EE105 - Spring 2007 Microelectronic Devices and Circuits. Structure and Symbol of MOSFET. MOS Capacitor. Metal-Oxide-Semiconductor (MOS) Capacitor
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1 EE105 - Spring 007 Microelectronic Device and ircuit Metal-Oide-Semiconductor (MOS) apacitor Lecture 4 MOS apacitor The MOS tructure can be thought of a a parallel-plate capacitor, with the top plate being the poitive plate, ide being the dielectric, and Si ubtrate being the negative plate. (We are auming P-ubtrate.) Structure and Symbol of MOSFET MOS apacitor = = Thi device i ymmetric, o either of the n+ region can be ource or drain. 3 MOS = Metal Oide Semiconductor Metal i more commonly a heavily doped (n+ or p+) polyilicon layer NMOS p-type ubtrate PMOS n-type ubtrate 4
2 harge Ditribution at Thermal Equilibrium Potential Ditribution for MOS apacitor (n+ Gate on p-subtrate with N a =10 17 cm -3 ) φ + = 550 m n (half of bandgap energy) Depletion Width in Subtrate Na φp = 60 m log Gate charge at poly/ide interface Bulk charge in the letion region of Si ubtrate Oide i an inulator No current flowing through ide 5 Step to contruct the potential ditribution: Gate potential i contant (550 m for n+ gate, -550 m for p+ gate) Potential of neutral ubtrate i contant, it value end on doping onnect the potential between gate and neutral ubtrate (qualitatively) Potential varie linearly in ide Potential varie quadratically in the letion region of ubtrate 6 Flatband oltage < : Accumulation oltage required to produce a flat potential profile = ( φ φ ) n+ p Eample: 17 3 Na = 10 cm, φp = 60m 7 = 40m φn+ = 550m = 970m No net charge at flatband Majority carrier (hole for p- ubtrate) accumulate at the Si-SiO interface Occur when gate bia i below flatband voltage: < harge ditribution: Two delta function QG = ( ) = [F/cm ] t 7 8
3 < < Tn : Depletion The majority carrier in Si near ide interface are leted Occur when gate bia between flatband voltage and threhold voltage harge ditribution: Gate charge at poly/sio interface Fied acceptor ion in letion region Depletion (cont d) + φ φ = + n+ p B qnad qnad = + = d ( ) = t 1+ 1 q N a 9 10 > Tn : Inverion An inverion layer with minority carrier (electron in p-ubtrate) i developed at Si-SiO interface Occur when gate bia i higher than threhold voltage harge ditribution: Gate charge: delta function Inverion layer: delta function Fied impurity charge: contant in letion region 11 Inverion (ont d) Electron concentration at Si- SiO interface qφ kt = i = a n ne N φ = φp Threhold voltage: 1 Tn = φ p + q Na ( φp ) After threhold ( > Tn ), φ i pinned at - φ p Inverion charge = 0 at threhold 1
4 Inverion Stop Depletion Q- urve for MOS apacitor A imple apprimation i to aume that once inverion happen, the letion region top growing Thi i a good aumption ince the inverion charge i an eponential function of the urface potential Under thi condition: accumulation Q G letion Tn inverion Q B,ma Q ( ) N ( ) Q ( ) Q G Tn B,ma Q ( ) = ( ) Q G Tn B,ma 13 In accumulation, the charge i imply proportional to the applied gate-body bia In inverion, the ame i true In letion, the charge grow lower ince the voltage i applied over a letion region 14 Numerical Eample Numerical Eample: Electric Field in Oide MOS apacitor with p-type ubtrate: 16 3 t = 0nm N a = 5 10 cm alculate flat-band: = ( φ + φp ) = (550 ( 40)) = 0.95 n alculate threhold voltage: F/cm = = -6 t 10 cm 1 Tn = φ p + q Na ( φp ) Tn =.95 ( 0.4) + = Apply a gate-to-body voltage: =.5 < Device i in accumulation The entire voltage drop i acro the ide: E + φ + φ n p ( 0.4) = = = = 8 10 t t The charge in the ubtrate (body) conit of hole: cm Q = ( ) = /cm B 7 16
5 Numerical Eample: Depletion Region MOS urve In inverion, what the letion region width and charge? B,ma = φ φp = φp φp = φp = 0.8 Q G Q B,ma Q ( ) N X B,ma 1 qn a = X B,ma d,ma = = qna d,ma 144nm QB,ma = qnaxd,ma = /cm 7 Tn ( ) Small-ignal capacitance i lope of Q- curve apacitance i linear in accumulation and inverion apacitance in letion region i mallet apacitance i non-linear in letion Tn urve Equivalent ircuit = tot In accumulation mode the capacitance i jut due to the voltage drop acro t In inverion the incremental charge come from the inverion layer (letion region top growing). In letion region, the voltage drop i acro the ide and the letion region = = = t 19 MOS apacitor: n+ Gate on n-type Subtrate φ + = 550 m n Tp t 1 Tp = φn q Nd ( φn) φ n Nd φn = 60 m log
6 MOS apacitor: n+ Gate on n-type Subtrate 1
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