India s No. 1 Institute for GATE, ESE & PSU s GATE - 2019 Online Test Series Instrumentation Engineering (IN) Total No.of Tests: 74 Chapter/Topic wise Tests 40 Subject wise / Multi Subject Grand Tests 22 Full Length Mock Tests 12 Features of Test Series All India Rank will be given for each test. Test wise and overall statistics. Comparison with all India Students of VANI INSTITUTE Powerful Analytics and Test Report which shows you All India Rank, Accuracy, Marks Distribution Chapter and topic wise Subject wise and Full Length
SUBJECT SUBJECT CODE TOPIC/CHAPTER Electrical Circuits (EC) Sensors and Industrial Inst. (SI) Signals and Systems (SS) EC-1 EC-2 SI-1 SI-2 SS-1 Voltage and current sources: independent, dependent, ideal and practical; v-i relationships of resistor, inductor, mutual inductor and capacitor Kirchoff s laws, mesh and nodal analysis, superposition, Thevenin, Norton, maximum power transfer and reciprocity theorems. Transient analysis of RLC circuits with dc excitation. Peak-, average- and rms values of ac quantities; apparent-, active- and reactive powers; phasor analysis, impedance and admittance; series and parallel resonance, locus diagrams, realization of basic filters with R, L and C elements. One-port and two-port networks, driving point impedance and admittance, open-, and short circuit parameters. Resistive-, capacitive-, inductive-, piezoelectric-, Hall effect sensors and associated signal conditioning circuits; transducers for industrial instrumentation: displacement (linear and angular), velocity, acceleration, force, torque, vibration, shock, pressure (including low pressure), Flow (differential pressure, variable area, electromagnetic, ultrasonic, turbine and open channel flow meters) temperature (thermocouple, bolometer, RTD (3/4 wire), thermistor, pyrometer and semiconductor); liquid level, ph, conductivity and viscosity measurement. Continuous-time signals: Fourier series and Fourier transform representations, sampling theorem and applications; Discrete-time signals: discrete-time Fourier transform (DTFT), DFT, FFT, 2
SS-2 Z-transform, interpolation of discrete-time signals; LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay, digital filter design techniques. Measurements (ME) Communication and Optical Inst. (CO) Control Systems (CS) ME-1 ME-2 CO-1 CO-2 CS-1 CS-2 SI units, systematic and random errors in measurement, expression of uncertainty - accuracy and precision index, propagation of errors. PMMC, MI and dynamometer type instruments; dc potentiometer; bridges for measurement of R, L and C, Q-meter. Measurement of voltage, current and power in single and three phase circuits; ac and dc current probes; true rms meters, voltage and current scaling, instrument transformers, timer/counter, time, phase and frequency measurements, digital voltmeter, digital multimeter; oscilloscope, shielding and grounding. Amplitude- and frequency modulation and demodulation; Shannon's sampling theorem, pulse code modulation; frequency and time division multiplexing, amplitude-, phase-, frequency-, pulse shift keying for digital modulation; Optical sources and detectors: LED, laser, photodiode, light dependent resistor and their characteristics; interferometer: applications in metrology; basics of fiber optic sensing. Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Frequency response; Routh-Hurwitz and Nyquist stability criteria; Bode and root-locus plots; Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems. 3
Analog Electronics (AE) Digital Electronics (DE) AE-1 AE-2 DE-1 DE-2 Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage, differential, feedback, power and operational; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op- amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip flops, counters, shift-registers and finite state machines; Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigen values and eigen vectors, rank, solution of linear equations existence and uniqueness. Engineering Mathematics (M) M-1 Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series. Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy's and Euler's equations, 4
methods of solution using variation of parameters, complementary function and particular integral, partial differential equations, variable separable method, initial and boundary value problems. Vector Analysis: Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss's, Green's and Stoke's theorems. Complex Analysis: Analytic functions, Cauchy's integral theorem, Cauchy's integral formula; Taylor's and Laurent's series, residue theorem. M-2 Numerical Methods: Solution of nonlinear equations, single and multi-step methods for differential equations, convergence criteria. General Aptitude (GA) VA NA Probability and Statistics: Mean, median, mode and standard deviation; combinatorial probability, probability distribution functions - binomial, Poisson, exponential and normal; Joint and conditional probability; Correlation and regression analysis. English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction Numerical computation, numerical estimation, numerical reasoning and data interpretation 5
Topic/Chapter wise test 1 st series Each test carries 25 marks and 45 minutes duration Test consists of 5 one mark questions and 10 two marks questions TEST NO TOPIC CODES DATE OF ACTIVATION IN-01 GPLEC-1 02-06-2018 IN -02 GPLEC-2 05-06-2018 IN -03 GPLSI-1 07-06-2018 IN-04 GPLSI-2 11-06-2018 IN-05 GPLSS-1 14-06-2018 IN-06 GPLSS-2 17-06-2018 IN-07 GPLME-1 20-06-2018 IN-08 GPLME-2 23-06-2018 IN-09 GPLCO-1 26-06-2018 IN-10 GPLCO-2 29-06-2018 IN-11 GPLCS-1 02-07-2018 IN-12 GPLCS-2 05-07-2018 IN-13 GPLAE-1 08-07-2018 IN-14 GPLAE-2 11-07-2018 IN-15 GPLDE-1 14-07-2018 IN-16 GPLDE-2 17-07-2018 IN-17 GPLM-1 26-07-2018 IN-18 GPLM-2 27-07-2018 IN-19 GPLVA 28-07-2018 IN-20 GPLNA 31-07-2018 6
Subject wise Grand Test 1 st Series Each test carries 50 marks and 90 minutes duration Test consists of 10 one mark questions and 20 two marks questions TEST NO SUBJECT CODES DATE OF ACTIVATION IN-21 GPLEC 02-08-2018 IN-22 GPLSI 06-08-2018 IN-23 GPLSS 09-08-2018 IN-24 GPLME 13-08-2018 IN-25 GPLCO 17-08-2018 IN-26 GPLCS 21-08-2018 IN-27 GPLAE 25-08-2018 IN-28 GPLDE 29-08-2018 IN-29 GPLM 04-09-2018 IN-30 GPLGA 06-09-2018 Full length Mock Test 1 st series Each test carries 100 marks and 3 hours duration TEST NO MOCK GATE CODES DATE OF ACTIVATION IN-31 PLMock-1 10-09-2018 IN-32 PLMock-2 14-09-2018 IN-33 PLMock-3 19-09-2018 7
Topic/Chapter wise test 2 nd Series Each test carries 25 marks and 45 minutes duration Test consists of 5 one mark questions and 10 two marks questions GAL = GATE Advanced Level TEST NO TOPIC CODES DATE OF ACTIVATION IN-34 GALEC-1 22-09-2018 IN-35 GALEC-2 24-09-2018 IN-36 GALSI-1 27-09-2018 IN-37 GALSI-2 30-09-2018 IN-38 GALSS-1 02-10-2018 IN-39 GALSS-2 04-10-2018 IN-40 GALME-1 07-10-2018 IN-41 GALME-2 09-10-2018 IN-42 GALCO-1 11-10-2018 IN-43 GALCO-2 14-10-2018 IN-44 GALCS-1 16-10-2018 IN-45 GALCS-2 19-10-2018 IN-46 GALAE-1 22-10-2018 IN-47 GALAE-2 25-10-2018 IN-48 GALDC-1 28-10-2018 IN-49 GALDE-2 30-10-2018 IN-50 GALM-1 07-11-2018 IN-51 GALM-2 09-11-2018 IN-52 GALVA 11-11-2018 IN-53 GALNA 11-11-2018 8
Multi Subject grand Test 2 nd Series Each test carries 50 marks and 90 minutes duration Test consists of 10 one mark questions and 20 two marks questions TEST NO SUBJECT CODES DATE OF ACTIVATION IN-54 ECT, SS 14-11-2018 IN-55 ME, EM 17-11-2018 IN-56 CO, CS 20-11-2018 IN-57 AE, DE 23-11-2018 IN-58 EM 28-11-2018 IN-59 GA 29-11-2018 Full Length Mock Test 2 nd Series Each test carries 100 marks and 3 hours duration TEST NO MOCK GATE CODES DATE OF ACTIVATION IN-60 ALMock-1 30-11-2018 IN-61 ALMock-2 04-12-2018 IN-62 ALMock-3 09-12-2018 9
Multi Subject grand Test 3 rd Series Each test carries 50 marks and 90 minutes duration Test consists of 10 one mark questions and 20 two marks questions TEST NO SUBJECT CODES DATE OF ACTIVATION IN-63 EC, SS 13-12-2018 IN-64 ME, EM 17-12-2018 IN-65 CO, CS 21-12-2018 IN-66 AE, DE 25-12-2018 IN-67 GM 01-01-2019 IN-68 GA 03-01-2018 Full Length GATE Mock Test 3 rd Series Each test carries 100 marks and 3 hours duration TEST NO MOCK GATE CODES DATE OF ACTIVATION IN-69 Mock-1 05-01-2019 IN-70 Mock-2 08-01-2019 IN-71 Mock-3 11-01-2019 IN-72 Mock -4 15-01-2019 IN-73 Mock -5 19-01-2019 IN-74 Mock -6 25-01-2019 10