Lecture 8 - Carrier Drift and Diffusion (cont.) September 21, 2001
|
|
- Prosper Kennedy
- 5 years ago
- Views:
Transcription
1 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-1 Lecture 8 - Carrier Drift and Diffusion (cont.) September 21, 2001 Contents: 1. Non-uniformly doped semiconductor in thermal equilibrium Reading assignment: del Alamo, Ch. 4, 4.5
2 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-2 Key questions Is it possible to have an electric field in a semiconductor in thermal equilibrium? What would that imply for the electron and hole currents? Is there a relationship between mobility and diffusion coefficient? Given a certain non-uniform doping distribution, how does one compute the equilibrium carrier concentrations? Under what conditions does the equilibrium majority carrier concentration follow the doping level in a non-uniformly doped semiconductor?
3 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture Non-uniformly doped semiconductor in thermal equilibrium It is possible to have an electric field in a semiconductor in thermal equilibrium non-uniform doping distribution Gauss Law: electrical charge produces an electric field: de dx = ρ ɛ ρ volume charge density [C/cm 3 ] if ρ =0 E=0 if ρ =0 de dx =0 it is possible to have E 0withρ =0 In semiconductors: ρ = q(p n + N + D N A ) If N + D N D and N A N A, de dx = q ɛ (p n + N D N A )
4 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-4 de dx = q ɛ (p n + N D N A ) Uniformly-doped semiconductor in TE: far away from any surface charge neutrality: ρ o =0 de o dx =0 since no field applied from the outside E o =0
5 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-5 Non-uniformly doped semiconductor in TE (n-type): n o, N D N D (x) n o (x)? n o (x)? x de o dx = q ɛ (N D n o ) Three possibilities: n o (x) =N D (x) net diffusion current n o (x) uniform net drift current n o = f(x) but n o (x) N D (x) in a way that there is no net current
6 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-6 n o, N D partially uncompensated donor charge a) - N D (x) + n o (x) net electron charge ρ o x b) + x c) ε ο x φ o d) φ ref x E c q[φ(x)-φ ref ] e) E F E v
7 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-7 Goal: understanding physics of non-uniformly doped semiconductors in TE principle of detailed balance for currents in TE Einstein relation Boltzmann relations general solution quasi-neutral solution
8 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-8 In thermal equilibrium: J = J e + J h =0 Detailed balance further demands that: J e = J h =0 [study example of 4.5.2]
9 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-9 Einstein Relation µ relates to ease of carrier drift in an electric field. D relates to ease of carrier diffusion as a result of a concentration gradient. Is there a relationship between µ and D? Yes, Einstein relation: D e µ e = D h µ h = kt q Relationship between D and µ only depends on T. [study derivation and restrictions in 4.5.2]
10 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-10 Boltzmann Relations InTE,diffusion = drift there must be a conexion between electrostatics and carrier concentrations. InTE,J e =0: J e = qµ e n o E o + qd e dn o dx =0 Then, relationship between E o and equilibrium carrier concentration: E o = kt q Express in terms of φ: 1 n o dn o dx = kt q d(ln n o ) dx dφ dx = kt q d(ln n o ) dx Integrate: φ(x) φ(ref) = kt q ln n o(x) n o (ref) Relationship between the ratio of equilibrium carrier concentration and difference of electrostatic potential at two different points. At 300 K: factor of 10 in n o kt q ln 10 = 60 mv of φ 60 mv/decade rule
11 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-11 If φ(ref) =0wheren o = n i : Similarly: n o = n i exp qφ kt p o = n i exp qφ kt Note: n o p o = n 2 i
12 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-12 Equilibrium carrier concentration: general solution in the presence of doping gradient (n-type) de o dx = q ɛ (N D n o ) Relationship between E o and n o in thermal equilibrium: E o = kt q d(ln n o ) dx Then: ɛkt d 2 (ln n o ) q 2 dx 2 = n o N D One equation, one unknown. Given N D (x), can solve for n o (x) (but in general, require numerical solution).
13 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-13 Quasi-neutral situation ɛkt d 2 (ln n o ) q 2 dx 2 = n o N D If N D (x) changes slowly with x n o (x) will also change slowly, then: n o (x) N D (x) The majority carrier concentration closely tracks the doping level. When does this simple result apply? ɛkt d 2 (ln n o ) q 2 dx 2 N D or ɛkt d 2 (ln n o ) 1 q 2 N D dx 2 Alternatively: n o N D N D 1
14 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-14 Define Debye length: L D = ɛkt q 2 N D Rewrite condition: L 2 D de o dx kt q Note: L D de o dx is change in electric field over a Debye length L 2 D de o dx is change in electrostatic potential over a Debye length For a non-uniformly doped profile to be quasi-neutral in TE, the change in the electrostatic potential over a Debye length must be smaller than the thermal voltage.
15 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-15 L D = ɛkt q 2 N D L D characteristic length for electrostatic problems in semiconductors. Similar arguments for p-type material. 1E-04 Si at 300K 1E-05 LD (cm) 1E-06 1E-07 1E-08 1E+15 1E+16 1E+17 1E+18 1E+19 1E+20 1E+21 N (cm -3 ) Since L D 1/ N: N L D QN condition easier to fulfill.
16 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-16 Key conclusions Detailed balance in TE demands that J e = J h = 0 everywhere. Einstein relation: D µ = kt q Boltzmann relations: in TE, difference of electrostatic potential between two points is proportional to ratio of carrier concentration at same points: φ(x) φ(ref) = kt q ln n o(x) n o (ref) = kt q ln p o(x) p o (ref) In quasi-neutral non-uniformly doped semiconductor in TE: n o (x) N D (x) Debye length: key characteristic length for electrostatics in quasineutral semiconductor. Order of magnitude of key parameters for Si at 300K: Debye length: L D cm (depends on doping)
17 6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 8-17 Self-study Derive Einstein relation. Study example supporting detailed balance for J e and J h. Work out exercises
Lecture 7 - Carrier Drift and Diffusion (cont.) February 20, Non-uniformly doped semiconductor in thermal equilibrium
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 7-1 Lecture 7 - Carrier Drift and Diffusion (cont.) February 20, 2007 Contents: 1. Non-uniformly doped semiconductor in thermal equilibrium
More informationLecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005
6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005
More informationLecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium. February 13, 2003
6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium February 13, 2003
More informationLecture 9 - Carrier Drift and Diffusion (cont.), Carrier Flow. September 24, 2001
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 9-1 Lecture 9 - Carrier Drift and Diffusion (cont.), Carrier Flow September 24, 2001 Contents: 1. Quasi-Fermi levels 2. Continuity
More informationLecture 8 - Carrier Drift and Diffusion (cont.), Carrier Flow. February 21, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 8-1 Lecture 8 - Carrier Drift and Diffusion (cont.), Carrier Flow February 21, 2007 Contents: 1. Quasi-Fermi levels 2. Continuity
More informationLecture 10 - Carrier Flow (cont.) February 28, 2007
6.720J/3.43J Integrated Microelectronic Devices - Spring 2007 Lecture 10-1 Lecture 10 - Carrier Flow (cont.) February 28, 2007 Contents: 1. Minority-carrier type situations Reading assignment: del Alamo,
More informationLecture 22 - The Si surface and the Metal-Oxide-Semiconductor Structure (cont.) April 2, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 22-1 Lecture 22 - The Si surface and the Metal-Oxide-Semiconductor Structure (cont.) April 2, 2007 Contents: 1. Ideal MOS structure
More informationLecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005
6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 15-1 Lecture 15 - The pn Junction Diode (I) I-V Characteristics November 1, 2005 Contents: 1. pn junction under bias 2. I-V characteristics
More informationLecture 3 Semiconductor Physics (II) Carrier Transport
Lecture 3 Semiconductor Physics (II) Carrier Transport Thermal Motion Carrier Drift Carrier Diffusion Outline Reading Assignment: Howe and Sodini; Chapter 2, Sect. 2.4-2.6 6.012 Spring 2009 Lecture 3 1
More informationLecture 17 - p-n Junction. October 11, Ideal p-n junction in equilibrium 2. Ideal p-n junction out of equilibrium
6.72J/3.43J - Integrated Microelectronic Devices - Fall 22 Lecture 17-1 Lecture 17 - p-n Junction October 11, 22 Contents: 1. Ideal p-n junction in equilibrium 2. Ideal p-n junction out of equilibrium
More informationLecture 2. OUTLINE Basic Semiconductor Physics (cont d) PN Junction Diodes. Reading: Chapter Carrier drift and diffusion
Lecture 2 OUTLIE Basic Semiconductor Physics (cont d) Carrier drift and diffusion P unction Diodes Electrostatics Caacitance Reading: Chater 2.1 2.2 EE105 Sring 2008 Lecture 1, 2, Slide 1 Prof. Wu, UC
More informationLecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.)
Lecture 7 PN Junction and MOS Electrostatics(IV) Metal Oxide Semiconductor Structure (contd.) Outline 1. Overview of MOS electrostatics under bias 2. Depletion regime 3. Flatband 4. Accumulation regime
More informationThe 5 basic equations of semiconductor device physics: We will in general be faced with finding 5 quantities:
6.012 - Electronic Devices and Circuits Solving the 5 basic equations - 2/12/08 Version The 5 basic equations of semiconductor device physics: We will in general be faced with finding 5 quantities: n(x,t),
More informationECE 340 Lecture 21 : P-N Junction II Class Outline:
ECE 340 Lecture 21 : P-N Junction II Class Outline: Contact Potential Equilibrium Fermi Levels Things you should know when you leave Key Questions What is the contact potential? Where does the transition
More informationReview 5 unknowns: n(x,t), p(x,t), J e. Doping profile problems Electrostatic potential Poisson's equation. (x,t), J h
6.012 - Electronic Devices and Circuits Lecture 3 - Solving The Five Equations - Outline Announcements Handouts - 1. Lecture; 2. Photoconductivity; 3. Solving the 5 eqs. See website for Items 2 and 3.
More informationLecture 13 - Carrier Flow (cont.), Metal-Semiconductor Junction. October 2, 2002
6.72J/3.43J - Integrated Microelectronic Devices - Fall 22 Lecture 13-1 Contents: Lecture 13 - Carrier Flow (cont.), Metal-Semiconductor Junction October 2, 22 1. Transport in space-charge and high-resistivity
More informationElectronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline
6.012 - Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline Review Depletion approimation for an abrupt p-n junction Depletion charge storage and depletion capacitance
More informationLecture 20 - p-n Junction (cont.) October 21, Non-ideal and second-order effects
6.70J/3.43J - Integrated Microelectronic Devices - Fall 00 Lecture 0-1 Lecture 0 - p-n Junction (cont.) October 1, 00 Contents: 1. Non-ideal and second-order effects Reading assignment: del Alamo, Ch.
More informationSemiconductor Device Physics
1 Semiconductor Device Physics Lecture 3 http://zitompul.wordpress.com 2 0 1 3 Semiconductor Device Physics 2 Three primary types of carrier action occur inside a semiconductor: Drift: charged particle
More informationWeek 3, Lectures 6-8, Jan 29 Feb 2, 2001
Week 3, Lectures 6-8, Jan 29 Feb 2, 2001 EECS 105 Microelectronics Devices and Circuits, Spring 2001 Andrew R. Neureuther Topics: M: Charge density, electric field, and potential; W: Capacitance of pn
More informationLecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oxide Semiconductor Structure (cont.) October 4, 2005
6.12 Microelectronic Devices and Circuits Fall 25 Lecture 8 1 Lecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oide Semiconductor Structure (cont.) Contents: October 4, 25 1. Overview
More informationSemiconductor Junctions
8 Semiconductor Junctions Almost all solar cells contain junctions between different materials of different doping. Since these junctions are crucial to the operation of the solar cell, we will discuss
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 23, 2018 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2018 Khanna Lecture Outline! CMOS Process Enhancements! Semiconductor
More informationn N D n p = n i p N A
Summary of electron and hole concentration in semiconductors Intrinsic semiconductor: E G n kt i = pi = N e 2 0 Donor-doped semiconductor: n N D where N D is the concentration of donor impurity Acceptor-doped
More informationLecture 7 - PN Junction and MOS Electrostatics (IV) Electrostatics of Metal-Oxide-Semiconductor Structure. September 29, 2005
6.12 - Microelectronic Devices and Circuits - Fall 25 Lecture 7-1 Lecture 7 - PN Junction and MOS Electrostatics (IV) Electrostatics of Metal-Oide-Semiconductor Structure September 29, 25 Contents: 1.
More informationPHYS208 P-N Junction. Olav Torheim. May 30, 2007
1 PHYS208 P-N Junction Olav Torheim May 30, 2007 1 Intrinsic semiconductors The lower end of the conduction band is a parabola, just like in the quadratic free electron case (E = h2 k 2 2m ). The density
More informationCarrier transport: Drift and Diffusion
. Carrier transport: Drift and INEL 5209 - Solid State Devices - Spring 2012 Manuel Toledo April 10, 2012 Manuel Toledo Transport 1/ 32 Outline...1 Drift Drift current Mobility Resistivity Resistance Hall
More informationECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline:
ECE 440 Lecture 20 : PN Junction Electrostatics II Class Outline: Depletion Approximation Step Junction Things you should know when you leave Key Questions What is the space charge region? What are the
More informationECE 142: Electronic Circuits Lecture 3: Semiconductors
Faculty of Engineering ECE 142: Electronic Circuits Lecture 3: Semiconductors Agenda Intrinsic Semiconductors Extrinsic Semiconductors N-type P-type Carrier Transport Drift Diffusion Semiconductors A semiconductor
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 29, 2019 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2019 Khanna Lecture Outline! CMOS Process Enhancements! Semiconductor
More informationElectrical Characteristics of MOS Devices
Electrical Characteristics of MOS Devices The MOS Capacitor Voltage components Accumulation, Depletion, Inversion Modes Effect of channel bias and substrate bias Effect of gate oide charges Threshold-voltage
More information6.012 Electronic Devices and Circuits
Page 1 of 1 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.12 Electronic Devices and Circuits Exam No. 1 Wednesday, October 7, 29 7:3 to 9:3
More informationcollisions of electrons. In semiconductor, in certain temperature ranges the conductivity increases rapidly by increasing temperature
1.9. Temperature Dependence of Semiconductor Conductivity Such dependence is one most important in semiconductor. In metals, Conductivity decreases by increasing temperature due to greater frequency of
More informationLecture 23 - The Si surface and the Metal-Oxide-Semiconductor Structure (cont.) April 4, 2007
6.720J/3.43J Integrated Microelectronic Devices Spring 2007 Lecture 231 Lecture 23 The Si surface and the MetalOxideSemiconductor Structure (cont.) April 4, 2007 Contents: 1. Ideal MOS structure under
More information! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 3, 018 MOS Transistor Theory, MOS Model Lecture Outline! CMOS Process Enhancements! Semiconductor Physics " Band gaps " Field Effects!
More informationPHYS208 p-n junction. January 15, 2010
1 PHYS208 p-n junction January 15, 2010 List of topics (1) Density of states Fermi-Dirac distribution Law of mass action Doped semiconductors Dopinglevel p-n-junctions 1 Intrinsic semiconductors List of
More informationEECS130 Integrated Circuit Devices
EECS130 Integrated Circuit Devices Professor Ali Javey 9/18/2007 P Junctions Lecture 1 Reading: Chapter 5 Announcements For THIS WEEK OLY, Prof. Javey's office hours will be held on Tuesday, Sept 18 3:30-4:30
More informationESE 570: Digital Integrated Circuits and VLSI Fundamentals
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 24, 2017 MOS Transistor Theory, MOS Model Penn ESE 570 Spring 2017 Khanna Lecture Outline! Semiconductor Physics " Band gaps "
More informationNumerical Example: Carrier Concentrations
2 Numerical ample: Carrier Concentrations Donor concentration: N d = 10 15 cm -3 Thermal equilibrium electron concentration: n o N d = 10 15 cm 3 Thermal equilibrium hole concentration: 2 2 p o = n i no
More informationOctob er 10, Quiz #1
Fall 2002 6.720J/3.43J Integrated Microelectronic Devices Prof. J. A. del Alamo Octob er 10, 2002 - Quiz #1 Name: General guidelines (please read carefully b efore starting): Make sure to write your name
More informationElectrostatics: The Key to Understanding Electronic Devices. Boundary Conditions. Physics approach: vector calculus, highly symmetrical problems
lectrostatics: The Key to Understanding lectronic Devices Boundary Conditions Physics approach: vector calculus, highly symmetrical problems 1. Potential: φ( = - ) = φ( = + ) φ() GaussÕs Law: ( ε) = ρ
More informationSection 12: Intro to Devices
Section 12: Intro to Devices Extensive reading materials on reserve, including Robert F. Pierret, Semiconductor Device Fundamentals Bond Model of Electrons and Holes Si Si Si Si Si Si Si Si Si Silicon
More information! CMOS Process Enhancements. ! Semiconductor Physics. " Band gaps. " Field Effects. ! MOS Physics. " Cut-off. " Depletion.
ESE 570: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 9, 019 MOS Transistor Theory, MOS Model Lecture Outline CMOS Process Enhancements Semiconductor Physics Band gaps Field Effects
More informationLecture 6 PN Junction and MOS Electrostatics(III) Metal-Oxide-Semiconductor Structure
Lecture 6 PN Junction and MOS Electrostatics(III) Metal-Oxide-Semiconductor Structure Outline 1. Introduction to MOS structure 2. Electrostatics of MOS in thermal equilibrium 3. Electrostatics of MOS with
More informationECE 440 Lecture 28 : P-N Junction II Class Outline:
ECE 440 Lecture 28 : P-N Junction II Class Outline: Contact Potential Equilibrium Fermi Levels Things you should know when you leave Key Questions What is the contact potential? Where does the transition
More informationLecture 2 - Carrier Statistics in Equilibrium. September 5, 2002
6.720J/3.43J Integrated Microelectronic Devices Fall 2002 Lecture 21 Lecture 2 Carrier Statistics in Equilibrium Contents: September 5, 2002 1. Conduction and valence bands, bandgap, holes 2. Intrinsic
More informationDiodes. anode. cathode. cut-off. Can be approximated by a piecewise-linear-like characteristic. Lecture 9-1
Diodes mplest nonlinear circuit element Basic operation sets the foundation for Bipolar Junction Transistors (BJTs) Also present in Field Effect Transistors (FETs) Ideal diode characteristic anode cathode
More informationChapter 2. Electronics I - Semiconductors
Chapter 2 Electronics I - Semiconductors Fall 2017 talarico@gonzaga.edu 1 Charged Particles The operation of all electronic devices is based on controlling the flow of charged particles There are two type
More informationESE 372 / Spring 2013 / Lecture 5 Metal Oxide Semiconductor Field Effect Transistor
Metal Oxide Semiconductor Field Effect Transistor V G V G 1 Metal Oxide Semiconductor Field Effect Transistor We will need to understand how this current flows through Si What is electric current? 2 Back
More informationThe Meaning of Fermi-Level And Related Concepts (Like Band-Bending)
The Meaning of Fermi-Level And Related Concepts (Like Band-Bending) Martin Peckerar January 14, 2003 The Fermi level is a term derived from statistical mechanics and used to calculate the number of mobile
More informationEE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions
EE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions Prof. Ming C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH) 1 pn Junction p-type semiconductor in
More informationECE-305: Spring Carrier Action: II. Pierret, Semiconductor Device Fundamentals (SDF) pp
ECE-305: Spring 015 Carrier Action: II Pierret, Semiconductor Device Fundamentals (SDF) pp. 89-104 Professor Mark Lundstrom Electrical and Computer Engineering Purdue University, West Lafayette, IN USA
More informationCarriers Concentration and Current in Semiconductors
Carriers Concentration and Current in Semiconductors Carrier Transport Two driving forces for carrier transport: electric field and spatial variation of the carrier concentration. Both driving forces lead
More informationGetting J e (x), J h (x), E(x), and p'(x), knowing n'(x) Solving the diffusion equation for n'(x) (using p-type example)
6.012 - Electronic Devices and Circuits Lecture 4 - Non-uniform Injection (Flow) Problems - Outline Announcements Handouts - 1. Lecture Outline and Summary; 2. Thermoelectrics Review Thermoelectricity:
More informationCarriers Concentration, Current & Hall Effect in Semiconductors. Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India
Carriers Concentration, Current & Hall Effect in Semiconductors 1 Prof.P. Ravindran, Department of Physics, Central University of Tamil Nadu, India http://folk.uio.no/ravi/semi2013 Conductivity Charge
More informationFor the following statements, mark ( ) for true statement and (X) for wrong statement and correct it.
Benha University Faculty of Engineering Shoubra Electrical Engineering Department First Year communications. Answer all the following questions Illustrate your answers with sketches when necessary. The
More informationBand-bending. EE 436 band-bending 1
Band-bending In the p-n junction and BJT, we saw that the semiconductor band edges were bent in the depletion layers. We used the depletion approximation and Poisson s equation to relate the band-bending
More informationElectrical Resistance
Electrical Resistance I + V _ W Material with resistivity ρ t L Resistance R V I = L ρ Wt (Unit: ohms) where ρ is the electrical resistivity 1 Adding parts/billion to parts/thousand of dopants to pure
More informationLecture 8. Equations of State, Equilibrium and Einstein Relationships and Generation/Recombination
Lecture 8 Equations of State, Equilibrium and Einstein Relationships and Generation/Recombination Reading: (Cont d) Notes and Anderson 2 sections 3.4-3.11 Energy Equilibrium Concept Consider a non-uniformly
More informationCharge Carriers in Semiconductor
Charge Carriers in Semiconductor To understand PN junction s IV characteristics, it is important to understand charge carriers behavior in solids, how to modify carrier densities, and different mechanisms
More informationLecture 2. Semiconductor Physics. Sunday 4/10/2015 Semiconductor Physics 1-1
Lecture 2 Semiconductor Physics Sunday 4/10/2015 Semiconductor Physics 1-1 Outline Intrinsic bond model: electrons and holes Charge carrier generation and recombination Intrinsic semiconductor Doping:
More informationSolid State Physics SEMICONDUCTORS - IV. Lecture 25. A.H. Harker. Physics and Astronomy UCL
Solid State Physics SEMICONDUCTORS - IV Lecture 25 A.H. Harker Physics and Astronomy UCL 9.9 Carrier diffusion and recombination Suppose we have a p-type semiconductor, i.e. n h >> n e. (1) Create a local
More information8.1 Drift diffusion model
8.1 Drift diffusion model Advanced theory 1 Basic Semiconductor Equations The fundamentals of semiconductor physic are well described by tools of quantum mechanic. This point of view gives us a model of
More informationSemiconductor Physics Problems 2015
Semiconductor Physics Problems 2015 Page and figure numbers refer to Semiconductor Devices Physics and Technology, 3rd edition, by SM Sze and M-K Lee 1. The purest semiconductor crystals it is possible
More informationPN Junction and MOS structure
PN Junction and MOS structure Basic electrostatic equations We will use simple one-dimensional electrostatic equations to develop insight and basic understanding of how semiconductor devices operate Gauss's
More informationECE 440 Lecture 12 : Diffusion of Carriers Class Outline:
ECE 440 Lecture 12 : Diffusion of Carriers Class Outline: Band Bending Diffusion Processes Diffusion and Drift of Carriers Things you should know when you leave Key Questions How do I calculate kinetic
More informationLecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor
Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE15 Spring 28 Lecture
More informationUniform excitation: applied field and optical generation. Non-uniform doping/excitation: diffusion, continuity
6.012 - Electronic Devices and Circuits Lecture 2 - Uniform Excitation; Non-uniform conditions Announcements Review Carrier concentrations in TE given the doping level What happens above and below room
More informationFundamentals of Semiconductor Physics
Fall 2007 Fundamentals of Semiconductor Physics 万 歆 Zhejiang Institute of Modern Physics xinwan@zimp.zju.edu.cn http://zimp.zju.edu.cn/~xinwan/ Transistor technology evokes new physics The objective of
More informationLecture 5 - Carrier generation and recombination (cont.) September 12, 2001
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2001 Lecture 5-1 Contents: Lecture 5 - Carrier generation and recombination (cont.) September 12, 2001 1. G&R rates outside thermal equilibrium
More informationLecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor
Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics t ti Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE105 Fall 2007
More informationLecture 2 - Carrier Statistics in Equilibrium. February 8, 2007
6.720J/3.43J Integrated Microelectronic Devices Spring 2007 Lecture 21 Lecture 2 Carrier Statistics in Equilibrium Contents: February 8, 2007 1. Conduction and valence bands, bandgap, holes 2. Intrinsic
More informationLecture 2. Introduction to semiconductors Structures and characteristics in semiconductors
Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation
More informationLong-channel MOSFET IV Corrections
Long-channel MOSFET IV orrections Three MITs of the Day The body ect and its influence on long-channel V th. Long-channel subthreshold conduction and control (subthreshold slope S) Scattering components
More information( )! N D ( x) ) and equilibrium
ECE 66: SOLUTIONS: ECE 66 Homework Week 8 Mark Lundstrom March 7, 13 1) The doping profile for an n- type silicon wafer ( N D = 1 15 cm - 3 ) with a heavily doped thin layer at the surface (surface concentration,
More informationFIELD-EFFECT TRANSISTORS
FIEL-EFFECT TRANSISTORS 1 Semiconductor review 2 The MOS capacitor 2 The enhancement-type N-MOS transistor 3 I-V characteristics of enhancement MOSFETS 4 The output characteristic of the MOSFET in saturation
More informationIntroductory Nanotechnology ~ Basic Condensed Matter Physics ~
Introductory Nanotechnology ~ Basic Condensed Matter Physics ~ Atsufumi Hirohata Department of Electronics Quick Review over the Last Lecture Classic model : Dulong-Petit empirical law c V, mol 3R 0 E
More informationLecture 04 Review of MOSFET
ECE 541/ME 541 Microelectronic Fabrication Techniques Lecture 04 Review of MOSFET Zheng Yang (ERF 3017, email: yangzhen@uic.edu) What is a Transistor? A Switch! An MOS Transistor V GS V T V GS S Ron D
More informationSection 12: Intro to Devices
Section 12: Intro to Devices Extensive reading materials on reserve, including Robert F. Pierret, Semiconductor Device Fundamentals EE143 Ali Javey Bond Model of Electrons and Holes Si Si Si Si Si Si Si
More informationLecture 29 - The Long Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 20, 2007
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 29-1 Lecture 29 - The Long Metal-Oxide-Semiconductor Field-Effect Transistor (cont.) April 20, 2007 Contents: 1. Non-ideal and second-order
More informationEE3901 A2001. Semiconductor Devices. Exam 1
Name ECE Box # Problem Score Points 1 10 2 30 3 35 4 25 EE3901 A2001 Semiconductor Devices Exam 1 This is a closed book test! You are allowed one sheet (both sides) of notes. Note: Potentially useful reference
More informationLecture Outline. ESE 570: Digital Integrated Circuits and VLSI Fundamentals. Review: MOSFET N-Type, P-Type. Semiconductor Physics.
ESE 57: Digital Integrated Circuits and VLSI Fundamentals Lec 4: January 24, 217 MOS Transistor Theory, MOS Model Lecture Outline! Semiconductor Physics " Band gaps " Field Effects! MOS Physics " Cutoff
More informationSample Exam # 2 ECEN 3320 Fall 2013 Semiconductor Devices October 28, 2013 Due November 4, 2013
Sample Exam # 2 ECEN 3320 Fall 203 Semiconductor Devices October 28, 203 Due November 4, 203. Below is the capacitance-voltage curve measured from a Schottky contact made on GaAs at T 300 K. Figure : Capacitance
More informationSession 5: Solid State Physics. Charge Mobility Drift Diffusion Recombination-Generation
Session 5: Solid State Physics Charge Mobility Drift Diffusion Recombination-Generation 1 Outline A B C D E F G H I J 2 Mobile Charge Carriers in Semiconductors Three primary types of carrier action occur
More informationLecture 19 - p-n Junction (cont.) October 18, Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode: parasitics, dynamics
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 19-1 Lecture 19 - p-n Junction (cont.) October 18, 2002 Contents: 1. Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode:
More information3. Consider a semiconductor. The concentration of electrons, n, in the conduction band is given by
Colloqium problems to chapter 13 1. What is meant by an intrinsic semiconductor? n = p All the electrons are originating from thermal excitation from the valence band for an intrinsic semiconductor. Then
More informationElectronic Circuits for Mechatronics ELCT 609 Lecture 2: PN Junctions (1)
Electronic Circuits for Mechatronics ELCT 609 Lecture 2: PN Junctions (1) Assistant Professor Office: C3.315 E-mail: eman.azab@guc.edu.eg 1 Electronic (Semiconductor) Devices P-N Junctions (Diodes): Physical
More informationECE-305: Spring 2018 Exam 2 Review
ECE-305: Spring 018 Exam Review Pierret, Semiconductor Device Fundamentals (SDF) Chapter 3 (pp. 75-138) Chapter 5 (pp. 195-6) Professor Peter Bermel Electrical and Computer Engineering Purdue University,
More informationLecture 2. Introduction to semiconductors Structures and characteristics in semiconductors
Lecture 2 Introduction to semiconductors Structures and characteristics in semiconductors Semiconductor p-n junction Metal Oxide Silicon structure Semiconductor contact Literature Glen F. Knoll, Radiation
More informationSpring Semester 2012 Final Exam
Spring Semester 2012 Final Exam Note: Show your work, underline results, and always show units. Official exam time: 2.0 hours; an extension of at least 1.0 hour will be granted to anyone. Materials parameters
More informationThermionic emission vs. drift-diffusion vs. p-n junction
6.772/SMA5111 - Compound Semiconductors Lecture 4 - Carrier flow in heterojunctions - Outline A look at current models for m-s junctions (old business) Thermionic emission vs. drift-diffusion vs. p-n junction
More informationPN Junctions. Lecture 7
Lecture 7 PN Junctions Kathy Aidala Applied Physics, G2 Harvard University 10 October, 2002 Wei 1 Active Circuit Elements Why are they desirable? Much greater flexibility in circuit applications. What
More informationInvestigation of tunneling effects modeling in degenerate semiconductors
Journal of Materials and Environmental Sciences ISSN : 08-508 Copyright 017, University of Mohammed 1er Oujda Morocco JMES, 017 Volume 8, Issue 3, Page 809-815 http://www.jmaterenvironsci.com ICMES016,
More informationMTLE-6120: Advanced Electronic Properties of Materials. Semiconductor p-n junction diodes. Reading: Kasap ,
MTLE-6120: Advanced Electronic Properties of Materials 1 Semiconductor p-n junction diodes Reading: Kasap 6.1-6.5, 6.9-6.12 Metal-semiconductor contact potential 2 p-type n-type p-type n-type Same semiconductor
More informationLecture 35 - Bipolar Junction Transistor (cont.) November 27, Current-voltage characteristics of ideal BJT (cont.)
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 35-1 Lecture 35 - Bipolar Junction Transistor (cont.) November 27, 2002 Contents: 1. Current-voltage characteristics of ideal BJT (cont.)
More informationMetal Semiconductor Contacts
Metal Semiconductor Contacts The investigation of rectification in metal-semiconductor contacts was first described by Braun [33-35], who discovered in 1874 the asymmetric nature of electrical conduction
More informationLecture Notes 2 Charge-Coupled Devices (CCDs) Part I. Basic CCD Operation CCD Image Sensor Architectures Static and Dynamic Analysis
Lecture Notes 2 Charge-Coupled Devices (CCDs) Part I Basic CCD Operation CCD Image Sensor Architectures Static and Dynamic Analysis Charge Well Capacity Buried channel CCD Transfer Efficiency Readout Speed
More informationUNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences. EECS 130 Professor Ali Javey Fall 2006
UNIVERSITY OF CALIFORNIA College of Engineering Department of Electrical Engineering and Computer Sciences EECS 130 Professor Ali Javey Fall 2006 Midterm I Name: Closed book. One sheet of notes is allowed.
More informationLecture 8: Ballistic FET I-V
Lecture 8: Ballistic FET I-V 1 Lecture 1: Ballistic FETs Jena: 61-70 Diffusive Field Effect Transistor Source Gate L g >> l Drain Source V GS Gate Drain I D Mean free path much shorter than channel length
More informationMOS CAPACITOR AND MOSFET
EE336 Semiconductor Devices 1 MOS CAPACITOR AND MOSFET Dr. Mohammed M. Farag Ideal MOS Capacitor Semiconductor Devices Physics and Technology Chapter 5 EE336 Semiconductor Devices 2 MOS Capacitor Structure
More information