EE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions

Size: px
Start display at page:

Download "EE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions"

Transcription

1 EE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions Prof. Ming C. Wu 511 Sutardja Dai Hall (SDH) 1

2 pn Junction p-type semiconductor in contact with n-type Basic building blocks of semiconductor devices Diodes, Bipolar junction transistors (BJT), Metal-oxide-semiconductor field effect transistors (MOSFET) 2

3 Built-in Voltage Example: A pn junction with n-doping of cm 3 and p-doping of cm 3 " V 0 = V T ln N N % A D 2 ' = 0.88 V # n i & At pn junction, free electrons from n-side "recombine" with free holes from p-side. "Depletion region" has no electrons or holes, but has fixed (immobile) charges from donor and acceptor ions The fixed charges establish an electric field, and create a potential difference between p- and n-sides. This potential is called "built-in potential"! V 0 = V T ln N D # 2 & " n i % V T : thermal voltage (= 26 mv at room temp) : acceptor concentration on p-side N D : donor concentration on n-side n i : intrinsic carrier concentration (= cm 3 at room temp) 3

4 Simplified Analysis of pn Junction Gauss Law: E # da = ' ( ) Electrical potential: V = 1 23 E x / dx Electric Field E max 4

5 Detailed Electrostatic Analysis of pn Junction (1) Electric Field Emax " Charge density: q(x) = # % Gauss Law: In one dimension: 5 E!" da!!" # = Q ε S, qa, x p < x < 0 qan D, 0 < x < x n ε S =11.7ε 0 ε 0 = F/cm E(x)A E( x p )A = qa(x + x p ) ε S E( x p ) = 0 (in charge neutral region, = p) " E(x) = # % Note: q (x + x p ) ε S, x p < x < 0 qn D (x x n ) ε S, 0 < x < x n x p = N D x n (charge equality) Maximum electrical field occurs at x = 0 (junction) E max = q x p ε S = qn Dx n ε S

6 Detailed Electrostatic Analysis of pn Junction (2) Electric Field " E(x) = # % V(x) = " V(x) = # % x x p q (x + x p ) ε S, x p < x < 0 qn D (x x n ) ε S, 0 < x < x n E(x')dx' q V(x n ) = q q x 2 2 ( p + N D x n ) qn D x 2 2 ( p + N D x n ) = V 0 ( x + x p ) 2, x p < x < 0 ( x x n ) 2, 0 < x < x n E max x p = N D + N D W, x n = + N D W W = 2e S q ' * ),V 0 : Depletion Width ( N D + 6

7 Depletion Width Under Bias W = 2e S q! # " N D & V 0 V % ( ) V is the applied voltage to the pn junction, it's positive for forward bias and negative for reverse bias. Depletion width is widened in reverse bias 7

8 Current-Voltage (I-V) Characteristics Under forward bias, minority carriers at the edge of depletion region is boosted up by (e V /V T 1) : p n (x) = p n0 + p n0 e V /V T ( 1 ) e x x n L p L p : hole diffusion length in n-type Hole diffusion current density on n-side dp J p = qd n (x) p = q D p p n0 e V /V ( T 1) dx x=x n L p Similarly, electron diffusion current density in p-side dn J n = qd p (x) n = q D n n p0 e V /V ( T 1) dx x= x p L n Total current : ( ) A = A q D p I = J p + J n I = I S e V /V T 1 " # L p p n0 + q D % n n p0 L ' ev /V T ( 1 ) n & 2 D ( ) where I S = Aqn p i " + D % n # L p N D L n N ' A & 8

9 I-V Curve I = I S e V /V T ( 1 ) where " 2 D I S = Aqn p i + # L p N D D % n L n N ' A & 9

10 Capacitance in pn Junction (1): Depletion Capacitance (Mainly Reverse Bias) Parallel plate capacitance: C j = ε sa W Plate separation, W, is voltage dependent: W = 2ε s q N D V 0 + V R Variable capacitance: C j V = C j0 1 + V R V 0 10

11 Capacitance in pn Junction (2): Diffusion Capacitance (Forward Bias) Extra minority carriers stored outside junction under forward bias Q p = Aq shaded area under p n (x) Q p = Aq p n0 e V /V T ( 1 ) e x x n L p dx x n ( ) = L 2 p Q p = AqL p p n0 e V /V T 1 D p I p = τ p I p L p 2 D p has unit of time, its physical meaning is minority carrier lifetime: τ p = L 2 p D p 11 Similarly, Q n = τ n I n Total charge stored : Q = τ p I p +τ n I n = τ T I τ T is mean transit time These stored charges correspond to another nonlinear capacitor call "diffusion capacitance": ( ) C d = dq dv = d τ T I dv = τ T di dv C ' d = τ * T ),I ( + V T

12 Summary of pn Junction! Built-in potential : V 0 = V T ln# N D 2 " n i Under forward bias : ( ) I-V curve : I = I S e V /V T 1! Diffusion capacitance : C d = τ T # &I " % Under revserse bias : V T & % Negligible current, I = I S Depletion capacitance : C j = Other important parameter : Depletion Width: W = 2e S q! # " C j0 1+ V R V N D & V 0 V % ( ) 12

13 Basic Semiconductor Fabrication 13

14 Economy of Scale 300mm and 450mm Si Wafers Current: 300mm wafers Next gen: 450mm wafers 200mm wafers are still workhorse, particularly for IoT 300mm-wafers/ Economy of scale Full CMOS has 60+ photomasks, and yet chip cost almost nothing 1K for 200mm /mm 2 10K for 300mm /mm 2 14

15 Basic Semiconductor Fabrication Process Learn more in EE

16 State of the Art Lithography Machine (EUV: Extreme Ultra Violet) 16

17 State of the Art Lithography Machine (EUV: Extreme Ultra Violet) 17

18 Microfabrication (cont d) 18

19 Microfabrication (cont d) 19

20 Microfabrication (cont d) 20

21 Modern CMOS IC Cross Section Intel 14nm Broadwell chip, side-on, showing all 13 layers 21

22 Appendix Rigorous derivation of pn junction potential Rigorous derivation of junction capacitance 22

23 " E(x) = # % V(x) = x x p Rigorous Derivation of pn Junction Potential q (x + x p ) ε S, x p < x < 0 qn D (x x n ) ε S, 0 < x < x n E(x')dx' (1) for x p < x < 0 :V(x) = E(x')dx' = x x p x x p q (x'+ x p ) dx' 23 ε S = q x'=x ( x'+ x p ) 2 x'= x p = q ( x + x p ) 2 (2) for 0 < x < x n : Because E(x) has different expression for x < 0 and x > 0, the integration should be performed in two separate ranges, first from x p to 0, and then from 0 to x. We can use V(x = 0) from the above equation for the first intgration. Therefore, V(x) = q = q x p x 2 qn D(x' x n ) dx' x p 0 ε S ' 2 qn D(x x n ) 2 ) ( Built-in potential : qn 2 Dx n = q *, = q + V 0 = V(x n ) = q x 2 p qn D(x' x n ) 2 x 0 x 2 p + qn 2 Dx n qn D(x x n ) 2 x 2 2 ( p + N D x n )

24 Rigorous Derivation of Junction Capacitance In comparision, for a "linear" (normal) capacitor: Total charge Ain depletion width at V = -V R N Q J = AqN D x n = Aq D W + N D W = 2e S q! # " N D & V 0 +V R % ( ) As bias voltage change, the amount of charge in the junction change. This is a "nonlinear" capacitor. The capacitance value is C j = dq J dv R = Aq N D + N D C j = A ε S q 2! N D # & " + N D % At zero bias, V R = 0 C j0 = A ε Sq 2! N D # & " + N D % 2e S q! # " 1 ( V 0 +V R ) 1 V N D & d % dv Note: ( V 0 +V R ) C j = ε S A W C = Q V is a constant Therefore at V = -V R, C j = 24 C j0 1+ V R V 0 This is a variable capacitor, controllable by voltage!

Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes

Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes Problem 1: Semiconductor Fundamentals [30 points] A uniformly doped silicon sample of length 100µm and cross-sectional area 100µm 2

More information

Lecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005

Lecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005 6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 15-1 Lecture 15 - The pn Junction Diode (I) I-V Characteristics November 1, 2005 Contents: 1. pn junction under bias 2. I-V characteristics

More information

Diodes. anode. cathode. cut-off. Can be approximated by a piecewise-linear-like characteristic. Lecture 9-1

Diodes. anode. cathode. cut-off. Can be approximated by a piecewise-linear-like characteristic. Lecture 9-1 Diodes mplest nonlinear circuit element Basic operation sets the foundation for Bipolar Junction Transistors (BJTs) Also present in Field Effect Transistors (FETs) Ideal diode characteristic anode cathode

More information

For the following statements, mark ( ) for true statement and (X) for wrong statement and correct it.

For the following statements, mark ( ) for true statement and (X) for wrong statement and correct it. Benha University Faculty of Engineering Shoubra Electrical Engineering Department First Year communications. Answer all the following questions Illustrate your answers with sketches when necessary. The

More information

Lecture 16 - The pn Junction Diode (II) Equivalent Circuit Model. April 8, 2003

Lecture 16 - The pn Junction Diode (II) Equivalent Circuit Model. April 8, 2003 6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 16-1 Lecture 16 - The pn Junction Diode (II) Equivalent Circuit Model April 8, 2003 Contents: 1. I-V characteristics (cont.) 2. Small-signal

More information

Lecture 16 The pn Junction Diode (III)

Lecture 16 The pn Junction Diode (III) Lecture 16 The pn Junction iode (III) Outline I V Characteristics (Review) Small signal equivalent circuit model Carrier charge storage iffusion capacitance Reading Assignment: Howe and Sodini; Chapter

More information

PN Junction and MOS structure

PN Junction and MOS structure PN Junction and MOS structure Basic electrostatic equations We will use simple one-dimensional electrostatic equations to develop insight and basic understanding of how semiconductor devices operate Gauss's

More information

1st Year-Computer Communication Engineering-RUC. 4- P-N Junction

1st Year-Computer Communication Engineering-RUC. 4- P-N Junction 4- P-N Junction We begin our study of semiconductor devices with the junction for three reasons. (1) The device finds application in many electronic systems, e.g., in adapters that charge the batteries

More information

Section 12: Intro to Devices

Section 12: Intro to Devices Section 12: Intro to Devices Extensive reading materials on reserve, including Robert F. Pierret, Semiconductor Device Fundamentals EE143 Ali Javey Bond Model of Electrons and Holes Si Si Si Si Si Si Si

More information

Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline

Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline 6.012 - Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline Review Depletion approimation for an abrupt p-n junction Depletion charge storage and depletion capacitance

More information

Lecture 20 - p-n Junction (cont.) October 21, Non-ideal and second-order effects

Lecture 20 - p-n Junction (cont.) October 21, Non-ideal and second-order effects 6.70J/3.43J - Integrated Microelectronic Devices - Fall 00 Lecture 0-1 Lecture 0 - p-n Junction (cont.) October 1, 00 Contents: 1. Non-ideal and second-order effects Reading assignment: del Alamo, Ch.

More information

Section 12: Intro to Devices

Section 12: Intro to Devices Section 12: Intro to Devices Extensive reading materials on reserve, including Robert F. Pierret, Semiconductor Device Fundamentals Bond Model of Electrons and Holes Si Si Si Si Si Si Si Si Si Silicon

More information

L03: pn Junctions, Diodes

L03: pn Junctions, Diodes 8/30/2012 Page 1 of 5 Reference:C:\Users\Bernhard Boser\Documents\Files\Lib\MathCAD\Default\defaults.mcd L03: pn Junctions, Diodes Intrinsic Si Q: What are n, p? Q: Is the Si charged? Q: How could we make

More information

EE105 Fall 2015 Microelectronic Devices and Circuits. pn Junction

EE105 Fall 2015 Microelectronic Devices and Circuits. pn Junction EE105 Fall 015 Microelectroic Devices ad Circuits Prof. Mig C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH 6-1 Juctio -tye semicoductor i cotact with -tye Basic buildig blocks of semicoductor devices

More information

Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005

Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005 6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005

More information

UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences

UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences EE 105: Microelectronic Devices and Circuits Spring 2008 MIDTERM EXAMINATION #1 Time

More information

Lecture 2. OUTLINE Basic Semiconductor Physics (cont d) PN Junction Diodes. Reading: Chapter Carrier drift and diffusion

Lecture 2. OUTLINE Basic Semiconductor Physics (cont d) PN Junction Diodes. Reading: Chapter Carrier drift and diffusion Lecture 2 OUTLIE Basic Semiconductor Physics (cont d) Carrier drift and diffusion P unction Diodes Electrostatics Caacitance Reading: Chater 2.1 2.2 EE105 Sring 2008 Lecture 1, 2, Slide 1 Prof. Wu, UC

More information

Bipolar junction transistor operation and modeling

Bipolar junction transistor operation and modeling 6.01 - Electronic Devices and Circuits Lecture 8 - Bipolar Junction Transistor Basics - Outline Announcements Handout - Lecture Outline and Summary; Old eam 1's on Stellar First Hour Eam - Oct. 8, 7:30-9:30

More information

EE105 Fall 2014 Microelectronic Devices and Circuits. NMOS Transistor Capacitances: Saturation Region

EE105 Fall 2014 Microelectronic Devices and Circuits. NMOS Transistor Capacitances: Saturation Region EE105 Fall 014 Microelectronic Devices and Circuits Prof. Ming C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH) 1 NMOS Transistor Capacitances: Saturation Region Drain no longer connected to channel

More information

ECE PN Junctions and Diodes

ECE PN Junctions and Diodes ECE 342 2. PN Junctions and iodes Jose E. Schutt-Aine Electrical & Computer Engineering University of Illinois jschutt@emlab.uiuc.edu ECE 342 Jose Schutt Aine 1 B: material dependent parameter = 5.4 10

More information

6.012 Electronic Devices and Circuits

6.012 Electronic Devices and Circuits Page 1 of 1 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.12 Electronic Devices and Circuits Exam No. 1 Wednesday, October 7, 29 7:3 to 9:3

More information

Semiconductor Physics fall 2012 problems

Semiconductor Physics fall 2012 problems Semiconductor Physics fall 2012 problems 1. An n-type sample of silicon has a uniform density N D = 10 16 atoms cm -3 of arsenic, and a p-type silicon sample has N A = 10 15 atoms cm -3 of boron. For each

More information

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE15 Spring 28 Lecture

More information

FIELD-EFFECT TRANSISTORS

FIELD-EFFECT TRANSISTORS FIEL-EFFECT TRANSISTORS 1 Semiconductor review 2 The MOS capacitor 2 The enhancement-type N-MOS transistor 3 I-V characteristics of enhancement MOSFETS 4 The output characteristic of the MOSFET in saturation

More information

ECE-342 Test 2 Solutions, Nov 4, :00-8:00pm, Closed Book (one page of notes allowed)

ECE-342 Test 2 Solutions, Nov 4, :00-8:00pm, Closed Book (one page of notes allowed) ECE-342 Test 2 Solutions, Nov 4, 2008 6:00-8:00pm, Closed Book (one page of notes allowed) Please use the following physical constants in your calculations: Boltzmann s Constant: Electron Charge: Free

More information

PN Junctions. Lecture 7

PN Junctions. Lecture 7 Lecture 7 PN Junctions Kathy Aidala Applied Physics, G2 Harvard University 10 October, 2002 Wei 1 Active Circuit Elements Why are they desirable? Much greater flexibility in circuit applications. What

More information

Semiconductor Device Physics

Semiconductor Device Physics 1 emiconductor Device Physics Lecture 8 http://zitompul.wordpress.com 2 0 1 3 emiconductor Device Physics 2 M Contacts and chottky Diodes 3 M Contact The metal-semiconductor (M) contact plays a very important

More information

Extensive reading materials on reserve, including

Extensive reading materials on reserve, including Section 12: Intro to Devices Extensive reading materials on reserve, including Robert F. Pierret, Semiconductor Device Fundamentals EE143 Ali Javey Bond Model of Electrons and Holes Si Si Si Si Si Si Si

More information

Spring Semester 2012 Final Exam

Spring Semester 2012 Final Exam Spring Semester 2012 Final Exam Note: Show your work, underline results, and always show units. Official exam time: 2.0 hours; an extension of at least 1.0 hour will be granted to anyone. Materials parameters

More information

Semiconductor Physics Problems 2015

Semiconductor Physics Problems 2015 Semiconductor Physics Problems 2015 Page and figure numbers refer to Semiconductor Devices Physics and Technology, 3rd edition, by SM Sze and M-K Lee 1. The purest semiconductor crystals it is possible

More information

Fundamentals of the Metal Oxide Semiconductor Field-Effect Transistor

Fundamentals of the Metal Oxide Semiconductor Field-Effect Transistor Triode Working FET Fundamentals of the Metal Oxide Semiconductor Field-Effect Transistor The characteristics of energy bands as a function of applied voltage. Surface inversion. The expression for the

More information

Classification of Solids

Classification of Solids Classification of Solids Classification by conductivity, which is related to the band structure: (Filled bands are shown dark; D(E) = Density of states) Class Electron Density Density of States D(E) Examples

More information

Semiconductors CHAPTER 3. Introduction The pn Junction with an Applied Voltage Intrinsic Semiconductors 136

Semiconductors CHAPTER 3. Introduction The pn Junction with an Applied Voltage Intrinsic Semiconductors 136 CHAPTER 3 Semiconductors Introduction 135 3.1 Intrinsic Semiconductors 136 3.2 Doped Semiconductors 139 3.3 Current Flow in Semiconductors 142 3.4 The pn Junction 148 3.5 The pn Junction with an Applied

More information

EECS130 Integrated Circuit Devices

EECS130 Integrated Circuit Devices EECS130 Integrated Circuit Devices Professor Ali Javey 9/18/2007 P Junctions Lecture 1 Reading: Chapter 5 Announcements For THIS WEEK OLY, Prof. Javey's office hours will be held on Tuesday, Sept 18 3:30-4:30

More information

The Devices. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. July 30, 2002

The Devices. Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic. July 30, 2002 igital Integrated Circuits A esign Perspective Jan M. Rabaey Anantha Chandrakasan Borivoje Nikolic The evices July 30, 2002 Goal of this chapter Present intuitive understanding of device operation Introduction

More information

Lecture 6 PN Junction and MOS Electrostatics(III) Metal-Oxide-Semiconductor Structure

Lecture 6 PN Junction and MOS Electrostatics(III) Metal-Oxide-Semiconductor Structure Lecture 6 PN Junction and MOS Electrostatics(III) Metal-Oxide-Semiconductor Structure Outline 1. Introduction to MOS structure 2. Electrostatics of MOS in thermal equilibrium 3. Electrostatics of MOS with

More information

Chapter 7. The pn Junction

Chapter 7. The pn Junction Chapter 7 The pn Junction Chapter 7 PN Junction PN junction can be fabricated by implanting or diffusing donors into a P-type substrate such that a layer of semiconductor is converted into N type. Converting

More information

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation

More information

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor

Lecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics t ti Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE105 Fall 2007

More information

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

ESE 570: Digital Integrated Circuits and VLSI Fundamentals ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 29, 2019 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2019 Khanna Lecture Outline! CMOS Process Enhancements! Semiconductor

More information

Midterm I - Solutions

Midterm I - Solutions UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences EECS 130 Spring 2008 Professor Chenming Hu Midterm I - Solutions Name: SID: Grad/Undergrad: Closed

More information

(Refer Slide Time: 03:41)

(Refer Slide Time: 03:41) Solid State Devices Dr. S. Karmalkar Department of Electronics and Communication Engineering Indian Institute of Technology, Madras Lecture - 25 PN Junction (Contd ) This is the 25th lecture of this course

More information

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

ESE 570: Digital Integrated Circuits and VLSI Fundamentals ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 23, 2018 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2018 Khanna Lecture Outline! CMOS Process Enhancements! Semiconductor

More information

Semiconductor Junctions

Semiconductor Junctions 8 Semiconductor Junctions Almost all solar cells contain junctions between different materials of different doping. Since these junctions are crucial to the operation of the solar cell, we will discuss

More information

Sample Exam # 2 ECEN 3320 Fall 2013 Semiconductor Devices October 28, 2013 Due November 4, 2013

Sample Exam # 2 ECEN 3320 Fall 2013 Semiconductor Devices October 28, 2013 Due November 4, 2013 Sample Exam # 2 ECEN 3320 Fall 203 Semiconductor Devices October 28, 203 Due November 4, 203. Below is the capacitance-voltage curve measured from a Schottky contact made on GaAs at T 300 K. Figure : Capacitance

More information

Recitation 17: BJT-Basic Operation in FAR

Recitation 17: BJT-Basic Operation in FAR Recitation 17: BJT-Basic Operation in FAR BJT stands for Bipolar Junction Transistor 1. Can be thought of as two p-n junctions back to back, you can have pnp or npn. In analogy to MOSFET small current

More information

Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium. February 13, 2003

Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium. February 13, 2003 6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium February 13, 2003

More information

Lecture 17 The Bipolar Junction Transistor (I) Forward Active Regime

Lecture 17 The Bipolar Junction Transistor (I) Forward Active Regime Lecture 17 The Bipolar Junction Transistor (I) Forward Active Regime Outline The Bipolar Junction Transistor (BJT): structure and basic operation I V characteristics in forward active regime Reading Assignment:

More information

CHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki

CHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki CHAPTER 4: P-N P N JUNCTION Part 2 Part 2 Charge Storage & Transient Behavior Junction Breakdown Heterojunction CHARGE STORAGE & TRANSIENT BEHAVIOR Once injected across the junction, the minority carriers

More information

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Chenming Hu.

UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. Professor Chenming Hu. UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences EECS 130 Spring 2009 Professor Chenming Hu Midterm I Name: Closed book. One sheet of notes is

More information

EE143 Fall 2016 Microfabrication Technologies. Evolution of Devices

EE143 Fall 2016 Microfabrication Technologies. Evolution of Devices EE143 Fall 2016 Microfabrication Technologies Prof. Ming C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH) 1-1 Evolution of Devices Yesterday s Transistor (1947) Today s Transistor (2006) 1-2 1 Why

More information

Lecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.)

Lecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.) Lecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.) Outline 1. Overview of MOS electrostatics under bias 2. Depletion regime 3. Flatband 4. Accumulation regime

More information

Lecture 19 - p-n Junction (cont.) October 18, Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode: parasitics, dynamics

Lecture 19 - p-n Junction (cont.) October 18, Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode: parasitics, dynamics 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 19-1 Lecture 19 - p-n Junction (cont.) October 18, 2002 Contents: 1. Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode:

More information

Junction Diodes. Tim Sumner, Imperial College, Rm: 1009, x /18/2006

Junction Diodes. Tim Sumner, Imperial College, Rm: 1009, x /18/2006 Junction Diodes Most elementary solid state junction electronic devices. They conduct in one direction (almost correct). Useful when one converts from AC to DC (rectifier). But today diodes have a wide

More information

( )! N D ( x) ) and equilibrium

( )! N D ( x) ) and equilibrium ECE 66: SOLUTIONS: ECE 66 Homework Week 8 Mark Lundstrom March 7, 13 1) The doping profile for an n- type silicon wafer ( N D = 1 15 cm - 3 ) with a heavily doped thin layer at the surface (surface concentration,

More information

Lecture-4 Junction Diode Characteristics

Lecture-4 Junction Diode Characteristics 1 Lecture-4 Junction Diode Characteristics Part-II Q: Aluminum is alloyed into n-type Si sample (N D = 10 16 cm 3 ) forming an abrupt junction of circular cross-section, with an diameter of 0.02 in. Assume

More information

The 5 basic equations of semiconductor device physics: We will in general be faced with finding 5 quantities:

The 5 basic equations of semiconductor device physics: We will in general be faced with finding 5 quantities: 6.012 - Electronic Devices and Circuits Solving the 5 basic equations - 2/12/08 Version The 5 basic equations of semiconductor device physics: We will in general be faced with finding 5 quantities: n(x,t),

More information

ELEC 3908, Physical Electronics, Lecture 19. BJT Base Resistance and Small Signal Modelling

ELEC 3908, Physical Electronics, Lecture 19. BJT Base Resistance and Small Signal Modelling ELEC 3908, Physical Electronics, Lecture 19 BJT Base Resistance and Small Signal Modelling Lecture Outline Lecture 17 derived static (dc) injection model to predict dc currents from terminal voltages This

More information

an introduction to Semiconductor Devices

an introduction to Semiconductor Devices an introduction to Semiconductor Devices Donald A. Neamen Chapter 6 Fundamentals of the Metal-Oxide-Semiconductor Field-Effect Transistor Introduction: Chapter 6 1. MOSFET Structure 2. MOS Capacitor -

More information

The pn junction. [Fonstad, Ghione]

The pn junction. [Fonstad, Ghione] The pn junction [Fonstad, Ghione] Band diagram On the vertical axis: potential energy of the electrons On the horizontal axis: now there is nothing: later we ll put the position qf s : work function (F

More information

Quiz #1 Practice Problem Set

Quiz #1 Practice Problem Set Name: Student Number: ELEC 3908 Physical Electronics Quiz #1 Practice Problem Set? Minutes January 22, 2016 - No aids except a non-programmable calculator - All questions must be answered - All questions

More information

EE 5611 Introduction to Microelectronic Technologies Fall Tuesday, September 23, 2014 Lecture 07

EE 5611 Introduction to Microelectronic Technologies Fall Tuesday, September 23, 2014 Lecture 07 EE 5611 Introduction to Microelectronic Technologies Fall 2014 Tuesday, September 23, 2014 Lecture 07 1 Introduction to Solar Cells Topics to be covered: Solar cells and sun light Review on semiconductor

More information

Lecture 17 - The Bipolar Junction Transistor (I) Forward Active Regime. April 10, 2003

Lecture 17 - The Bipolar Junction Transistor (I) Forward Active Regime. April 10, 2003 6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 17-1 Lecture 17 - The Bipolar Junction Transistor (I) Contents: Forward Active Regime April 10, 2003 1. BJT: structure and basic operation

More information

Lecture 12: MOS Capacitors, transistors. Context

Lecture 12: MOS Capacitors, transistors. Context Lecture 12: MOS Capacitors, transistors Context In the last lecture, we discussed PN diodes, and the depletion layer into semiconductor surfaces. Small signal models In this lecture, we will apply those

More information

Electrical Characteristics of MOS Devices

Electrical Characteristics of MOS Devices Electrical Characteristics of MOS Devices The MOS Capacitor Voltage components Accumulation, Depletion, Inversion Modes Effect of channel bias and substrate bias Effect of gate oide charges Threshold-voltage

More information

Holes (10x larger). Diode currents proportional to minority carrier densities on each side of the depletion region: J n n p0 = n i 2

Holes (10x larger). Diode currents proportional to minority carrier densities on each side of the depletion region: J n n p0 = n i 2 Part V. (40 pts.) A diode is composed of an abrupt PN junction with N D = 10 16 /cm 3 and N A =10 17 /cm 3. The diode is very long so you can assume the ends are at x =positive and negative infinity. 1.

More information

CMOS Devices. PN junctions and diodes NMOS and PMOS transistors Resistors Capacitors Inductors Bipolar transistors

CMOS Devices. PN junctions and diodes NMOS and PMOS transistors Resistors Capacitors Inductors Bipolar transistors CMOS Devices PN junctions and diodes NMOS and PMOS transistors Resistors Capacitors Inductors Bipolar transistors PN Junctions Diffusion causes depletion region D.R. is insulator and establishes barrier

More information

PART III SEMICONDUCTOR DEVICES

PART III SEMICONDUCTOR DEVICES PART III SEMICONDUCTOR DEVICES Chapter 3: Semiconductor Diodes Chapter 4: Bipolar Junction Transistors (BJT s) Chapter 5: Field Effect Transistors (FET s) Chapter 6: Fabrication technology for monolithic

More information

6.012 Electronic Devices and Circuits

6.012 Electronic Devices and Circuits Page 1 of 12 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.012 Electronic Devices and Circuits FINAL EXAMINATION Open book. Notes: 1. Unless

More information

Electronics EC /2/2012. * In-class exams: 40% 7 th week exam 25% 12 th week exam 15%

Electronics EC /2/2012. * In-class exams: 40% 7 th week exam 25% 12 th week exam 15% Arab Academy for Science, Technology and Maritime Transport Electronics EC 331 Dr. Mohamed Hassan Course Assessment * In-class exams: 40% 7 th week exam 25% 12 th week exam 15% *Tutorial exams and activities:

More information

Lecture 04 Review of MOSFET

Lecture 04 Review of MOSFET ECE 541/ME 541 Microelectronic Fabrication Techniques Lecture 04 Review of MOSFET Zheng Yang (ERF 3017, email: yangzhen@uic.edu) What is a Transistor? A Switch! An MOS Transistor V GS V T V GS S Ron D

More information

BJT - Mode of Operations

BJT - Mode of Operations JT - Mode of Operations JTs can be modeled by two back-to-back diodes. N+ P N- N+ JTs are operated in four modes. HO #6: LN 251 - JT M Models Page 1 1) Forward active / normal junction forward biased junction

More information

! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.

! CMOS Process Enhancements. ! Semiconductor Physics.  Band gaps.  Field Effects. ! MOS Physics.  Cut-off.  Depletion. ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 9, 019 MOS Transistor Theory, MOS Model Lecture Outline CMOS Process Enhancements Semiconductor Physics Band gaps Field Effects

More information

CLASS 3&4. BJT currents, parameters and circuit configurations

CLASS 3&4. BJT currents, parameters and circuit configurations CLASS 3&4 BJT currents, parameters and circuit configurations I E =I Ep +I En I C =I Cp +I Cn I B =I BB +I En -I Cn I BB =I Ep -I Cp I E = I B + I C I En = current produced by the electrons injected from

More information

EECS130 Integrated Circuit Devices

EECS130 Integrated Circuit Devices EECS130 Integrated Circuit Devices Professor Ali Javey 10/02/2007 MS Junctions, Lecture 2 MOS Cap, Lecture 1 Reading: finish chapter14, start chapter16 Announcements Professor Javey will hold his OH at

More information

Semiconductor Physics fall 2012 problems

Semiconductor Physics fall 2012 problems Semiconductor Physics fall 2012 problems 1. An n-type sample of silicon has a uniform density N D = 10 16 atoms cm -3 of arsenic, and a p-type silicon sample has N A = 10 15 atoms cm -3 of boron. For each

More information

Lecture 10 - Carrier Flow (cont.) February 28, 2007

Lecture 10 - Carrier Flow (cont.) February 28, 2007 6.720J/3.43J Integrated Microelectronic Devices - Spring 2007 Lecture 10-1 Lecture 10 - Carrier Flow (cont.) February 28, 2007 Contents: 1. Minority-carrier type situations Reading assignment: del Alamo,

More information

n N D n p = n i p N A

n N D n p = n i p N A Summary of electron and hole concentration in semiconductors Intrinsic semiconductor: E G n kt i = pi = N e 2 0 Donor-doped semiconductor: n N D where N D is the concentration of donor impurity Acceptor-doped

More information

! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.

! CMOS Process Enhancements. ! Semiconductor Physics.  Band gaps.  Field Effects. ! MOS Physics.  Cut-off.  Depletion. ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 3, 018 MOS Transistor Theory, MOS Model Lecture Outline! CMOS Process Enhancements! Semiconductor Physics " Band gaps " Field Effects!

More information

Session 6: Solid State Physics. Diode

Session 6: Solid State Physics. Diode Session 6: Solid State Physics Diode 1 Outline A B C D E F G H I J 2 Definitions / Assumptions Homojunction: the junction is between two regions of the same material Heterojunction: the junction is between

More information

ELEN0037 Microelectronic IC Design. Prof. Dr. Michael Kraft

ELEN0037 Microelectronic IC Design. Prof. Dr. Michael Kraft ELEN0037 Microelectronic IC Design Prof. Dr. Michael Kraft Lecture 2: Technological Aspects Technology Passive components Active components CMOS Process Basic Layout Scaling CMOS Technology Integrated

More information

Solid State Electronics. Final Examination

Solid State Electronics. Final Examination The University of Toledo EECS:4400/5400/7400 Solid State Electronic Section elssf08fs.fm - 1 Solid State Electronics Final Examination Problems Points 1. 1. 14 3. 14 Total 40 Was the exam fair? yes no

More information

Lecture 7 - PN Junction and MOS Electrostatics (IV) Electrostatics of Metal-Oxide-Semiconductor Structure. September 29, 2005

Lecture 7 - PN Junction and MOS Electrostatics (IV) Electrostatics of Metal-Oxide-Semiconductor Structure. September 29, 2005 6.12 - Microelectronic Devices and Circuits - Fall 25 Lecture 7-1 Lecture 7 - PN Junction and MOS Electrostatics (IV) Electrostatics of Metal-Oide-Semiconductor Structure September 29, 25 Contents: 1.

More information

figure shows a pnp transistor biased to operate in the active mode

figure shows a pnp transistor biased to operate in the active mode Lecture 10b EE-215 Electronic Devices and Circuits Asst Prof Muhammad Anis Chaudhary BJT: Device Structure and Physical Operation The pnp Transistor figure shows a pnp transistor biased to operate in the

More information

Lecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oxide Semiconductor Structure (cont.) October 4, 2005

Lecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oxide Semiconductor Structure (cont.) October 4, 2005 6.12 Microelectronic Devices and Circuits Fall 25 Lecture 8 1 Lecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oide Semiconductor Structure (cont.) Contents: October 4, 25 1. Overview

More information

ECE 340 Lecture 21 : P-N Junction II Class Outline:

ECE 340 Lecture 21 : P-N Junction II Class Outline: ECE 340 Lecture 21 : P-N Junction II Class Outline: Contact Potential Equilibrium Fermi Levels Things you should know when you leave Key Questions What is the contact potential? Where does the transition

More information

Week 3, Lectures 6-8, Jan 29 Feb 2, 2001

Week 3, Lectures 6-8, Jan 29 Feb 2, 2001 Week 3, Lectures 6-8, Jan 29 Feb 2, 2001 EECS 105 Microelectronics Devices and Circuits, Spring 2001 Andrew R. Neureuther Topics: M: Charge density, electric field, and potential; W: Capacitance of pn

More information

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors

Lecture 2. Introduction to semiconductors Structures and characteristics in semiconductors Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation

More information

ECE321 Electronics I

ECE321 Electronics I ECE321 Electronics I Lecture 4: Physics of Semiconductor iodes Payman Zarkesh-Ha Office: ECE Bldg. 230B Office hours: Tuesday 2:00-3:00PM or by appointment E-mail: pzarkesh.unm.edu Slide: 1 Review of Last

More information

Introduction to Power Semiconductor Devices

Introduction to Power Semiconductor Devices ECE442 Power Semiconductor Devices and Integrated Circuits Introduction to Power Semiconductor Devices Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Power Semiconductor Devices Applications System Ratings

More information

Basic Physics of Semiconductors

Basic Physics of Semiconductors Basic Physics of Semiconductors Semiconductor materials and their properties PN-junction diodes Reverse Breakdown EEM 205 Electronics I Dicle University, EEE Dr. Mehmet Siraç ÖZERDEM Semiconductor Physics

More information

ECE-305: Spring 2018 Exam 2 Review

ECE-305: Spring 2018 Exam 2 Review ECE-305: Spring 018 Exam Review Pierret, Semiconductor Device Fundamentals (SDF) Chapter 3 (pp. 75-138) Chapter 5 (pp. 195-6) Professor Peter Bermel Electrical and Computer Engineering Purdue University,

More information

Integrated Circuits & Systems

Integrated Circuits & Systems Federal University of Santa Catarina Center for Technology Computer Science & Electronics Engineering Integrated Circuits & Systems INE 5442 Lecture 10 MOSFET part 1 guntzel@inf.ufsc.br ual-well Trench-Isolated

More information

Lecture 3 Semiconductor Physics (II) Carrier Transport

Lecture 3 Semiconductor Physics (II) Carrier Transport Lecture 3 Semiconductor Physics (II) Carrier Transport Thermal Motion Carrier Drift Carrier Diffusion Outline Reading Assignment: Howe and Sodini; Chapter 2, Sect. 2.4-2.6 6.012 Spring 2009 Lecture 3 1

More information

ECE 340 Lecture 27 : Junction Capacitance Class Outline:

ECE 340 Lecture 27 : Junction Capacitance Class Outline: ECE 340 Lecture 27 : Junction Capacitance Class Outline: Breakdown Review Junction Capacitance Things you should know when you leave M.J. Gilbert ECE 340 Lecture 27 10/24/11 Key Questions What types of

More information

1 Name: Student number: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND. Fall :00-11:00

1 Name: Student number: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND. Fall :00-11:00 1 Name: DEPARTMENT OF PHYSICS AND PHYSICAL OCEANOGRAPHY MEMORIAL UNIVERSITY OF NEWFOUNDLAND Final Exam Physics 3000 December 11, 2012 Fall 2012 9:00-11:00 INSTRUCTIONS: 1. Answer all seven (7) questions.

More information

ESE 570: Digital Integrated Circuits and VLSI Fundamentals

ESE 570: Digital Integrated Circuits and VLSI Fundamentals ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 24, 2017 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2017 Khanna Lecture Outline! Semiconductor Physics " Band gaps "

More information

Schottky Rectifiers Zheng Yang (ERF 3017,

Schottky Rectifiers Zheng Yang (ERF 3017, ECE442 Power Semiconductor Devices and Integrated Circuits Schottky Rectifiers Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Power Schottky Rectifier Structure 2 Metal-Semiconductor Contact The work function

More information

EE 560 MOS TRANSISTOR THEORY

EE 560 MOS TRANSISTOR THEORY 1 EE 560 MOS TRANSISTOR THEORY PART 1 TWO TERMINAL MOS STRUCTURE V G (GATE VOLTAGE) 2 GATE OXIDE SiO 2 SUBSTRATE p-type doped Si (N A = 10 15 to 10 16 cm -3 ) t ox V B (SUBSTRATE VOLTAGE) EQUILIBRIUM:

More information

Introduction and Background

Introduction and Background Analog CMOS Integrated Circuit Design Introduction and Background Dr. Jawdat Abu-Taha Department of Electrical and Computer Engineering Islamic University of Gaza jtaha@iugaza.edu.ps 1 Marking Assignments

More information