OptiMOS -P2 Power-Transistor

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Transcription:

OptiMOS -P2 Power-Transistor Product Summary V DS -4 V R DS(on) (SMD Version) 3.1 mw Features P-channel - Logic Level - Enhancement mode I D -12 A AEC qualified PG-TO263-3-2 PG-TO262-3-1 PG-TO22-3-1 MSL1 up to 26 C peak reflow 175 C operating temperature Green package (RoHS compliant) 1% Avalanche tested Type Package Marking IPB12P4P4L-3 PG-TO263-3-2 4PP4L3 IPI12P4P4L-3 PG-TO262-3-1 4PP4L3 IPP12P4P4L-3 PG-TO22-3-1 4PP4L3 Maximum ratings, at T j =25 C, unless otherwise specified Parameter Symbol Conditions Value Unit Continuous drain current 1) I D T C =25 C, V GS =-1V -12 A T C =1 C, V GS =-1V 2) -114 Pulsed drain current 2) I D,pulse T C =25 C -48 Avalanche energy, single pulse E AS I D =-6A 78 mj Avalanche current, single pulse I AS - -12 A Gate source voltage V GS - ±16 3) V Power dissipation P tot T C =25 C 136 W Operating and storage temperature T j, T stg - -55... +175 C IEC climatic category; DIN IEC 68-1 - - 55/175/56 Rev. 1.1 page 1 215-5-27

Parameter Symbol Conditions Values Unit min. typ. max. Thermal characteristics 2) Thermal resistance, junction - case R thjc - - - 1.1 K/W Thermal resistance, junction - ambient, leaded R thja - - - 62 SMD version, device on PCB R thja minimal footprint - - 62 6 cm 2 cooling area 4) - - 4 Electrical characteristics, at T j =25 C, unless otherwise specified Static characteristics Drain-source breakdown voltage V (BR)DSS V GS =V, I D = -1mA -4 - - V Gate threshold voltage V GS(th) V DS =V GS, I D =-34µA -1.2-1.7-2.2 Zero gate voltage drain current I DSS V DS =-32V, V GS =V, T j =25 C - -.5-1 µa V DS =-32V, V GS =V, T j =125 C 2) - -2-2 Gate-source leakage current I GSS V GS =-16V, V DS =V - - -1 na Drain-source on-state resistance R DS(on) V GS =-4.5V, I D =-1A - 4. 5.2 mw V GS =-4.5V, I D =-1A, SMD version - 3.7 4.9 V GS =-1V, I D =-1A - 2.9 3.4 V GS =-1V, I D =-1A, SMD version - 2.6 3.1 Rev. 1.1 page 2 215-5-27

Parameter Symbol Conditions Values Unit min. typ. max. Dynamic characteristics 2) Input capacitance C iss - 1138 15 pf Output capacitance C oss V GS =V, V DS =-25V, f =1MHz - 341 5 Reverse transfer capacitance C rss - 135 27 Turn-on delay time t d(on) - 21 - ns Rise time t r V DD =-2V, V GS =-1V, I D =-12A, - 16 - Turn-off delay time t d(off) R G =3.5W - 85 - Fall time t f - 57 - Gate Charge Characteristics 2) Gate to source charge Q gs - 4 52 nc Gate to drain charge Q gd V DD =-32V, I D =-12A, - 32 64 Gate charge total Q g V GS = to -1V - 18 234 Gate plateau voltage V plateau - 3.5 - V Reverse Diode Diode continous forward current 2) I S T C =25 C - - -12 A Diode pulse current 2) I S,pulse - - -48 Diode forward voltage V SD V GS =V, I F =-1A, T j =25 C - -1-1.3 V Reverse recovery time 2) t rr V R =-2V, I F =-5A, - 54 ns Reverse recovery charge 2) Q rr di F /dt =-1A/µs - 6 nc 1) Current is limited by bondwire; with an R thjc = 1.1K/W the chip is able to carry -171A at 25 C. 2) Defined by design. Not subject to production test. 3) V GS =+5V/-16V according AEC; V GS =+16V for max 168h at T J =175 C 4) Device on 4 mm x 4 mm x 1.5 mm epoxy PCB FR4 with 6 cm 2 (one layer, 7 µm thick) copper area for drain connection. PCB is vertical in still air. Rev. 1.1 page 3 215-5-27

1 Power dissipation 2 Drain current IPB12P4P4L-3 P tot = f(t C ); V GS -6V I D = f(t C ); V GS -6V; SMD 16 14 14 12 12 1 1 P tot [W] 8 6 8 6 4 4 2 2 5 1 15 2 5 1 15 2 T C [ C] T C [ C] 3 Safe operating area 4 Max. transient thermal impedance I D = f(v DS ); T C = 25 C; D = ; SMD Z thjc = f(t p ) parameter: t p parameter: D =t p /T 1 1 1 1 µs 1 µs 1 1 ms 1 µs 1.5 Z thjc [K/W] 1-1.1.5 1 1-2.1 single pulse 1.1 1 1 1 -V DS [V] 1-3 1-6 1-5 1-4 1-3 1-2 1-1 1 t p [s] Rev. 1.1 page 4 215-5-27

5 Typ. output characteristics 6 Typ. drain-source on-state resistance I D = f(v DS ); T j = 25 C; SMD parameter: V GS R DS(on) = (I D ); T j = 25 C; SMD parameter: V GS 64 56-1 V -5 V 2 18-2.8 V -3 V -3.5 V 48 16 4-4.5 V 14 32 24-4 V R DS(on) [mw] 12 1 8 16-3.5 V 6 8-3 V 1 2 3 4 5 6 4 2-4 V -4.5 V -5 V -1V 4 8 12 -V DS [V] 7 Typ. transfer characteristics 8 Typ. drain-source on-state resistance I D = f(v GS ); V DS = -6V R DS(on) = f(t j ); I D = -1 A; V GS = -1 V; SMD parameter: T j 64 25 C 4.5 56-55 C 48 175 C 4 32 R DS(on) [mw] 3.5 24 2.5 16 8 2 3 4 5 -V GS [V] 1.5-6 -2 2 6 1 14 18 T j [ C] Rev. 1.1 page 5 215-5-27

9 Typ. gate threshold voltage 1 Typ. capacitances IPB12P4P4L-3 V GS(th) = f(t j ); V GS = V DS C = f(v DS ); V GS = V; f = 1 MHz parameter: I D 2.5 1 5 2 1 4 Ciss -34µA Coss -V GS(th) [V] 1.5-34µA C [pf] 1 3 1 1 2 Crss.5-6 -2 2 6 1 14 18 T j [ C] 1 1 5 1 15 2 25 3 -V DS [V] 11 Typical forward diode characteristicis 12 Drain-source breakdown voltage IF = f(v SD ) V BR(DSS) = f(t j ); I D = -1 ma parameter: T j 1 3 45 44 43 1 2 42 -I F [A] 175 C 25 C -V BR(DSS) [V] 41 4 39 1 1 38 37 36 1.2.4.6.8 1 1.2 1.4 -V SD [V] 35-6 -2 2 6 1 14 18 T j [ C] Rev. 1.1 page 6 215-5-27

13 Typ. gate charge 14 Gate charge waveforms V GS = f(q gate ); I D = -12 A pulsed parameter: V DD 12 1 V GS Q g 8-8V -32V -V GS [V] 6 4 2 Q gate 2 4 6 8 1 12 14 16 Q gs Q gd Q gate [nc] Rev. 1.1 page 7 215-5-27

Published by Infineon Technologies AG 81726 Munich, Germany Infineon Technologies AG 211 All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Rev. 1.1 page 8 215-5-27

Revision History Version Date Changes 1. 1.1 211-1-24 Final Data Sheet 215-5-27 Update of marking Rev. 1.1 page 9 215-5-27