Bipolar junction transistor operation and modeling
|
|
- David Campbell
- 5 years ago
- Views:
Transcription
1 Electronic Devices and Circuits Lecture 8 - Bipolar Junction Transistor Basics - Outline Announcements Handout - Lecture Outline and Summary; Old eam 1's on Stellar First Hour Eam - Oct. 8, 7:30-9:30 pm; thru p-n diodes, PS #4 Review/Diode model wrap-up Eponential diode: i D (v AB = I S (e qvab/kt -1 (holes (electrons with I S A q n i [(D h / w n* + (D e /N Ap w p* ] Short- vs. long-base diodes: effective diode lengths and consequences Observations: Saturation current, I S, goes down as doping levels go up Injection is predominantly into more lightly doped side Junctions as injecting and etracting contacts. Diffusion charge stores; diffusion capacitance: Quasi-neutral region ecess carriers as charge store Total charge vs. voltage and current; incremental capacitance Bipolar junction transistor operation and modeling Bipolar junction transistor structure Qualitative description of operation: 1. Visualizing the carrier flues (using npn as the eample. The control function 3. Design objectives Operation in forward active region, v BE > 0, v BC < 0: d E, d B, a F, I ES Clif Fonstad, 9/03 Lecture 8 - Slide 1
2 Biased p-n junctions: ecess minority carrier (diffusion charge stores Ecess minority carrier charge stores; Diffusion capacitance: Using eample of asymmetrically doped p+-n diode Note: Assuming negligible charge stored on p-side p ( n Diffusion charge store, n-side: Notice that the stored positive charge (the ecess holes and the stored negative charge (the ecess electrons occupy the same volume in space (between = n and = w n! [ [ ] w n - n ] q A,DF (v AB = Aq p'( n - p'(w n p (, n ( -w p - p n w n Clif Fonstad, 9/03 Lecture 8 - Slide Charge stored on n-side (holes and electrons ª Aq n i e qv AB / [ kt -1] w n,eff The charge stored depends non-linearly on v AB. As we did in the case of the depletion charge store, we define an incremental linear equivalent diffusion capacitance, C df, as: n (- p C df q A,DF v AB v AB =V AB ª A q kt w n,eff n i e qv AB / kt
3 Diffusion capacitance, cont.: p ( n p (, n ( Ecess holes and electrons stored on n-side n (- p -w p - p n w n A very useful way to write the diffusion capacitance is in terms of the bias current, I D : I D ª Aqn i D h e qv AB / kt D [ -1] ª Aqn h i e qv AB / kt w n,eff w n,eff for V AB >> kt Comparing this to C dff we find: C df ª A q kt w n,eff n i e qv AB / kt ª w n,eff q I D D h kt ** Notice that the cross-sectional area of the device, A, does not appear eplicitly in this epression. Only the total current! Clif Fonstad, 9/03 Lecture 8 - Slide 3
4 Comparing charge stores and small-signal linear equivalent capacitors: Parallel plate capacitor q A r( q A,PP = A e d v AB -d/ d/ q B ( = -q A C pp q A,PP = Ae v AB d v AB =V AB Depletion region charge store - p qa q r( q B ( = -Q A -qn Ap QNR region diffusion charge store p ( n n p (, n ( n (- p -w p - p n w n q A, q B (=-q A q A,DP (v AB = -A qe Si [ f b - v AB ] C dp = A q AB,DF (v AB ª Aqn i C df ª w n,eff q I D D h kt N Ap [ N Ap + ] D h e qv AB / [ kt -1] w n,eff = w n,eff i D (v AB D h Clif Fonstad, 9/03 Lecture 8 - Slide 4 qe Si [ ] f b -V AB Note: Approimate because we are only accounting for the charge store on the lightly doped side. Note: Valid in forward bias where v AB >> kt/q N Ap [ N Ap + ] = A e Si w
5 Bipolar Junction Transistors: basic operation and modeling how the base-emitter voltage, v BE, controls the collector current, i C E C i C E - - i E n N DE v CE p N AB n N DC + i C C + vbe- E v BE + B i B -w E 0 w B w B + w C Forward biased v BE, the bias on the emitter-base junction, controls the injection of electrons across the E-B junction into the base and toward the collector. Reverse biased v CB, the reverse bias on the collectorbase junction, insures collection of those electrons injected across the E-B junction that reach the C-B junction as the collector current, i C Our net task is to determine: Given a structure, what are i E (v BE,v CE, i C (v BE,v CE, and i B (v BE,v CE? Clif Fonstad, 9/03 Lecture 8 - Slide 5
6 npn BJT: Forward active region operation, v EB > 0 and v CB 0 Ecess Carriers: (n i /N DE (eqvbe/kt - 1 p, n (n i /N AB (eqvbe/kt (ohmic ~ 0 (vbc < 0 0 (ohmic -we 0 wb wb + wc Currents: i e, i h -we 0 wb wb + wc Clif Fonstad, 9/03 i he [= d E i ee ] i ee i E [= i ee + i ee = i ee (1 + d E ] } i C [= i ee (1 d B ] i B [= i he + d B i ee = i ee (d E + d B ] Lecture 8 - Slide 6
7 npn BJT: Well designed structure in FAR N DE >> N AB, w E << L he, w B <<L eb Ecess Carriers: (n i /N DE (eqvbe/kt - 1 p, n (n i /N AB (eqvbe/kt (ohmic 0 (vbc = 0 0 (ohmic -we 0 wb wb + wc Currents: i e, i h -we 0 wb wb + wc i he [= d E i ee ] i ee i C [= i ee (1 d B i ee ] Clif Fonstad, 9/03 i E [= i ee (1 + d E ] i B [= i E ( i C = i ee (d E + d B i ee d E ] Lecture 8 - Slide 7
8 B + ib vbe Electronic Devices and Circuits Lecture 8 - Bipolar Junction Transistor Basics - Summary Review/Junction diode model wrap-up Refer to "Lecture 7- Summary" for a good overview Diffusion capacitance: adds to depletion capacitance In asym., short-base diodes: C df (qi D /kt[(w n - n /D h ] (area doesn't enter epression! (p + -n eample Bipolar junction transistor operation and modeling Hole Flu n n p C E ie ic Electron Flu wb 0 -we wb + wc Currents (forward active: (npn eample i E (v BE,0 = I ES (e qvbe/kt 1 i C (v BE,0 = a F i E (v BE,0 with a F [(1 d B /(1 + d E ] Emitter defect, d E (D h N AB w B* /D e N DE w E* (ratio of hole to electron current across E-B junction Base defect, d B (w B /L e (fraction of injected electrons recombining in base n, p Also, i B (v BE,0 = [(d E + d B /(1 + d E ] i E (v BE,0 and, i C (v BE,0 = b F i B (v BE,0, with b F a F /(1 a F = [(1 d B /(d E + d B ] Clif Fonstad, 9/03 Lecture 8 - Slide 8
Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline
6.012 - Electronic Devices and Circuits Lecture 5 - p-n Junction Injection and Flow - Outline Review Depletion approimation for an abrupt p-n junction Depletion charge storage and depletion capacitance
More informationEE105 - Fall 2006 Microelectronic Devices and Circuits
EE105 - Fall 2006 Microelectronic Devices and Circuits Prof. Jan M. Rabaey (jan@eecs) Lecture 21: Bipolar Junction Transistor Administrative Midterm Th 6:30-8pm in Sibley Auditorium Covering everything
More informationMicroelectronic Devices and Circuits Lecture 9 - MOS Capacitors I - Outline Announcements Problem set 5 -
6.012 - Microelectronic Devices and Circuits Lecture 9 - MOS Capacitors I - Outline Announcements Problem set 5 - Posted on Stellar. Due net Wednesday. Qualitative description - MOS in thermal equilibrium
More informationMicroelectronic Devices and Circuits Lecture 13 - Linear Equivalent Circuits - Outline Announcements Exam Two -
6.012 Microelectronic Devices and Circuits Lecture 13 Linear Equivalent Circuits Outline Announcements Exam Two Coming next week, Nov. 5, 7:309:30 p.m. Review Subthreshold operation of MOSFETs Review Large
More informationfigure shows a pnp transistor biased to operate in the active mode
Lecture 10b EE-215 Electronic Devices and Circuits Asst Prof Muhammad Anis Chaudhary BJT: Device Structure and Physical Operation The pnp Transistor figure shows a pnp transistor biased to operate in the
More informationLecture 15 The pn Junction Diode (II)
Lecture 15 The pn Junction Diode (II I-V characteristics Forward Bias Reverse Bias Outline Reading Assignment: Howe and Sodini; Chapter 6, Sections 6.4-6.5 6.012 Spring 2007 Lecture 15 1 1. I-V Characteristics
More informationDigital Integrated CircuitDesign
Digital Integrated CircuitDesign Lecture 5a Bipolar Transistor Dep. Region Neutral Base n(0) b B C n b0 P C0 P e0 P C xn 0 xp 0 x n(w) b W B Adib Abrishamifar EE Department IUST Contents Bipolar Transistor
More informationLecture 16 - The pn Junction Diode (II) Equivalent Circuit Model. April 8, 2003
6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 16-1 Lecture 16 - The pn Junction Diode (II) Equivalent Circuit Model April 8, 2003 Contents: 1. I-V characteristics (cont.) 2. Small-signal
More informationRecitation 17: BJT-Basic Operation in FAR
Recitation 17: BJT-Basic Operation in FAR BJT stands for Bipolar Junction Transistor 1. Can be thought of as two p-n junctions back to back, you can have pnp or npn. In analogy to MOSFET small current
More informationLecture 17. The Bipolar Junction Transistor (II) Regimes of Operation. Outline
Lecture 17 The Bipolar Junction Transistor (II) Regimes of Operation Outline Regimes of operation Large-signal equivalent circuit model Output characteristics Reading Assignment: Howe and Sodini; Chapter
More informationElectronic Devices and Circuits Lecture 14 - Linear Equivalent Circuits - Outline Announcements
6.012 Electronic Devices and Circuits Lecture 14 Linear Equivalent Circuits Outline Announcements Handout Lecture Outline and Summary Review Adding refinements to large signal models Charge stores: depletion
More informationLecture 17 - The Bipolar Junction Transistor (I) Forward Active Regime. April 10, 2003
6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 17-1 Lecture 17 - The Bipolar Junction Transistor (I) Contents: Forward Active Regime April 10, 2003 1. BJT: structure and basic operation
More information6.012 Electronic Devices and Circuits
Page 1 of 1 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.12 Electronic Devices and Circuits Exam No. 1 Wednesday, October 7, 29 7:3 to 9:3
More informationLecture 16 The pn Junction Diode (III)
Lecture 16 The pn Junction iode (III) Outline I V Characteristics (Review) Small signal equivalent circuit model Carrier charge storage iffusion capacitance Reading Assignment: Howe and Sodini; Chapter
More informationELEC 3908, Physical Electronics, Lecture 18. The Early Effect, Breakdown and Self-Heating
ELEC 3908, Physical Electronics, Lecture 18 The Early Effect, Breakdown and Self-Heating Lecture Outline Previous 2 lectures analyzed fundamental static (dc) carrier transport in the bipolar transistor
More informationELEC 3908, Physical Electronics, Lecture 19. BJT Base Resistance and Small Signal Modelling
ELEC 3908, Physical Electronics, Lecture 19 BJT Base Resistance and Small Signal Modelling Lecture Outline Lecture 17 derived static (dc) injection model to predict dc currents from terminal voltages This
More informationLecture 35 - Bipolar Junction Transistor (cont.) November 27, Current-voltage characteristics of ideal BJT (cont.)
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 35-1 Lecture 35 - Bipolar Junction Transistor (cont.) November 27, 2002 Contents: 1. Current-voltage characteristics of ideal BJT (cont.)
More informationLecture 19 - p-n Junction (cont.) October 18, Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode: parasitics, dynamics
6.720J/3.43J - Integrated Microelectronic Devices - Fall 2002 Lecture 19-1 Lecture 19 - p-n Junction (cont.) October 18, 2002 Contents: 1. Ideal p-n junction out of equilibrium (cont.) 2. pn junction diode:
More informationSchottky Rectifiers Zheng Yang (ERF 3017,
ECE442 Power Semiconductor Devices and Integrated Circuits Schottky Rectifiers Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Power Schottky Rectifier Structure 2 Metal-Semiconductor Contact The work function
More informationELEC 3908, Physical Electronics, Lecture 17. Bipolar Transistor Injection Models
LC 3908, Physical lectronics, Lecture 17 Bipolar Transistor njection Models Lecture Outline Last lecture looked at qualitative operation of the BJT, now want to develop a quantitative model to predict
More informationUNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences
UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences EE 105: Microelectronic Devices and Circuits Spring 2008 MIDTERM EXAMINATION #1 Time
More informationEE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions
EE105 Fall 2015 Microelectronic Devices and Circuits: Semiconductor Fabrication and PN Junctions Prof. Ming C. Wu wu@eecs.berkeley.edu 511 Sutardja Dai Hall (SDH) 1 pn Junction p-type semiconductor in
More informationFinal Examination EE 130 December 16, 1997 Time allotted: 180 minutes
Final Examination EE 130 December 16, 1997 Time allotted: 180 minutes Problem 1: Semiconductor Fundamentals [30 points] A uniformly doped silicon sample of length 100µm and cross-sectional area 100µm 2
More informationECE-342 Test 2 Solutions, Nov 4, :00-8:00pm, Closed Book (one page of notes allowed)
ECE-342 Test 2 Solutions, Nov 4, 2008 6:00-8:00pm, Closed Book (one page of notes allowed) Please use the following physical constants in your calculations: Boltzmann s Constant: Electron Charge: Free
More informationDevice Physics: The Bipolar Transistor
Monolithic Amplifier Circuits: Device Physics: The Bipolar Transistor Chapter 4 Jón Tómas Guðmundsson tumi@hi.is 2. Week Fall 2010 1 Introduction In analog design the transistors are not simply switches
More informationForward-Active Terminal Currents
Forward-Active Terminal Currents Collector current: (electron diffusion current density) x (emitter area) diff J n AE qd n n po A E V E V th ------------------------------ e W (why minus sign? is by def.
More informationGetting J e (x), J h (x), E(x), and p'(x), knowing n'(x) Solving the diffusion equation for n'(x) (using p-type example)
6.012 - Electronic Devices and Circuits Lecture 4 - Non-uniform Injection (Flow) Problems - Outline Announcements Handouts - 1. Lecture Outline and Summary; 2. Thermoelectrics Review Thermoelectricity:
More informationElectronic Devices and Circuits Lecture 18 - Single Transistor Amplifier Stages - Outline Announcements. Notes on Single Transistor Amplifiers
6.012 Electronic Devices and Circuits Lecture 18 Single Transistor Amplifier Stages Outline Announcements Handouts Lecture Outline and Summary Notes on Single Transistor Amplifiers Exam 2 Wednesday night,
More informationBJT - Mode of Operations
JT - Mode of Operations JTs can be modeled by two back-to-back diodes. N+ P N- N+ JTs are operated in four modes. HO #6: LN 251 - JT M Models Page 1 1) Forward active / normal junction forward biased junction
More informationSession 6: Solid State Physics. Diode
Session 6: Solid State Physics Diode 1 Outline A B C D E F G H I J 2 Definitions / Assumptions Homojunction: the junction is between two regions of the same material Heterojunction: the junction is between
More informationLecture 17 The Bipolar Junction Transistor (I) Forward Active Regime
Lecture 17 The Bipolar Junction Transistor (I) Forward Active Regime Outline The Bipolar Junction Transistor (BJT): structure and basic operation I V characteristics in forward active regime Reading Assignment:
More informationCHAPTER 4: P-N P N JUNCTION Part 2. M.N.A. Halif & S.N. Sabki
CHAPTER 4: P-N P N JUNCTION Part 2 Part 2 Charge Storage & Transient Behavior Junction Breakdown Heterojunction CHARGE STORAGE & TRANSIENT BEHAVIOR Once injected across the junction, the minority carriers
More informationElectronic Devices and Circuits Lecture 15 - Digital Circuits: Inverter Basics - Outline Announcements. = total current; I D
6.012 - Electronic Devices and Circuits Lecture 15 - Digital Circuits: Inverter asics - Outline Announcements Handout - Lecture Outline and Summary The MOSFET alpha factor - use definition in lecture,
More informationBipolar Junction Transistor (BJT) - Introduction
Bipolar Junction Transistor (BJT) - Introduction It was found in 1948 at the Bell Telephone Laboratories. It is a three terminal device and has three semiconductor regions. It can be used in signal amplification
More informationSemiconductor Physics fall 2012 problems
Semiconductor Physics fall 2012 problems 1. An n-type sample of silicon has a uniform density N D = 10 16 atoms cm -3 of arsenic, and a p-type silicon sample has N A = 10 15 atoms cm -3 of boron. For each
More informationLecture 15 - The pn Junction Diode (I) I-V Characteristics. November 1, 2005
6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 15-1 Lecture 15 - The pn Junction Diode (I) I-V Characteristics November 1, 2005 Contents: 1. pn junction under bias 2. I-V characteristics
More informationLecture 38 - Bipolar Junction Transistor (cont.) May 9, 2007
6.72J/3.43J - Integrated Microelectronic Devices - Spring 27 Lecture 38-1 Lecture 38 - Bipolar Junction Transistor (cont.) May 9, 27 Contents: 1. Non-ideal effects in BJT in FAR Reading material: del Alamo,
More informationECE 340 Lecture 27 : Junction Capacitance Class Outline:
ECE 340 Lecture 27 : Junction Capacitance Class Outline: Breakdown Review Junction Capacitance Things you should know when you leave M.J. Gilbert ECE 340 Lecture 27 10/24/11 Key Questions What types of
More informationSpring Semester 2012 Final Exam
Spring Semester 2012 Final Exam Note: Show your work, underline results, and always show units. Official exam time: 2.0 hours; an extension of at least 1.0 hour will be granted to anyone. Materials parameters
More informationLecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor
Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics t ti Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE105 Fall 2007
More informationElectrical Characteristics of MOS Devices
Electrical Characteristics of MOS Devices The MOS Capacitor Voltage components Accumulation, Depletion, Inversion Modes Effect of channel bias and substrate bias Effect of gate oide charges Threshold-voltage
More information6.012 Electronic Devices and Circuits
Page 1 of 12 YOUR NAME Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology 6.012 Electronic Devices and Circuits FINAL EXAMINATION Open book. Notes: 1. Unless
More informationLecture 04 Review of MOSFET
ECE 541/ME 541 Microelectronic Fabrication Techniques Lecture 04 Review of MOSFET Zheng Yang (ERF 3017, email: yangzhen@uic.edu) What is a Transistor? A Switch! An MOS Transistor V GS V T V GS S Ron D
More informationMemories Bipolar Transistors
Technische Universität Graz nstitute of Solid State Physics Memories Bipolar Transistors Technische Universität Graz nstitute of Solid State Physics Exams February 5 March 7 April 18 June 27 Exam Four
More informationSemiconductor Physics Problems 2015
Semiconductor Physics Problems 2015 Page and figure numbers refer to Semiconductor Devices Physics and Technology, 3rd edition, by SM Sze and M-K Lee 1. The purest semiconductor crystals it is possible
More informationInstitute of Solid State Physics. Technische Universität Graz. Exam. Feb 2, 10:00-11:00 P2
Technische Universität Graz nstitute of Solid State Physics Exam Feb 2, 10:00-11:00 P2 Exam Four questions, two from the online list. Calculator is ok. No notes. Explain some concept: (tunnel contact,
More information13. Bipolar transistors
Technische Universität Graz Institute of Solid State Physics 13. Bipolar transistors Jan. 16, 2019 Technische Universität Graz Institute of Solid State Physics bipolar transistors npn transistor collector
More informationECE-305: Spring 2018 Final Exam Review
C-305: Spring 2018 Final xam Review Pierret, Semiconductor Device Fundamentals (SDF) Chapters 10 and 11 (pp. 371-385, 389-403) Professor Peter Bermel lectrical and Computer ngineering Purdue University,
More informationLecture 20 - p-n Junction (cont.) October 21, Non-ideal and second-order effects
6.70J/3.43J - Integrated Microelectronic Devices - Fall 00 Lecture 0-1 Lecture 0 - p-n Junction (cont.) October 1, 00 Contents: 1. Non-ideal and second-order effects Reading assignment: del Alamo, Ch.
More informationCharge-Storage Elements: Base-Charging Capacitance C b
Charge-Storage Elements: Base-Charging Capacitance C b * Minority electrons are stored in the base -- this charge q NB is a function of the base-emitter voltage * base is still neutral... majority carriers
More informationESE319 Introduction to Microelectronics. BJT Biasing Cont.
BJT Biasing Cont. Biasing for DC Operating Point Stability BJT Bias Using Emitter Negative Feedback Single Supply BJT Bias Scheme Constant Current BJT Bias Scheme Rule of Thumb BJT Bias Design 1 Simple
More informationECE 305 Fall Final Exam (Exam 5) Wednesday, December 13, 2017
NAME: PUID: ECE 305 Fall 017 Final Exam (Exam 5) Wednesday, December 13, 017 This is a closed book exam. You may use a calculator and the formula sheet at the end of this exam. Following the ECE policy,
More informationLecture 17 - p-n Junction. October 11, Ideal p-n junction in equilibrium 2. Ideal p-n junction out of equilibrium
6.72J/3.43J - Integrated Microelectronic Devices - Fall 22 Lecture 17-1 Lecture 17 - p-n Junction October 11, 22 Contents: 1. Ideal p-n junction in equilibrium 2. Ideal p-n junction out of equilibrium
More informationPeak Electric Field. Junction breakdown occurs when the peak electric field in the PN junction reaches a critical value. For the N + P junction,
Peak Electric Field Junction breakdown occurs when the peak electric field in the P junction reaches a critical value. For the + P junction, qa E ( x) ( xp x), s W dep 2 s ( bi Vr ) 2 s potential barrier
More informationCLASS 3&4. BJT currents, parameters and circuit configurations
CLASS 3&4 BJT currents, parameters and circuit configurations I E =I Ep +I En I C =I Cp +I Cn I B =I BB +I En -I Cn I BB =I Ep -I Cp I E = I B + I C I En = current produced by the electrons injected from
More informationSemiconductor Physics fall 2012 problems
Semiconductor Physics fall 2012 problems 1. An n-type sample of silicon has a uniform density N D = 10 16 atoms cm -3 of arsenic, and a p-type silicon sample has N A = 10 15 atoms cm -3 of boron. For each
More informationThermionic emission vs. drift-diffusion vs. p-n junction
6.772/SMA5111 - Compound Semiconductors Lecture 4 - Carrier flow in heterojunctions - Outline A look at current models for m-s junctions (old business) Thermionic emission vs. drift-diffusion vs. p-n junction
More informationMost matter is electrically neutral; its atoms and molecules have the same number of electrons as protons.
Magnetism Electricity Magnetism Magnetic fields are produced by the intrinsic magnetic moments of elementary particles associated with a fundamental quantum property, their spin. -> permanent magnets Magnetic
More informationLecture 15 OUTLINE. MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor
Lecture 15 OUTLINE MOSFET structure & operation (qualitative) Review of electrostatics The (N)MOS capacitor Electrostatics Charge vs. voltage characteristic Reading: Chapter 6.1 6.2.1 EE15 Spring 28 Lecture
More informationLecture 27: Introduction to Bipolar Transistors
NCN www.nanohub.org ECE606: Solid State Devices Lecture 27: Introduction to ipolar Transistors Muhammad Ashraful Alam alam@purdue.edu Alam ECE 606 S09 1 ackground E C E C ase! Point contact Germanium transistor
More information(Refer Slide Time: 03:41)
Solid State Devices Dr. S. Karmalkar Department of Electronics and Communication Engineering Indian Institute of Technology, Madras Lecture - 25 PN Junction (Contd ) This is the 25th lecture of this course
More informationHalf-circuit incremental analysis techniques
6.012 Electronic Devices and Circuits Lecture 19 Differential Amplifier Stages Outline Announcements Handouts Lecture Outline and Summary Design Problem out tomorrow in recitation Review Singletransistor
More informationLecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium. February 13, 2003
6.012 - Microelectronic Devices and Circuits - Spring 2003 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium February 13, 2003
More informationLecture 18 - The Bipolar Junction Transistor (II) Regimes of Operation. November 10, 2005
6.012 - Microelectronic Devices and ircuits - Fall 2005 Lecture 18-1 Lecture 18 - The ipolar Junction Transistor (II) ontents: 1. Regimes of operation. Regimes of Operation November 10, 2005 2. Large-signal
More informationCurrent mechanisms Exam January 27, 2012
Current mechanisms Exam January 27, 2012 There are four mechanisms that typically cause currents to flow: thermionic emission, diffusion, drift, and tunneling. Explain briefly which kind of current mechanisms
More informationPN Junction and MOS structure
PN Junction and MOS structure Basic electrostatic equations We will use simple one-dimensional electrostatic equations to develop insight and basic understanding of how semiconductor devices operate Gauss's
More informationFundamentals of Semiconductor Physics
Fall 2007 Fundamentals of Semiconductor Physics 万 歆 Zhejiang Institute of Modern Physics xinwan@zimp.zju.edu.cn http://zimp.zju.edu.cn/~xinwan/ Transistor technology evokes new physics The objective of
More informationEE 230 Lecture 31. THE MOS TRANSISTOR Model Simplifcations THE Bipolar Junction TRANSISTOR
EE 23 Lecture 3 THE MOS TRANSISTOR Model Simplifcations THE Bipolar Junction TRANSISTOR Quiz 3 Determine I X. Assume W=u, L=2u, V T =V, uc OX = - 4 A/V 2, λ= And the number is? 3 8 5 2? 6 4 9 7 Quiz 3
More informationSemiconductor Physics and Devices
The pn Junction 1) Charge carriers crossing the junction. 3) Barrier potential Semiconductor Physics and Devices Chapter 8. The pn Junction Diode 2) Formation of positive and negative ions. 4) Formation
More informationSemiconductor Junctions
8 Semiconductor Junctions Almost all solar cells contain junctions between different materials of different doping. Since these junctions are crucial to the operation of the solar cell, we will discuss
More informationChapter 2. - DC Biasing - BJTs
Chapter 2. - DC Biasing - BJTs Objectives To Understand : Concept of Operating point and stability Analyzing Various biasing circuits and their comparison with respect to stability BJT A Review Invented
More information12. Memories / Bipolar transistors
Technische Universität Graz Institute of Solid State Physics 12. Memories / Bipolar transistors Jan. 9, 2019 Technische Universität Graz Institute of Solid State Physics Exams January 31 March 8 May 17
More informationIntroduction to Transistors. Semiconductors Diodes Transistors
Introduction to Transistors Semiconductors Diodes Transistors 1 Semiconductors Typical semiconductors, like silicon and germanium, have four valence electrons which form atomic bonds with neighboring atoms
More informationAbout Modeling the Reverse Early Effect in HICUM Level 0
About Modeling the Reverse Early Effect in HICUM Level 0 6 th European HICUM Workshop, June 12-13, 2006, Heilbronn Didier CELI, STMicroelectronics 1/21 D. Céli Purpose According to the bipolar models,
More informationJunction Diodes. Tim Sumner, Imperial College, Rm: 1009, x /18/2006
Junction Diodes Most elementary solid state junction electronic devices. They conduct in one direction (almost correct). Useful when one converts from AC to DC (rectifier). But today diodes have a wide
More informationElectronic Circuits 1. Transistor Devices. Contents BJT and FET Characteristics Operations. Prof. C.K. Tse: Transistor devices
Electronic Circuits 1 Transistor Devices Contents BJT and FET Characteristics Operations 1 What is a transistor? Three-terminal device whose voltage-current relationship is controlled by a third voltage
More informationLecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oxide Semiconductor Structure (cont.) October 4, 2005
6.12 Microelectronic Devices and Circuits Fall 25 Lecture 8 1 Lecture 8 PN Junction and MOS Electrostatics (V) Electrostatics of Metal Oide Semiconductor Structure (cont.) Contents: October 4, 25 1. Overview
More informationEE 230 Lecture 33. Nonlinear Circuits and Nonlinear Devices. Diode BJT MOSFET
EE 230 Lecture 33 Nonlinear Circuits and Nonlinear Devices Diode BJT MOSFET Review from Last Time: n-channel MOSFET Source Gate L Drain W L EFF Poly Gate oxide n-active p-sub depletion region (electrically
More informationEE 5611 Introduction to Microelectronic Technologies Fall Tuesday, September 23, 2014 Lecture 07
EE 5611 Introduction to Microelectronic Technologies Fall 2014 Tuesday, September 23, 2014 Lecture 07 1 Introduction to Solar Cells Topics to be covered: Solar cells and sun light Review on semiconductor
More informationChapter 13 Small-Signal Modeling and Linear Amplification
Chapter 13 Small-Signal Modeling and Linear Amplification Microelectronic Circuit Design Richard C. Jaeger Travis N. Blalock 1/4/12 Chap 13-1 Chapter Goals Understanding of concepts related to: Transistors
More informationRegional Approach Methods for SiGe HBT compact modeling
Regional Approach Methods for SiGe HBT compact modeling M. Schroter 1),2) and H. Tran 2) 1) ECE Dept., University of California San Diego, La Jolla, CA, USA 2) Chair for Electron Devices and Integr. Circuits,
More informationLecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005
6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 4-1 Contents: Lecture 4 - PN Junction and MOS Electrostatics (I) Semiconductor Electrostatics in Thermal Equilibrium September 20, 2005
More informationEECS130 Integrated Circuit Devices
EECS130 Integrated Circuit Devices Professor Ali Javey 9/18/2007 P Junctions Lecture 1 Reading: Chapter 5 Announcements For THIS WEEK OLY, Prof. Javey's office hours will be held on Tuesday, Sept 18 3:30-4:30
More informationReview - Differential Amplifier Basics Difference- and common-mode signals: v ID
6.012 Microelectronic Devices and Circuits Lecture 20 DiffAmp Anal. I: Metrics, Max. Gain Outline Announcements Announcements D.P.: No Early effect in large signal analysis; just LECs. Lec. 21 foils useful;
More informationIntroduction to Power Semiconductor Devices
ECE442 Power Semiconductor Devices and Integrated Circuits Introduction to Power Semiconductor Devices Zheng Yang (ERF 3017, email: yangzhen@uic.edu) Power Semiconductor Devices Applications System Ratings
More informationL03: pn Junctions, Diodes
8/30/2012 Page 1 of 5 Reference:C:\Users\Bernhard Boser\Documents\Files\Lib\MathCAD\Default\defaults.mcd L03: pn Junctions, Diodes Intrinsic Si Q: What are n, p? Q: Is the Si charged? Q: How could we make
More informationELECTRONICS IA 2017 SCHEME
ELECTRONICS IA 2017 SCHEME CONTENTS 1 [ 5 marks ]...4 2...5 a. [ 2 marks ]...5 b. [ 2 marks ]...5 c. [ 5 marks ]...5 d. [ 2 marks ]...5 3...6 a. [ 3 marks ]...6 b. [ 3 marks ]...6 4 [ 7 marks ]...7 5...8
More informationReview 5 unknowns: n(x,t), p(x,t), J e. Doping profile problems Electrostatic potential Poisson's equation. (x,t), J h
6.012 - Electronic Devices and Circuits Lecture 3 - Solving The Five Equations - Outline Announcements Handouts - 1. Lecture; 2. Photoconductivity; 3. Solving the 5 eqs. See website for Items 2 and 3.
More informationLecture 23: Negative Resistance Osc, Differential Osc, and VCOs
EECS 142 Lecture 23: Negative Resistance Osc, Differential Osc, and VCOs Prof. Ali M. Niknejad University of California, Berkeley Copyright c 2005 by Ali M. Niknejad A. M. Niknejad University of California,
More informationA study of the silicon Bulk-Barrier Diodes designed in planar technology by means of simulation
Journal of Engineering Science and Technology Review 2 (1) (2009) 157-164 Research Article JOURNAL OF Engineering Science and Technology Review www.jestr.org A study of the silicon Bulk-Barrier Diodes
More informationHoles (10x larger). Diode currents proportional to minority carrier densities on each side of the depletion region: J n n p0 = n i 2
Part V. (40 pts.) A diode is composed of an abrupt PN junction with N D = 10 16 /cm 3 and N A =10 17 /cm 3. The diode is very long so you can assume the ends are at x =positive and negative infinity. 1.
More informationEE 3329 Electronic Devices Syllabus ( Extended Play )
EE 3329 - Electronic Devices Syllabus EE 3329 Electronic Devices Syllabus ( Extended Play ) The University of Texas at El Paso The following concepts can be part of the syllabus for the Electronic Devices
More informationCapacitors Diodes Transistors. PC200 Lectures. Terry Sturtevant. Wilfrid Laurier University. June 4, 2009
Wilfrid Laurier University June 4, 2009 Capacitor an electronic device which consists of two conductive plates separated by an insulator Capacitor an electronic device which consists of two conductive
More informationSOLUTIONS: ECE 606 Homework Week 10 Mark Lundstrom. Purdue University. (Revised 3/29/13)
ECE- 66 SOLUTIOS: ECE 66 Homework Week 1 Mark Lundstrom (Revised 3/9/13) 1) In a forward- biased P junction under low- injection conditions, the QFL s are aroximately flat from the majority carrier region
More informationChapter 2 - DC Biasing - BJTs
Objectives Chapter 2 - DC Biasing - BJTs To Understand: Concept of Operating point and stability Analyzing Various biasing circuits and their comparison with respect to stability BJT A Review Invented
More informationLecture 10 - Carrier Flow (cont.) February 28, 2007
6.720J/3.43J Integrated Microelectronic Devices - Spring 2007 Lecture 10-1 Lecture 10 - Carrier Flow (cont.) February 28, 2007 Contents: 1. Minority-carrier type situations Reading assignment: del Alamo,
More informationDiodes. anode. cathode. cut-off. Can be approximated by a piecewise-linear-like characteristic. Lecture 9-1
Diodes mplest nonlinear circuit element Basic operation sets the foundation for Bipolar Junction Transistors (BJTs) Also present in Field Effect Transistors (FETs) Ideal diode characteristic anode cathode
More informationLecture 18 - The Bipolar Junction Transistor (II) Regimes of Operation April 19, 2001
6.012 - Microelectronic Devices and ircuits - Spring 2001 Lecture 18-1 Lecture 18 - The ipolar Junction Transistor (II) Regimes of Operation April 19, 2001 ontents: 1. Regimes of operation. 2. Large-signal
More informationEECS130 Integrated Circuit Devices
EECS130 Integrated Circuit Devices Professor Ali Javey 10/02/2007 MS Junctions, Lecture 2 MOS Cap, Lecture 1 Reading: finish chapter14, start chapter16 Announcements Professor Javey will hold his OH at
More informationPHYSICAL ELECTRONICS(ECE3540) CHAPTER 9 METAL SEMICONDUCTOR AND SEMICONDUCTOR HETERO-JUNCTIONS
PHYSICAL ELECTRONICS(ECE3540) CHAPTER 9 METAL SEMICONDUCTOR AND SEMICONDUCTOR HETERO-JUNCTIONS Tennessee Technological University Wednesday, October 30, 013 1 Introduction Chapter 4: we considered the
More information