Report on methods for accelerated ageing tests of SSL

Similar documents
solid state LED LED LED LED LED LED Light Emitting Diode: LED LED module Self - ballasted LED module Integral LED module

EMRP JRP SIB-05. NewKILO. Developing a practical means of disseminating the redefined kilogram (June 2012 May 2015) Stuart Davidson, NPL, UK

Measurement method for the proficiency testing program

NO LONGER ORDERABLE LUXEON S. Best punch and easy integration. For NEW designs consider these replacement products: ILLUMINATION

March 26, Title: TEMPO 21 Report. Prepared for: Sviazinvest, OJSC. Prepared by: Cree Durham Technology Center (DTC) Ticket Number: T

NIST Role in Supporting Solid State Lighting Initiative

Good practice guide containing experimental results and recommendations for the selection, preparation and calibration of the temperature sensors

Photometric Test Report. Keystone Technologies

Photometric Test Report. Keystone Technologies

Uncertainty Analysis for Heat-flux DSC Measurements

SignalSure 150. Mid power solution AUTOMOTIVE. SignalSure 150 is a compact, surface-mount, mid power LED signaling

Optical Measurement Guidelines for High-Power LEDs and Solid State Lighting Products

LED Retrofit. Fast-track proposal and feedback. W. Schlager Karlsruhe, 23-July-2015

Economic and Social Council

OSLON SQUARE White (CCT 2400K 5000K)

UVTOP. Specification S-T39B-B (Formerly UVTOP250TO39BL) RoHS. Drawn Approval Approval

TEST REPORT IES LM For Signlite Opto-electronics Co.,Ltd.

SI Broader Scope - Projects

Page 2 of 14 Report No.: Test sample... : Type of test object... : LED Downlight LED Downlight

Metrology Principles for Earth Observation: the NMI view. Emma Woolliams 17 th October 2017

LM Test Report. For. Beyond LED Technology. (Brand Name: Beyond LED) 2725 Mountain Industrial Blvd. Suite A-1 Tucker, GA 30084

NVLAP LAB CODE LM Test Report. For DONGGUAN THAILIGHT SEMICONDCTOR LIGHTING CO.,LTD

NVLAP LAB CODE LM Test Report. For DONGGUAN THAILIGHT SEMICONDCTOR LIGHTING CO.,LTD

Improvement Uncertainty of Total luminous Flux Measurements by Determining Some Correction Factors

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Economic and Social Council

LUXEON Z. Industry s smallest high power emitter for use in close-packed applications requiring an undomed solution ILLUMINATION

TEST REPORT For Company:

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Table of Contents. DS133 LUXEON TX Product Datasheet Lumileds Holding B.V. All rights reserved.

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Wet Locations Use 71400A 120 W PF V 2.9A 93% 144 pcs. Philips 130 LM/W 5000K Hrs. 5 Years. 24-1/4 Lbs 665*530*120 1 PCS

RoHS. Dimming: PWM/VR/0-10V QPL ID # PL21D5Q1B95E. Cat# W LED FlatPanel Slipfitter Mount. EPA Rating 2.

SnapLED 150. Reliability and robustness AUTOMOTIVE. SnapLED 150 cold clinching technology provides automotive exterior

LED light engines LED linear / area

LED Lumen Maintenance and Life Test System (LEDLM-80PL) Brochure. Global Office of Lisun Electronics Inc.

Report No.: HZ p. (Lumens) Stabilization Time CRI (K)

IES LM MEASUREMENT AND TEST REPORT. For. EiKO Global, LLC W 84th St Shawnee, KS Jeanne Han/Safety Manager

CIE The Measurement of Luminous Flux. XIN Hongzheng

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

EMRP JRP ENV54 METROLOGY FOR DECOMMISSIONING NUCLEAR FACILITIES (WP2, WP3)

PHOTOMETRIC TESTING & EVALUATION TO IES LM Sample Tested LN130-A30 LED HIGH BAY. Prepared for: Janie Chung

The official directions are written in Chinese, this English edition is for your reference only -1-

NVLAP LAB CODE LM Test Report. For AOK LED LIGHT COMPANY LIMITED. (Brand Name: AOK)

MODEL NAME : LLDMWW0-15K*0*A

LUXEON UV U1. Highest power density, superior efficiency, powered by leading Chip Scale Package (CSP) technology ILLUMINATION

LED light engines LED linear / area. Module QLE G3+ ADV Modules QLE ADVANCED

IES LM MEASUREMENT AND TEST REPORT For. Eiko Limited W. 84th Street,Shawnee, KS, USA. Test Model: LEDP-13WPAR30/NFL/830-DIM

Photometric Test Report

3mm Advanced Super Flux LEDs B84-YSC-A1T1U1DH-AM

Photometric Test Report

OLLA White Paper on the Necessity of Luminous Efficacy Measurement Standardisation of OLED Light Sources

Morris Products 53 Carey Road, Queensbury, NY 12804

PRACTICAL UNCERTAINTY BUDGETS FOR SPECTRAL MEASUREMENTS OF LEDS

IES LM MEASUREMENT AND TEST REPORT For

IES LM MEASUREMENT AND TEST REPORT For. IGT LIGHTING INC Lincoln St. Suite B, Riverside, CA Test Model: IGTFL

SHP-TS GroLux. SHP-TS 600W GroLux PRODUCT OVERVIEW

IES LM MEASUREMENT AND TEST REPORT For. ATG Electronics Corp Rancho Park Court Rancho Cucamonga, CA Test Model: HBUF-150W-50

IES LM MEASUREMENT AND TEST REPORT For. ATG Electronics Corp 9020 Rancho Park Court Rancho Cucamonga, CA Test Model: HBUF-100W-50

Technical Notes. Introduction. PCB (printed circuit board) Design. Issue 1 January 2010

IES LM MEASUREMENT AND TEST REPORT. For. EiKO Global, LLC W. 84th St., Shawnee, KS Jeanne Han/Safety Manager

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Photometric Test Report

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

Product Description. MASTERColour CDM-R

Calibration Due Date Chroma Programmable AC Source 61604

3mm Photodiode PD204-6B

LM Test Report. for. Forest Lighting Corporate. LED Tube. Model: FL-T8U BN

LEDs in ERCO luminaires

TEST REPORT. Test Method : See the attached sheets.

LAMP UTW/S400-X9/T10(WS)

Optimal light performance for short or long operation per switch-on Multiple light color choice Good color rendering (CRI > 80)

LED modules LED linear / area

5mm Phototransistor T-1 3/4 PT334-6C

Revision of GRE/2017/05

OIML D 28 DOCUMENT. Edition 2004 (E) ORGANISATION INTERNATIONALE INTERNATIONAL ORGANIZATION. Conventional value of the result of weighing in air

8165 E Kaiser Blvd. Anaheim, CA p f NVLAP LAB CODE MANUFACTURE NAME 8165 E. KAISER BLVD, ANAHEIM, CA 92808

Test report of IES LM Approved Method: Electrical and Photometric

HONOURTEK Delux Array Series HRA0303 Preliminary

Tunable White LED compact

LedEngin, Inc. High Luminous Efficacy White Power LedFlex Emitter LZ4-00CW15. Key Features. Typical Applications. Description

LED Entryway Light RoHS

Best color perception in spotlighting and downlighting

IES LM TEST REPORT For Shenzhen sunper opto co., ltd

Long-Term Photometric Performance of Airfield Luminaires

NVLAP LAB CODE LM Test Report. For REMPHOS TECHNOLOGIES LLC. (Brand Name: ) 90 Holten St, Danvers, MA 01923,USA.

Cree Racine Engineering Services Testing Laboratory (RESTL) Photometric Testing and Evaluation Report

TEST REPORT. Page 1 of 11

Checked X.CAO

1 General 1.1 Product Information Manufacturer Maxlite.Inc Page 2 of 17 Manufacturer Address 12 York Ave West Caldwell, NJ Brand Name Luminaire

PRODUCT DATA SHEET. Eagle Eye Outdoor LED Module 3000K. RoHS Compliant. CUSTOMER :. DATE : REV : Rev. 1.0.

Transcription:

Report on methods for accelerated ageing tests of SSL EMRP-ENG05-2.4.6 Version 1.2 D. Renoux Laboratoire National de Métrologie et d Essais, France A report of the EMRP Joint Research Project Metrology for Solid State Lightning www.m4ssl.npl.co.uk

Title : Report on methods for accelerated ageing tests of SSL Reference : EMRP-ENG05-246 Version : 1.2 Date : 02-04-2013 Dissemination level : PUBLIC Author(s) : D. Renoux Laboratoire National de Métrologie et d Essais, France Keywords : Accelerated ageing, thermal stress, life time projection, SSL, LED Abstract : This report presents the facilities and the methods used to conduct accelerated ageing tests on LED lamps using thermal stress at two elevated operation temperatures. A brief state-of-the-art is first given, and then the methodology and measurements performed are fully described. The main characteristics of the facilities and the main instruments performance are presented, including a comparison of optical measurements with MIKES which performed the natural ageing on lamps of the same types. The main results of the two accelerated tests are given to conclude on the investigated methods. Contact : http://www.m4ssl.npl.co.uk/contact About the EMRP The European Metrology Research Programme (EMRP) is a metrology-focused European programme of coordinated R&D that facilitates closer integration of national research programmes. The EMRP is jointly supported by the European Commission and the participating countries within the European Association of National Metrology Institutes (EURAMET e.v.). The EMRP will ensure collaboration between National Measurement Institutes, reducing duplication and increasing impact. The overall goal of the EMRP is to accelerate innovation and competitiveness in Europe whilst continuing to provide essential support to underpin the quality of our lives. See http://www.emrponline.eu for more information. About the EMRP JRP Metrology for Solid State Lighting In the EMRP Joint Research Project (JRP) Metrology for Solid State Lighting, the following partners cooperate to create a European infrastructure for the traceable measurement of solid state lighting: VSL (Coordinator), Aalto, CMI, CSIC, EJPD, INRIM, IPQ, LNE, MKEH, NPL, PTB, SMU, SP, Trescal, CCR, TU Ilmenau and Université Paul Sabatier. See http://www.m4ssl.npl.co.uk/ for more information. The research leading to these results has received funding from the European Union on the basis of Decision No 912/2009/EC. - ii -

SUMMARY This report presents the facilities and the methods used to conduct accelerated ageing tests on LED lamps using thermal stress at two elevated operation temperatures. The detailed results on the selected set of lamps are presented in the deliverable D242. A brief state-of-the-art of lifetime determination is given with the measurement standards dealing with lifetime determination and endurance tests applying to LED system or lamps. The rational for the method choice, within the framework of the task, is explained. The present framework of the related task is dedicated to junction temperature measurement by optical methods to derive a lifetime expectancy. The methodology implementation and the measurements performed are fully described. The main characteristics of the facilities and the main instruments performances are presented. A comparison of measurement results of optical and electrical characteristics has been performed on a set of lamps measured at MIKES and delivered to LNE to perform accelerated ageing on it. The goal was to compare the measurement chains at LNE and MIKES to correctly exploit the measurements results performed at LNE and MIKES. The main results of the two accelerated tests compared to those of natural ageing are given to conclude on the investigated methods. - III -

TABLE OF CONTENTS 1. INTRODUCTION... 3 2. BRIEF STATE-OF-THE-ART OF LIFETIME TEST AND REGULATION... 3 3. METHOD DESCRIPTION... 4 3.1. Method selection... 4 3.2. Method description... 6 4. METHOD IMPLEMENTATION... 6 4.1. Description of equipments... 6 4.2. Equipments performances... 7 4.2.1. Climatic chamber stability... 7 4.2.2. Power supply stability... 9 4.2.3. Flux measurement system performance... 9 5. MAIN RESULTS... 11 6. CONCLUSION AND PERSPECTIVES... 12 - IV -

LIST OF FIGURES Figure 1: LED PCB current wire extension... 5 Figure 2: Effect of ambient temperature on luminous flux... 5 Figure 3 : 50 cm integrating sphere and moving lamp support... 7 Figure 4: Long-term temperature stability at 45 C... 8 Figure 5: Long-term temperature stability at 60 C... 8 Figure 6: Long-term stability of the electrical power supply... 9 Figure 7: Graphs of SPD lamp A4 measured at LNE and MIKES... 10 Figure 8: Graphs of SPD lamp B6 measured at LNE and MIKES... 10 Figure 9: Graphs of SPD lamp C4 measured at LNE and MIKES... 10 Figure 10 : Flux deprecation with natural and accelerated ageing at 45 C... 11 Figure 11: Flux deprecation with natural and accelerated ageing at 60 C... 11 LIST OF TABLES Erreur! Aucune entrée de table d'illustration n'a été trouvée. - 1 -

LIST OF SYMBOLS X <Definition> LIST OF ABBREVIATIONS EMRP NMI JRP SSL European Metrology Research Programme National Measurement Institute Joint Research Project Solid State Lighting - 2 -

1. Introduction Due to their long lifetime, inherited from the robustness of the LED, SSLs are claimed to have superior lifetime, in term of 70% lumen maintenance, up to 50000 hours or 5,7 years. The European commission started to publish regulations for LED lamps with functionality parameters assessed over long-term period up to 6000 h. Such so long durations can not be easily measured in laboratories, slows down the introduction on the market and limits consumer s organisation assessment and then have aroused the interest of accelerated lifetime tests or projection methods of lifetime. The present report describes the methods investigated and apparatus used for accelerated ageing tests of SSLs in the framework of task 4 of WP2 devoted to Lifetime expectancy determination of SSLs. We will start, section 2, with a brief state-of-the-art of general lifetime tests for lighting products. Then section 3 will explain the choice of the thermal stress as the best method for this study with respect to the objective of the task. The method and procedure are described in the next section 4. The described accelerated test has been applied on two sets of 15 lamps, each one aged at two operating conditions at LNE while MIKES was conducting natural ageing test on another set of 20 lamps. Detailed results are given in the deliverable D242, we will just expose in section 5 global comparative results to draw conclusion and perspective about the investigated method. 2. Brief state-of-the-art of lifetime test and regulation The SSL as a novel technology motivated the revision of all the measurement standards including the lifetime test. Some standards are finalized for LEDs and LED modules [1][2] and other are preliminary drafts for GLS (General Lighting Service) [3]. Recently the European Commission published a regulation with regard to the eco-design requirements [4] applicable on 1 st March 2014 for directional lamps. This regulation includes lamp survival factor at 6000 h and lumen maintenance at 2000h and 600 h. 1. The IESNA LM-80 2008 provides the methods of the measurement of the lumen maintenance of LEDs and LED modules. 2. The IESNA LM-21 is a guideline to derive a Lumen maintenance Life projection from the data collected with the LM-80-2008. 3. The IEC/PAS 62612 is a pre-standard for self-ballasted LED-lamps for general lighting services (GLS). The LM-80 approved standard defines conditions to conduct an ageing test : number of samples, case temperature, airflow, ambient temperature and so on. The TM-21 is a guideline for data extrapolation with uncertainty estimation. Some rules are given like for a sample size of 20 lamps : the projected lamp life shall not be projected longer than 6 times the test. The IEC/PAS specifies the performance requirements for self-ballasted LED lamps with the tests methods. A section is related to the endurance test for built-in electronic ballast including : Thermal choc test, - 3 -

Thermal cycling, Supply voltage switching test, Accelerated operation test : ambient temperature test at 45 C and the test period is equal to 25% of the rated lamp life. From the literature we can learn that the main factor affecting the LED are the junction temperature and the current density [5] and that the power supply units and electronic drivers will probably last shorter than the LED with some common weakness like the electrolytic capacitors. To summarize ageing, accelerated or not, of LEDs or lamps are either using electrical stress or thermal stress : switching, cycling, shocking. There is no approved standard for accelerated LED-based lamps and model for lifetime projection. 3. Method description 3.1. Method selection The main approach of the task 2 relies upon the fact that the junction temperature of the LEDs in the SSL is the major influent parameter of the lifetime and also that the characteristics of the emitted spectra are linked to the junction temperature. The first challenge of this task is to determine a lifetime expectancy based on a junction temperature obtained only from the spectra and thus to provide a very useful and efficient optical method to estimate the lifetime of these new lighting devices. Several stages toward this goal have been achieved but barriers are left to determine the junction temperature from any lamp spectrum, some results are available and presented in the dedicated deliverable. It was proposed for task 2 to work on the lifetime expectancy of SSLs not on LEDs to avoid results not reflecting the real lamps behaviour along the time of operation, as the consumer experiences at home. Natural ageing and accelerated ageing tests are the second part of this task : primarily to provide data for the ageing model based on junction temperature and to assess stand-alone accelerated ageing tests. So a the link between the two parts of this task could be to age the LEDs inside the lamps and to compare with the model derived from junction temperature. We assume that electrical stress could affect more the electronics rather than the LEDs and is rather and endurance test. Therefore we deliberately avoid any electrical stress to age the lamp. There is no way to increase the current trough the electronics, many drivers have a current regulator, so an over voltage does not yield to an elevated current. More over the natural ageing conducted at MIKES on a set of 20 lamps did not apply any electrical or thermal stress : the lamps were just turned on at room temperature and measured each 2 months. LNE therefore proposed an accelerated ageing method based on high ambient temperatures operation to be consistent with the natural ageing test and to provide data for further deprecation model targeted in the first part of the task. To measure the effect o the electronic and to observe the variation of the current accounting for the flux variation we extended, on a set of separate lamps, the wire connected to the LED PCB out of the lamp cap. Two small holes of the wire diameter were drilled in the cap. The wires out of the lamp were inserted a current clamp. These lamps with minor modification were aged in the same conditions than the lamps. The - 4 -

flux emitted by the modified lamps were not measured because of the lack of optical stability and rigidity of the wire that could have an effect on the optical output. A coloured sheath can fade out and a white sheath can turn yellow. Figure 1: LED PCB current wire extension The temperature selection is a critical choice, prior to fix any temperature we observed the relative deprecation of the flux in a climatic chamber featured with a window. The lamps were measured through a white diffuser and trough the window in the same way for each temperature of the climatic chamber. The results are illustrated on the figure 2 below. 100 Luminance drop against ambiant temperature increase (from 22,5 C) 98 96 Relative luminance (%) 94 92 90 88 86 84 82 80 A2 B2 C2 D2 E2 Polynomial (B2) Polynomial (D2) Polynomial (C2) Polynomial (E2) Polynomial (A2) 0 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 Ambiant temperature increase from 22,5 C ( C) Figure 2: Effect of ambient temperature on luminous flux - 5 -

We also visually observed that all the lamps till 65 C are normally functioning with a flux gradually decreasing to less than 20% at 65 C. We conclude than we can chose temperatures in the range of 20-60 C with a limited risk of over-burning. We started the first experiment at a not too elevated temperature, i.e. 45 C, and given the very slow acceleration factor obtained, but well matching the behaviour of the natural ageing data, we pushed the second temperature to 60 C. 3.2. Method description Mikes provided 3 samples of 5 different reference of lamps and on extra set of 1 sample of each reference for electrical current monitoring. For the two temperatures the following steps have applied : 1. initial burning : 100 h first optical/electrical measurement at MIKES, 2. initial optical/electrical measurement at LNE on the 5x3 lamps, 3. 2 months of ageing in a climatic chamber : ambient temperature 45 C or 60 C, 4. periodic measurement stabilisation time 2 hours, 5. back to 3 until the lamps are aged by 6 months. No specific care was taken to handle the lamps and switch on/off the lamps. The lamp are turned on at room temperature in the climatic chamber, turn off in the climatic chamber at the elevated temperature and handled with clean wool gloves to avoid optical contamination and thermal effect. 4. Method implementation The method implementation uses basic instrumentation and tools available in a metrology institute and testing laboratory. 4.1. Description of equipments Aluminium rack for lamps and porcelain socket (lamp-holder), parallel electrical connection 230 VAC stabilized power supply and an auto-transformer for voltage adjustment, Climatic chamber (cooling / heating) (~1.5 m x 1.5 m x 2 m), Integrating sphere with a photometer and a cooled spectro-photometer, Specific electrical measurements unit : current clamp We used our standard equipment except for the integrating sphere. Our flux measurement system, integrating sphere based, does not enable to introduce warm lamp, then long stabilization time is need after - 6 -

the lamp is placed inside the sphere. To enable efficient and fast measurement during ageing we built a measurement system enabling to introduce the lamps initially warmed and stable (see figure3 bellow). The lamp with its socket and base is clamped to the moving rod terminated by a disk to close the sphere. The f1 of the system (combined sphere efficiency and photometer response) is equal to 1,6%. white sector to close the sphere wall disk white rod & sphere wall disk with lamp support Figure 3 : 50 cm integrating sphere and moving lamp support 4.2. Equipments performances 4.2.1. Climatic chamber stability A large heating/cooling climatic chamber has been chosen, small chamber with no cooling will not dissipate the 200W. The temperature has been measured with 4 thermocouples located inside the chamber and the graphs are presented below showing the uniformity and stability of the chamber : roughly +/- 1 C at 45 C and +/- 2 C at 60 C. - 7 -

D.RENOUX - Affaire M010274-T4 (extrait du 21/11 au 14/12/2011) Enceinte ec X (courbe ALMEMO) 50.00 49.00 48.00 47.00 46.00 45.00 44.00 43.00 42.00 41.00 40.00 39.00 38.00 37.00 36.00 35.00 34.00 33.00 32.00 31.00 30.00 21/11/11 0:00 22/11/11 0:00 23/11/11 0:00 24/11/11 0:00 25/11/11 0:00 26/11/11 0:00 Température 27/11/11 0:00 28/11/11 0:00 29/11/11 0:00 30/11/11 0:00 1/12/11 0:00 2/12/11 0:00 3/12/11 0:00 4/12/11 0:00 5/12/11 0:00 6/12/11 0:00 7/12/11 0:00 8/12/11 0:00 9/12/11 0:00 10/12/11 0:00 11/12/11 0:00 12/12/11 0:00 13/12/11 0:00 14/12/11 0:00 Temps Th 2 Th 3 Th 4 Th 5 Figure 4: Long-term temperature stability at 45 C D.RENOUX - Relevé de la température dans l'enceinte ec X - Extrait du 27/11 au 10122012 Courbe Almémo 65.00 60.00 55.00 50.00 45.00 40.00 35.00 30.00 25.00 20.00 15.00 10.00 27/11/12 4:48 27/11/12 16:48 28/11/12 4:48 28/11/12 16:48 29/11/12 4:48 29/11/12 16:48 Température 30/11/12 4:48 30/11/12 16:48 1/12/12 4:48 1/12/12 16:48 2/12/12 4:48 2/12/12 16:48 3/12/12 4:48 3/12/12 16:48 4/12/12 4:48 4/12/12 16:48 5/12/12 4:48 5/12/12 16:48 6/12/12 4:48 6/12/12 16:48 7/12/12 4:48 7/12/12 16:48 8/12/12 4:48 8/12/12 16:48 9/12/12 4:48 9/12/12 16:48 10/12/12 4:48 10/12/12 16:48 Temps M1 M2 M3 Figure 5: Long-term temperature stability at 60 C - 8 -

4.2.2. Power supply stability The voltage has been adjusted during the 2-month period, the maximum deviation was +/- 0,5 VAC. Stability of 230 VAC power supply 1 month : 1/12/2011 to 2/01/2012 Voltage deviation (%) 0,5 0,4 0,3 0,2 0,1 0-0,1-0,2-0,3-0,4-0,5 350 398 446 494 542 590 638 686 734 782 830 878 926 974 1022 1070 1118 Hours Figure 6: Long-term stability of the electrical power supply 4.2.3. Flux measurement system performance Calibration The calibration of the flux measurement system, before and after the first 6-month ageing period, exhibited a drift of 0,06%. The calibration of the flux measurement system, before and after the second 6-month ageing period, exhibited a drift of 1,60 %. Comparison MIKES-LNE MIKES uses a metrological optical flux system: a 2-metre integrating sphere equipped with a photometer and with a double monochromator/pmt. We checked at once that the two systems give the same flux measurement for the first batch of lamps. The agreement was quite good for the luminous flux, with absolute relative difference smaller than 2%, and for the spectral density of flux (see figures 6,7 and 8 hereafter). Reproducibility The reproducibility of the measurement was better than 0,6% except for one type of lamps (lamp D) : these lamps use blue LED and yellow phosphor and extra red LEDs which are very instable with respect to photometric data, radiometric data and ageing curves. - 9 -

Comparison of relative spectral density of flux Lamp A4 0,7 0,6 0,5 LNE Aalto University Relative level 0,4 0,3 0,2 0,1 0 380 430 480 530 580 630 680 730 780 Wavelength (nm) Figure 7: Graphs of SPD lamp A4 measured at LNE and MIKES 1,2 Comparison of relative spectral density of flux Lamp B6 1 LNE Aalto University Realative level 0,8 0,6 0,4 0,2 0 380 430 480 530 580 630 680 730 780 Wavelenght (nm) Figure 8: Graphs of SPD lamp B6 measured at LNE and MIKES 0,7 Comparison of relative spectral density of flux Lamp C4 0,6 LNE 0,5 Aalto University Realative level 0,4 0,3 0,2 0,1 0 380 430 480 530 580 630 680 730 780 Wavelenght (nm) Figure 9: Graphs of SPD lamp C4 measured at LNE and MIKES - 10 -

5. Main results The following two graphs (figures 10 and 11 below) show the comparison on average of natural ageing and accelerated ageing, with no calibration correction of the measurement system, with respectively an acceleration factor, as a gain on time scale, of 1.34 and 2.96. The detailed results are presented in the deliverable D242. Relative flux 1,0100 1,0000 0,9900 0,9800 0,9700 0,9600 0,9500 0,9400 0,9300 0,9200 Ageing graphes - average lamps A,B,C,E - natural/45 Natural Accelerated 0 2000 4000 6000 8000 10000 12000 Time (h) Figure 10 : Flux deprecation with natural and accelerated ageing at 45 C Relative flux Ageing graphes - lamps A,B,C,E - natural/60 1,0100 1,0000 0,9900 0,9800 0,9700 0,9600 0,9500 Natural 0,9400 0,9300 Accelerated 0,9200 0 2000 4000 6000 8000 10000 12000 14000 16000 Time (h) Figure 11: Flux deprecation with natural and accelerated ageing at 60 C - 11 -

6. Conclusion and perspectives An adapted measurement chain is proposed and validated for the purpose of the fast periodic measurement of luminous flux and spectral density of flux of lamps under ageing process. The integrating sphere was designed to measure in few days a large number of samples during the ageing period. The recommended samples size is generally 20 samples par lamp type [1][3] and was limited by the labour and consumables cost of the project. A basic accelerated ageing experiment is also proposed with minimal requirements on the climatic chamber (+/- 2 C) and the power supply stability (+/- 0.5 VAC) for end lighting product (lamp, luminaire). Despite the low sample size this preliminary work on ageing method demonstrates the potential of accelerated ageing by operation under elevated ambient temperature. The results on average (12 lamps) shows (1) a very good matching for the accelerated operation at 45 C but with a low acceleration factor of 1.34 and (2) a approximate matching at the accelerated operation at 60 C with a greater acceleration factor of 2.96 (see report D242). The matching is observed by comparison of the flux evolution curve for natural and the flux evolution curve for accelerated with a gain in time equal to the acceleration factor. The low samples sizes, 4 for natural and 3 for accelerated ageing, on 5 lamp types do not enable accurate computation of life time projection : inter-variability between lamps of the same type is too high to project the life time with a good accuracy. It is recommended that the lifetime projection shall not exceed 6 times the lumen maintenance test time [3], thus to project a 50000 h of lifetime a natural ageing of 8300 h (0.95 x year) is needed. The IEC standard in preparation [3] for self ballasted lamps requires to conduct an endurance test at 45 C for the 25% of the rated lifetime with a maximum of 6000h, the related compliance requirements are under consideration. This study shows that the average acceleration factor at this temperature is not so high (1.34). Then using the acceleration factor deduced from results of this test at the elevated temperature of 45 C and for the lamps we have tested we can project the flux evolution only on a 8000h ( ~1.34 x 6000h) period of time. References [1] IES-LM80-2008 - Measuring Lumen Maintenance of LED light source [2] IES TM-21 11 - Projecting Long Term Lumen Maintenance of LED Light Sources [3] IEC/PAS 62612 - Self-ballasted LED-lamps for General Lighting Services [4] Regulation n 1194/2012 of 12 December 2012 [5] Philips Lumileds : Evaluating the lifetime behaviour of LED system [6] Accelerated life test for high-power white LED based on spectro-radiometric measurement. Shen H. Pan J., Feng H. Zhejiang University, EVERFINE PHOTO-E-INFO CO, China. [7] Long-term performance of white LEDs and systems Nararajah N, Jayasinghe L, Freysssinier JP, Zhu Y, Lighting Research Center, NY - Usa - 12 -