IPC-TM-650 TEST METHODS MANUAL

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ASSOCIATION CONNECTING ELECTRONICS INDUSTRIES 3000 Lakeside Drive, Suite 309S Bannockburn, IL 60015-1249 TEST METHODS MANUAL Number Thermal Stress, Convection Reflow Assembly Simulation Originating Task Group Thermal Stress Test Methodology Subcommittee (D-32) 1 Scope and Purpose 1.1 Scope This method shall be used to simulate exposure to the thermal conditions of convection reflow assembly. 1.2 Purpose This method shall be used to replicate the thermodynamic effects of assembly on the test specimen. The use of this method in accordance with the requirements defined herein shall cover those effects that are the result of convection reflow assembly, rework or repair. 1.2.1 This method shall be used for qualification testing of an applicable test specimen. The evaluation of acceptability for qualification shall be in accordance with the requirements defined in 5.3. 1.2.2 This method may be used for lot acceptance. The evaluation for lot acceptability should be in accordance with the requirements defined in 5.3 or as agreed upon between user and supplier (AABUS). 2 Applicable Documents IPC-T-50 IPC-A-600 Terms and Definitions Acceptability of Printed Boards Test Methods Manual 2.1.1 Microsectioning 2.1.1.2 Microsectioning - Semi or Automatic Technique Microsection Equipment (Alternate) IPC-2221 Generic standard on Printed Board Design IPC-6012 Qualification and Performance Specification for Rigid Printed Boards IPC-6013 Qualification and Performance Specification for Flexible Printed Boards IPC-6016 Qualification and Performance Specification for High Density Interconnect (HDI) Layers or Boards 3 Test Specimen 3.1 Design/Construction Criteria 3.1.1 The test specimen shall be the A/B coupon in accordance with the requirements of IPC-2221. 3.1.2 The test specimen shall be constructed with both the largest plated-through holes (PTHs) and the smallest vias contained in the printed board (PB) it represents. 3.1.2.1 The test specimen shall contain the representative ground and power planes of the PB design. 3.1.2.2 The test specimen shall contain the representative/ applicable blind and/or buried vias of the PB design. 3.1.2.3 The test specimen shall contain a minimum of four (4) of the smallest vias that represent the via protection strategy incorporated in the PB design. 3.1.3 The test specimen shall allow for microsection evaluation of all the applicable, representative PTHs and vias defined in 3.1.2 after exposure to the conditions of this Test Method. 3.1.4 Deviations to the test specimen design/construction or use of an alternate test specimen such as the PB or a section of the PB shall be AABUS. 4 Apparatus 4.1 Drying Oven 4.1.1 The oven shall be capable of maintaining a uniform set temperature within the 105 to 125 C [221 to 257 F] range. 4.2 Thermal Excursion Simulator IPC-6018 Test Microwave End Product Board Inspection and 4.2.1 The system used to simulate the thermodynamic effects of assembly shall be convection reflow. Material in this Test Methods Manual was voluntarily established by Technical Committees of IPC. This material is advisory only and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement. Equipment referenced is for the convenience of the user and does not imply endorsement by IPC. Page 1 of 8

4.2.1.1 The system shall have adequate environmental controls to maintain the tolerance range and limits in accordance with the reflow profile depicted in either Figure 5-1 or Figure 5-2. 4.2.1.2 The system should accommodate verifiable calibration compliance and reflow profile generation. See note 6.1 for additional considerations. 4.2.1.3 The test specimen shall be handled and stored in a controlled environment to minimize moisture ingression. 4.2.2 Deviations to the equipment requirements and acceptability of the alternative methods shall be AABUS. 4.3 Microscope 4.3.1 The magnification used for defect recognition must be in agreement with the inspection requirements/capabilities defined in IPC-A-600 and the applicable performance specification (e.g., IPC-6012, IPC-6013, IPC-608, etc.). 5 Procedure 5.1 Conditioning 5.1.1 The test specimen shall be conditioned by drying in an oven to remove moisture for a minimum of six (6) hours at 105 to 125 C [221 to 257 F]. This conditioning process is mandatory if this method is used for qualification purposes. This method shall replicate the assembly process. The requirement for conditioning (bake/drying) shall be in accordance with product/process lot acceptance criteria. If conditioning of the PB is not part of the normal assembly process, and this method is being used for acceptance testing, then conditioning is not a requirement. 5.1.2 Test specimens that are thicker or more complex may require longer baking times to achieve acceptable moisture levels. Record the bake times and temperature if different than those stated in 5.1.1 (see 6.2). 5.1.3 Deviations to the conditioning requirements in 5.1.1 such as when used for acceptance criteria and/or any changes to the time and temperature shall be AABUS (see 6.3). 5.2 Reflow Profile 5.2.1 Reflow the test specimen in accordance with Table 5-1 (default) or Table 5-2 (low temperature profile). 5.2.2 The reflow profile shall be in accordance with either Figure 5-1 or Figure 5-2. Figure 5-1 represents the default reflow profile. Figure 5-2 represents the low temperature profile. The attachment of thermocouples to the sample test specimen shall be such that the reflow profile is calibrated to the surface temperature of the test specimen. 5.2.3 The test specimen shall be subjected to six (6) complete reflow cycles. 5.2.4 The cool down rate shall be in accordance with Table 5-1. The cool down is complete when the test specimen reaches 30 C. The test specimen shall achieve a thermal equilibrium of 30 C or less prior to starting the next reflow cycle. If the time it takes to achieve thermal equilibrium cannot be determined, then a five (5) minute dwell between reflow cycles shall be required. 5.2.5 Deviations to the reflow profile or number of cycles shall be AABUS. 5.3 Evaluation 5.3.1 Microsection After the test specimen has been conditioned and reflowed in accordance with the requirements of 5.1 and 5.2, microsection the test specimen in accordance with the requirements defined in, Method 2.1.1 or Method 2.1.1.2 and evaluate for compliance to the applicable performance specification. 5.3.2 Deviations to the stated requirements or additional requirements defined here shall be AABUS. Page 2 of 8

Table 5-1 260 C Reflow Profile Specifications (Default) Value Time (Seconds) Temperature ( C) Description t1 210 ± 15 Target preheat time t2 270 ± 10 Target peak reflow time t3 330 ± 15 Target cool-down start time t3 - t1 120 ± 30 Target time above T1 T1 230 Maximum preheat temperature T2 260 ± 5 Target reflow temperature Point Time (Seconds) Temperature ( C) Description A 0 30 B 100 230 C 195 230 D 255 265 Upper specification limit values E 285 265 F 345 230 G 550 30 H 30 30 I 157 93 J 225 230 K 260 255 Lower specification limit values L 280 255 M 315 230 N 383 30 Segment Slope ( C / second) Description A-B & I-J 2.0 Maximum preheat rate H-I 0.5 Minimum preheat rate F-G -1.0 Minimum cool-down rate M-N -3.0 Maximum cool-down rate Page 3 of 8

260 C Reflow Profile Specifications 300 t1 t2 t3 USL LSL Example 270 D E T2 Temperature ( C) 240 210 180 150 120 B C J K L M F T1 90 I 60 A G 30 0 H 60 120 180 240 300 360 N 420 480 540 600 Time (Seconds) IPC-2627-5-1 Figure 5-1 260 C Reflow Profile Chart (Default) Page 4 of 8

Table 5-2 230 C Reflow Profile Specifications (Low Temperature Profile) Value Time (Seconds) Temperature ( C) Description t1 186 ± 15 Target preheat time t2 239 ± 10 Target peak reflow time t3 292 ± 15 Target cool-down start time t3 - t1 106 ± 30 Target time above T1 T1 203 Maximum preheat temperature T2 230 ± 5 Target reflow temperature Point Time (Seconds) Temperature ( C) Description A 0 30 B 88 203 C 172 203 D 226 235 Upper specification limit values E 252 235 F 305 203 G 487 30 H 30 30 I 139 83 J 199 203 K 230 225 Lower specification limit values L 248 225 M 279 203 N 339 30 Segment Slope ( C / second) Description A-B & I-J 2.0 Maximum preheat rate H-I 0.5 Minimum preheat rate F-G -1.0 Minimum cool-down rate M-N -3.0 Maximum cool-down rate Page 5 of 8

230 C Reflow Profile Specifications 300 270 t1 t2 t3 USL LSL Example 240 D E T2 Temperature ( C) 210 180 150 120 B C J K L M F T1 90 60 I A G 30 0 H 60 120 180 240 300 N 360 420 480 540 600 Time (Seconds) IPC-2627-5-2 Figure 5-2 230 C Reflow Profile Chart (Low Temperature Profile) Page 6 of 8

6 Notes 6.1 The design of the convection reflow system should be flexible enough to facilitate the creation of the reflow profiles depicted in Figure 5-1 and Figure 5-2 for all the applicable test specimen designs encountered. Some issues to consider are as follows: Thermal mass compensation capability (energy vs. time) Environmental control capability (heating and cooling) Reproducibility of parameters Preheat Conveyor speed (if applicable) Heating ramp rate Cool down rate Programming capability The website provides a non-comprehensive listing of providers of convection reflow systems suitable for meeting the reflow profiles within this test method. 6.2 Deviations to the time and temperature specified in 5.1.1 should take into consideration maintaining the solderability of the surface finish being utilized. 6.3 As this method addresses assembly issues with PBs, it is recommended that the user of the PB establish a drawing note in the procurement documentation to provide the PB fabricator with guidance relative to the intended application of the PB. An example of such a drawing note is provided as follows: TEST COUPONS SHALL BE SUBJECTED X TIMES TO IPC- TM-650, METHOD REFLOW PROFILES PER TABLE 5-Y AFTER PRECONDITIONING FOR XX HOURS AT Z C. Profile memory Page 7 of 8

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