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1 Mat. Res. Soc. Symp. Proc. Vol Materials Research Society G Determination of the Plastic Behavior of Low Thermal Expansion Glass at the Nanometer Scale Richard Tejeda, 1 Roxann Engelstad, 1 Edward Lovell, 1 Anthony Anderson, 2 Dehua Yang, 2 and Kenneth Blaedel 3 1 University of Wisconsin Computational Mechanics Center, Madison, WI Hysitron Incorporated, Minneapolis, MN Lawrence Livermore National Laboratory, Livermore, CA ABSTRACT The nanometer-scale plastic behavior of two low thermal expansion glasses (ULE and Zerodur ) was determined through a combination of nanoindentation experiments and finite element modeling. The finite element models were then extended to investigate aspects of the performance of these materials as extreme ultraviolet lithography reticles. INTRODUCTION Cleanroom specifications used for semiconductor manufacturing allow for a finite number of airborne particles in the production environment. Inevitably, these particles and other very small pieces of debris shed from equipment will find their way onto surfaces that are critical to the lithographic process. For example, in the exposure tool, the backside of the reticle can be electrostatically clamped to the chuck. Here entrapped debris could distort the reticle and its image as it is projected onto the wafer that is being exposed. Simulations have shown that a localized gap as small as 40 nm at the interface of the reticle and chuck in an extreme ultraviolet lithography (EUVL) exposure tool can adversely affect the performance of the system [1]. In order to fully characterize this problem, a detailed investigation of the mechanics of a particle being crushed between the reticle and chuck was performed. Preliminary finite element (FE) models have shown that the particle crush event involves a substantial amount of plastic deformation of the reticle, chuck, and particle. An accurate FE simulation must, therefore, incorporate the nanometer-scale plastic behavior of the components. Techniques for the determination of hardness and elastic properties of materials at small (mesoscale) dimensions are well established [2]. However, it is not obvious how to extract information such as a material s yield strength and post-yield behavior from typical nanoindentation test data. This paper describes how the nonlinear material properties of two different glasses were derived using a combination of nanoindentation testing and FE modeling. The two types of glass investigated were ULE and Zerodur, which are principal candidates for the EUVL reticle and chuck material because of their low thermal expansivity. NANOINDENTATION PROCEDURE AND RESULTS Three key pieces of information were required from the nanoindentation experiments: 1) the elastic properties of the glass, 2) the geometry of the indenter tip, and 3) the force-deflection response of the materials during a non-elastic indentation. A Hysitron TriboIndenter equipped with a conical diamond tip was used for all of the nanoindentation testing. The tip had a 60
2 G included angle and a nominal radius of 1 µm. The nanoscale elastic properties of ULE and Zerodur were first determined by standard nanoindentation techniques and are listed in Table I. Two methods were used to check the radius of curvature of the end of the diamond tip. The first involved making an indentation in a known material and then using a Hertzian contact analysis to calculate the radius of the tip. This technique requires that a completely elastic indentation be made into a standard sample with known elastic properties. In this case, fused quartz was chosen as the standard. The resulting load vs. displacement data (see Fig. 1) can then be fit using the classic Hertz elastic contact equations to determine the tip radius. Using this analysis method, which is built into the Hysitron software, the tip radius was found to be between 700 and 800 nm. The second method requires that the tip be imaged with a scanning probe microscope on a standard of spikes that are much sharper than the tip itself (see Fig. 2). Here the spikes on the standard were approximately 10 nm in radius. These images were then used in two different ways. One was to use a commercially available software program to analyze the images and fit the data to calculate a radius at the end of the tip. This method gave a tip radius from 750 to 850 nm. An alternative procedure was to simply fit a circle to the cross-section profile of the image and measure the radius of that circle using the appropriate scale as shown in Fig. 3. These measurements indicate a tip radius in the range of 600 to 650 nm. Table I. Elastic properties of ULE and Zerodur determined by nanoindentation testing. ULE (GPa) Zerodur (GPa) Elastic Modulus Poisson s Ratio Figure 1. Force vs. displacement curve for 150 µn indent on fused quartz.
3 G Figure 2. Three-dimensional plot of image after scanning the indentation diamond tip over 10 nm silicon nitride spikes. Figure 3. Cross section of the indenter tip with sized circle superimposed on image. Load and deflection data were then collected for several non-elastic indentations into each glass sample. Finally, correlation of this information to an FE model allowed for the characterization of the glasses plastic properties as described in the next section. FINITE ELEMENT PROCEDURE AND RESULTS An axisymmetric model of the nanoindentation process was created for the FE code LS-DYNA (see Fig. 4). A uniform tip radius of 700 nm and the elastic properties listed in Table I were assumed.
4 G (a) (b) (c) Figure 4. FE simulation (a) before, (b) during, and (c) after nanoindentation. An elastic, perfectly-plastic constitutive model was chosen to represent the glass samples. Consequently, there was only a single unknown material parameter: the yield strength of each glass. This parameter was extracted by adjusting the numerical value of the proportional limit until the output of the FE model matched the experimental load-deflection data. An example of the agreement that can be achieved is shown in Fig. 5. The yield strengths that were obtained by this method are listed in Table II. Table II. Nanoscale yield strength of ULE and Zerodur. ULE Zerodur 8.5 GPa 8.0 GPa Indenter Load (mn) Nanoindenter FE model Indenter Depth (nm) Figure 5. Correlation between the FE simulation and nanoindention experimental results for ULE glass.
5 G Because of the assumptions of the preceding analysis, it is important that the values obtained only be used in applications involving a similar indenter size (700 nm) and indentation depth (800 nm). One such application is the analysis of particle contamination in an EUVL exposure tool, as described in the introduction. As part of a study to determine the appropriate clamping force for the EUVL reticle, an FE model (Fig. 6) that incorporates the material properties shown above was created in order to quantify the force required to fully crush and/or embed small particles. Output from the model (Fig. 7) shows that it takes less than 20 mn to crush a typical particle. Figure 6. Finite element simulation of a spherical ULE particle (1.0 µm diameter) being crushed between a ULE reticle and chuck Crush Force (mn) Zerodur ULE Displacement (nm) Figure 7. Force-displacement curves generated by the FE simulation of the particle crush event.
6 G SUMMARY AND CONCLUSIONS Potential imaging errors for extreme ultraviolet lithography could originate from debris particles trapped between the reticle and chuck. Both of these components will be fabricated from low thermal expansion glass, such as ULE or Zerodur. To support assessment of reticle distortion from particle crushing and embedding, the nanoscale material properties of these glasses were determined. Using conventional indentation methods, the elastic modulus and Poisson's ratio were measured for ULE (66.3 GPa and 0.17) and Zerodur (83.3 GPa and 0.24). Non-elastic indentation testing was also performed. The material constitutive relation was assumed to be elastic, perfectly plastic with unknown yield stresses. To identify these values, a finite element model replicated the non-elastic indentation test. By adjusting unknown parameters for matching experimental and FE results, the yield stresses were established as 8.5 GPa for ULE and 8.0 GPa for Zerodur. With these results, a comprehensive FE simulation of the clamping process showed that it takes less than 20 mn to crush a 1.0-µm diameter ULE particle between a ULE reticle and chuck. These methods and models can be extended to address related EUVL problems such as distortions induced from trapping multiple particles and reduced effective heat transfer from the reticle to the chuck. ACKNOWLEDGMENTS This research has been funded by International SEMATECH and DARPA / ARL. Computer support was provided by the Intel Corporation and Microsoft. REFERENCES 1. R. Tejeda, R. Engelstad, E. Lovell, and K. Blaedel, to appear in J. Vac. Sci. Technol. B (2002). 2. W. Oliver and G. Pharr, J. Mater. Res. 7,p.1564(1992).
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