TEST REPORT. NO.: A001R Date: Dec 27, 2013 Page 1 of 13

Size: px
Start display at page:

Download "TEST REPORT. NO.: A001R Date: Dec 27, 2013 Page 1 of 13"

Transcription

1 NO.: A001R Date: Dec 27, 2013 Page 1 of 13 Applicant: Jinyun Lanxin Electronic Technology Co., Ltd. Address: NO.2XINMIN ROAD,DONGSHAN INDUSTRIAL AREA WUYUN TOWN JINYUN CONUNTY,LISHUI CITY,ZHEJIANG,CHINA Report on the submitted sample said to be: Sample name: POWER CHARGER Model: LT-12, LT-09, LT-01 Item/Lot No.: / Material: / Buyer: / Supplier: / Manufacturer: / Sample received date: Dec 20, 2013 Testing period: From Dec 20, 2013to Dec 27, 2013 Test Method: (1) Screening by X-ray Fluorescence Spectrometry (XRF) :With reference to IEC :2013 Ed 1.0 Screening Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry (2) Chemical test: Test Item Pretreatment Method Measuring Instrument MDL Lead (Pb) IEC :2013 Ed 1.0 Section 7 ICP-OES 2 mg/kg Cadmium (Cd) IEC :2013 Ed 1.0 Section 7 ICP-OES 2 mg/kg Mercury (Hg) IEC :2013 Ed 1.0 Section 7 ICP-OES 2 mg/kg Hexavalent Chromium (Cr 6+ ) IEC 62321:2008 Ed 1.0 Annex C UV-VIS 2 mg/kg Hexavalent Chromium (Cr 6+ ) IEC 62321:2008 Ed 1.0 Annex B UV-VIS / Polybrominated Biphenyls (PBBs )/ Polybrominated Diphenyl Ethers (PBDEs) IEC 62321:2008 Ed 1.0 Annex A GC-MS 5 mg/kg Conclusion: Tested samples Standard Conclusion Screening components Screening by XRF spectroscopy Pass of submitted samples and chemical confirmation test for RoHS directive (2011/65/EU) ******FOR FURTHER DETAILS, PLEASE REFER TO THE FOLLOWING PAGE(S)****** Signed for and on behalf of Shenzhen AOV Testing Technology Co., Ltd Tested by: Reviewed by: Approved by: Li Xian Yong, Leif Liu Lin Wen, Lewis Lv Jie Hua, Jeewah Project Leader Laboratory Supervisor Technical Director

2 NO.: A001R Date: Dec 27, 2013 Page 2 of 13 Test Flow (Chemical Test): 1. To Determine Lead, Cadmium Content(for Polymer, Electronics): Weigh the sample into a vessel. Add the digestion solution, close the microwave vessel The sample is digested in the microwave oven following a specific decomposition program. Report Tested by ICP-OES Take out the vessel, filter; transfer the digestion solution into the volumetric flask and filled to the mark with DI water. 2. To Determine Lead, Cadmium Content (for Metals): Weigh the sample into a vessel. Add the digestion solution; the vessel is heated until the sample has been dissolved. Add H 2 O 2 until the digestion solution is clear. Report Tested by ICP-OES Cool to room temperature, filter; transfer the digestion solution into the volumetric flask and filled to the mark with DI water. 3.To Determine Mercury Content: Weigh the sample into a vessel. Add the digestion solution, close the microwave vessel. The sample is digested in the microwave oven following a specific decomposition program. Report Tested by ICP-OES Take out the vessel, filter; transfer the digestion solution into the volumetric flask and filled to the mark with DI water.

3 NO.: A001R Date: Dec 27, 2013 Page 3 of To Determine Hexavalent Chromium Content (for Polymer, Electronics): Weigh the sample into a conical flask; add the digestion solution. Stir 3 hours while heating the samples continuously to ºC, Gradually cool each solution to room temperature. Filter; adjust the ph of the solution, transfer the digestion solution into the volumetric flask and filled to the mark with DI water. Report Tested by UV-VIS Add the diphenylcarbazide solution and adjust the ph to acidic. Transfer a portion of the solution to absorption cell. 5. To Determine Hexavalent Chromium Content (for Metals/boiling water extraction): Measure 50 ml of water and fill into the beaker and bring to a boil on the hot plate. Totally immerse the samples which have a surface area of (50±5) cm 2 inside the beaker. Leach for 10 minutes while the water continues to boil. Remove the samples, and cool the beaker to room temperature. Filter and then add H 3 PO 4, Split the solution into another beaker as the blank. Report Tested by UV-VIS Add test solution to one of the two beakers. Compare the colour with blank. If need, Transfer a portion of the solution and standard solution with concentration of 0.02mg/kg to absorption cell respectively. 6. To Determine Polybrominated Biphenyls/Polybrominated Diphenyl Ethers Content: Weigh appropriate sample into a extraction thimble. Add appropriate internal standard Add organic solvent to the flask; extract within appropriate hours. Report Tested by GC-MS Concentrate the extract into a volumetric flask, filled to the mark with organic solvent.

4 NO.: A001R Date: Dec 27, 2013 Page 4 of 13 Test Results: Part no. Sample name XRF results Chemical confirmation result(mg/kg) 1 Metal plug PBBs: N.D. 2 Black outer shell (Mono to Nona) BDEs: N.D. DecaBDE: 55 Br (#2) Inconclusive 3 White wire 4 Black wire 5 Sheath 6 Metal plug 7 Black plastic Cd: 23 Cd (#1) Inconclusive PBBs: N.D. (Mono to Nona) BDEs: N.D. DecaBDE: 58 Br (#2) Inconclusive

5 NO.: A001R Date: Dec 27, 2013 Page 5 of 13 Part no. Sample name XRF results Chemical confirmation result(mg/kg) 8 Contact sheet 9 Copper wire 10 DC plug sheath 11 Yellow wire 12 Tinplating copper wire 13 Transformer skeleton 14 Copper wire

6 NO.: A001R Date: Dec 27, 2013 Page 6 of 13 Part no. Sample name XRF results Chemical confirmation result(mg/kg) 15 Yellow plastic film 16 Capacitor black plastic film 17 Capacitor 18 Blue ceramic capacitor 19 Resistor 1 Cr 6+ : N.D. Cr (#2) Inconclusive 20 Resistor 2 21 Resistor pin

7 NO.: A001R Date: Dec 27, 2013 Page 7 of 13 Part no. Sample name XRF results Chemical confirmation result(mg/kg) 22 Diode body Pb (#1) Inconclusive 23 Diode pin Pb: Diode 25 Capacitor 26 Capacitor 27 Resistor 28 LED PBBs: N.D. PBDEs: N.D. Br (#2) Inconclusive

8 NO.: A001R Date: Dec 27, 2013 Page 8 of 13 Part no. Sample name XRF results Chemical confirmation result(mg/kg) 29 Circuit board 30 Soldering tin 31 Voltage-regulator PBBs: N.D. tube PBDEs: N.D. Br (#2) Inconclusive 32 IC PBBs: N.D. PBDEs: N.D. Br (#2) Inconclusive Pb OL 33 Chip resistor Pb: (#3) Pb OL 34 Chip capacitor Pb: (#3) Pb (#1) Inconclusive 35 Fuse pin Pb: 14

9 NO.: A001R Date: Dec 27, 2013 Page 9 of 13 Part no. Sample name XRF results Chemical confirmation result(mg/kg) 36 Fuse metal outer shell 37 Fuse glass 38 Screw 39 Black EVA Remark: -Specimens, which requested to determine Cadmium and Lead Content by chemical test, have been dissolved completely. - mg/kg = ppm - N.D.=not detected(<mdl) - MDL=Method Detection Limit - N.A.= Not Applicable - BL= BELOW LIMIT - OL= OVER LIMIT - Homogeneous material means one material of uniform composition throughout or a material, consisting of a combination of materials, that cannot be disjointed or separated into different materials by mechanical actions such as unscrewing, cutting, crushing, grinding and abrasive processes. - (#1) = The screening result was found in the region of inconclusive (See Table B) and further chemical tests were suggested. - (#2) = Cr or Br were detected above the screening Limit (see table B) and further chemical tests were suggested. - (#3) = Sample 33 is electronic component. The lead content in glass of electronic components is exempted from the requirement of Directive 2011/65/EU (RoHS) - (#3) = Sample 34 is electronic ceramic parts. The lead content in electronic ceramic parts (e.g. piezoelectronic devices) is exempted from the requirement of Directive 2011/65/EU (RoHS) ******************************

10 NO.: A001R Date: Dec 27, 2013 Page 10 of 13 (B) XRF Screening Limit in mg/kg for regulated elements in various matrices. Element Polymer materials Metallic materials Composite materials (70-3σ)< X < ( 130+3σ) OL BL (70-3σ) < X < (70 +3σ) OL LOD < X < (150 +3σ) OL (700-3σ) < X < ( σ) OL BL (700-3σ) < X < ( σ) OL BL (500-3σ) < X < ( σ) OL (700-3σ) < X < ( σ) OL BL (700-3σ) < X < ( σ) OL BL (500-3σ) < X < ( σ) OL (700-3σ)< X BL (700-3σ)< X BL (500-3σ)< X ( 300-3σ)< X Not Applicable BL (250-3σ)< X Remark: -A BELOW LIMIT (BL) or OVER LIMIT (OL) determination will be set at 30 % (50 % for composite materials) less than or greater than the limit, respectively. The margins of safety have been agreed upon based on the experience of many experts and practitioners in the industry. Further explanation for this approach to estimating uncertainty. -The symbol X marks the region, where further investigation is necessary. -LOD means Limit of Detection. -The term σ expresses the repeatability of the analyzer at the action level. (C) RoHS Requirement Restricted substances Lead (Pb) Cadmium (Cd) Mercury (Hg) Hexavalent Chromium (Cr 6+ ) Polybrominated biphenyls (PBBs) Polybrominated diphenyl ethers (PBDEs) The above limits were quoted from 2011/65/EU. Limits 0.1% (1000 ppm) 0.01% (100 ppm) 0.1% (1000 ppm) 0.1% (1000 ppm) 0.1% (1000 ppm) 0.1% (1000 ppm) ****************************** Remark: -Chemical confirmation tests were conducted to verify the inconclusive results, Hexavalent Chromium (Cr 6+ ), Polybrominated biphenyls(pbbs) and Polybrominated diphenyl ethers(pbdes) content. -As requested by the applicant, only components shown in this report were screened by XRF spectroscopy for 2011/65/EU, other components were not screened included in this report. Disclaimers: This XRF Screening Report is for reference purposes only. The applicant shall make its/his/her own judgment as to whether the information provided in this XRF Screening Report is sufficient for its/his/her purposes. The results shown in this XRF Screening Report will differ based on various factors, including but not limited to, the sample size, thickness, area, surface flatness, equipment parameters and matrix effect (e.g. Plastic, Rubber, Metal, Glass, Ceramic etc.). Further wet chemical pre-treatment with relevant chemical equipment analysis are required to obtain quantitative data. - Photo is included.

11 NO.: A001R Date: Dec 27, 2013 Page 11 of 13 Photographs of Samples POWER CHARGER

12 NO.: A001R Date: Dec 27, 2013 Page 12 of 13 Photographs of Samples

13 NO.: A001R Date: Dec 27, 2013 Page 13 of 13 Photographs of Samples ***End of Report***

Test Report NO.: ASZ L-2 Date: Jun 19, 2008 Page 1 of 5

Test Report NO.: ASZ L-2 Date: Jun 19, 2008 Page 1 of 5 Test Report NO.: ASZ0806043504L-2 Date: Jun 19, 2008 Page 1 of 5 Customer: Foshan ADL lighting Co., Ltd Address: No.1, LIANHE Industrial Zone, Luocun, Nanhai, Foshan, Guangdong, China. Report on the submitted

More information

Test Report. LEDELS LIGHTING CO., LTD Address. Applicant

Test Report. LEDELS LIGHTING CO., LTD Address. Applicant Test Report No. R011412010R-1 Date Dec. 09, 2014 Page 1 of 10 Applicant LEDELS LIGHTING CO., LTD Address 5F, Block C, Mingjinhai Ind. Park, Zhoushi Road, Shiyan, Bao an, Shenzhen, Guangdong, China The

More information

Applicant: Cactus Technologies Ltd Date : Apr 07, 2010 Suite C 15/F Capital Trade Center 62 Tsun Yip Street Kwun Tong Kowloon Hong Kong

Applicant: Cactus Technologies Ltd Date : Apr 07, 2010 Suite C 15/F Capital Trade Center 62 Tsun Yip Street Kwun Tong Kowloon Hong Kong RoHS Screening Analysis Report Number : TWNC00152904 Applicant: Cactus Technologies Ltd Date : Apr 07, 2010 Suite C 15/F Capital Trade Center 62 Tsun Yip Street Kwun Tong Kowloon Hong Kong Sample Description:

More information

Verification Report. No. CANEC Date: 12 Apr Page 1 of 9.

Verification Report. No. CANEC Date: 12 Apr Page 1 of 9. Verification Report. No. CANEC1302893701 Date: 12 Apr 2013. Page 1 of 9. PROMOVER INDUSTRIAL COMPANY LIMITED. N0.34 CHIA SHINE ROAD WAN LUAN VILLAGE PING TUNG COUNTRY 92343 TAIWAN. Sample Name :. SGS Job

More information

APPLICANT: CACTUS TECHNOLOGIES LTD DATE : JUL 25, 2007 SUITE /F BILLION TRADE CENTER 31 HUNG TO ROAD KWUN TONG KOWLOON HONG KONG

APPLICANT: CACTUS TECHNOLOGIES LTD DATE : JUL 25, 2007 SUITE /F BILLION TRADE CENTER 31 HUNG TO ROAD KWUN TONG KOWLOON HONG KONG XRF SCREENING AND CHEMICAL CONFIRMATION REPORT NUMBER : APPLICANT: CACTUS TECHNOLOGIES LTD DATE : JUL 25, 2007 SUITE 2002 20/F BILLION TRADE CENTER 31 HUNG TO ROAD KWUN TONG KOWLOON HONG KONG SAMPLE DESCRIPTION:

More information

Verification Result :.

Verification Result :. Verification Report. No. CANEC1405274901 Date: 05 May 2014. Page 1 17. AMERICAN POWER CONVERSION HOLDING INC.,TAIWAN BRANCH. 3F.,NO. 205, SEC.3, BEIXIN RD., 231 XINDIAN DIST., NEW TAIPEI CITY, 231 TAIWAN.

More information

Verification Result :.

Verification Result :. Verification Report. No. SZXEC1700532001 Date: 13 Jun 2017. Page 1 of 15. SHENZHEN REFLYING ELECTRONIC CO.,LTD. 6 BLDG, GAOXINJIAN INDUSTRIAL ZONE, HEPING VILLAGE,FUYONG TOWN,BAO AN DISTRICT,SHENZHEN,

More information

Verification Report. No. CANEC Date: 10 Jul Page 1 of 13.

Verification Report. No. CANEC Date: 10 Jul Page 1 of 13. Verification Report. No. Date: 10 Jul 2012. Page 1 of 13. 10GTEK TRANSCEIVERS CO.,LTD. 7 FLOOR WEST, ANLE WUYE BUILDING, SHUNFENG ROAD, AREA 44, BAOAN DISTRICT, SHENZHEN, GUANGDONG PROVINCE, CHINA. Sample

More information

: DAM1-125,DAM1-160,DAM1-400,DAM1-630,DAM1-800, DAM1-1600

: DAM1-125,DAM1-160,DAM1-400,DAM1-630,DAM1-800, DAM1-1600 Applicant: Shanghai DADA Electric CO.,Ltd. Date: Aug 10, 2015 No 171,Yezhuang Road, Zhuanghang, Fengxian, Shanghai, China Sample Description: One (1) piece of submitted sample said to be Item Name : Moulded

More information

Test Report. Report No. RLSHE Page 2 of 5 Test Result: Content 1 2

Test Report. Report No. RLSHE Page 2 of 5 Test Result: Content 1 2 Report No. RLSHE001093670001 Page 1 of 5 Applicant NANTONG HUADA MICROELECTRONICS GROUP CO., LTD Address NO.99 ZILANG ROAD,NANTONG CITY,JIANGSU PROVINCE The following sample(s)and sample information was/were

More information

Test Report. Report No. RLSHD Page 1 of 6

Test Report. Report No. RLSHD Page 1 of 6 Report No. RLSHD000756910001 Page 1 of 6 Applicant Address WUJIANG MIGHTYTEK SEMICONDUCTOR CO.,LTD NO.2100 NORTH OF ZHONGSHAN ROAD,SONGLING TOWN,WUJIANG CITY Report on the submitted sample said to be Sample

More information

Verification Report. No. CANEC Date: 21 Jun Page 1 of 8.

Verification Report. No. CANEC Date: 21 Jun Page 1 of 8. Verification Report No CANEC1809061901 Date: 21 Jun 2018 Page 1 of 8 FLASHBAY ELECTRONICS BLGD B & C XI FENG CHENG IND ZONE,NO2 FUYUAN ROAD HE PING, VILLAGE, FUYONG TOWN,SHENZHEN,CHINA Sample Name : SGS

More information

TEST REPORT NUMBER: SHAH TESTS CONDUCTED. (A) TEST RESULT SUMMARY FOR RoHS DIRECTIVE:

TEST REPORT NUMBER: SHAH TESTS CONDUCTED. (A) TEST RESULT SUMMARY FOR RoHS DIRECTIVE: TESTS COUCTED (A) TEST RESULT SUMMARY FOR RoHS DIRECTIVE: TESTING ITEM RESULT (ppm) (1) CADMIUM (Cd) CONTENT (ppm) (

More information

TEST REPORT. Report No.: STR Date: September 09, 2013 Page 1 of 12

TEST REPORT. Report No.: STR Date: September 09, 2013 Page 1 of 12 TEST REORT Report No.: STR130828810 Date: September 09, 2013 age 1 of 12 Applicant : Shenzhen New Huayi Instrument Co., Ltd Applicant Address : West Wing, 9F., Block 3, Saige Science and Technology Industrial

More information

Test Report. Report No. SCL03H Page 1 of 7

Test Report. Report No. SCL03H Page 1 of 7 Report No. SCL03H004659 Page 1 of 7 Applicant FOSHAN BLUEROCKET ELECTRONICS CO.,LTD Address NO.45 GUXIN ROAD, CHANCHENG DISTRICT, FOSHAN, GUANGDONG, P.R.C. The following sample(s) and sample information

More information

Test Report MITSUI HIGH-TEC (SHANGHAI) CO.,LTD NO.2001 XINJIN QIAO ROAD EXPORT PROCESSING ZONE PUDONG SHANGHAI CHINA

Test Report MITSUI HIGH-TEC (SHANGHAI) CO.,LTD NO.2001 XINJIN QIAO ROAD EXPORT PROCESSING ZONE PUDONG SHANGHAI CHINA Report No. ECL01H033498 Page 1 of 7 Applicant Address MITSUI HIGH-TEC (SHANGHAI) CO.,LTD NO.2001 XINJIN QIAO ROAD EXPORT PROCESSING ZONE PUDONG SHANGHAI CHINA The following sample(s) and sample information

More information

Test Report. Report No. ECL01H Page 1 of 7

Test Report. Report No. ECL01H Page 1 of 7 Report No. ECL01H067640001 Page 1 of 7 Applicant SHANGHAI SEEFULL ELECTRONIC CO., LTD LITE-ON SEMICONDUCTOR CORP. Address 6 ZHENYE RD. DONGJING INDUSTRIAL AREA SONGJIANG DISTRICT, SHANGHAI, CHINA 9F,NO.233-2

More information

6 Floor Baowen Building, Baole New Village, Xixiang Yantian, Bao An District, Shenzhen City Tel : Fax:

6 Floor Baowen Building, Baole New Village, Xixiang Yantian, Bao An District, Shenzhen City Tel : Fax: 6 Floor Baowen Building, Baole New Village, Xixiang Yantian, Bao An District, Shenzhen City Tel : +86-755-27912080 Fax: +86-755-27916936 RoHS TEST REPORT Product name: POE power adapter Trademark: Model

More information

Page 2 of 8 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of PBBs

Page 2 of 8 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of PBBs Page 1 of 8 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period DIE BONDING

More information

Test Report NANTONG HUADA MICROELECTRONICS GROUP CO., LTD NO.99 ZILANG ROAD,NANTONG CITY,JIANGSU PROVINCE

Test Report NANTONG HUADA MICROELECTRONICS GROUP CO., LTD NO.99 ZILANG ROAD,NANTONG CITY,JIANGSU PROVINCE Report No. ECL01J068075001 Page 1 of 6 Applicant Address NANTONG HUADA MICROELECTRONICS GROUP CO., LTD NO.99 ZILANG ROAD,NANTONG CITY,JIANGSU PROVINCE The following sample(s) and sample information was/were

More information

Test Report. Report No. RLSHE Page 2 of 7

Test Report. Report No. RLSHE Page 2 of 7 Report No. Page 1 of 7 Applicant LIGHT COUNTRY (CHANG SHU)CO.,LTD Address NO.88,NING BO ROAD,NEW HI-TECH INDUSTRY,CHANGSHU,JIANGSU,CHINA The following sample(s)and sample information was/were submitted

More information

Test Report. Report No. ECL01H Page 1 of 9

Test Report. Report No. ECL01H Page 1 of 9 Report No. ECL01H067809001 Page 1 of 9 Applicant Address LITE-ON MICROELECTRONICS (WUXI) CO., LTD. LITE-ON SEMICONDUCTOR CORP. LAND LOT J7 J8WEPZ, NEW DISTRICT, WUXI CITY, JIANGSU, CHINA 9F,NO.233-2 PAO-CHIAO

More information

Client : NINGBO PACE PNEUMATICS CO.,LTD NO.11 ANXING RD ZHANGQI TOWN,CIXI NINGBO CITY P.R.CHINA

Client : NINGBO PACE PNEUMATICS CO.,LTD NO.11 ANXING RD ZHANGQI TOWN,CIXI NINGBO CITY P.R.CHINA TEST REPORT DEKRA Testing and Certification (Shanghai) Ltd 5F, 217# Jiangchangsan Road, Shibei Hi-Tech Park, Shanghai, P.R.C. (200436) Tel.: +86 21 6056 7512 Fax: +86 21 6056 7555 Contact Mr. James Yu

More information

The following sample(s) was/were submitted and identified by/on behalf of the client as : (2) (3) (4) (5) Please refer to next page(s).

The following sample(s) was/were submitted and identified by/on behalf of the client as : (2) (3) (4) (5) Please refer to next page(s). Test Report No. : CE/2007/C7382B Date : 2008/06/18 Page : 1 of 5 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Manufacturer

More information

TEST REPORT : SR A-DC, SR A-DA, SR A-DT, SR A-DN, SR C-DC, SR C-DA, SR C-DT, SR C-DN

TEST REPORT : SR A-DC, SR A-DA, SR A-DT, SR A-DN, SR C-DC, SR C-DA, SR C-DT, SR C-DN Applicant : UTIS Address : 652-10, Choji-dong, Danwon-ku, Ansan-city, Gyeonggi-do, Korea Page: 1 of 5 Sample Description : The following submitted sample(s) said to be:- Name/Type of Product Sample ID

More information

No. KE/2016/52417 Date 2016/05/26 Page 2 of 6 Test Result(s) PART NAME No.1 Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI

No. KE/2016/52417 Date 2016/05/26 Page 2 of 6 Test Result(s) PART NAME No.1 Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI No. KE/2016/52417 Date 2016/05/26 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Style/Item No. Material Component Color Sample Receiving

More information

No. : CE/2012/A3090 Date : 2012/10/23 GAP PAD 1000SF RICK STEWART REPORT PER REQUEST FOR QUOTE, DATED 10/5/11

No. : CE/2012/A3090 Date : 2012/10/23 GAP PAD 1000SF RICK STEWART REPORT PER REQUEST FOR QUOTE, DATED 10/5/11 No. CE/2012/A3090 Date 2012/10/23 Page 1 of 5 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Buyer/Order No. Other Info. Sample Receiving Date

More information

Test Report. Report No. ECL01H Page 1 of 7

Test Report. Report No. ECL01H Page 1 of 7 Report No. ECL01H067806001 Page 1 of 7 Applicant LITE-ON MICROELECTRONICS (WUXI) CO., LTD. LITE-ON SEMICONDUCTOR CORP. Address LAND LOT J7 J8WEPZ, NEW DISTRICT, WUXI CITY, JIANGSU, CHINA 9F,NO.233-2 PAO-CHIAO

More information

No. CE/2014/51910 Date 2014/05/20 Page 2 of 5 Test Result(s) PART NAME No.1 Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI

No. CE/2014/51910 Date 2014/05/20 Page 2 of 5 Test Result(s) PART NAME No.1 Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI No. CE/2014/51910 Date 2014/05/20 Page 1 of 5 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No. Other Info.

More information

TEST REPORT NUMBER: SHAH S1 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.

TEST REPORT NUMBER: SHAH S1 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O. APPLICANT: LITEON SEMICOUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.C DATE: AUG 20, 2008 SHANGHAI SEEFULL ELECTRONIC CO.,LTD. 6 ZHENGYE RD., DONGJING, SONGJIANG DISTRICT, SHANGHAI,

More information

Test Report No. : CE/2008/38467 Date : 2008/04/07 Page : 2 of 11 Test Result(s) PART NAME NO.1 : BLACK PLASTIC TUBE Cadmium (Cd) Lead (Pb) Mercury (Hg

Test Report No. : CE/2008/38467 Date : 2008/04/07 Page : 2 of 11 Test Result(s) PART NAME NO.1 : BLACK PLASTIC TUBE Cadmium (Cd) Lead (Pb) Mercury (Hg Test Report No. : CE/2008/38467 Date : 2008/04/07 Page : 1 of 11 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Lot No.

More information

TEST REPORT Report No. : GR:HL: DATE : 20/11/2014

TEST REPORT Report No. : GR:HL: DATE : 20/11/2014 RAJASTHAN ELECTRIC INDUSTRIES. C-2, INDUSTRIAL ESTATE BAIS GODAM JAIPUR- INDIA CONTACT PERSON : Mr. GAURANG GUPTA THE FOLLOWING SAMPLE(S) WAS/WERE SUBMITTED AND IDENTIFIED BY/ON BEHALF OF THE CUSTOMER

More information

Test Report. Report No. ECL01H Page 1 of 9

Test Report. Report No. ECL01H Page 1 of 9 Report No. ECL01H067702001 Page 1 of 9 Applicant SHANGHAI SEEFULL ELECTRONIC CO., LTD LITE-ON SEMICONDUCTOR CORP. Address 6 ZHENYE RD. DONGJING INDUSTRIAL AREA SONGJIANG DISTRICT, SHANGHAI, CHINA 9F,NO.233-2

More information

Test Report REPORT NO. : CRSSA/ /16 CRS REF. : CRSSA/16/3035/Hitachi DATE REPORTED : 06 th Jan., 2017 PAGE : 1 of 5

Test Report REPORT NO. : CRSSA/ /16 CRS REF. : CRSSA/16/3035/Hitachi DATE REPORTED : 06 th Jan., 2017 PAGE : 1 of 5 CRS REF. : CRSSA/16/303/Hitachi PAGE : 1 of Hitachi Chemical (Selangor) Sdn. Bhd. The following merchandise was (were) submitted and identified by the client as: Sample Receiving Date : 30/12/2016 Testing

More information

Test Report No. CANEC Date: 01 Sep 2011 Page 1 of 8

Test Report No. CANEC Date: 01 Sep 2011 Page 1 of 8 Test Report No. CANEC1103340401 Date: 01 Sep 2011 Page 1 of 8 GEJIU ZILI MINING&SMEL TING CO.,LTD HUOGUDU,JIJIE TOWN,GEJIU CITY,HONGHE ZHOU,YUNNAN PROVINCE CHINA The following sample(s) was/were submitted

More information

TEST REPORT NUMBER: SHAH S1 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.

TEST REPORT NUMBER: SHAH S1 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O. APPLICANT: LITEON SEMICOUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.C DATE: AUG 20, 2008 SHANGHAI SEEFULL ELECTRONIC CO.,LTD. 6 ZHENGYE RD., DONGJING, SONGJIANG DISTRICT, SHANGHAI,

More information

Test Report REPORT NO. : CRSSA/ /16 CRS REF. : CRSSA/16/0030/Hitachi DATE REPORTED : 13 th Jan., 2016 PAGE : 1 of 5

Test Report REPORT NO. : CRSSA/ /16 CRS REF. : CRSSA/16/0030/Hitachi DATE REPORTED : 13 th Jan., 2016 PAGE : 1 of 5 REPORT NO. : CRSSA/0032-1/16 PAGE : 1 of Hitachi Chemical (Selangor) Sdn. Bhd. The following merchandise was (were) submitted and identified by the client as: Sample Receiving Date : 07/01/2016 Testing

More information

Test Report No. KD/2013/50027A-01 Date 2013/07/01 Page 2 of 6 Test Result(s) PART NAME No.1 PART NAME No.2 PART NAME No.3 Cadmium (Cd) Lead (Pb) Mercu

Test Report No. KD/2013/50027A-01 Date 2013/07/01 Page 2 of 6 Test Result(s) PART NAME No.1 PART NAME No.2 PART NAME No.3 Cadmium (Cd) Lead (Pb) Mercu Test Report No. KD/2013/50027A-01 Date 2013/07/01 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Style/Item No. Sample Receiving

More information

ICP Test Report Certification Packet

ICP Test Report Certification Packet Company Name: Littelfuse, Inc. ICP Test Report Certification Packet Product Type: Surface Mount Varistors Product Series: CH Series RoHS Compliant Models Issue Date: June 4, 2010 It is hereby certified

More information

ICP Test Report Certification Packet

ICP Test Report Certification Packet ICP Test Report Certification Packet Company name : Littelfuse, Inc. Product Series: Mini PCB Holder 153 series Product #: 01530008Z_01530007Z Issue Date: November 12, 2012 It is hereby certified by Littelfuse,

More information

TEST REPORT NUMBER: SHAH DATE: AUG 18, 2008 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.

TEST REPORT NUMBER: SHAH DATE: AUG 18, 2008 APPLICANT: LITEON SEMICONDUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O. APPLICANT: LITEON SEMICOUCTOR CORP. 28-1, WU SHIN STREET, TA WU LUNG, KEELUNG 204, TAIWAN, R.O.C DATE: AUG 18, 2008 SHANGHAI SEEFULL ELECTRONIC CO.,LTD. 6 ZHENGYE RD., DONGJING, SONGJIANG DISTRICT, SHANGHAI,

More information

Test Report No. : KA/2012/40043 Date : 2012/04/10 Page : 2 of 8 Test Result(s) PART NAME NO.1 : BLACK EPOXY MOLDING COMPOUNDS Test Item (s): MDL Resul

Test Report No. : KA/2012/40043 Date : 2012/04/10 Page : 2 of 8 Test Result(s) PART NAME NO.1 : BLACK EPOXY MOLDING COMPOUNDS Test Item (s): MDL Resul Test Report No. : KA/2012/40043 Date : 2012/04/10 Page : 1 of 8 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : JP Reference

More information

Page 2 of 11 Test Result(s) PART NAME No.1 TRANSPARENT-YELLOW PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of

Page 2 of 11 Test Result(s) PART NAME No.1 TRANSPARENT-YELLOW PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of Page 1 of 11 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period TSF 6592LV

More information

Test Report No. : KA/2010/C2116 Date : 2011/01/05 Page : 2 of 6 Test results by chemical method (Unit: mg/kg) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexa

Test Report No. : KA/2010/C2116 Date : 2011/01/05 Page : 2 of 6 Test results by chemical method (Unit: mg/kg) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexa Test Report No. : KA/2010/C2116 Date : 2011/01/05 Page : 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Color : Sample Receiving Date

More information

Management number No. KA/2015/80033 Date 2015/08/10 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf

Management number No. KA/2015/80033 Date 2015/08/10 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf Date of issue August 19, 2015 Management number 00000000152298 TO AMKOR TECHNOLOGY Analysis Report Analysis Compounds RoHS(Cd,Pb,Cr.Hg,PBB,PBDE) 1.Parts number ELP NBD-5232K 2.Results of analysis Please

More information

ICP Test Report Certification Packet

ICP Test Report Certification Packet ICP Test Report Certification Packet Company name : Littelfuse, Inc. Product Series: Varistors Product #: VxxZXxxP Series Issue Date: May 18, 2010 It is hereby certified by Littelfuse, Inc. that there

More information

Test Report REPORT NO. : CRSSA/ /17 CRS REF. : CRSSA/17/1680/Hitachi DATE REPORTED : 06 th July, 2017 PAGE : 1 of 5

Test Report REPORT NO. : CRSSA/ /17 CRS REF. : CRSSA/17/1680/Hitachi DATE REPORTED : 06 th July, 2017 PAGE : 1 of 5 REPORT NO. : CRSSA/0827-1/17 PAGE : 1 of Hitachi Chemical (Selangor) Sdn. Bhd. The following merchandise was (were) submitted and identified by the client as: Sample Receiving Date : 29/06/2017 Testing

More information

Materials Declaration

Materials Declaration Part Name: : Part Weight (kg): 3300 International Airport Drive, Suite 200 Charlotte, NC 28208 (704) 424-5448 www.norcomp.net Materials Declaration Dual Port Connector 189-009-613R491 0.01600 Environment

More information

Page 2 of 12 Test Result(s) PART NAME No.1 IC TRANSCEIVER Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performed by

Page 2 of 12 Test Result(s) PART NAME No.1 IC TRANSCEIVER Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performed by Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Test Report No. : CE/2015/15894 Date : 2015/02/04 NIHON ALMIT CO., LTD. ALMIT BLDG., , YAYOICHO, NAKANO-KU, TOKYO, JAPAN Page : 1 of 7 *CE/2015/

Test Report No. : CE/2015/15894 Date : 2015/02/04 NIHON ALMIT CO., LTD. ALMIT BLDG., , YAYOICHO, NAKANO-KU, TOKYO, JAPAN Page : 1 of 7 *CE/2015/ Page 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period FLUX SR-34SUPER

More information

Page 2 of 9 Test Result(s) PART NAME No.1 DARK BROWN PASTE Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and pe

Page 2 of 9 Test Result(s) PART NAME No.1 DARK BROWN PASTE Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and pe Page 1 of 9 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period TSF-6522

More information

Chemical Laboratory - Kao., SGS Taiwan Ltd. Test Report No. : KA/2017/50850 Date : 2017/05/25 HERAEUS MATERIALS SINGAPORE PTE LTD BLOCK 5002, ANG MO K

Chemical Laboratory - Kao., SGS Taiwan Ltd. Test Report No. : KA/2017/50850 Date : 2017/05/25 HERAEUS MATERIALS SINGAPORE PTE LTD BLOCK 5002, ANG MO K Page 1 of 14 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Description Style/Item No. Color Sample Receiving Date Testing Period Sample Submitted By

More information

TEST REPORT Report No. : GR:HL: DATE : 27/10/2014

TEST REPORT Report No. : GR:HL: DATE : 27/10/2014 TECHNOVA IMAGING SYSTEMS (P) LTD. C-2 M.I.D.C. TALOJA, DIST. RAIGAD RAIGAD-410208 INDIA CONTACT PERSON : MR. VINAY KADAM THE FOLLOWING SAMPLE(S) WAS/WERE SUBMITTED AND IDENTIFIED BY/ON BEHALF OF THE CUSTOMER

More information

Test Report No. KE/2017/C1499 Date 2018/01/02 Page 2 of 7 Test Result(s) PART NAME No.1 WHITE POLYOXYMETHYLENE Test Item(s) Cadmium (Cd) Lead (Pb) Mer

Test Report No. KE/2017/C1499 Date 2018/01/02 Page 2 of 7 Test Result(s) PART NAME No.1 WHITE POLYOXYMETHYLENE Test Item(s) Cadmium (Cd) Lead (Pb) Mer Test Report No. KE/2017/C1499 Date 2018/01/02 Page 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Description Style/Item No. Material Component

More information

Test Report No. CE/2016/43515 Date 2016/04/22 Page 2 of 7 Test Result(s) PART NAME No.1 AMBER FILM Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) He

Test Report No. CE/2016/43515 Date 2016/04/22 Page 2 of 7 Test Result(s) PART NAME No.1 AMBER FILM Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) He Test Report No. CE/2016/43515 Date 2016/04/22 Page 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Color Style/Item

More information

Test Report No. CE/2017/40923 Date 2017/04/14 Page 2 of 5 Test Result(s) PART NAME No.1 COPPER COLORED METAL WIRE Test Item(s) Cadmium (Cd) Lead (Pb)

Test Report No. CE/2017/40923 Date 2017/04/14 Page 2 of 5 Test Result(s) PART NAME No.1 COPPER COLORED METAL WIRE Test Item(s) Cadmium (Cd) Lead (Pb) Test Report No. CE/2017/40923 Date 2017/04/14 Page 1 of 5 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Sample Receiving

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

No. CE/2012/C1503 Date 2012/12/18 Page 2 of 6 Test Result(s) PART NAME No.1 Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI

No. CE/2012/C1503 Date 2012/12/18 Page 2 of 6 Test Result(s) PART NAME No.1 Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI No. CE/2012/C1503 Date 2012/12/18 Page 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the client as Sample Description Buyer/Order No. Other Info. Sample Receiving Date

More information

Test Report. Report No. ECL01I Page 1 of 7

Test Report. Report No. ECL01I Page 1 of 7 Report No. ECL01I058317 Page 1 of 7 Applicant MITSUI HIGH-TEC (SHANGHAI) CO.,LTD Address NO.2001 XINJIN QIAO ROAD EXPORT PROCESSING ZONE PUDONG SHANGHAI CHINA The following sample(s) and sample information

More information

Test Report No. : KA/2012/41514 Date : 2012/05/07 Page : 2 of 9 Test Result(s) PART NAME NO.1 : SILVER NIPPON COPPER WIRE Cadmium (Cd) mg/kg With refe

Test Report No. : KA/2012/41514 Date : 2012/05/07 Page : 2 of 9 Test Result(s) PART NAME NO.1 : SILVER NIPPON COPPER WIRE Cadmium (Cd) mg/kg With refe Test Report No. : KA/2012/41514 Date : 2012/05/07 Page : 1 of 9 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : JP Reference

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) ( ) Sum of

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) ( ) Sum of Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Page 2 of 10 Test Result(s) PART NAME No.1 TRANSPARENT-YELLOW PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of

Page 2 of 10 Test Result(s) PART NAME No.1 TRANSPARENT-YELLOW PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of Page 1 of 10 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period TSF 6502JCR

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Chemical Laboratory - Kao., SGS Taiwan Ltd. Test Report No. : KE/2017/40842 Date : 2017/04/17 ROGERS CORPORATION 245 WOODSTOCK ROAD, WOODSTOCK, CT. 06

Chemical Laboratory - Kao., SGS Taiwan Ltd. Test Report No. : KE/2017/40842 Date : 2017/04/17 ROGERS CORPORATION 245 WOODSTOCK ROAD, WOODSTOCK, CT. 06 Page: 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Color : Sample Receiving Date : Testing Period : Sample Submitted

More information

Test Report No. : KA/2012/61391 Date : 2012/06/28 Page : 2 of 9 Test Result(s) PART NAME NO.1 : BLACK EPOXY MOLDING COMPOUND Test Item (s): Unit Metho

Test Report No. : KA/2012/61391 Date : 2012/06/28 Page : 2 of 9 Test Result(s) PART NAME NO.1 : BLACK EPOXY MOLDING COMPOUND Test Item (s): Unit Metho Test Report No. : KA/2012/61391 Date : 2012/06/28 Page : 1 of 9 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Sample Receiving

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Test Item(s) Cadmium (Cd) Unit Method With reference to IEC (2013) and performe Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Test Report. As per applicant s request

Test Report. As per applicant s request Applicant: Sigma Ink Corporation Date : Nov 19, 2014 674 Via De La Valle Ste 100, Solana Beach, CA 92075 USA Sample Description: One (1) group of submitted samples said to be : Sample Description : UV

More information

3M OPTICAL SYSTEMS No. : CE/2007/13746 Page : 2 of 6 Test Result(s) PART NAME NO.1 : 3M OPTICAL FILM Test Item (s): Unit Method MDL Result Method No.1

3M OPTICAL SYSTEMS No. : CE/2007/13746 Page : 2 of 6 Test Result(s) PART NAME NO.1 : 3M OPTICAL FILM Test Item (s): Unit Method MDL Result Method No.1 3M OPTICAL SYSTEMS 3M CENTER, BUILDING 235-1E-54 ST. PAUL, MN 55144-1000 No. : CE/2007/13746 Date : 2007/01/22 Page : 1 of 6 The following sample(s) was/were submitted and identified by/on behalf of the

More information

TEST REPORT. Page : 1 of 9 Report No. RT14R-U E Date: Oct. 13, : The following submitted sample(s) said to be:-

TEST REPORT. Page : 1 of 9 Report No. RT14R-U E Date: Oct. 13, : The following submitted sample(s) said to be:- Applicant Address : PSMC Co., Ltd. : #52, Banyeo-1dong, Haeundae-gu, Busan, Korea Page : 1 of 9 Sample Description : The following submitted sample(s) said to be:- Name/Type of Product Name of Material

More information

Test Report No. SH /CHEM Date: Oct. 22, 2009 Page 1 of 5

Test Report No. SH /CHEM Date: Oct. 22, 2009 Page 1 of 5 Test Report No. SH9202593/CHEM Date: Oct. 22, 2009 Page 1 of 5 ROGERS CORPORATION 245 WOODSTOCK RD. WOODSTOCK, CT 06281 The following sample(s) was/were submitted and identified by/on behalf of the client

More information

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With reference to IEC (2013) an

Page 2 of 12 Test Result(s) PART NAME No.1 INTEGRATED CIRCUITS Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With reference to IEC (2013) an Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Buyer/Order No. Other Info. Sample Receiving

More information

Page 2 of 12 Test Result(s) PART NAME No.1 YELLOW LUMP Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs Monobro

Page 2 of 12 Test Result(s) PART NAME No.1 YELLOW LUMP Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium Cr(VI) Sum of PBBs Monobro Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period ELEKTRISOLA

More information

Test Report No. : KE/2016/B2076 Date : 2016/11/24 Page : 2 of 8 Test Result(s) PART NAME NO.1 : GRAY Test Item (s): Unit Method Cadmium (Cd) mg/kg Wit

Test Report No. : KE/2016/B2076 Date : 2016/11/24 Page : 2 of 8 Test Result(s) PART NAME NO.1 : GRAY Test Item (s): Unit Method Cadmium (Cd) mg/kg Wit Test Report No. : KE/2016/B2076 Date : 2016/11/24 Page : 1 of 8 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Lot No. : Material Component

More information

Test Report. Report No.RLSZE Page 1 of 11

Test Report. Report No.RLSZE Page 1 of 11 Report No. Page 1 of 11 Applicant Address HER MEI ELECTRONIC CO.,LTD NO.61,FONG TIEN RD.,FONG TIEN INDUSTRY PARK,DAH-PYI SHANE,YUNLIN COUNTY,TAIWAN,R.O.C The following sample(s) and sample information

More information

TEST REPORT. : The following submitted sample(s) said to be:-

TEST REPORT. : The following submitted sample(s) said to be:- Applicant : Amkor Technology Korea, Inc. Address : 280-8, 2-ga, Seongsu-dong, Seongdong-gu, Seoul, 133-706 Korea Page: 1 of 7 Sample Description : The following submitted sample(s) said to be:- Name/Type

More information

TEST REPORT. ADDRESS : 77, Seokam-ro 13-gil, Iksan, Jeonllabuk-do, Korea PAGE: 1 of 8 REPORT NO. RT17R-U2181-E DATE: Dec. 29, 2017

TEST REPORT. ADDRESS : 77, Seokam-ro 13-gil, Iksan, Jeonllabuk-do, Korea PAGE: 1 of 8 REPORT NO. RT17R-U2181-E DATE: Dec. 29, 2017 APPLICANT : CALIX ELECTRONIC CHEMICAL CO., LTD. ADDRESS : 77, Seokam-ro 13-gil, Iksan, Jeonllabuk-do, Korea PAGE: 1 of 8 SAMPLE DESCRIPTION : The following submitted sample(s) said to be:- NAME/TYPE OF

More information

Test Report No. : CE/2009/45866B Date : 2009/05/20 Page : 1 of 7

Test Report No. : CE/2009/45866B Date : 2009/05/20 Page : 1 of 7 Test Report No. : CE/2009/45866B Date : 2009/05/20 Page : 1 of 7 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Sample Receiving

More information

Page 2 of 9 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of PBBs

Page 2 of 9 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Lead (Pb) Mercury (Hg) Test Item(s) Hexavalent Chromium Cr(VI) Sum of PBBs Page 1 of 9 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period ADHESIVE

More information

TEST REPORT. : The following submitted sample(s) said to be:- SAMPLE RECEIVED : Jan. 07, 2019 TESTING DATE : Jan. 07, 2019 ~ Jan.

TEST REPORT. : The following submitted sample(s) said to be:- SAMPLE RECEIVED : Jan. 07, 2019 TESTING DATE : Jan. 07, 2019 ~ Jan. APPLICANT : KOSTIC KOREA LTD. ADDRESS : 185, Pungmu-ro, Gimpo-si, Gyeonggi-do, Korea PAGE: 1 of 8 SAMPLE DESCRIPTION : The following submitted sample(s) said to be:- NAME/TYPE OF PRODUCT SAMPLE ID NO.

More information

Thin Film on Silicon Resistor Networks Models 2NBS, 2QSP Mold Material Change

Thin Film on Silicon Resistor Networks Models 2NBS, 2QSP Mold Material Change Bourns Manufacturers Representatives Corporate Distributor Product Managers Americas Sales Team Asia Sales Team Europe Sales Team Bourns Internal Bourns Plant Managers June, 2010 RESISTOR NETWORKS Thin

More information

Test Report REPORT NO. : CRSPG/00478/16 : CRSPG/16/0042/INOAC DATE REPORTED : 14 th Mar., 2016 PAGE : 1 of 5

Test Report REPORT NO. : CRSPG/00478/16 : CRSPG/16/0042/INOAC DATE REPORTED : 14 th Mar., 2016 PAGE : 1 of 5 PAGE : 1 of INOAC CORPORATION AICHI, JAPAN 446-804. The following merchandise was (were) submitted and identified by the client as: Sample Receiving : 18/02/2016 Testing Date : 18/02/2016 to 14/03/2016

More information

CHI NHANH CONG TY TNHH SAN XUAT THUONG MAI HA PHONG -XUONG SAN XUAT

CHI NHANH CONG TY TNHH SAN XUAT THUONG MAI HA PHONG -XUONG SAN XUAT Test Report No. HLL13/1269/2441 Date: August 22, 2013 Page 1 of 6 CHI NHANH CONG TY TNHH SAN XUAT THUONG MAI HA PHONG -XUONG SAN XUAT LO LA2, DUONG SO 1, KCN XUYEN A, MY HANH BAC, DUC HOA, LONG AN. VIET

More information

Page 2 of 10 Test Result(s) PART NAME No.1 LT.GRAY SHEET Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and perf

Page 2 of 10 Test Result(s) PART NAME No.1 LT.GRAY SHEET Test Item(s) Cadmium (Cd) Lead (Pb) Unit Method With reference to IEC (2013) and perf Page 1 of 10 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No. Other Info. Sample Receiving Date Testing Period

More information

Chemical Laboratory - Kao., Test Report No. : KE/2018/11379 Date : 2018/01/25 Page : 2 of 8 Test Result(s) PART NAME NO.1 : CLEAR FAL FILM WITH ADHESI

Chemical Laboratory - Kao., Test Report No. : KE/2018/11379 Date : 2018/01/25 Page : 2 of 8 Test Result(s) PART NAME NO.1 : CLEAR FAL FILM WITH ADHESI Chemical Laboratory - Kao., Test Report No. : KE/2018/11379 Date : 2018/01/25 Page : 1 of 8 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description

More information

TEST REPORT. * Note 2 : This report shall not be reproduced except in full without the written approval of the testing laboratory.

TEST REPORT. * Note 2 : This report shall not be reproduced except in full without the written approval of the testing laboratory. Applicant : Doosan Corporation Electro-Materials Address : 40, Doosan-ro, Jeungpyeong-eup, Jeungpyeong-gun, Chungcheongbuk-do, Korea Page: 1 of 5 : The following submitted sample(s) said to be:- Name/Type

More information

Test Report No _rev01 Date: 06/DEC/2017 Page 1 of 5

Test Report No _rev01 Date: 06/DEC/2017 Page 1 of 5 Test Report No. 4346137-02_rev01 Date: 06/DEC/2017 Page 1 of 5 Ms. Anja Meyer The following samples were submitted and identified by/on behalf of the client as SGS Job file : 4346137 Order date : 06/NOV/2017

More information

Test Report No. CRSSA/03608/18 Date : 28/03/2018 Page: 1 of 7 CRS Ref. CRSSA/18/0736/Toray

Test Report No. CRSSA/03608/18 Date : 28/03/2018 Page: 1 of 7 CRS Ref. CRSSA/18/0736/Toray Test Report No. CRSSA/03608/18 Date : 28/03/2018 Page: 1 of 7 TORAY PLASTICS (M) SDN BHD 2628, MK. 1, SPT., LORONG PERUSAHAAN 4 PRAI FREE INDUSTRIAL ZONE 13600 PRAI, PENANG, MALAYSIA The following merchandise

More information

Test Report No. : CE/2014/50660 Date : 2014/05/22 Page : 2 of 14 Test Result(s) PART NAME No.1 Cadmium (Cd) Lead (Pb) Mercury (Hg) Antimony (Sb) Test

Test Report No. : CE/2014/50660 Date : 2014/05/22 Page : 2 of 14 Test Result(s) PART NAME No.1 Cadmium (Cd) Lead (Pb) Mercury (Hg) Antimony (Sb) Test Test Report No. : CE/2014/50660 Date : 2014/05/22 Page : 1 of 14 The following sample(s) was/were submitted and identified by/on behalf of the applicant as : Sample Submitted By Sample Description Style/Item

More information

Chemical Laboratory - Kao., Page 2 of 14 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Test Item(s) Unit Method mg/kg With reference

Chemical Laboratory - Kao., Page 2 of 14 Test Result(s) PART NAME No.1 SILVER COLORED PASTE Cadmium (Cd) Test Item(s) Unit Method mg/kg With reference Chemical Laboratory - Kao., Page 1 of 14 The following sample(s) was/were submitted and identified by/on behalf of the applicant as Sample Description Style/Item No. Sample Receiving Date Testing Period

More information

Page 2 of 11 Test Result(s) PART NAME No.1 YELLOW/WHITE PAD (EXCLUDING THE RELEASE FILM) Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With referenc

Page 2 of 11 Test Result(s) PART NAME No.1 YELLOW/WHITE PAD (EXCLUDING THE RELEASE FILM) Cadmium (Cd) Lead (Pb) Test Item(s) Unit Method With referenc Page 1 of 11 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Buyer/Order No. Other Info. Sample Receiving Date Testing Period

More information

TEST REPORT. Address : , Doksan-dong, Geumcheon-gu, Seoul, Korea Page: 1 of 12 Report No. RT16R-S E Date: Jul.

TEST REPORT. Address : , Doksan-dong, Geumcheon-gu, Seoul, Korea Page: 1 of 12 Report No. RT16R-S E Date: Jul. Applicant : Young Yiel Precision Address : 1001-10, Doksan-dong, Geumcheon-gu, Seoul, Korea Page: 1 of 12 : The following submitted sample(s) said to be:- Name/Type of Product Name of Material Item No.

More information

Page 2 of 12 Test Result(s) PART NAME No.1 DK. BROWN LUMP Cadmium (Cd) Lead (Pb) Mercury (Hg) Antimony (Sb) Beryllium (Be) Test Item(s) Hexavalent Chr

Page 2 of 12 Test Result(s) PART NAME No.1 DK. BROWN LUMP Cadmium (Cd) Lead (Pb) Mercury (Hg) Antimony (Sb) Beryllium (Be) Test Item(s) Hexavalent Chr Page 1 of 12 The following samples was/were submitted and identified by/on behalf of the applicant as Sample Submitted By Sample Description Style/Item No. Sample Receiving Date Testing Period ELEKTRISOLA

More information

Intertek Testing Services Ltd., Shanghai TFH Division Block B, Jinling Business Square,No.801 Yi Shan Road, Shanghai, China, 200233 Tel: +86 21 6120 6565 Fax: +86 21 6127 9740 E-mail: labtest.shanghai@intertek.com

More information

TEST REPORT. : Lead Frame / Ag is plated on Ni-Fe Alloy-A42 material

TEST REPORT. : Lead Frame / Ag is plated on Ni-Fe Alloy-A42 material APPLICANT : PSMC CO., LTD. ADDRESS : 16, Barangongdan-ro 4-gil, Hyangnam-eup, Hwaseong-si, Gyeonggi-do, Korea PAGE: 1 of 10 SAMPLE DESCRIPTION : The following submitted sample(s) said to be:- NAME/TYPE

More information

Test Report No. : CE/2014/B4428 Date : 2014/12/03 Page : 1 of 12 PELNOX CO., LTD. 8-7 BODAI, HADANO CITY, KANAGAWA , JAPAN *CE/2014/B4428* The

Test Report No. : CE/2014/B4428 Date : 2014/12/03 Page : 1 of 12 PELNOX CO., LTD. 8-7 BODAI, HADANO CITY, KANAGAWA , JAPAN *CE/2014/B4428* The Test Report No. : CE/2014/B4428 Date : 2014/12/03 Page : 1 of 12 The following sample(s) was/were submitted and identified by/on behalf of the applicant as : Sample Description Style/Item No. Sample Receiving

More information

Test Report No. : KA/2014/61579 Date : 2014/07/07 Page : 2 of 14 Test Result(s) PART NAME NO.1 : GOLD BONDING WIRE Test Item (s): Unit Method Cadmium

Test Report No. : KA/2014/61579 Date : 2014/07/07 Page : 2 of 14 Test Result(s) PART NAME NO.1 : GOLD BONDING WIRE Test Item (s): Unit Method Cadmium Test Report No. : KA/2014/61579 Date : 2014/07/07 Page : 1 of 14 The following sample(s) was/were submitted and identified by/on behalf of the client as : Sample Description : Style/Item No. : Color :

More information

Test Report No. CTSSA/13164/14 Date: 11/07/2014 Page: 1 of 10 CTS Ref. CTSSA/14/2009/Redring

Test Report No. CTSSA/13164/14 Date: 11/07/2014 Page: 1 of 10 CTS Ref. CTSSA/14/2009/Redring Test Report No. CTSSA/13164/14 Date: 11/07/2014 Page: 1 o 10 REDRING SOLDER (M) SDN. BHD. LOT 17486, JALAN DUA, TAMAN SELAYANG BARU 68100 BATU CAVES, SELANGOR DARUL EHSAN, MALAYSIA The ollowing merchandise

More information