E-MAIL: DISCRETE SEMICONDUCTORS DATA SHEET March 1993
E-MAIL: FEATURES Internal matching for an optimum wideband capability and high gain Emitter-ballasting resistors for optimum temperature profile Gold metallization ensures excellent reliability. DESCRIPTION NPN silicon planar epitaxial transistor encapsulated in a 6-lead SOT171 flange envelope with a ceramic cap. It is intended for common emitter, class-ab operation in cellular radio base stations in the 96 MHz frequency band. All leads are isolated from the mounting base. QUICK REFERENCE DATA RF performance at T h =25 C in a common emitter test circuit. MODE OF OPERATION PIN CONFIGURATION f (MHz) V CE (V) P L (W) G p (db) c.w. class-ab 96 2 > 11.5 > 5 WARNING Product and environmental safety - toxic materials η C (%) This product contains beryllium oxide. The product is entirely safe provided that the BeO disc is not damaged. All persons who handle, use or dispose of this product should be aware of its nature and of the necessary safety precautions. After use, dispose of as chemical or special waste according to the regulations applying at the location of the user. It must never be thrown out with the general or domestic waste. PINNING - SOT171 PIN DESCRIPTION k, halfpage 1 emitter 2 emitter 3 base collector 5 emitter 6 emitter 1 3 5 2 6 b MBB12 c e Top view MBA931-1 Fig.1 Simplified outline and symbol. March 1993 2
E-MAIL: LIMITING VALUES In accordance with the Absolute Maximum System (IEC 13). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT V CBO collector-base voltage open emitter 5 V V CEO collector-emitter voltage open base 3 V V EBO emitter-base voltage open collector V I C collector current DC or average value 1.25 A P tot total power dissipation T mb =25 C 17 W T stg storage temperature range 65 15 C T j junction operating temperature 2 C 5 I C (A) MRA366 handbook, 25 halfpage P tot (W) 2 (3) (2) MRA365 1 T h = 7 o C T mb = 25 o C 15 (1) (1) 1 5.1 1 1 V CE (V) 1 2 2 6 8 1 12 T h ( o C) (1) Second breakdown limit (independent of temperature). Fig.2 DC SOAR. (1) Continuous DC operation. (2) Continuous RF operation. (3) Short time operation during mismatch. Fig.3 Power/temperature derating. THERMAL RESISTANCE SYMBOL PARAMETER CONDITIONS MAX. UNIT R th j-mb from junction to mounting base T mb =25 C; P dis =17W 1.3 K/W R th mb-h from mounting base to heatsink. K/W March 1993 3
E-MAIL: CHARACTERISTICS T j = 25 C. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT V (BR)CBO collector-base breakdown voltage open emitter; 5 V I C =ma V (BR)CEO collector-emitter breakdown voltage open base; 3 V I C =3mA V (BR)EBO emitter-base breakdown voltage open collector; V I E =2mA I CES collector-emitter leakage current V BE =; 1 ma V CE =3V h FE DC current gain V CE =25V; 2 I C = 3 ma C c collector capacitance V CB =25V; 6.6 8 pf I E =I e =; f = 1 MHz C re feedback capacitance V CE =25V; I C = 2 ma; f = 1 MHz 3.5.5 pf handbook, 5 halfpage MRA361 2 MRA358 h FE V CE = 25 V C c (pf) 3 5 V 1 2 1.2..6.8 1 I C (A) 1 2 V CB (V) 3 I E =i e = ; f = 1 MHz. Fig. DC current gain as a function of collector current, typical values. Fig.5 Collector capacitance as a function of collector-base voltage, typical values. March 1993
E-MAIL: APPLICATION INFORMATION RF performance at T h =25 C in a common emitter test circuit, R th mb-h =. K/W. MODE OF OPERATION f (MHz) V CE (V) I CQ (ma) c.w. class-ab 96 2 5 > 11.5 typ. 13 P L (W) G P (db) η c (%) > 5 typ. 8 96 26 5 typ. 1 typ. 5 16 G P (db) 12 G P MRA359 8 η (%) 6 8 P L (W) 6 V CE = 26 V MRA36 2 V 8 η 2 2 2 6 8 P L (W) 2 6 8 P IN (mw) Class-AB operation; I CQ =5mA ; f = 96 MHz; V CE =2V. Class-AB operation; I CQ =5mA ; f = 96 MHz. Fig.6 Gain and efficiency as functions of load power, typical values. Fig.7 Load power as a function of drive power, typical values. Ruggedness in class-ab operation The is capable of withstanding a full load mismatch corresponding to VSWR = 5:1 through all phases at rated output power under the following conditions: V CE = 2 V; f = 96 MHz; T h =25 C; R th mb-h =. K/W. March 1993 5
E-MAIL: handbook, full pagewidth R1 C6 C8 R2 V B C7 L6 L5 L7 L8 C9 C1 V CC 5 Ω input C1 C5 D.U.T. C12 L1 L2 L3 L L9 L1 L11 L12,,,,,,,,,,,, C15 5 Ω output C2 C3 C C11 C13 C1 MDA537 Fig.8 Class-AB test circuit at f = 96 MHz. List of components (see test circuit) COMPONENT DESCRIPTION VALUE DIMENSIONS C1, C6, C7, C8, multilayer ceramic chip capacitor C15 C2, C3, C13, film dielectric trimmer C1 C, C5 multilayer ceramic chip capacitor (note 1) 33 pf 1. to 5.5 pf 5.1 pf CATALOGUE NO. 2222 89 91 C9 35 V solid aluminum capacitor 2.2 µf 2222 128 5228 C1 multilayer ceramic chip capacitor 3 1 nf in parallel C11, C12 multiplayer ceramic chip capacitor (note 2) 6.2 pf L1, L12 stripline (note 3) 5 Ω 9 mm 2. mm L2, L11 stripline (note 3) 5 Ω 23 mm 2. mm L3 stripline (note 3) 5 Ω 16 mm 2. mm L stripline (note 3) 3 Ω 3mm 3mm L5 3 turns enamelled.8 mm copper wire int. dia. 3 mm; length 5 mm; leads 2 mm 5 mm L6, L8 grade 3B Ferroxcube wideband HF choke 312 2 3662 L7 turns enamelled.8 mm copper wire int. dia. mm; length 5 mm; leads 2 mm 5 mm L9 stripline (note 3) 3 Ω 1.5 mm 3mm L1 stripline (note 3) 5 Ω.5 mm 2. mm R1, R2. W metal film resistor 1 Ω 2322 151 719 March 1993 6
E-MAIL: Notes 1. American Technical Ceramics (ATC) capacitor, type 1A or other capacitor of the same quality. 2. American Technical Ceramics (ATC) capacitor, type 1B or other capacitor of the same quality. 3. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric (ε r = 2.2); thickness 1 32 inch. handbook, full pagewidth 122 mm copper straps copper straps rivets rivets 7 mm rivets M2 rivets copper straps copper straps M3 C7 L6 L8 R1 C6 C8 C1 R2 C9 C1 L1 L5 C5 L2 L3 L L9 L7 C12 L1 L11 C15 L12 C3 C3 C C11 C13 C1 MDA536 The circuit and components are situated on one side of a copper-clad PTFE fibre-glass board; the other side is fully metallized and serves as a ground plane. Connections are made by means of fixing screws, hollow rivets and copper straps around the board and under the emitters, to provide a direct contact between the components side and the ground plane. Fig.9 Component layout for 96 MHz class-ab test circuit. March 1993 7
E-MAIL: handbook, 1 halfpage Z i (Ω) 8 MRA362 16 Z L (Ω) 12 X L MRA363 6 r i x i 8 R L 2 8 88 92 96 1 f (MHz) 8 88 92 96 1 f (MHz) Class-AB operation; V CE = 2 V; I CQ = 5 ma; P L = W; T h =25 C. Class-AB operation; V CE = 2 V; I CQ = 5 ma; P L = W; T h =25 C. Fig.1 Input impedance (series components) as a function of frequency, typical values. Fig.11 Load impedance (series components) as a function of frequency, typical values. 16 G P (db) MRA36 12 8 Z i Z L MBA51 8 88 92 96 1 f (MHz) Class-AB operation; V CE = 2 V; I CQ = 5 ma; P L = W; T h =25 C. Fig.12 Definition of transistor impedance. Fig.13 Power gain as a function of frequency, typical values. March 1993 8
E-MAIL: PACKAGE OUTLINE Flanged ceramic package; 2 mounting holes; 6 leads SOT171A D A F D 1 U 1 B q C H 1 w 2 M C b 1 c 2 6 H U 2 E 1 E A 1 3 5 p w 1 M A B b w 3 M Q e 5 1 mm scale DIMENSIONS (millimetre dimensions are derived from the original inch dimensions) UNIT A b b 1 c D D 1 E E 1 e F H H 1 p Q q U 1 U 2 w 1 w 2 w 3 mm 6.81 6.7 2.15 1.85 3.2 2.89.16.7 9.25 9. 9.3 8.99 5.95 5.7 6. 5.7 3.58 3.5 2.5 11.31 1.5 9.27 9.1 3.3 3.17.32.11 18.2 2.9 2.63 6. 5.7.51 1.2.26 inches.268.239.85.73.126.6.11.3.36.356.366.35.23.226.236.22.1.12.1.5.15.365.355.135.125.17.162.725.98.97.236.22.2..1 OUTLINE VERSION REFERENCES IEC JEDEC EIAJ EUROPEAN PROJECTION ISSUE DATE SOT171A 97-6-28 March 1993 9
E-MAIL: DEFINITIONS Data Sheet Status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 13). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. March 1993 1