EECS 151/251A Homework 5
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1 EECS 151/251A Homework 5 Due Monday, March 5 th, 2018 Problem 1: Timing The data-path shown below is used in a simple processor. clk rd1 rd2 0 wr regfile 1 0 ALU REG 1 The elements used in the design have the following timing characteristics. The worst case clock skew is 1ns. For this problem you can ignore the delay in the controller. setup-time clock-to-q CL delay regfile 2ns 2ns - register 1ns 1ns - mux - - 1ns ALU - - 5ns 1. What is the minimum clock period for this design? Show your work. 2. Can you improve the clock frequency by rearranging the elements in the data-path (and adding more hardware if needed), but keeping the same function? If so, what is the new minimum clock period? Show your design.
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3 EECS 151/251A Homework 5 3 Problem 2: Inverter Sizing Part a Size inverters INV1, INV2, and INV3 in the following circuit for minimum delay. Assume C INV 0 = 2fF and C L = 162fF and that there is no interconnect capacitance. in INV0 INV1 INV2 INV3 out C L Calculate fanout F = C L C INV 0 = 81 Since there are 4 stages, the optimal fanout per stage is f = 4 F = 4 81 = 3 Size each inverter relative to the first: C INV 0 = 2fF C INV 1 = 6fF C INV 2 = 18fF C INV 3 = 54fF Part b What is the total delay from in to out in part a? Use the simple MOSFET switch model, and assume each inverter is sized such that R ON,N = R ON,P and V th,n = V th,p = V DD 2. Assume that gate capactiance C G and the explicit load C L are the only sources of capacitance. R ON for INV0 is 2.4kΩ τ 0 = R 0 C 1 = 2.4kΩ 6fF = 14.4ps τ 1 = R 1 C 2 = R 0 f C 2 = 2.4kΩ 18fF = 14.4ps 3 τ 2 = R 2 C 3 = R 0 f 2 C 2 = 2.4kΩ 54fF = 14.4ps 9 τ 3 = R 3 C L = R 0 f 3 C 2 = 2.4kΩ 162fF = 14.4ps 27 t p = ln(2) (τ 0 + τ 1 + τ 2 + τ 3 ) 40.0ps
4 EECS 151/251A Homework 5 4 Problem 3: Wires and Repeaters You have two circuits on chip, A and B, that are physically located 10 mm (Manhattan distance) apart. With the following process parameters, design a chain of repeaters that minimizes the delay from A to B. Design the repeaters so that the rising and falling transitions are symmetrical. Do not worry about whether or not the signal is inverted; you may assume that the circuit B can invert the signal if needed. For your answer, include the device sizes in each repeater (including the driver inside A) and the dimensions of each wire segment. Wire parameters: R sheet = 50mΩ/ C pp = 1.8fF/µm 2 C fringe = 0.01fF/µm W min = 50nm Device parameters: R on,n = 2kΩ L W R on,p = 4kΩ L W γ = 1 L min = 50nm W min = 100nm C gate = 200fF/µm 2 Start by calculating r and c: Use a minimum length wire W = W min r = R sheet /W = 50mΩ/ /50nm = 1Ω/µm c = C pp W + C fringe = 0.1fF/µm Size a minumim inverter: W p = 200nm W n = 100nm L = 50nm And calculate the drive resistance and capacitance: R d = R on,n = R on,p = 2kΩ 50nm 100nm = 1kΩ C d = 200fF (0.1µm 0.05µm + 0.2µm 0.05µm) = 3.0fF Now calculate the optimum number of repeaters:
5 EECS 151/251A Homework r c m opt = L 0.69 R d C d (γ + 1) Ω/µm 0.1fF/µm m opt = 10000µm Ω 3.0fF 2 30 Now scale the inverters to size them optimally: Rd c s opt = r C d 1000Ω 0.1fF/µm s opt = 1Ω/µm 3.0fF 6 W n,repeater = s opt W n = 600nm W p,repeater = s opt W p = 1200nm L crit = L = 10000µm 333µm m opt 30 W 1200 nm L = 50 nm W 1200 nm L = 50 nm W = 50 nm, L = 333 µm W L = 600 nm 50 nm W L = 600 nm 50 nm x 30 We can also solve this another way (as in the lecture slides): R N = R on,n L min = 2000Ω 0.05µm = 100Ω µm C in = C gate 3 L min = 200fF/µm nm = 30fF/µm RN c 100Ω µm 0.1fF/µm W opt = = r C in 1Ω/µ 30fF/µm 600µm Note that this is W opt for the NMOS. The PMOS should be twice as large.
6 EECS 151/251A Homework 5 6 Problem 4: Power and Leakage Consider an N-input NOR gate shown below with V DD = 1V, C L = 5fF, C D = 2fF/µm. Assume R ON,n = 0.2mΩ µm, R ON,p = 0.3mΩ µm, R OF F,n = 100kΩ µm, R OF F,p = 1.5MΩ µm for the given device length. You may assume N > 2 and you don t have to worry about extreme cases (i.e. an unreasonably large N). a) Size the gate, using as a reference a symmetrically sized inverter with W n = 1µm. Express your answer as a function of N. Each NMOS has 1µm width, each PMOS has 3 2Nµm width. b) Assume that the probability of an input being high is 0.5 (i.e., on any given clock cycle, each input is equally likely to be a 0 or a 1.) and that all inputs are independent. What is the probability that the output is high, P (Out = 1)? What is the probability that the output is low, P (Out = 0)? What is the gate activity factor (i.e. the probability that the output will transition from low to high, P 0 1 )? (Again, you may express your answer as a function of N.) P (Out = 1) = P (In1 = 0) P (In2 = 0)... P (InN = 0) = ( 1 2 )N P (Out = 1) = 1 2 N P (Out = 0) = 1 P (Out = 1) P (Out = 0) = 2N 1 2 N a 0 1 = P 0 1 = P (Out = 0) P (Out = 1) a 0 1 = 2N 1 2 2N c) What is the dynamic power dissipation of the gate as a function of N, if the clock frequency is 3GHz? You may ignore the parasitic drain capacitance in the internal nodes of the PMOS stack, but not at the output.
7 EECS 151/251A Homework 5 7 P dyn = a 0 1 C L,T OT V 2 DD f = 2N 1 2 2N (N 1µm C D Num C D + C L ) 1 2 V 3GHz = 2N 1 2 2N (5 ff Nµm 2 + 5fF ) 1V 3GHz 2 µm = (N + 1) (2N 1) 2 2N 15µW d) EECS 251A Only. For the following three cases, calculate the leakage current. Express your answer as a function of N when needed. An approximate expression is perfectly fine as long as you explain and justify your assumptions/simplifications. All inputs are zero. When all inputs are zero, the output is 1. All NMOS (in parallel) devices are leaking, so: I leak,tot = N V DD R OF F,n /1µm = 10NµA All inputs are 1. When all inputs are 1, the output is 0. There is leakage through the stack of PMOS devices, so: V DD I leak,tot = N R OF F,p /1.5Nµm = 1µA One of the inputs is 1, and the rest are zero. In this case, the output is also 0. The stack of PMOS devices is leaking, but only one of them is OFF - the rest are ON. I leak,tot = V DD (N 1)R ON,p /1.5Nµm + R OF F,p /1.5Nµm For reasonable values of N, we can assume that R OF F,p /1.5Nµm >> (N 1)R ON,p /1.5Nµm so: V DD I leak,tot R OF F,p /1.5Nµm = NµA
8 EECS 151/251A Homework 5 8 Problem 5: Gate Delays Part a Using the transistor switch model, draw the output of the circuit below for a 0 to V DD input step. Calculate the propagation delay in terms of the given parameters. Assume that V th,p = V th,n = V DD/2 and that R on,p = R on,n. You may ignore R off. in C out The propagation delay t p = ln(2) R on C Part b Using the transistor switch model, draw the step response (0 to V DD) of the circuit below. Calculate the propagation delay in terms of the given parameters. Assume that V th,p = V th,n = V DD/2 and that R on,p = R on,n. Assume that C gs,p = 2 C gs,n and that C gs is the only significant source of capacitance. You may ignore R off.
9 EECS 151/251A Homework 5 9 in C out The propagation delay for the first stage t p,0 = ln(2) R on 3 C gs The propagation delay for the second stage t p,1 = ln(2) R on C The total propagation delay is therfore t p = t p,0 + t p,1 = ln(2) R on (3 C gs + C)
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