 5

: Importance of squeeze film Gap to length ratio* Change in effective stiffness and Damping * X/δst * ME Thesis, S Patra, Indian Institute of Science, Bangalore, 2011 6

Squeeze Film in MEMS devices Accelerometer [1] Cantilever resonator [3] Varactor [5] RF Switch [7] CMUT [4] Yaw Rate sensor [8] Gyroscope [2] Torsion Mirror [6] 7

Getting to the Reynolds Equation Under continuum hypothesis fluid flow is modelled using the Navier Stoke s Equation 1 Assuming smalltemperat temperature re differences es within fluid μ can be treated as constant and we can rewrite (1) as 2 Assuming incompressible flow we get from equation (2) 3 8

Contd. Key equations Continuity Expanded Navier Navier Stokes Stokes Isothermal 9

Contd. Navier Stokes Neglect Body forces Neglect fluid inertia Thin Film thickness Small am.p of Osc. Fully Developed flow 10

Contd. Thus we arrive at the 2D Reduced NS Eqn. No Slip BC a) SFD Flow normal motion b) plate Top view * Velocities Flow rates * Source [2] 11

Contd. Using Velocities & With Continuity Eqn Flow rates h/2 h /2 & Isothermal Flow 12

The Reynolds Equation Nonlinear compressible Reynolds Equation Linearized compressible Reynolds Equation Linearized Non dimensional compressible Reynolds Equation Squeeze Number 13

The Squeeze number Rarefaction Ambient pressure Length to air gap ratio Oscillation frequency 14

Analytical Techniques for solution of Reynolds Equation Analytical techniques Variable Separation Green s function Acoustic Impedance Reduction of Dimension Bessels Function Mixed Methods Fourier Transform Equivalent Circuit Models Perturbation Methods 9 Analytical Methods 8 7 6 5 4 3 2 1 0 Based on 28 papers surveyed

Problem deifinition : Variable flow boundary: All sides clamped plate Structural BC all sides clamped Rectangular plate all sides open OOOO OOOC Geometry flow B.C. s OOCC OCOC OCCC CCCC CC 16

Separation of Variables : Eigen Expansion We are solving linearized Reynolds eqn. (1) Consider homogeneous form of (1) Using eigen expansion and separation of variables we assume Where (2) (3) (4) Thus from (2), (3), and 4 we get (5) Now assume the following (6) (7) 17

Thus we get Assuming harmonic source term Thus choosing Solution: Contd. (8) (9) (10) Using (8),(9),(10) and Reynolds Eqn (11) Multiplying both sides of (11) by (12) And using orthogonality (13) 18

Solution: Contd. We get (14) Now the first mode shape of the plate can be approximated as Kinematic BCs are satisfied (15) Thus the solution is given by (8) Where Is an admissible eigen function Open Closed Boundary Boundary 19

Kinematic BC s Mode shape Satisfies No deflection at fixed edges Maximum deflection at center 20

Admissible Eigen Function s: OOOO From separation of variables for P Assuming We get Separating variables we get the x and y equations Applying zero pressure BCs, we get 21

Solution for the All sides open case : OOOO All sides open Zero pressure B.C. s C s Admissible eigen function And using with in with 22

Solution for the All sides open case : OOOO Non dimensional pressure Total Force 23

Results : Stiffness and Damping Stiffness Damping 24

Results : Stiffness and Damping Relative comparison among flow BCs Stiffness Ratios Damping Ratios 25

Results : Pressure and Phase variation: OOCC Pressure variation : a) σ = 0.1, b) σ = 1000 OOCC Phase variation : a) σ = 0.1, b) σ = 1000 26

Pressure Profiles varying with Squeeze number OOOO OCOC 27

We have seen when and where squeeze film effects occur. We discussed modeling aspects and solution methods. Variation of squeeze film parameters with squeeze number was shown. Effect of flow boundary conditions were discussed. Pressure and phase variation with squeeze number were shown. Other aspects in squeeze film modeling Complexities Rarefaction Coupled Domains Structural Commercial Software for Squeeze Film Compressibility Fluid Inertia Electrostatic ANSYS Perforations COMSOL Non trivial BC s NISA Complex geometries 28

References 1. Khan S, Thejas and Bhat N (2009) Design and characterization of a micromachined accelerometer with mechanical amplifier for intrusion detection. 3rd National ISSS conference on MEMS, Smart Structures and Materials, Kolkata, India (Oct. 14-16, 2009). 2. Patil N (2006) Design and analysis of MEMS angular rate sensors. Master's Thesis: Indian Institute of Science, Bangalore, India. 3. Pandey AK, Venkatesh KP and Pratap R (2009) Effect of metal coating and residual stress on the resonant frequency of MEMS resonators. Sãdhãna 34(4):651-661 4. Ahmad B and Pratap R (2011) Analytical evaluation of squeeze film forces in a CMUT with sealed air filled cavity. IEEE Sensors s 11(10): 2426-2431. 5. Venkatesh C, Bhat N, Vinoy K J, et al.(2012) Microelectromechanical torsional varactors with low parasitic capacitances and high dynamic range. J. Micro/Nanolith. MEMS MOEMS 11(1):013006. 6. Pandey A (2007) Analytical, l Numerical, and Experimental Studies of Fluid Damping in MEMS Devices. PhD Thesis: Indian Institute of Science, Bangalore, India. 7. Shekhar S, Vinoy K J and Ananthasuresh G K (2011) Switching and release time analysis of electrostatically actuated capacitive RF MEMS switches. Sensors & Transducers Journal 130(7):77-90. 8. Venkatesh K P, Patil N, Pandey A K, et al. (2009) Design and characterization of in-plane MEMS yaw rate sensor. Sãdhãna 34(4):633-634. 29

Thank You! Acknowledgements Funding Agency UGC Grant SAP II Siddarth Patra : ME IISC 2011, Dept, Of Mechanical Engineering Dr Ashoke Pandey: Faculty In Dept of mechanical Engineering, IIT Hyderabad 30

Help Slides 31

Losses in MEMS devices Losses inmems Devices Internal External Bulk Losses Support Losses Fluid Flow Losses Surface Losses Surface Roughness Loss Support due to structure internal friction absorbing from vibration Surface treatment t t damages Total Quality factor for a system is given as : Squeeze Film Damping Drag 32

Definitions and Basic Terminology Number Density of molecules (n) P = Pressure K b ( Boltzmann Const) = 1.3805 x 10 23 T = Temperature Mean Free Path λ Average distance travelled by a molecule l between two successive collisions Under ambient conditions Under standard conditions T = 300 K P = 1.013 x 10 5 Pa (1 atm ) d 3.7 x 10 10 m T = 273.15 K n = 2.41x 10 20 x P m 3 n = 2.69x 10 25 x m 3 λ = 0.0068/P and for P = 1.013 x 10 5 Pa (1 atm ) λ = 67 nm Molecular diameter(d) Under STP using Hard sphere model d 3.7 x 10 10 m Characteristic flow length (h) Characteristic length of the flow channel in case of Squeeze film it is the gap thickness

Effective Viscosity* * MS Thesis, J Young, Massachusetts Institute of Technology, 1998 34

Vector Diagram Force and Displacement* F= PdA F= F exp(i (ωt φ)) Fs= F cos(φ) Fd= F sin(φ) Ksq=Fs/δh Csq=Fs/δh/ ω * Slide courtesy S Patra 35

Discussion Analytical We have For low σ Is negligible resulting in differential pressure to be small and out of phase 90 with displacement For high σ Is dominant term and pressure profile approximately matches displacement profile and pressure profile is +- 180º out of phase with displacement 36