Graphene-Bi 2 Te 3 Heterostructure as Saturable Absorber for Short Pulse Generation

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Supporting Information Graphene-Bi 2 Te 3 Heterostructure as Saturable Absorber for Short Pulse Generation Haoran Mu,, Zhiteng Wang,, Jian Yuan,, Si Xiao, Caiyun Chen, Yu Chen, Yao Chen, Jingchao Song,Yusheng Wang,Yunzhou Xue, Han Zhang, *, Qiaoliang Bao,, *. Institute of Functional Nano and Soft Materials (FUNSOM), Jiangsu Key Laboratory for Carbon-Based Functional Materials and Devices, and Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, Suzhou 215123, P. R. China. SZU-NUS Collaborative Innovation Center for Optoelectronic Science and Technology, and Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China. Institute of Super-Microstructure and Ultrafast Process in Advanced Materials, School of Physics and Electronics, Hunan Key Laboratory for Super-Microstructure and Ultrafast Process, Central South University, Changsha 410083, China. Department of Materials Science and Engineering, Monash University, Clayton, VIC 3800, Australia. These authors contributed equally to this work. *Address correspondence to (H. Zhang) hzhang@szu.edu.cn and (Q. Bao) qlbao@suda.edu.cn

1. Raman spectra of pure graphene and graphene-bi 2 Te 3 hetero-structure The shift of characteristic peaks in Raman spectroscopy can provide an indirect evidence of interlay interaction between graphene and Bi 2 Te 3. Specifically, we compared the Raman spectrum of the graphene-bi 2 Te 3 heterostructure sample with that of pure graphene sample, as shown in Figure S1. It is interesting to find that G peak shift from 1580 to 1598 cm -1, and 2D peak shift from 2680 to 2652 cm -1. The shift of G peak suggests an additional strain which originates from the slight lattice mismatch between graphene and Bi 2 Te 3 after the formation of a heterostructure. 1 The change of 2D peak is correlated to the modification of the electronic structure in graphene after growing Bi 2 Te 3 on it. 2 a b c d Figure S1 a) Raman spectrum of the graphene-bi 2 Te 3 heterostructure. b) Raman spectrum of the pure graphene. c) Raman G peaks of pure graphene and graphene-bi 2 Te 3 heterostructure. d) Raman 2D peaks of pure graphene and graphene-bi 2 Te 3 heterostructure.

2. Pump-probe experiments for graphene-bi 2 Te 3 hetero-structure samples with different Bi 2 Te 3 coverage a c b Figure S2 Pump-probe results showing the time for inter-band relaxation in graphene-bi 2 Te 3 heterostructure samples. a) The sample with 15% coverage of Bi 2 Te 3. b) The sample with 65% coverage of Bi 2 Te 3. c) The sample with 85% coverage of Bi 2 Te 3. The samples were pumped and probed at the wavelength of 1550 nm. The open green dots are experimental data and the red curves are analytical fit to the data using exponentials with a time constant τ 2. We suggested that the second decay times were not very precisely resolved due to the limitation of sampling process in pump-probe measurements. In our pump-probe experiments, we collected data points in equal intervals of time and every sampling point needs an integral time. It is very time-consuming to obtain the same scale of standard error as that of fast decay time (τ 1 ) as the second decay time has

tens-times time range. We found that the stand errors of the second decay time of all these three samples are relatively high. The second decay times (τ 2 ) of 15%, 65% and 85% coverage samples are 4.05±1.18 ps, 2.52±0.48 ps and 2.81±0.3 ps, respectively which are all in the picosecond-level, slower than that of graphene but much faster than that of Bi 2 Te 3.

3. The experimental setup of the Erbium-doped fiber laser ring cavity. Figure S3. Experimental setup of the Erbium-doped fiber laser ring cavity. LD: Laser diode with work wavelength of 975 nm. WDM: Wavelength division multiplex. EDF: Erbium-doped fiber. PC: Polarization controller. ISO: Polarization independent isolator. Reference 1. Ni, Z. H.; Yu, T.; Lu, Y. H.; Wang, Y. Y.; Feng, Y. P.; Shen, Z. X., Uniaxial Strain on Graphene: Raman Spectroscopy Study and Band-Gap Opening. ACS Nano 2008, 2, 2301-2305. 2. Ferrari, A. C.; Basko, D. M., Raman spectroscopy as a versatile tool for studying the properties of graphene. Nat. Nanotechnol. 2013, 8, 235-246.