Interfacial effects on magnetic relaxation in CoÕPt multilayers

PHYSICAL REVIEW B 68, 134443 2003 Interfacial effects on magnetic relaxation in CoÕPt multilayers S. J. Yuan, 1 L. Sun, 2 H. Sang, 3 J. Du, 3 and S. M. Zhou 1,3, * 1 Surface Physics Laboratory (National Key Laboratory) and Department of Physics, Fudan University, Shanghai 200433, China 2 Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA 3 National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China Received 19 April 2003; revised manuscript received 11 July 2003; published 24 October 2003 Out-of-plane ferromagnetic resonance FMR spectra of sputtered Co/Pt multilayers with in-plane anisotropy were measured and analyzed by the Landau-Lifshitz-Gilbert equation. In order to explain the FMR linewidth, the extrinsic magnetic relaxation must be considered, in addition to the intrinsic Gilbert damping effect and the broadening induced by the magnetic inhomogeneity. The characteristic of the extrinsic magnetic relaxation is consistent with the two-magnon scattering model. The contributions of the intrinsic and the extrinsic magnetization relaxations decrease with increasing Co layer thickness, exhibiting an interfacial effect in the Co/Pt multilayers. DOI: 10.1103/PhysRevB.68.134443 PACS number s : 75.70. i, 76.50. g I. INTRODUCTION Ferromagnetic resonance FMR is one of the standard techniques used in studies of magnetic thin films. Most FMR studies have focused on the dependence of the resonance field on various variables, such as the orientation of the applied magnetic field, the film thickness, and the temperature. 1 Very recently, the FMR linewidth in magnetic metallic films has begun to attract much attention because it can provide information about the anisotropy field, magnetic inhomogeneity, magnetic relaxation, and film quality. Three mechanisms have been considered to contribute to the linewidth. 2 9 As the first contribution, intrinsic Gilbert damping, i.e., the magnetization relaxation process towards equilibrium states after microwave power pumping, exists in all magnetic materials. This effect results from a combined effect of exchange interaction and spin-orbit coupling. The corresponding linewidth has a strong angular dependence if the magnetic materials have a strong magnetic anisotropy. An enhancement of the Gilbert damping parameter was observed in magnetic multilayers due to an interfacial effect. 2,4,5 The second contribution to the FMR linewidth arises from the broadening induced by magnetic inhomogeneity, such as the magnitude of the magnetization or the internal static magnetic field, and the orientation of the crystallographic axis or the anisotropy axis. Actually, this part should always be considered because all samples might have magnetic inhomogeneity. This effect has already been used to define the film quality of ultrathin films and layered films. 2,3 As the third contribution to the linewidth, the so-called extrinsic magnetic relaxation has been argued to originate from the coupling between the uniform resonance mode and degenerating spin waves through structural inhomogeneity. This phenomenon is called two-magnon scattering process. 10,11 It was studied extensively in ferrites in the 1950s and 1960s. 12 Very recently, this mechanism has been applied to magnetic metallic films. 6 A utilitarian model AM model was proposed by Arias and Mills AM to explain the contribution of the extrinsic magnetization relaxation to the linewidth in magnetic ultrathin films, after taking into account the effect of the interfacial defects on the dipolar interaction and the surface anisotropy. 8 Theoretically, the three effects can be clearly analyzed and discerned from the angular and frequency dependence of the linewidth because they have different frequency and angular dependencies. However, very few experiments have shown that the contribution of the two-magnon scattering process to the linewidth is absolutely necessary in the metallic magnetic films. For example, Azevedo et al. attributed the linewidth of the sputtered NiFe films to the extrinsic magnetic relaxation within the two-magnon scattering model, 9 but Dubowik et al. found that the linewidth can also be explained very well by the intrinsic magnetization relaxation. 13 Clearer and more direct evidence is required to prove the existence of the extrinsic magnetic relaxation in the frame of two-magnon scattering model in magnetic metallic films. Because both the intrinsic and the extrinsic magnetic relaxations increase with decreasing ferromagnet FM layer thickness, their difference in the out-of-plane angular dependence is more prominent in thinner FM layers than in thick FM layers. Up to now, the magnetic relaxation has been studied in exchange-coupled FM/antiferromagnet bilayers with the exchange anisotropy and FM/nonmagnetic layered structure with the surface anisotropy as a pure consequence of broken symmetry. Since the surface anisotropy at Co/Pt interface originates from interfacial s-d hybridization 14 and is completely different, FMR studies on the Co/Pt multilayers at microwave frequency might provide new information about the two-magnon scattering process. In this paper, we provide clear and direct evidence of the existence of the twomagnon scattering process. Note that in this study, Co/Pt multilayers have a large Co layer thickness with an in-plane anisotropy. During experiments, Co/Pt multilayers with wedged Co layers are used to avoid the run-to-run error. Angular dependent FMR spectra have been recorded for samples with various Co layer thicknesses so that dependences of the FMR field and the FMR linewidth on the constituent layer thickness and the orientation of the applied magnetic field are obtained. An analysis of the experimental data confirms that the extrinsic magnetic relaxation must be considered, in addition to the broadening induced by the magnetic inhomogeneity and the intrinsic magnetic relax- 0163-1829/2003/68 13 /134443 6 /$20.00 68 134443-1 2003 The American Physical Society

S. J. YUAN, L. SUN, H. SANG, J. DU, AND S. M. ZHOU PHYSICAL REVIEW B 68, 134443 2003 ation. The extrinsic magnetic relaxation can be described by a model of the two-magnon scattering process. The intrinsic and the extrinsic contributions decrease with increasing Co layer thickness. Because the Co/Pt multilayers are promising candidates for a new generation of storage materials, 15 this work might also be helpful to uncover the characteristic of the magnetization reversal. II. PHENOMENOLOGICAL DESCRIPTION OF FMR The coordinate system used for the analysis is described as follows. The film surface is aligned in the x-y plane. The orientation of the external dc magnetic field H is defined by the polar angle H and azimuthal angle H. The polar and azimuthal angles of the magnetization vector M are and, respectively. The external microwave field h is parallel to the y direction. The angular dependence of the FMR spectra can be obtained by using the Landau-Lifshitz-Gilbert LLG equation: M t M H G M M M 2 S t. Here ( g B / ) and G are the gyromagnetic ratio and the Gilbert damping coefficient, respectively. g and B are the Landé factor and the Bohr magnon moment, respectively. M S is the saturation magnetization. Neglecting the damping effect in Eq. 1, one can obtain the following resonance condition 16 : 2 2 1 2 F T 2 F T M S t Co sin 2 2 F T 2, 2 2 where t Co is the Co layer thickness. Since the in-plane anisotropy energy is very small, as shown below, we will mainly focus on the out-of-plane angular dependence of the resonance field and the linewidth. The free energy density per volume in the above equations contains the out-of-plane anisotropy energy, the Zeeman energy in the applied field, and the demagnetizing energy. The first order out-of-plane anisotropy energy consists of the bulk anisotropy (K U ) and the surface one (K S ). The second-order anisotropy constant is K 2 : F T 2 M S 2 K U t Co 2K S cos 2 t Co K 2 sin 4 1 HM S t Co sin sin H cos H cos cos H. 3 For the above free energy, the FMR dispersion is given as follows: 2 H RES cos H 4 M eff cos 2 H K2 3 sin 2 cos 2 sin 4 H RES cos H 4 M eff cos 2 H K2 sin 2 cos 2, 4 where 4 M eff 4 M S H K, H K (2K U /M S ) (4K S /t Co M S ), and H K2 4K 2 /M S. In numerical calculations of the dispersion equation, the following equilibrium equations of the magnetization vector are required: F T 0, F T 0. After considering the contribution of the intrinsic Gilbert damping H intrin and the inhomogeneity induced broadening H inhomo, one has the following peak-to-peak linewidths H pp Ref. 2 : H pp 1 3 H intrin 1 3 H inhomo, 5 6 2 F T H intrin M S 2 F T 2 2 sin, 7 2 H RES 1 H inhomo H RES 4 M eff 4 M eff H RES H H H RES H H, where the coefficient of 1/ 3 is the correction of the difference between the full width at half maximum FWHM and the peak-to-peak linewidth for the Lorentzian line shape. We have the dimensionless damping coefficient G/ M S. (4 M eff ) represents the spread of the magnitude of the effective demagnetizing field, H and H represent the spread of the direction of crystallographic axis. In the AM model, 8 the defects at the film surface or interfaces are assumed to be rectangles, with edges perpendicular to and parallel to the magnetization and randomly varying dimensions. These defects will produce additional Zeeman energy, dipolar interaction, and surface anisotropy, and thus induce extrinsic magnetic relaxation to the FMR linewidth. Considering the present specific situation, the extrinsic contribution to the FMR linewidth can be written approximately as 9 H extrin 1 2 16sH K 3 D H RES H RES 4 M eff, where D is the exchange stiffness constant. The geometrical factor of the surface roughness s pb 2 (a/c) 1, where p is the fraction of the surface covered by defects having average height or depth b and lateral dimensions a and c. The coefficient of 1/ 3 in Eq. 9 is the correction of the difference between the FWHM and the peak-to-peak linewidth for the Lorentzian line shape. In the following calculations, the value of the second order anisotropy is neglected because it is much smaller than that of the first order anisotropy. 8 9 134443-2

INTERFACIAL EFFECTS ON MAGNETIC RELAXATION... PHYSICAL REVIEW B 68, 134443 2003 FIG. 1. Typical x-ray diffraction spectrum in small angle region for Co(1.5 nm)/pt(1.5 nm) 10 at room temperature. III. EXPERIMENTS A large specimen of wedged-co (0-2.0 nm)/ Pt (1.0 nm) 8 multilayer was prepared onto a Si 100 substrate by dc magnetron sputtering with a base pressure of 10 8 Torr. Before multilayer deposition, a 10-nm-thick Si 3 N 4 layer and a subsequent 10-nm-thick Pt layer were deposited. The sample was cut into pieces along the wedge direction, thus providing many small samples with various Co layer thicknesses. X-ray diffraction measurement of a uniform Co(1.5 nm)/pt(1.5 nm) 10 multilayer showed that the Co/Pt multilayer had a well-defined periodicity, as shown in Fig. 1. The period calculated from the separation between the two main peaks agrees with the designed value of the bilayer thickness. The satellite diffraction peaks between the main peaks can be identified clearly. Co and Pt layers are found to have fcc 111 textures. Magnetic measurements were performed on a superconducting quantum interference device magnetometer at low temperatures and on a vibrating sample magnetometer at room temperature. In our experiments, it is found that the samples with a Co layer thickness smaller than 1.0 nm have a strong perpendicular anisotropy, and the out-of-plane hysteresis loops are squared. With increasing Co layer thickness, the perpendicular anisotropy decreases and the loop becomes slanted. All samples studied here can be saturated within the field of 10 koe, as shown by typical hysteresis loop at room temperature in Fig. 2. FMR measurements were carried out at room temperature, using a Bruker ER 200D-SRC EPR spectrometer, with a fixed microwave frequency of 9.78 GHz and a swept external dc field. The FMR spectra at various orientation of the dc magnetic field H were obtained by changing the azimuthal angle H in the film plane and the polar angle H. All spectra have a Lorentzian line shape. Thus an angular dependence of the resonance field and the peak-to-peak linewidth H pp were obtained. In experiments, a small uniaxial anisotropy in the film plane is demonstrated by the in-plane angular dependence of the resonance field. This uniaxial anisotropy is generally formed during deposition by the stray field FIG. 2. Typical hysteresis loops for Co(2.0 nm)/pt(1.0 nm) 8 at room temperature. from the sputtering gun. The easy axis is set to align along the x axis, i.e., H 0. For simplification, we only measured FMR spectra at various H with the external field in the x-z plane. For the samples with a Co layer thickness smaller than 1.0 nm, the FMR signal is very weak and the FMR peak is located near the background signal of the FMR cavity. In particular, the samples have an out-of-plane anisotropy, which does not favor the observation of the extrinsic magnetization relaxation. 8 Therefore, we mainly study the FMR properties of the Co/Pt multilayers with an in-plane anisotropy. IV. RESULTS AND DISCUSSION Figures 3 a 3 c show the representative out-of-plane angular dependence of the resonance field H RES and the linewidth H pp of the uniform resonance mode for Co/Pt multilayers as well as corresponding fitted results. For specific Co layer thicknesses, such as t Co 1.49 and 1.97 nm, the resonance field decreases with increasing H. With a decreasing Co layer thickness the resonance field decreases at H 0 but increases at H 90. In general, the measured H pp has the largest value at H 0 and goes through a minimum at H from 20 to 50. When the field is parallel or perpendicular to the film plane, H pp increases with decreasing Co layer thickness. The fitted results are discussed below. The experimental data in Fig. 3 a can be fitted to obtain the effective demagnetizing field 4 M eff and the Landé g factor by using Eqs. 3 5. As shown in Fig. 4 a, the effective demagnetizing field 4 M eff increases with decreasing 1/t Co as a linear function of 1/t Co, demonstrating an interface nature. When the Co layer thickness is smaller than a critical value, the 4 M eff is negative and an out-of-plane anisotropy occurs. Numerical calculations show that the surface anisotropy constant K S 0.43 erg/cm 2, close to other reported results. 17 The value of the second order anisotropy is found to be one order smaller than that of the first order one. Figure 4 b shows that for all samples the g factor is larger than 2.0 and decreases slightly with increasing Co layer thickness. The value of the extrapolated g factor when 134443-3

S. J. YUAN, L. SUN, H. SANG, J. DU, AND S. M. ZHOU PHYSICAL REVIEW B 68, 134443 2003 FIG. 3. The out-of-plane angular dependence of the measured resonance field ( and ) a and linewidth ( and ) b for Co(0 2.0 nm)/pt(1.0 nm) 8. The lines are the least-square fitted results by Eqs. 3 5 in a and by Eqs. 6 8 in b. c shows the fitted linewidth induced by the inhomogeneity and the intrinsic, and their sum for the sample with t Co 1.97 nm. FIG. 4. Dependence of the effective demagnetizing field on the inverse Co layer thickness a and the Landé g factor versus the Co layer thickness b. The line in a refers to the least-square fitted results, and that in b serves as a guide to the eye. t Co approaches infinity is equal to 2.05. This value is smaller than the bulk value 2.15 of fcc cobalt, 18 which could be related to the noncollinear alignment of the magnetization and the applied field. In principle, FMR experiments at higher frequency and magnetic field are required to prove this effect. However, it is shown that the g has the same deduced value at different microwave frequencies. 18 The effect of the noncollinear alignment can be excluded. The smaller value of the g factor should be related to the microstructure of the present Co/Pt multilayers. The variation of the g factor with Co layer thickness reflects the interfacial nature. Since L / S g 2 /2, 19 one can know that the orbital magnetic moment is not equal to zero and this additional orbital magnetic moment decreases with increasing Co layer thickness. Two possible sources contribute to the orbital magnetic moment in Co/Pt multilayers. First, a small value of orbital magnetic moment can be induced by a mixture of excited states into the ground state or by unquenched orbital angular momentum, 20 which commonly exists in bulk magnetic materials of transition metals or their alloys. Second, an additional orbital magnetic moment is induced by s-d hybridization at the Co/Pt interface. This has been recently observed and verified to be the cause of the perpendicular anisotropy at Co/Pt interface. 14 Therefore, the variation of the g factor can be explained in terms of the mixture of the excited and the ground states and the s-d hybridization at the Co/Pt interface. In order to see the contribution of the extrinsic magnetic relaxation, the contributions of the intrinsic magnetic relaxation and the broadening induced by the magnetic inhomogeneity to the linewidth are calculated. With the above determined values of 4 M eff and g, their contributions can be calculated by using Eqs. 3 8, in which, (4 M eff ), and H are adjustable parameters. The typical results are shown in Figs. 3 b and 3 c. Unambiguously, the measured linewidth cannot be explained by the intrinsic Gilbert damping and the inhomogeneity induced broadening and the two contributions have quite different angular dependence. Note that the intrinsic contribution has a maximum value near H 20 degrees, where H is found to have the largest value. Therefore, the noncollinear alignment of the magnetization and applied field leads to the angular dependence of the intrinsic contribution. In calculations, (4 M eff ) and H are not found to increase significantly with decreasing t Co. This means that the microstructure and magnetic inhomogeneity in the Co/Pt multilayers do not change much with the variation of the Co layer thickness. The damping coefficient changes significantly with t Co. So the enhancement of the damping coefficient is one of the major reasons for the rise in the linewidth H pp with decreasing Co layer thickness. Because the Gilbert damping factor G M S, the value of G can be calculated by the determined values of and. It is found to decrease with increasing t Co, as shown in Fig. 5. There are two possible mechanisms to explain the variation of the Gilbert damping factor. It is well known that G ( g) 2 (g 2) 2 as in bulk materials. 21 The inset of Fig. 5 shows that, although ( g) 2 and G are not proportional to 134443-4

INTERFACIAL EFFECTS ON MAGNETIC RELAXATION... PHYSICAL REVIEW B 68, 134443 2003 FIG. 5. Dependence of the determined G factor on the Co layer thickness in the Co/Pt multilayers. The inset shows the relationship between the G and the ( g) 2 in the Co/Pt multilayers. The dashed lines serve as a guide to the eye. FIG. 6. a The measured linewidth in the parallel geometry ( ) and in the perpendicular geometry ( ) and the least-square fitted results solid lines by Eqs. 6 8. The difference ( ) in the linewidth of the parallel geometry between the experimental and the fitted results that varies with the Co layer thickness is shown in b. The solid line in b refers to the calculated results by Eq. 9, based on the two-magnon scattering model, in which s 0.16 nm 2 and D 3.4 10 9 Oe cm 2. each other, they both decrease with increasing Co layer thickness in the present Co/Pt multilayers. Moreover, the variation of the g factor is related to the unquenched orbital magnetic moment and the s-d hybridization at Co/Pt interface. Therefore, the unquenched orbital magnetic moment and the Co/Pt s-d hybridization is one possible reason for the variation of the Gilbert damping factor G. As the second possible reason, the so-called interfacial nonlocal Gilbert damping effect makes the Gilbert damping factor decrease with increasing FM layer thickness. It has been explained as a result of the transfer of electron angular momentum from one FM layer to the neighboring FM layer in Fe/Au/Fe, 5 and of spin diffusion from the FM layer to the Pt layer in permalloy/cu/pt. 2 Since the coupling between the magnetization precession in neighboring FM layers demonstrates an interfacial characteristic, the Gilbert damping factor G and thus the induced additional linewidth decrease with increasing FM layer thickness. The nonlocal Gilbert damping and the unquenched orbital magnetic moment both decrease with increasing Co layer thickness, demonstrating an interfacial characteristic. Therefore, both of them should be considered in the explanations of the results in Fig. 5. Figure 6 a shows the measured and fitted values of the linewidth versus the Co layer thickness in the perpendicular and parallel geometries. Apparently, there is a big difference in the linewidth of the parallel geometry between the experimental and fitted results. In experiments, it is found that for specific samples the linewidth changes little with the orientation H of the applied field in the film plane. Therefore, the difference should not be induced by the in-plane uniaxial anisotropy in the film plane. The difference might come from an extrinsic magnetic relaxation, and thus is called H extrin. It is instructive to compare the characteristic of H extrin and the theoretical prediction of the two-magnon scattering model. On the one hand, H extrin is almost zero in the perpendicular geometry and is very large in the parallel geometry. At H 90, it decreases with increasing Co layer thickness. On the other hand, in the AM model based on the two-magnon scattering process, the FMR linewidth has the largest value in the parallel geometry and is zero in perpendicular geometry if the magnetic film exhibits an in-plane anisotropy. 8 In the parallel geometry, it is also expected to increase substantially as the magnetic film thickness decreases. Therefore, the variation of the linewidth difference, i.e., the contribution of the extrinsic magnetic relaxation matches the prediction of the two-magnon scattering model. Apparently, Fig. 6 b shows the calculated linewidth contributed from the two-magnon scattering process by using Eq. 9. In calculations, H RES, H K, and 4 M eff take above fitted values, s 0.16 nm 2 Ref. 3 and D 3.4 10 9 Oe cm 2. 22 The variation of the H extrin agrees with the calculated results qualitatively. The extrinsic magnetic relaxation does exist in the Co/Pt multilayers and the contribution can be explained in the frame of two-magnon scattering model. The deviation of the calculated results from the experimental data in Fig. 6 b is caused by the simplified assumption that D and s are fixed with the variation of the Co layer thickness. In reality, however, this is not true. For example, Fig. 7 shows that for Co/Pt multilayers with various Co layer thicknesses the spontaneous magnetization at low temperatures changes as a linear function of T 3/2. It is obvious that the slope B of the curve M T 3/2 decreases with increasing Co layer thickness. The slope for t Co 0.4 nm is several times larger than that of large Co layer thickness. Similar phenomena have been observed in other ultrathin films or magnetic multilayers. 23 This is because the surface or interface effect on the exchange stiffness becomes predominant 134443-5

S. J. YUAN, L. SUN, H. SANG, J. DU, AND S. M. ZHOU PHYSICAL REVIEW B 68, 134443 2003 layer thickness dependence of the linewidth caused by the two-magnon scattering, detailed dependencies of the surface roughness and the exchange stiffness constant on the Co layer thickness are required. As the FM layer thickness is very large, however, the exchange stiffness and the surface roughness will approach to constants, and thus the calculations become simple. V. CONCLUSION FIG. 7. a Linear dependence of the normalized spontaneous magnetization on T 3/2 for Co/Pt multilayers with different Co layer thicknesses and b the slope B vs the Co layer thickness. The lines refer to the linear fit in a and serve as a guide to the eye in b. for a small ferromagnetic FM layer thickness. 23 It is well known that the exchange stiffness constant D is proportional to B 3/2. Therefore, the exchange stiffness constant increases with increasing Co layer thickness. Moreover, the surface roughness is strongly dependent on the film layer thickness and the preparation condition. In sputtered Co/Pt multilayers, the surface roughness also increases with increasing Co layer thickness. 24 Therefore, in rigorous calculations of the Co We have prepared Co/Pt multilayers by sputtering, which have thick Co layers and exhibit an in-plane anisotropy. The out-of-plane FMR spectra were measured and analyzed by the LLG equation. The peak-to-peak linewidth H pp in parallel and perpendicular geometries decreases with increasing Co layer thickness. The angular dependence of the linewidth cannot be explained only in terms of the intrinsic Gilbert damping and the inhomogeneity induced broadening. The extrinsic magnetic relaxation must be taken into account. As a result of the interfacial effect, the Gilbert damping factor G and the extrinsic magnetic relaxation decrease with increasing Co layer thickness. The variation of the G factor is caused by an additional orbital magnetic moment and an interfacial nonlocal Gilbert damping effect. The extrinsic magnetic relaxation is consistent with the prediction of the two-magnon scattering model. These phenomena exhibit an apparent interfacial characteristic. ACKNOWLEDGMENTS We acknowledge S. Mizukami for fruitful discussion. This work was supported by the National Science Foundation of China Grant Nos. 1017404 and 60271013, the State Key Project of Foundational Research Grant Nos. 2002C8613504 and 001CB610602, and JSNSF. *Corresponding author. Email address: shimingzhou@yahoo.com 1 B. Heinrich, in Ultrathin Magnetic Structures II, edited by B. Heinrich and J. A. C. Bland Springer, Berlin, 1994, Chap. 3. 2 S. Mizukami, Y. Ando, and T. Miyazaki, Phys. Rev. B 66, 104413 2002. 3 W. Platow, A.N. Anisimov, G.L. Dunifer, M. Farle, and K. Baberschke, Phys. Rev. B 58, 5611 1998. 4 L. Berger, J. Appl. Phys. 90, 4632 2001. 5 R. Urban, G. Woltersdorf, and B. Heinrich, Phys. Rev. Lett. 87, 217204 2001. 6 R.D. McMichael, M.D. Stiles, P.J. Chen, and W.F. Egelhoff, Jr., J. Appl. Phys. 83, 7037 1998. 7 C. Chappert, K.L. Dang, P. Beauvillain, H. Hurdequint, and D. Renard, Phys. Rev. B 34, 3192 1986. 8 R. Arias and D.L. Mills, Phys. Rev. B 60, 7395 1999. 9 A. Azevedo, A.B. Oliveira, F.M. de Aguiar, and S.M. Rezende, Phys. Rev. B 62, 5331 2000. 10 M. Sparks, R. Loudon, and C. Kittel, Phys. Rev. 122, 791 1961. 11 R.C. Flectcher, R.C. Lcraw, and E.G. Spencer, Phys. Rev. 117, 955 1960. 12 C. E. Patton, in Magnetic Oxides, edited by D. J. Craik Wiley, London, 1975, Chap. 10, p. 575. 13 J. Dubowik and F. Stobiecki, J. Magn. Magn. Mater. 242, 538 2002. 14 N. Nakajima, T. Koide, T. Shidara, H. Miyauchi, H. Fukutani, A. Fujimori, K. Iio, T. Katayama, M. Nyvlt, and Y. Suzuki, Phys. Rev. Lett. 81, 5229 1998. 15 P.F. Carcia, J. Appl. Phys. 63, 5066 1988. 16 H. Suhl, Phys. Rev. 97, 555 1955. 17 M.T. Johnson, P.J.H. Bloemen, F.J.A. den Broeder, and J.J. de Vries, Rep. Prog. Phys. 59, 1409 1996. 18 J. Pelzl, R. Meckenstock, D. Sponddig, F. Schreiber, J. Pflaum, and Z. Frfait, J. Phys. Condens. Matter 15, S451 2003. 19 C. Kittel, Phys. Rev. 76, 743 1949. 20 K. Baberschke, Appl. Phys. A: Mater. Sci. Process. 62, 417 1996. 21 R.J. Elliott, Phys. Rev. 96, 266 1954. 22 X. Liu, M.M. Steiner, R. Sooryakumar, G.A. Prinz, R.F.C. Farrow, and G. Harp, Phys. Rev. B 53, 12166 1996. 23 C. Aron, P. Auric, and C. Jeandey, Solid State Commun. 79, 217 1991. 24 Z.G. Li, P.F. Carcia, and Y. Cheng, J. Appl. Phys. 73, 2433 1993. 134443-6