UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. EECS 130 Professor Ali Javey Fall 2006

Similar documents
UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Midterm I

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. EECS 130 Professor Ali Javey Fall 2006

Semiconductor Physics fall 2012 problems

Midterm I - Solutions

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Chenming Hu.

UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences

Semiconductor Physics fall 2012 problems

Semiconductor Devices and Circuits Fall Midterm Exam. Instructor: Dr. Dietmar Knipp, Professor of Electrical Engineering. Name: Mat. -Nr.

Semiconductor Physics Problems 2015

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Fall Exam 1

UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences

collisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Ali Javey. Spring 2009.

6.012 Electronic Devices and Circuits

EECS130 Integrated Circuit Devices

ECE 305 Exam 2: Spring 2017 March 10, 2017 Muhammad Alam Purdue University

Session 6: Solid State Physics. Diode

Quiz #1 Practice Problem Set

ECE 305 Exam 3: Spring 2015 March 6, 2015 Mark Lundstrom Purdue University

EECS130 Integrated Circuit Devices

1 Name: Student number: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND. Fall :00-11:00

ECEN 3320 Semiconductor Devices Final exam - Sunday December 17, 2000

Review of Semiconductor Fundamentals

Lecture 2. Semiconductor Physics. Sunday 4/10/2015 Semiconductor Physics 1-1

EE3901 A2001. Semiconductor Devices. Exam 1

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Ali Javey. Fall 2009.

Engineering 2000 Chapter 8 Semiconductors. ENG2000: R.I. Hornsey Semi: 1

n N D n p = n i p N A

EECS143 Microfabrication Technology

Spring Semester 2012 Final Exam

Lecture 1. OUTLINE Basic Semiconductor Physics. Reading: Chapter 2.1. Semiconductors Intrinsic (undoped) silicon Doping Carrier concentrations

ESE 372 / Spring 2013 / Lecture 5 Metal Oxide Semiconductor Field Effect Transistor

ECE 250 Electronic Devices 1. Electronic Device Modeling

A semiconductor is an almost insulating material, in which by contamination (doping) positive or negative charge carriers can be introduced.

EECS130 Integrated Circuit Devices

Sample Exam # 2 ECEN 3320 Fall 2013 Semiconductor Devices October 28, 2013 Due November 4, 2013

Solid State Electronics. Final Examination

CLASS 12th. Semiconductors

V BI. H. Föll: kiel.de/matwis/amat/semi_en/kap_2/backbone/r2_2_4.html. different electrochemical potentials (i.e.

Semiconductor Physics and Devices

Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes

Classification of Solids

For the following statements, mark ( ) for true statement and (X) for wrong statement and correct it.

UNIVERSITY OF CALIFORNIA. College of Engineering. Department of Electrical Engineering and Computer Sciences. Professor Ali Javey.

This is the 15th lecture of this course in which we begin a new topic, Excess Carriers. This topic will be covered in two lectures.

Semiconductor Junctions

The German University in Cairo. Faculty of Information Engineering & Technology Semiconductors (Elct 503) Electronics Department Fall 2014

Introduction to Engineering Materials ENGR2000. Dr.Coates

Section 12: Intro to Devices

Session 5: Solid State Physics. Charge Mobility Drift Diffusion Recombination-Generation

Electrical Characteristics of MOS Devices

ECE-305: Spring 2018 Exam 2 Review

ECE 340 Lecture 21 : P-N Junction II Class Outline:

Qualitative Picture of the Ideal Diode. G.R. Tynan UC San Diego MAE 119 Lecture Notes

Chapter 7. The pn Junction

Consider a uniformly doped PN junction, in which one region of the semiconductor is uniformly doped with acceptor atoms and the adjacent region is

Electro - Principles I

KATIHAL FİZİĞİ MNT-510

Semiconductors 1. Explain different types of semiconductors in detail with necessary bond diagrams. Intrinsic semiconductors:

Stanford University MatSci 152: Principles of Electronic Materials and Devices Spring Quarter, Final Exam, June 8, 2010

EE143 Fall 2016 Microfabrication Technologies. Evolution of Devices

( )! N D ( x) ) and equilibrium

ECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline:

n i exp E g 2kT lnn i E g 2kT

6.012 Electronic Devices and Circuits

ECE 606 Homework Week 7 Mark Lundstrom Purdue University (revised 2/25/13) e E i! E T

ECE 442. Spring, Lecture -2

PN Junction

Electronic Circuits for Mechatronics ELCT 609 Lecture 2: PN Junctions (1)

ELECTRONIC DEVICES AND CIRCUITS SUMMARY

Semiconductor Device Physics

Holes (10x larger). Diode currents proportional to minority carrier densities on each side of the depletion region: J n n p0 = n i 2

Lecture (02) PN Junctions and Diodes

Lecture (02) Introduction to Electronics II, PN Junction and Diodes I

Semiconductor Physics. Lecture 3

Peak Electric Field. Junction breakdown occurs when the peak electric field in the PN junction reaches a critical value. For the N + P junction,

4. I-V characteristics of electric

Introduction to Semiconductor Physics. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India

MSE 310/ECE 340: Electrical Properties of Materials Fall 2014 Department of Materials Science and Engineering Boise State University

Solid State Physics SEMICONDUCTORS - IV. Lecture 25. A.H. Harker. Physics and Astronomy UCL

Session 0: Review of Solid State Devices. From Atom to Transistor

Electrical Resistance

Atoms? All matters on earth made of atoms (made up of elements or combination of elements).

Chapter 1 Overview of Semiconductor Materials and Physics

Determination of properties in semiconductor materials by applying Matlab

Ch. 2: Energy Bands And Charge Carriers In Semiconductors

Section 12: Intro to Devices

pn JUNCTION THE SHOCKLEY MODEL

ELECTRONIC I Lecture 1 Introduction to semiconductor. By Asst. Prof Dr. Jassim K. Hmood

3 Minority carrier profiles (the hyperbolic functions) Consider a

Fundamentals of Semiconductor Physics

L03: pn Junctions, Diodes

Semiconductor Detectors

Solution 11:00 AM, Wednesday February 10, 2010, 108 Nedderman Hall 80 minutes allowed (last four digits of your student #) ( if new)

Junction Diodes. Tim Sumner, Imperial College, Rm: 1009, x /18/2006

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors

The Semiconductor in Equilibrium

Department of Electrical and Computer Engineering, Cornell University. ECE 3150: Microelectronics. Spring Exam 1 ` March 22, 2018

Semiconductor Physics. Lecture 6

Semiconductor device structures are traditionally divided into homojunction devices

Transcription:

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences EECS 130 Professor Ali Javey Fall 2006 Midterm I Name: Closed book. One sheet of notes is allowed. Show all your work in order to receive partial credit. Include correct units when appropriate. Make sure everything is on the exam papers. Work on additional papers will NOT be accepted. There are a total of 10 pages of this exam including this page. Make sure you have them all. Problem 1 30 Problem 2 15 & 5 extra credit Problem 3 28 Problem 4 27 Total 100

Physical Constants Electronic charge q 1.602 10-19 C Permittivity of vacuum ε 0 8.845 10-14 F cm -1 Relative permittivity of silicon ε Si /ε 0 11.8 Boltzmann s constant k 8.617 x 10-5 ev/ K or Thermal voltage at T = 300K kt/q 0.026 V 1.38 10-23 J K -1 Effective density of states N c 2.8 x 10 19 cm -3 Effective density of states N v 1.04 x 10 19 cm -3 Silicon Band Gap E G 1.12 ev Intrinsic Carrier Concentration n i 10 10 cm -3 in Si at 300K

1. Carriers Concentrations [30 pts] This problem concerns a specimen of gallium arsenide, GaAs, which has 2x10 17 cm -3 donors and an unknown number of acceptors. A measurement is made on the specimen and it is found that it is p-type with an equilibrium hole concentration, p o, of 5 x 10 17 cm -3. At room temperature in GaAs, the intrinsic carrier concentration, n i, is 10 7 cm -3, the hole mobility, µ h, is 300 cm 2 /V-s, and the electron mobility, µ e, is 4000 cm 2 /V-s. The minority carrier lifetime, t min, is 10-9 s. a) [6 pts] What is the net acceptor concentration, N A (= N a - N d ), in this sample, and what is the total acceptor concentration, N a? N A = cm -3 N a = cm -3 b) [6 pts] What is the equilibrium electron concentration, n, in this sample at room o temperature? n 0 = cm -3

c) [6 pts] Calculate E F E i in this sample at room temperature. E F E i = ev d) [6 pts] What is the electrical conductivity, σ 0, of this sample in thermal equilibrium at room temperature? σ 0 = S/cm e) [6 pts] This sample is illuminated by a steady state light which generates hole-electron pairs uniformly throughout its bulk, and the conductivity of the sample is found to increase by 1% (that is, to 1.01 σ 0 ). What are the excess hole and electron concentrations, Δp and Δn, in the illuminated sample, assuming that the illumination has been on for a long time?

Δn = cm -3 Δp = cm -3

2. Temperature Dependence of Carrier Concentrations and Mobility [15 pts] A silicon wafer is moderately doped with arsenic. The plots in parts (a)-(c) show the relationship between ln(n) and 1/T for this Si wafer, where n is the electron density in the conduction band and T is the temperature. In each case, clearly mark any pertinent shift in the curve and/or the slopes of the two non-flat regions as various properties of the semiconductor is changed. [5 pts] Draw a second curve that would correspond to an intrinsic (undoped) Si wafer. [5 pts] Draw a second curve that would correspond to using a Ge (E g ~0.67) wafer with the same dopant density instead of a Si (E g ~1.1) wafer. Assume the same (E D E C ).

[5 pts] Draw a second curve that would correspond to another Si wafer, but doped with a different donor such that (E D E C ) NEW_DONER = 4 x ((E D E C ) As, where E D is the donor energy level. [5pts extra credit] Draw a second curves that would correspond to a heavily doped Si wafer. Hint: when doping density is high, the impurity energy level splits into a band of available states due to Pauli exclusion principle. This impurity band crosses E c.

3. Band Model [28 pts] A silicon device maintained at 300 K is characterized by the following band diagram. Use the cited energy band diagram in answering parts (a)-(e) [8 pts] Sketch the electric field inside the semiconductor. [5 pts] Do equilibrium conditions prevail (yes, no, or cannot determine)? [5 pts] Is the semiconductor degenerate at any point? If so, specify one point where this is the case. [5 pts] What is the electron current density (J N ) flowing at x = x 1? [5 pts] What is the kinetic energy of the hole shown in the diagram?

4. [27 pts] Assume a Si PN junction with the following dopant density profiles for the two segments: N P [6 pts] Find V bi. V bi = V [7 pts] Draw a band diagram for the structure with a forward bias of V A =0.5 V. Label V A, V bi, E v, E c, and Fermi (or quasi-fermi) levels.

[4 pts] For part b, using arrows, indicate direction of I n,diff, I p,drift, I n, and I total (Redraw the band diagrams from b here). [10 pts] So far, we have been assuming that there is no series resistance (and therefore, no potential drop) in the neutral P and N regions of our diodes. However, when lightly doped (~<5e16cm -3 ), the resistivity of the P and N type regions are often high, leading to series resistance or potential drop in the P and N regions under an applied voltage. Draw a band diagram for this PN junction in equilibrium and then under forward bias, this time including the effect of the series resistance (qualitatively) of the N segment. Hint: assume the series resistance is constant throughout the N segment.

PAGE PAGE 10 N D = 2 10 16 cm 3 N A = 1 10 17 cm 3 N A = 1 10 16 cm 3 N D = 1 10 13 cm 3