Enhancing field-effect mobility and maintaining solid-state emission by incorporating 2,6-diphenyl substitution to 9,10- bis(phenylethynyl)anthracene

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Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C. This journal is The Royal Society of Chemistry 2017 Electronic Supplementary Information (ESI) Enhancing field-effect mobility and maintaining solid-state emission by incorporating 2,6-diphenyl substitution to 9,10- bis(phenylethynyl)anthracene Jie Liu, a Jinyu Liu, b,c Zichao Zhang, b,c Chunhui Xu, a Qingyuan Li, d Ke Zhou, b,c Huanli Dong b,* Xiaotao Zhang, a and Wenping Hu a* a Tianjin Key Laboratory of Molecular Optoelectronic Sciences, Department of Chemistry, School of Science, Tianjin University & Collaborative Innovation Center of Chemical Science and Engineering (Tianjin), Tianjin 300072, China. b Beijing National Laboratory for Molecular Science, Key Laboratory of Organic Solids, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100190, China. c University of the Chinese Academy of Sciences, Beijing 100190, China. d Beijing Key Laboratory for Optical Materials and Photonic Devices, Department of Chemistry, Capital Normal University, Beijing 100048, China *Correspondence:dhl522@iccas.ac.cn, huwp@tju.edu.cn Table of Contents Experimental Section Table S1. Crystal data and structure refinement for DP-BPEA (CCDC1526493). (S2) (S5) Table S2. Transfer integrals (T) and reorganization energies (R) of BPEA and DP-BPEA along b-axis. Figure S1. Calculated transfer integrals of BPEA and DP-BPEA along b-axis. Figure S2. Fluorescent quantum efficiency of DP-BPEA solution. Figure S3. Transfer and output curves of thin film devices. Figure S4. AFM images of 40-nm DP-BPEA thin films. Figure S5. AFM, TEM and SAED results of DP-BPEA single crystals. References (S6) (S6) (S6) (S7) (S7) (S8) (S8) S1

Experimental section: Sample preparation Single crystal samples for quantum efficiency measurements of the compounds were prepared by drop-casting (THF for DP-BPEA, CH2Cl2 for α-phase BPEA, chlorobenzene for β-phase BPEA) 1 on 1 cm 2 quartz plates. Single crystals for OFETs were grown by physical vapor transport (PVT) directly on OTS (octadecyltrichlorosilane) treated SiO 2 /Si. X-ray crystal structure analysis High-quality single crystals of DP-BPEA were grown from saturated THF solution at room temperature for X-ray analysis. X-ray diffraction intensity data were collected on a Rigaku Pilatus 200k diffract meter with confocal monochromator Mo K\α radiation under 113 K (Table S1). Density Functional Theory (DFT) calculation All the density functional theory (DFT) calculations in this work were done by the Gaussian 09 package. For transfer integrals and reorganization energies, the site-energy overlap correction method and adiabatic potential energy surface method were adopted respectively, where the DFT calculations were obtained at the B3LYP/6-31G(d) level. For excited states, CAM-B3LYP hybrid functional was used, and the basis set size was increased to 6-31+G(d, p). The excitation energy of S1 was obtained as the energy of the first singlet electronic excitation calculated by time-dependent density functional theory (TD-DFT), and the excitation energy of T1 was the difference between the ground state energy of molecules with triplet and singlet multiplicity, both in fully optimized geometry. Electrochemical analysis Cyclic voltammetry measurements were performed in 0.1 M electrolyte solution (Bu 4 NPF 6 ) in CH 2 Cl 2 with sample concentration of 10-3 M at room temperature in N 2 atmosphere, using a Pt disk as a working electrode, Ag/AgCl as a reference electrode and Pt wire as an auxiliary electrode. Ferrocene was added to the analyzed solution at the end of the measurement as an internal reference. S2

Photophysical studies of solution sample UV-vis absorption spectra were measured with Hitachi (model U-3010) UV-Vis spectrophotometer in a 1 cm quartz cell for solution samples. Photoluminescence (PL) spectra were recorded on a Perkin-Elmer LS 55spectrofluorometer for solution samples. And 1 10-5 M THF solution was used for monomers measurements. The relative fluorescence quantum yields of the solutions were measured using fluorescein as a reference (Φ = 0.79). Photophysical studies of crystalline sample Absolute quantum yield measurement (LabSphere, FluoroMax-4, HORIBA Jobin Yvon, PLQY (PL quantum yield) software package) was used for crystalline sample. Emission spectra including the scattering region of excitation light were measured for both blank and samples, and these spectra were corrected with instrumental factors to calculate the quantum yield. PL image was obtained using Olympus inverted fluorescence microscope IX83 with CCD camera. Fluorescent mapping was conducted on laser scanning confocal microscope for the same crystal. Modification of SiO 2 wafer with OTS The substrate was a heavily doped n-type Si wafer with a 300 nm thick SiO 2 layer. The substrates were cleaned with deionised water, piranha solution (H 2 SO 4 :H 2 O 2 = 7:3), deionised water and isopropanol successively. OTS modification: The clean wafers were dried under vacuum at 90 C for 0.5 h in order to eliminate moisture. After cooling to room temperature, one drop of OTS was placed on the wafer. This system was then heated up to 120 C for 2 h under vacuum. After cooling down to room temperature, the wafers were washed by n-hexane, chloroform and isopropanol successively, and then blow-dried by N 2 and ready for use. AFM and TEM study of single crystal samples AFM image of single crystal was obtained by using a Digital Instruments Nanoscope III atomic force microscope in air. TEM and SAED measurements were carried out on a JEM 1011 (Japan). Fabrication of thin film transistors S3

Thin film transistors (TFTs) were fabricated in bottom-gate top-contact (BGTC) configuration. Thin films of DP-BPEA were grown at room temperature by vacuum deposition (8 10-4 Pa) with a deposition speed of 0.1-0.5 Ås -1 on OTS treated SiO 2 (300 nm)/si substrate. TFTs characteristics were recorded by a Keithley 4200 SCS and Micromanipulator 6150 probe station in a clean and shielded box in air. Fabrication of single crystal transistors Single crystal devices were fabricated using the organic ribbon mask technique. 1 The channel width is the width of the as grown crystals of DP-BPEA, and the channel length is the width of the ribbon mask. Material Synthesis 2,6-Dibromoanthracene-9,10-dione and 2,6-diphenylanthracene-9,10-dione was synthesized as we previously reported. 2,6-Diphenyl-9,10-bis(phenylethynyl)anthracene (DP-BPEA). To a 250 ml roundbottom flask containing 100 ml anhydrous THF, ethynylbenzene 2.85 g (27.88 mmol) was added and the stirring system was placed in an ice-water bath, then 7.8 ml (15.6 mmol 2M) n-buli was added slowly and this mixture was stirred for 1 h at 0 o C. Then 2,6-diphenylanthracene-9,10-dione 1.8 g (5 mmol) was added quickly, and the mixture was stirred overnight. Stannous chloride dihydrate 2.83 g (12.5 mmol) and 12.5 ml 10% HCl was added to the mixture which was stirred for another 7 h. Then the whole system was extracted with chloroform (60 ml 3) and the combined organic layer was washed with saturated brine solution, dried over anhydrous Na 2 SO 4 and concentrated. The final DP-BPEA was obtained after silica chromatography (eluent: petroleum ether/dichloromethane) with a yield of 56% (1.48 g). 1 H NMR (300 MHz, CD 2 Cl 2, δ): 8.93 (2 H, s), 8.79 (2 H, d, J = 9.0), 7.98 (2 H, d, J = 9.0), 7.89 (4 H, d, J = 7.7), 7.81 (4 H, d, J = 7.9), 7.55 (4 H, t, J = 7.5), 7.46 (8 H, t, J = 8.0). MS (EI) m/z: 530 (M + ). Anal. calcd for C 42 H 26 (%): C: 95.06, H: 4.94. Found: C: 94.79, H: 5.18. S4

Table S1. Crystal Data and Structure Refinement for DP-BPEA (CCDC1526493) Empirical formula C42H26 Formula weight 530.63 Temperature Wavelength Crystal system 113.0 K 0.71075 Å Monoclinic Space group P 2 1 /c Unit cell dimensions a = 17.727(13) Å α = 90 b = 3.932(3) Å β = 111.119(16) c = 20.797(15) Å γ = 90. Volume 1352.2(18) Å 3 Z 2 Density (calculated) 1.303 mg/m 3 Absorption coefficient 0.074 mm -1 F(000) 556 Crystal size 0.16 0.14 0.12 mm 3 Theta range for data collection 3.5 to 27.5 Index ranges -22 h 22, -5 k 4, -27 l 25 Reflections collected 12339 Independent reflections 3057 [R(int) = 0.0889] Absorption correction Semi-empirical from equivalents Max. and min. transmission 0.991 and 0.988 Refinement method Full-matrix least-squares on F2 Data / restraints / parameters 3057 / 0 / 190 Goodness-of-fit on F2 1.040 Final R indices [I>2sigma(I)] R1 = 0.0612, R indices (all data) R1 = 0.1023, Largest diff. peak and hole 0.365 and -0.267 e.å -3 S5

Table S2. Transfer integrals (T) and reorganization energies (R) of BPEA and DP-BPEA along b-axis. T (mev) R (mev) BPEA 56.2 141.4 DP-BPEA 71.5 128.3 a) b) 56.2 71.5 56.2 71.5 Figure S1 Calculated transfer integrals of BPEA (a) and DP-BPEA (b) along b-axis. Integrated Fluorescence Intensity (a.u) 250.0k 200.0k 150.0k 100.0k 50.0k 0.0 Fluorescein DP-BPEA 0.0 0.1 0.2 0.3 0.4 Absorbance Figure S2. Fluorescent quantum efficiency of DP-BPEA solution. The efficiency of DP- BPEA solution was measured in comparison with fluorescein. THF was used as solvent for the two compounds and the excite wavelength was fixed at 440 nm, ΦF of 79% was reported for fluorescein, and a 5 times stronger fluorescence was obtained for DP-BPEA under the same condition, thus the Φ F of DP-BPEA was estimated as 100%. S6

(-I DS (A)) 1/2 0.003 0.002 0.001 0.000-80 -60-40 -20 0 20 40 V G (V) 10-4 a) b) 0.0020 10-6 10-8 10-10 10-12 -I DS (A) c) d) 10-6 -I DS ( A) 4 3 2 1 0 1.5 0.0015 1.0 0V -20V -40V -60V -80V 0-20 -40-60 -80 V DS (V) 0V -20V -40V -60V -80V (-I DS (A)) 1/2 0.0010 0.0005 10-8 -I DS (A) 10-10 -I DS ( A) 0.5 0.0000-80 -60-40 -20 0 20 40 V G (V) 10-12 0.0 0-20 -40-60 -80 V DS (V) Fig. S3 Transfer and output curves of thin film devices fabricated on OTS-treated (a, b) and bare Si/SiO 2 substrates (c, d). 200 nm 1 μm 1 μm Fig. S4 AFM images of 40-nm DP-BPEA thin films on OTS-treated (left) and bare Si/SiO 2 (right). S7

200 nm a) 60 0.5 μm 0.5 1.0 1.5 2.0 2.5 Horizontal distance ( m) c) d) Vertical distance (nm) 40 20 0-20 b) [010] 010 1 μm 10 1/nm Fig. S5. a) and b) AFM image and heights profile corresponding to the white dot line in a; c) and d) TEM image and corresponding SAED of typical single crystals. References: 1. L. Jiang, J. H. Gao, E. J. Wang, H. X. Li, Z. H. Wang, W. P. Hu and L. Jiang, Adv. Mater., 2008, 20, 2735-2740. S8