Towards Automatic Nanomanipulation at the Atomic Scale

Similar documents
Low Temperature (LT), Ultra High Vacuum (UHV LT) Scanning Probe Microscopy (SPM) Laboratory

Scanning Probe Microscopy. Amanda MacMillan, Emmy Gebremichael, & John Shamblin Chem 243: Instrumental Analysis Dr. Robert Corn March 10, 2010

Control of Dynamics of SPM Probes for Non-destructive Defectoscopy

Lecture 4 Scanning Probe Microscopy (SPM)

Introduction to the Scanning Tunneling Microscope

REPORT ON SCANNING TUNNELING MICROSCOPE. Course ME-228 Materials and Structural Property Correlations Course Instructor Prof. M. S.

Design of an Information Based Manufacturing framework for Nano Manipulation

Nanometrology and its role in the development of nanotechnology

Application Note 12: Fully Automated Compound Screening and Verification Using Spinsolve and MestReNova

Alpha spectrometry systems. A users perspective. George Ham. 26 th May Date Month Year

Crystalline Surfaces for Laser Metrology

Institute for Functional Imaging of Materials (IFIM)

QuantumMCA QuantumNaI QuantumGe QuantumGold

Low Temperature Physics Measurement Systems

Molecular Dynamics on the Angstrom Scale

Scanning Probe Microscopy

Introducing the Morphologi G3 ID The future of particle characterization

GIS Software. Evolution of GIS Software

INTRODUCTION TO SCA\ \I\G TUNNELING MICROSCOPY

Scanning Tunneling Microscopy and its Application

FRAM V5.2. Plutonium and Uranium Isotopic Analysis Software

The most versatile AFM platform for your nanoscale microscopy needs

Enabling ENVI. ArcGIS for Server

PHI 5000 Versaprobe-II Focus X-ray Photo-electron Spectroscopy

Introduction to Portal for ArcGIS. Hao LEE November 12, 2015

Characterization of MEMS Devices

Model 2300XP PSL & Process-Particle Wafer Deposition System

WeatherHawk Weather Station Protocol

Portal for ArcGIS: An Introduction. Catherine Hynes and Derek Law

Chapter 10. Nanometrology. Oxford University Press All rights reserved.

Among various open-source GIS programs, QGIS can be the best suitable option which can be used across partners for reasons outlined below.

Basic Laboratory. Materials Science and Engineering. Atomic Force Microscopy (AFM)

Sensors and Metrology. Outline

Software BioScout-Calibrator June 2013

Leveraging Web GIS: An Introduction to the ArcGIS portal

Introduction to Scanning Tunneling Microscopy

Contrôle de position ultra-rapide d un objet nanométrique

FSA TM Multi-bit Digital Processors

Introduction to Portal for ArcGIS

Supporting Information

Scanning Tunneling Microscopy

Orbital Insight Energy: Oil Storage v5.1 Methodologies & Data Documentation

Scanning Tunneling Microscopy

Low Vibration Cryogenic Equipment

CHAPTER 3 RESEARCH METHODOLOGY

Defining quality standards for the analysis of solid samples

ICP-MS. High Resolution ICP-MS.

Perseverance. Experimentation. Knowledge.

Proposed SPICE model for core loss

Pascal ET is an handheld multifunction calibrator for the measurement and simulation of the following parameters: - pressure

Compact Titration. Compact Titrator G20. One Click Titration Simple & Dependable

Ákos Tarcsay CHEMAXON SOLUTIONS

Scanning Tunneling Microscopy and Single Molecule Conductance

The next generation in weather radar software.

Whole Tablet Measurements Using the Frontier Tablet Autosampler System

Chapter 103 Spin-Polarized Scanning Tunneling Microscopy

Scanning Tunneling Microscopy

Contents. What is AFM? History Basic principles and devices Operating modes Application areas Advantages and disadvantages

THE MEASUREMENT OF SOLAR ULTRAVIOLET SPECTRAL IRRADIANCE PROBLEMS & SOLUTIONS

Automation of Routine Microplate Pipetting and Dispensing

Program Operacyjny Kapitał Ludzki SCANNING PROBE TECHNIQUES - INTRODUCTION

NIS: what can it be used for?

Evaluating Physical, Chemical, and Biological Impacts from the Savannah Harbor Expansion Project Cooperative Agreement Number W912HZ

Agilent MassHunter Quantitative Data Analysis

Scanning Tunneling Microscopy Transmission Electron Microscopy

ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPE STM GPI-300

Imago: open-source toolkit for 2D chemical structure image recognition

Nanoscale work function measurements by Scanning Tunneling Spectroscopy

= 6 (1/ nm) So what is probability of finding electron tunneled into a barrier 3 ev high?

How to Pick a GIS. GIS Software Chapter 8 in Longley, Goodchild, Maguire, and Rhind,, 2001

Santosh Devasia Mechanical Eng. Dept., UW

SOFTWARE FOR WEATHER DATABASES MANAGEMENT AND CONSTRUCTION OF REFERENCE YEARS

Semester s projects at UTT in Autumn 2011

STM: Scanning Tunneling Microscope

Formation of Halogen Bond-Based 2D Supramolecular Assemblies by Electric Manipulation

Using FLOTHERM and the Command Center to Exploit the Principle of Superposition

Standardized Verification System for Long-Range Forecasts. Simon Mason

MEMS Metrology. Prof. Tianhong Cui ME 8254

Nanostructure. Materials Growth Characterization Fabrication. More see Waser, chapter 2

Sensors and Metrology

Computational Biology Course Descriptions 12-14

The New Legend. Eppendorf Reference 2 Pipette

Portal for ArcGIS: An Introduction

SOLID STATE PHYSICS PHY F341. Dr. Manjuladevi.V Associate Professor Department of Physics BITS Pilani

Neural Networks for Protein Structure Prediction Brown, JMB CS 466 Saurabh Sinha

DATA SOURCES AND INPUT IN GIS. By Prof. A. Balasubramanian Centre for Advanced Studies in Earth Science, University of Mysore, Mysore

Plasma Diagnostics Introduction to Langmuir Probes

Kestrel 4500 Pocket Weather Tracker

PHI. Scanning XPS Microprobe

Automated determination of the uniformity of dosage in quinine sulfate tablets using a fiber optics autosampler

TOXI-SCREENING KIT. Microbiotest for ultra-rapid on-site. toxicity screening of water STANDARD OPERATIONAL PROCEDURE

Whole Tablet Measurements Using the Spectrum One NTS Tablet Autosampler System

BECKMAN COULTER QbD1200 Total Organic Carbon Analyzer Critical Measurements Made Simple

Scanning Tunneling Microscopy

Multi-Sensor Fusion for Localization of a Mobile Robot in Outdoor Environments

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]

4. GIS Implementation of the TxDOT Hydrology Extensions

Imaging Methods: Scanning Force Microscopy (SFM / AFM)

Thermo Scientific ICP-MS solutions for the semiconductor industry. Maximize wafer yields with ultralow elemental detection in chemicals and materials

Transcription:

Towards Automatic Nanomanipulation at the Atomic Scale Bernd Schütz Department of Computer Science University of Hamburg, Germany

Department of Computer Science Outline Introduction System Overview Workpackages 1. integration of nm into an STM-Measurementsystem 2. segmentation/labelling of atoms and molecules 3. navigation/calibration 4. manipulation skills 5. planning/simulation Outlook Towards Automatic Nanomanipulation at the Atomic Scale 1

Department of Computer Science Introduction Definition: Manipulation of nanometer size objects with a nanometer size tool-tip with (sub)nanometer precision. Application: manual (scan manipulate scan) cycle Motivation: Nanomanipulation will soon be a standard preparation technique for experiments in physical and biological science. automation of nanomanipulation mandatory Towards Automatic Nanomanipulation at the Atomic Scale 2

Department of Computer Science Introduction Tools Atomic Force Microscope (AFM) manipulation of nanoparticles push, pull, pick and place, bend, twist etc. Scanning Tunneling Microscope (STM) manipulation at the atomic scale repulsive, attractive and vertical mode special tools integrated into a microscope Towards Automatic Nanomanipulation at the Atomic Scale 3

Department of Computer Science Introduction STM Manipulation Modes repulsive mode (pure pushing) constant current mode TIP F Adsorbat Surface attractive mode (pure pulling) constant current mode Adsorbat F TIP Surface vertical mode voltage pulse to attain atom to tip move in imaging mode voltage pulse to attain atom to surface F TIP Adsorbat TIP F TIP Surface Towards Automatic Nanomanipulation at the Atomic Scale 4

Department of Computer Science Introduction Advanced User Interfaces several user interfaces intended for manual nanomanipulation under development features: advanced graphics haptic device and reliable force feedback teleoperation contact models, modeling of nanoobjects drift compensation designed for ambiant AFM Towards Automatic Nanomanipulation at the Atomic Scale 5

Department of Computer Science Introduction Automation in Nanomanipulation manipulating nanoparticles with an AFM first steps towards automation CAD-models of nanostructures drift calculation manipulation at atomic scale with a STM Autonomous Atom Assembler (AAA) tool for automatic positioning of tens of single atoms rule-based path planning no drift compensation Michigan State University National Institute of Standards and Technology Towards Automatic Nanomanipulation at the Atomic Scale 6

Department of Computer Science Where we are Introduction System Overview Workpackages 1. integration of nm into an STM-Measurementsystem 2. segmentation/labelling of atoms and molecules 3. navigation/calibration 4. manipulation skills 5. planning/simulation Outlook Towards Automatic Nanomanipulation at the Atomic Scale 7

Department of Computer Science System Overview Automatic Manipulation of Atomic Structures in Hamburg (AMASH) tool for automatic nanomanipulation at atomic scale manual manipulation and user intervention possible anytime target description via graphic editor or algorithmic description rule-based pathplanner open-end knowledge base Towards Automatic Nanomanipulation at the Atomic Scale 8

Department of Computer Science System Overview System Overview User Interface visualization control haptic Task Database Strategy Recognition Measurement Planning Image Computing Knowledge Base Skill Model Servo Controller Nanomanipulation Sensing Towards Automatic Nanomanipulation at the Atomic Scale 9

Department of Computer Science Workpackages 1. enhanced user interface & STM 2. segmentation/labelling of atoms and molecules 3. navigation/calibration 4. manipulation skills 5. planning/simulation Towards Automatic Nanomanipulation at the Atomic Scale 10

Department of Computer Science Workpackage 1 Enhanced User Interface & AMASH nanomanipulator from the University of North Carolinas (UNC) nanomanipulator-project: enhanced 3D visualization system haptic control system force-feedback-driven manual manipulation basic manipulation skills supports teleoperation full source code available to us Towards Automatic Nanomanipulation at the Atomic Scale 11

Department of Computer Science Workpackage 1 UNC nm & AMASH User Interface Visualization Control Haptic Task Database Strategy Recognition Measurement Planning Image Computing Knowledge Base Skill Model Servo Controller Nanomanipulation Sensing green darkgreen covered by the nanomanipulator covered by the microscope Towards Automatic Nanomanipulation at the Atomic Scale 12

Department of Computer Science Workpackage 1 Hamburg UHV LT-STM & AMASH Ultra High Vacuum (UHV) Low Temperature down to 6K Magnetic field 6T Contamination rate < 1 adsobate per 500x500nm per week Fe evaporator Towards Automatic Nanomanipulation at the Atomic Scale 13

Department of Computer Science Workpackage 1 Measurement System TOPS II measurement system from WA Technologie attached to: UHV LT-STM (1) specification see above UHV LT-AFM temperature down to 10 K atomic resolution UHV LT-STM (2) temperature down to 300 mk magnetic field 14 T full source code available Towards Automatic Nanomanipulation at the Atomic Scale 14

Department of Computer Science Workpackage 1 UNC nm & HH UHV LT-STM both user interfaces (primary and nm) should run in parallel at least two secondary user interfaces (nms) should be able to run in parallel the architecture of the UNC nm provides an excellent basis for AMASH Towards Automatic Nanomanipulation at the Atomic Scale 15

Department of Computer Science Workpackage 1 Integration of nm & STM Image generation Geometry Buttons Events User Interface Commands/ queries TCP/IP Host System Linux PC Transputer System ISA Expansioncard Store Tops T805 16M T805 2M Screen Analog Electronics & HV Amplifier Display nanomanipulator Positions Forces Phantom Samples/ responses TOPS System Body Head T805 1M T414 1M External Expansion DAC ADC DAC (XYZ)shift bias shift captured data (XYZ)scale & position bias scale & value XYZ sensor STM Tunneling current I + Sample Positoning device for X, Y and Z Y X Z only minor changes of the nm-software Towards Automatic Nanomanipulation at the Atomic Scale 16

Department of Computer Science Workpackage 1 Integration of nm & STM Image generation Geometry Buttons Events User Interface Commands/ queries TCP/IP Host System Linux PC Transputer System ISA Expansioncard Store Tops T805 16M T805 2M Screen Analog Electronics & HV Amplifier Display nanomanipulator Positions Forces Phantom Samples/ responses TOPS System Body Head T805 1M T414 1M External Expansion DAC ADC DAC (XYZ)shift bias shift captured data (XYZ)scale & position bias scale & value XYZ sensor STM Tunneling current I + Sample Positoning device for X, Y and Z Y X Z only minor changes of the nm-software the primary user interface of the microscope completely reprogrammed Towards Automatic Nanomanipulation at the Atomic Scale 16

Department of Computer Science Workpackage 1 Integration of nm & STM Image generation Geometry Buttons Events User Interface Commands/ queries TCP/IP Host System Linux PC Transputer System ISA Expansioncard Store Tops T805 16M T805 2M Screen Analog Electronics & HV Amplifier Display nanomanipulator Positions Forces Phantom Samples/ responses TOPS System Body Head T805 1M T414 1M External Expansion DAC ADC DAC (XYZ)shift bias shift captured data (XYZ)scale & position bias scale & value XYZ sensor STM Tunneling current I + Sample Positoning device for X, Y and Z Y X Z only minor changes of the nm-software the primary user interface of the microscope completely reprogrammed some changes of the low-level routines of the measurementsystem software also neccessary Towards Automatic Nanomanipulation at the Atomic Scale 16

Department of Computer Science Workpackage 1 Requirements for primary user Interface interface for communication with nm via TCP/IP API for controlling the instrument (more flexibility with other microscopes) API for IEEE 488 equipment for full control of instruments environment script language for rapid prototyping of low-level algorithms ability to run instrument in batch mode web-interface for monitoring readouts Towards Automatic Nanomanipulation at the Atomic Scale 17

Department of Computer Science Workpackage 1 Results of Integration of nm & UHV LT-STM full power of the nm-system is now available to the STM users manual manipulation is much more comfortable due to haptic device nm-user can access the microscope from all over the world (problem: network latency in manipulation mode) excellent platform for developing automation on the atomic scale Towards Automatic Nanomanipulation at the Atomic Scale 18

Department of Computer Science Workpackage 1 Tungsten surface as used for our tests with surface steps and some Fe adsorbat Atoms. The step highlighted by the red and blue line denotes a monolayer step. Towards Automatic Nanomanipulation at the Atomic Scale 19

Department of Computer Science Where we are Introduction System Overview Workpackages 1. integration of nm into an STM-Measurementsystem 2. segmentation/labelling of atoms and molecules 3. navigation/calibration 4. manipulation skills 5. planning/simulation Outlook Towards Automatic Nanomanipulation at the Atomic Scale 20

Department of Computer Science Workpackage 2 Segmentation/Labelling Robust automatic segmentation/labelling of atoms and molecules: Segmentation: several types of adsorbat atoms STM topographic data on-demand local spectroscopy structural and statistical methods Labelling: atoms: on/beneath the surface molecules: orientation, shape descriptors Towards Automatic Nanomanipulation at the Atomic Scale 21

Department of Computer Science Workpackage 3 Navigation/Calibration Navigation/Positioning based on results of image processing specialized software-controller off-line training Calibration consecutive update and recalibration of internal control Calibrated Synthetic Viewing (CSV) approach Drift compensation Kalman filtering restrictive local scan approach Towards Automatic Nanomanipulation at the Atomic Scale 22

Department of Computer Science Workpackage 4 Manipulation Skills Hierarchical sensor-based skill library: basic skills positioning tool tip moving tool tip pure pushing, pure pulling attain/reattain adsorbat advanced skills (composed of basic and acvanced skills) moving (attractive repulsive vertical) collision-free path control cleaning area Towards Automatic Nanomanipulation at the Atomic Scale 23

Department of Computer Science Workpackage 5 Planning/Simulation Planning rule-based planning knowledge base with a set of rules for every adsorbat error recovery for uncertainty Simulation validating the moves of a path validating the sequence of paths Control scheme adjustable autonomy Towards Automatic Nanomanipulation at the Atomic Scale 24

Department of Computer Science Outlook realized combination of nanomanipulator and UHV LT-STM not only an excellent platform for AMASH but also eases the usage of the STM step by step refinement towards automation a working system at every stage of development Towards Automatic Nanomanipulation at the Atomic Scale 25