Lecture 5 Junction characterisation
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1 Lecture 5 Junction characterisation Jon Major October 2018
2 The PV research cycle Make cells Measure cells Despair Repeat % 4.9% Data Current density (ma/cm 2 ) Voltage (V)
3 Lecture Outline Key junction characterisation techniques Analysis of current voltage (J-V) curves External quantum efficiency (EQE) measurements Capacitance voltage (C-V) measurements
4 J-V analysis (J-V) Parasitic resistances Perfect p-n junction Real p-n junction A good device should have low R S And high R Sh
5 J-V analysis (J-V) R s R sh Causes of high R S values Overly thick absorber layer Low conductivity TCO Low doping levels Low FF Causes of low R Sh values Pinholes in layers Weak diode regions Low V OC
6 J-V analysis (J-V)
7 J-V analysis (J-V) To determine R sh fit to straight line portion of JV curve in reverse bias A B R s can be more difficult to accurately determine. Two common methods Fit to forward bias region of curve Measure change as function of light bias
8 J-V analysis (J-V) If a non-ohmic contact is formed this results in the creation of a back contact junction diode. Roll-over This back-contact diode opposes the main junction diode and leads to the phenomenon of roll-over at high forward bias.
9 J-V analysis (J-V) Ohmic contact For a p-type semiconductor can create an ohmic contact if; Metal work function Electron affinity Bandgap Schottky barrier If this condition is not met we introduce a back contact Schottky barrier Back contact barrier height
10 J-V-T analysis K K 313 K Current density (macm -2 ) K 293 K 283 K K Voltage (V) Influence of barrier height changes as a function of temperature By measuring J-V curves as a function of temperature we can extract the barrier height
11 J-V-T analysis Series resistance varies with temperature via R S R 0 R T 0 T C T 2 b exp( kt ) Ohmic resistance Ohmic temperature dependence Measure R S Fitting to exponential region allows us to extract a value in ev for the barrier height. Generally anything < 0.3eV is considered a good contact
12 Accurate J-V measurement: A cautionary tale
13 High V oc is reliable. J sc values are very sensitive to calibration or contact size errors. Contacts should be minimum of 0.25cm 2 If it looks to good to be true it usually is!
14 Efficiency tables Jan 2015 L6
15 Efficiency tables Jan 2015 Efficiency tables Jul 2015
16 This is becoming a big issue!
17 External quantum efficiency (EQE)
18 External quantum efficiency (EQE) Glass AM1.5 AM1.5 Transparent conductive oxide (e.g. ITO) Window layer (e.g. CdS) Absorber layer (e.g. CdTe) J SC E( ) hc
19 External quantum efficiency (EQE) J () Define the EQE as the ratio of photons in to current generated EQE J J cell photon A 100% EQE means every photon that strikes the cell generates an electron hole pair which flows through the external circuit
20 External quantum efficiency (EQE) Theoretical case Normalised EQE Area under curve proportional to J SC Wavelength (nm)
21 External quantum efficiency (EQE) Most solar cell technologies display same typical top hat EQE curve shape
22 External quantum efficiency (EQE)
23 External quantum efficiency (EQE) Glass Transparent conductive oxide (e.g. ITO) Window layer (e.g. CdS) E( ) hc Absorber layer (e.g. CdTe) J=0 Region 1: E photon <E Asorber
24 External quantum efficiency (EQE) Normalised EQE Wavelength (nm)
25 External quantum efficiency (EQE) Glass Transparent conductive oxide (e.g. ITO) Window layer (e.g. CdS) E( ) hc Absorber layer (e.g. CdTe) J 0 Region 2: E photon >E Asorber
26 External quantum efficiency (EQE) Normalised EQE Wavelength (nm)
27 External quantum efficiency (EQE) Normalised EQE Absorber bandgap hc E( ) Wavelength (nm)
28 External quantum efficiency (EQE) Glass Transparent conductive oxide (e.g. ITO) Window layer (e.g. CdS) E( ) hc Absorber layer (e.g. CdTe) J=0 Region 3: E photon >E window
29 External quantum efficiency (EQE) Normalised EQE Wavelength (nm)
30 External quantum efficiency (EQE) Normalised EQE Window bandgap 0.2 E( ) hc Wavelength (nm)
31 External quantum efficiency (EQE) Real cells
32 External quantum efficiency (EQE) Optical losses High efficiency Low efficiency Uniform reduction in EQE signal across wavelength range is an indication of optical losses i.e. reflection loss, optical blockages etc. Can also be an indication of poor system calibration.
33 External quantum efficiency (EQE) window/ n-type layer losses nm CdS 250nm CdS 200nm CdS High efficiency Normalised EQE High efficiency Lower efficiency 0.2 Lower efficiency Wavelength (nm) Reduced window layer thickness allows more light transmission to absorber Higher bandgap n-type layer shifts absorption edge
34 External quantum efficiency (EQE) Deep penetration losses If absorber layer is thin or depletion width is narrow then longer wavelength photons have an increased probability of not contributing to photocurrent. See a decrease in EQE for longer wavelengths.
35 External quantum efficiency (EQE) Graded bandgap/back surface recombination In multi component materials such as CZTS can get a broad cut-off region due to changes in the absorber bandgap. This often signifies the material isn t single phase and reduces the efficiency. Can also indicate enhanced recombination close to the back surface.
36 External quantum efficiency (EQE) In certain situations see a complete change in EQE that corresponds to very low performance See reasonable EQE response near absorber band-edge but low response at all other wavelengths
37 External quantum efficiency (EQE) This is a buried junction response due to both p and n type regions being present in the absorber layer
38 Capacitance Voltage analysis (C-V) Capacitance-voltage measurements are useful in deriving particular parameters about PV devices. Depending on the type of solar cell, capacitance-voltage (C-V) measurements can be used to derive parameters such as the doping concentration and the built-in voltage of the junction. Liverpool CV/Admittance spectroscopy system A capacitance-frequency (C-f) sweep can be used to provide information on the existence of traps in the depletion region.
39 Capacitance Voltage analysis (C-V) Can treat a p-n junction as a capacitor - depletion region sandwiched between two plates. Can define the junction capacitance per unit area as C j dq dv dq dq W d s s W Space charge distribution Where W is the width of the depletion region and ε S is the semiconductor permittivity Field distribution
40 Capacitance Voltage analysis (C-V) We generally assume a one sided abrupt junction for calculations. This is due to the higher doping densities in the n- type layer meaning the depletion region lies within the p-type layer For a one sided junction we can determine the depletion width as W 2 sv qn a Electron charge Acceptor doping density Using previous equation we get the relation 1 C 2 2V q sn a Hence we can get N a from a plot of 1/C 2 vs V
41 Capacitance Voltage analysis (C-V) Worked example CdTe solar cell Measure the capacitance response of the cell as a function of applied bias. C-V measurements can be made either forward-biased or reverse biased. However, when the cell is forward-biased, the applied DC voltage must be limited; otherwise non-ohmic back contacts can alter the signal. C vs. V plot 1/C 2 vs. V plot 8e-9 3.5e+17 Capacitance (F) 7e-9 6e-9 5e-9 4e-9 1/C 2 (F -2 ) 3.0e e e e+17 Determine gradient of straight line fit around V=0 3e-9 1.0e+17 2e-9 5.0e+16 1e V (volts) V (volts)
42 Capacitance Voltage analysis (C-V) p-type doping density is given by 2 Na 1 d( 2 ) C q 2 s A dv We have included a contact area term A So for a CdTe cell with 5mm diameter square contacts we measured a the slope of the 1/C 2 plot to be 2.7x d( C 2 ) dv V F A m s q C 11 Fm 1 So CdTe doping density is N a m cm 3
43 LX Summary Key junction characterisation techniques JV R S and R SH can infer the issue J-V-T Back contact barrier height measurements EQE Layer behaviour and optical losses CV - doping density of p-type layer
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